NAVY MIL-C-50765-1971 CARTRIDGE DELAY CCU-17 B CCU-18 B CCU-19 B ASSEMBLY《延时炮弹CCU-17 B CCU-18 B CCU-19 B型组件》.pdf

1、 - - S-374s MIL- C- 50765 (MU) 1 November i971 MILITARY SP EGIFICATION CARTRIDGE DELAY , CCU- 17/B, CCU- 18/B , CCU-19/BY ASSEMBLY 1. SCOPE 1.1 This specification covers Cartridge, Delay: CCU-17/BY CCU-i8/B, CCU-19/B Assembly, for use in cartridge actuated devices. 2. APPLICABLE DOCUMENTS: 2.1 The f

2、ollowing documents of the issue in effect on date of invitation for bids or request for proposal, form a part of this specification to the extent specified herein: SPECIFICATIONS : Military MIL-A-2550 - Ammunition and Special Weapons, General Speci- MIL-E-5272 MIL- C- 6 05 3 9 - Coating, Anodic, Con

3、venrional, for Aluminum and fication for. Equipment, General Specification for, Aluminum Alloys. - Environmental Testing, Aeronautical and Associated STANDARDS : Military MIL- STD- 105 - Sampling Procedures and Tables for Inspection MIL-STD- 109 MIL-STD-171 - Finishing of Metal and Wood Surfaces MIL

4、- STD-413 by Attributes. - Quality Assurance Terms and Definitions. - Visual Inspection Guide for Rubber O-Rings. DRAWINGS : C87 987 14 Ca798715 D117 38 7 33 Dl1738735 Dl1738737 - Carton, Packing, Amunition for Cartridge Delay - Box, Packing, Ammunition for Cartridge Delay - Cartridge Delay, CCU-l7/

5、B Assembly - Cartridge Delay, CCU-lS/B Assembly - Cartridge Delay, CCU-l9/B Assembly (Copies of specifications, standards, drawings and publications required by suppliers in connection with specific procurement functions should be obtained from the procuring activity or as directed by the contractin

6、g officer.) FSC 1377 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-7 MIL-C-50765 13 W 7777906 0330935 3 W HILI C- 50765 ( W 9 2.2 Other publications.- The following document forms a part of this specification to the extent specified herein. the iss

7、ue in effect on date of invitation for bid or request for proposal shall apply: Unless otherwise indicated, ASA-B-46.1 - Surface Texture (Application for copies should be addressed to the American National Standards Institute (ANSI) 1430 Broadway, New York, New York 10018). 3. REQUIWNTS 3.1 General.

8、- Materials, parts and assemblies shall conform to the applicable drawings (See 6,l and 6.3) and referenced specifications. 3.2 Protective finish.- Protective finish shall be in accordance with MIL-(2-60539 and MIL-STD-171 as referenced on applicable drawings. 3.3 Moisture content of lead azide.- Th

9、e moisture content of the lead azide at the time of loading shall not exceed 0.50 percent. 3.4 Vibration.- The assembled cartridge shall withstand vibration as prescribed in MIL-E-5272, Procedure XII without evidenSe of any disintegration of the primer, delay charge, or relay charge, or derangement

10、of any component. 3.5 Primer sensitivity. 3.5.1 The primer, when primed into Delay Element Housin s, shall all- fire when drop tested at an energy level of 26.0 inch ounces. 3.5.2 The primer, when primed into Delay Element Housings, shall not fire when drop tested at an energy level of 4.0 inch ounc

11、es. 3.6 Shock.- The assembled cartridge shall be temperature conditioned in accordance with Table I, inserted into an acceptable test fixture and shocked 750g in either direction along the major axis, The shock load shall be applied during cartridge function and shall not fail to comply with delay t

12、imes specified in Table I, shall not occur in excess of d x 10 -4 cc/sec. 3.7 Airtightness.- The cartridge shall be sealed such that leakage 3,8 Functional . 3,8,1 The cartridge shall not fail to fnire. 2 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,

