KS X ISO 6342-2007 Micrographics－Aperture cards－Method of measuring thickness of buildup area《缩微摄影技术 开窗卡 增厚区厚度的测量方法》.pdf

1、 KS X ISO 6342 KSKSKSKS SKSKSKS KSKSKS SKSKS KSKS SKS KS KS X ISO 6342 : 2007 (2012 ) 2007 10 31 http:/www.kats.go.krKS X ISO 6342：2007 : ( ) ( ) ( ) : (http:/www.standard.go.kr) ： ：2004 10 28 ：2007 10 31 ：2012 12 28 ： 2012-0863 ： ( 02-509-7262) (http:/www.kats.go.kr). 10 5 , . KS X ISO 6342：2007 i

2、. KS X ISO 6342 . A() , , . , , . KS X ISO 6342 : 2007 (2012 ) Micrographics Aperture cards Method of measuring thickness of buildup area 2003 2 ISO 6342, MicrographicsAperture cardsMethod of measuring thickness of buildup area , . 1 (buildup) . 2 . . ( ) . KS M ISO 534, KS X ISO 61961, 1： KS X ISO

3、61964, 4： 3 KS X ISO 61961 KS X ISO 61964 . 4 4.1 (dial micrometer) (dead-weight) , . 0.8 mm/s . (pressure foot) (160.5) mm . (anvil) . . (505) kPa . KS M ISO 534 1 1 . KS X ISO 6342：2007 2 1 ( ) 2.5 0.5 % 5 1 % 2.5 0.5 % 1 2 . 2 . . 5 6 . (231) (502) % . 6 6.1 0.007 5 mm 0.8 mm/s 12 mm/s . 2 . . 6.

4、2 6.35 mm 4 . . 6.3 1 4 . 1 KS X ISO 6342：2007 3 ( A ). . 6.4 (buildup) 6.3 6.2 . KS X ISO 6342：2007 4 A () 6.3 . . A.1 A A . a) AA b) c) A.1 KS X ISO 6342：2007 5 KS X ISO 6342 : 2007 , . 2004 . 1 2003 ISO 6342, MicrographicsAperture cardsMethod of measuring thickness of buildup area , . (buildup) .

5、 2 ISO/TC 171, (Document imaging applications) SC 2, (Application issues) . ISO 6432：2003 2 , ISO 6432：1993 . 3 . 153787 1 145 3(16) (02)26240114 (02)26240148 http:/ KS X ISO 6342 ：2007KSKSKS SKSKS KSKS SKS KS SKS KSKS SKSKS KSKSKS Micrographics Aperture cards Method of measuring thickness of buildup area ICS 37.080 Korean Agency for Technology and Standards http:/www.kats.go.kr