UNI 6418-1969 Hexagon nuts for nomenclature of railway and tramway rolling stock ISO metric coarse thread Finish a 《铁路车辆和有轨电车车辆制造用标准的高的，矮的六边形螺母 粗距ISO公制螺纹 A级 分类UNI 5588-65 5587-68和5.pdf

相关资源

JIS E4021-1994 铁路车辆.车内噪声的试验方法.pdf

JIS E4025-2009 铁路车辆.声学.轨道车辆发出的噪声测量.pdf

JIS E4031 2008 铁路车辆设备 冲击和振动试验.pdf

JIS E4504-2004 铁路车辆用轮副.质量要求.pdf

JIS E4603-2009 铁路车辆用电动式速度计装置铁道车辆－－速度计装置.pdf

JIS E5004-3-2008 铁路设施.铁路车辆用电子设备.第3部分.电工元件.直流断路器规则.pdf

JIS E5008-2009 铁路车辆.车辆上安装的电源变流器.pdf

JIS E5011-1-2009 铁路车辆.带交流发电机的电力转换器联合试验.第1部分：变换器系统.pdf

JIS E5011-2-2009 铁路车辆.带交流发电机的电力转换器联合试验.第2部分：带中间直流线路变流器-变换器系统.pdf

IEC 61133-2006 铁路设施 铁路车辆 车辆组装后和运行前的整车试验.pdf

猜你喜欢

CNS 6117-1988 Environmental Testing Methods and Endurance Testing Methods for Discrete Semiconductor Devices (Damp Heat Test)《单件半导体装置之环境检验法及耐久性检验法–耐湿性试验》.pdf

CNS 6118-1988 1《单件半导体装置之环境检验法及耐久性检验法–低温保存试验》.pdf

CNS 6119-1988 Environmental Testing Methods and Endurance Testing Methods for Discrete Semiconductor Devices (Continuous Operation Test of Rectifier Diodes)《单件半导体装置之环境检验法及耐久性检验法–整流二极管连续动作试验》.pdf

CNS 6120-1988 Environmental Testing Methods and Endurance Testing Methods for Discrete Semiconductor Devices(Continuous Operation Test of Thyristors)《单件半导体装置之环境检验法及耐久性检验法–闸流体之连续动作试验》.pdf

CNS 6121-1988 Environmental Testing Methods and Endurance Testing Methods for Discrete Semiconductor Devices(Continuous Applying Voltage Test of Rectifier Diodes)《单件半导体装置之环境检验法及耐久性.pdf

CNS 6122-1988 Environmental Testing Methods and Endurance Testing Methods for Discrete Semiconductor Devices(Continuous Applying Voltage Test of Thyristors)《单件半导体装置之环境检验法及耐久性检验法–闸流体之连续通电试验》.pdf

CNS 6123-1988 Environmental Testing Methods and Endurance Testing Methods for Discrete Semiconductor Devices (Intermittent Appling Voltage Test of Rectifier Diodes)《单件半导体装置之环境检验法及耐.pdf

CNS 6124-1988 Environmental Testing Methods and Endurance Testing Methods for Discrete Semiconductor Devices(Intermittent Applying Voltage Test of Thyristors)《单件半导体装置之环境检验法及耐久性检验法–.pdf

CNS 6125-1988 Environmental Testing Methods and Endurance Testing Methods for Discrete Semiconductor Devices(High Temperature for Applying Voltage Test of Rectifier Diodes)《单件半导体装置.pdf