13、-,-NIL-C-50765 13 m 7977706 0330736 5 m MIL-C-O(MTJ) 3.8.2 Ballistics.- The cartridge when tested shall comply with the requirements specified in Table I. TABLE I Delay Times, Seconds (See 6.2) Temp era tur e CCU-l7/B 1 Sec. Delay -65“ to -70F 1.2 max 65“ to 75F 1.0 2 0.10 200“ to 205F 0.8 min. CCU-

14、 18/B CCU-l9/B 2 Sec. Delay 4 Sec. Delay 2.4 max. 1.6 min. 2.0 2 0.20 4.8 max. 4.0 i 0.40 3.2 min. 3.9 Workmanship. - Workmanship shall be in accordance with the require- ments of the applicable drawings , referenced specifications and the following: 3.9.1 Metal defects.- The metal part shall be fre

15、e from cracks, splits, cold shuts, inclusions, porosity or other metal defects. 3.9.2 Burr.- The part shall not have a burr which might interfere with the assembly or function of the item or which might be injurious to personnel handling the item. 3.9.3 Foreign matter.- The part or assembly shall no

16、t contain chips, dirt, grease, oil, rust, corrosion or other foreign matter. 4. QUALITY ASSURANCE PROVISIONS 4.1 Responsibility for inspection.- Unless otherwise specified in the contract or purchase order, the supplier is responsible for the performance (“of all inspection requirements as specified

17、 herein. 5 specified in the contract or order, the supplier may use his own qr any other facilities suitable for the performance of the inspection requirements speci- fied herein, unless disapproved by the Government. The Government reserves the right to perform any of the inspections set forth in t

18、he specification where such inspections are deemed necessary to assure supplies and services conform to prescribed requirements. Except as otherwise 4.1.1 Quality Assurance terms and definitions.- References shall be made to MIL-STD-109 to define the quality assurance terms used. 4.1.2 Inspection. -

19、 Inspection shall be in accordance with MIL-A-2550. 4.2 First Article Sample. 4.2.1 Initial production sample.- At the beginning of regular produc- tion, a sample shall be submitted in accordance with contract requirements and shall consist of 54 assembled cartridges, 10 sets of unassembled componen

20、ts (including explosive components) for visual and dimensional examination and tests, and 100 primed delay housings for primer sensitivity test. 3 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-MIL-C-50765 13 m 7977706,0330737 7 m MTL- C- 50765 (MU)

21、 4.2.1 Continued The sample shall be manufactured using the same materials, equipment, process and procedures as used in regular production. including packaging and packing shall be the same as used for regular production and shall be obtained from the same source of supply. All parts and materials,

22、 4.2.1.1 Examination and tests.- After examination and provisional Bcceptance at source, the sample shall be inspected sf the drawings and specifications at a Government laboratory or such pther facility specified in the contract. for all requirements 4.2.1.2 Ballistics.- The sample for ballistics t

23、ests shall be temperature conditioned and tested to determine compliance with 3.8, The Tempera ture -65“ to -70F 65“ to 75F 200“ to 205F Vibrated 4 4 4 sample for testing shall consist of the following: TABLE III Shock 4 4 4 - Not Vibrated 10 10 10 4.2.1,3 In-tia1 pr0duct-m sample failure.- Fai-are

24、of the sample to comply with the requirements of the drawings and specifications shall result in sample disapproval. 4.3 inspection provisions. 4.3.1 a. 4.3.1.1 Submission of product.- The product shall be submitted in accordance with MIL-STD-105. 4.3.1.2 Size of Lots.- A lot shall consist of an ide

25、ntifiable group of assembled units and shall include: a, b, Primers from not more than one lot, c. d, Relay assembly from not more than one lot. Components produced by a homogeneous process. Delay assemblies from not more than one lot. 4 Provided by IHSNot for ResaleNo reproduction or networking per

26、mitted without license from IHS-,-,-MIL-C-50765 13 m 7777706 0330738 7 m 4.3.2 Examination.- One hundred percent examination shall be performed Examination for major and minor defects shall be for all critical defects. performed on a defect basis in accordance with the classification of defects cont

27、ained herein, using sampling plan and associated criteria in Tables IV and V. For an individual defect (single characteristic) the criteria in Table IV shall be used. class, the criteria in Table V, shall be used. All non-conforming material shall be rejected. MIL-STD-413. be used as a basis of comp

28、arison for surface roughness determination. power magnification may be used in performing visual examination for such defects as burr and foreign matter. For total defects within a major or minor Inspection for Rubber O-rings shall be in accordance with The roughness comparison specimen prescribedin

29、 ASA-B-36.1 shall Four TABLE IV Ma i or Lot Size Sample Size Accept 1-300 100% Examination 301 - 1300 110 1 1301 - 3200 150 2 3201 - 8000 225 3 8001 - 22000 300 4 TABU V Total Allowable Defects per Sample Size Sample Size for Maior Defects I10 Number of Defects in Class 2- 3 1 4- 7 2 8-19 3 20-43 4

30、over 43 6 Sample Size for Minor Defects 110 2-3 4- 7 8-16 17-48 over 48 5 Reject 2 3 4 5 i5 O 2 3 4 5 8 150 3 4 5 8 11 Minor Accept 2 3 4 5 225 3 4 5 8 11 225 4 5 8 11 17 Reject 3 4 5 6 300 4 5 7 10 14 300 5 7 10 14 20 Provided by IHSNot for ResaleNo reproduction or networking permitted without lice

31、nse from IHS-,-,-MIL-C-507b5 13 m 9797706 0330737 O m MIL-C- 5076s (MU) 4.3,2.1 Rinn, Seal Drawinv B11738770 covering a detail of the applicable Cartridge Delay Assembly. Catepories CRITICAL None defined . - Defect Method of Inspection .lol. Inside Diameter 102. Cross-section diameter MINOR Gage Gag

32、e 201. Length of protrusion, max. 202. Width of protrusion, max. Gage Gage 4.3.2.2 CUP Relay, Drawinn B11738771 coveringa detail of the applicable Cartridge Delay Assembly. CRITICAL None defined. MAJOR 101. Inside diameter 102. Outside diameter 103. Thickness through bottom, min, 104. Metal Defectiv

33、e MINOR Gage Gag e Gage Visual 201. Total length 202. Thickness through bottom, max. 203, Protective finish inadequate or defective Gag e Gag e Visual 4.3,2.3 Body Delay, Drawing C117.38773 covering a detail of the applicable Cartridge Delay Assembly. CRITICAL None defined. 6 - . Provided by IHSNot

34、for ResaleNo reproduction or networking permitted without license from IHS-,-,- flIL-C-507b5 13 W 7779906 03307LtO 7 W 4.3,2.3 Continued Categories Defects MAJOR 101. 102. 103. 104. 105. 106. 107. 108. 109. 110. 111. 112. Pitch diameter of thread, min. Major diameter of thread, min. True position of

35、 pitch diameter of thread with small outside diameter True position of large outside diameter with small outside diameter Total length Depth of cavity Large outside diameter Diameter of cavity Metal defective Burr Foreign matter Protective finish inadequate or improper MINOR 201. Small outside diame

36、ter 202. Diameter of hole 203, Width of slots 204. Length of thread 205. 206. Angles incorrect 207. Length of slots 208. Thread damage 209. Surface finish improper Length to small outside diameter MIL- c-50765 (MU) Methods of Inspection Gage Gage Gage Gage Gage Gag e Gag e Gage Visual Visual Visual

37、Visual Gage Gage Gage Gage Gage Gage Gage Visual Visual 4.3.2.4 Housing, Delay Element, Drawing D11738774, covering a detail of the applicable Cartridge Delay Assembly. CRITICAL None defined . MAJOR 101. Pitch diameter of small external thread, min. 102. Major diameter of small external thread, min.

38、 103. Pitch diameter of internal thread, max. 104. Minor diameter of internal thread, max. 105. 106. 107. True position of large cavity with pitch diameter of Pitch diamter or large external thread, min. Major diameter of large external thread, min. internal thread. Gage Gage Gage Gage Gage Gage Gag

39、e 7 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-VIL-C-50765 13 m 7777706 03307Yl 3 m 4.3.2.4 Continued Catepor ies Defect Method of Inspection 108, 109. -120 * 111 512 I 113. 114. 115, 116. 117. 118. 119. 120 * 121 1 122. 123, 124. 125. 126. 127.

40、 128 * 129, True position of pitch diameter of small external Run out of cavity at small end with large Depth of cavity at small end .Diameter of large cavity below internal thread Length to flange from small end Length to flange from large end Dameter between (hexagon) flange and large Total length

41、 Diameter of cavity at small end Diameter of thru hole Length of internal thread Depth of small cavity below internal thread Depth of large cavity below internal thread Depth of internal thread cavity Angle in counterbore at small end Angle at mouth of cavity at small end Runout of counterbore with

42、cavity at small end Thread damage Protective finish inadequate or defective Burr Foreign matter Metal defective thread with cavity at small end. cavity below internal thread external thread , min. MINOR 201. 202. 203 I 204, 205. 206. 207 e 208 6 209. 210. 211 I Pitch diameter of large external threa

43、d max. Pftch diameter of small external thread, max. Pitch diameter of internal thread, min. Diameter of small cavity below internal thread Length of large external thread Width across flange Length from small external thread to flange, max. Outside diameter of counterbore at small end Inside diamet

44、er of counterbore at small end Depth of counterbore at small end Surface finish improper 8 Gage Gage Gage Gage Gage Gage Gage Gage Gage Gage Gage Gage Gage Gage Gage Gage Gag e Visual Visual Visual Visua 1 Visual Gage Gage Gage Gage Gage Gage Gage Gage Gage Visual Provided by IHSNot for ResaleNo rep

45、roduction or networking permitted without license from IHS-,-,-MIL-C-50765 13 m 9979706 0330742 O m MIL-C-50765(MU) 4.3.2.5 Relay Assembly, Drawing B11738772, covering a detail of the applicable Cartridge I Delay Assembly Drawing. Categories Defects Method of Inspection CRITICAL 1. Charge missing MA

46、JOR Visual 101. Metal defective 102. Protective finish inadequate or defective Visual 103. Foreign matter Visual Visual MINOR 201. Outside diameter Gage 202, Charge height Gage 4.3.2.6 Body, Delay Assembly, Drawing D11738734, Dl1738736 or D11738738, ;. CRITICAL 1. improper assembly 2. 3. Metal defec

47、tive 4. 5. Delay charge missing. 6. Marking missing, incorrect, or illegible Flash hole missing or obstructed Protective finish inadequate or defective Visual Visual Visual Visual Visual Visual MAJOR 101. Foreign matter MINOR None defined. 4.3.2.7 Cartridge Delay As CRITICAL 1. Any part missing 2. I

48、mproper assembly 3. Metal Defective rmb ly , Drawi 4. Marking missing, incorrect or illegible Visua 1 g D11738733, 511738735, or D11738737 x by L/ Visual X Ray L/ Visual Visual Visual 9 . Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-4.3.2.7 (Contd

49、) Categories Defect Method of 1n.spection 101, Foreign matter 102. Total length (rnax) 103. Thread damaged 104. Primer crimp less than 360 Vi sua 1 Gage vi sual Visl-iil MINOR None defined - 1/ to the rays. The X-ray negatives, properly identified, shall be forwarded to the procuring activity. The cartridge shall be X-rayed with the sides of the housing perpendicular 4.3.2.