IEC 62490-2-2010 ESL measuring method - Part 2 Surface mount capacitors for use in electronic equipment《ESL测量方法.第2部分 电子设备用表面安装电容器》.pdf

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1、 IEC 62490-2 Edition 1.0 2010-07 INTERNATIONAL STANDARD NORME INTERNATIONALE ESL measuring method Part 2: Surface mount capacitors for use in electronic equipment Mthode de mesure de lESL Partie 2: Condensateurs pour montage en surface utiliss dans les quipements lectroniques IEC 62490-2:2010 colour

2、 inside THIS PUBLICATION IS COPYRIGHT PROTECTED Copyright 2010 IEC, Geneva, Switzerland All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized in any form or by any means, electronic or mechanical, including photocopying and microfilm, without perm

3、ission in writing from either IEC or IECs member National Committee in the country of the requester. If you have any questions about IEC copyright or have an enquiry about obtaining additional rights to this publication, please contact the address below or your local IEC member National Committee fo

4、r further information. Droits de reproduction rservs. Sauf indication contraire, aucune partie de cette publication ne peut tre reproduite ni utilise sous quelque forme que ce soit et par aucun procd, lectronique ou mcanique, y compris la photocopie et les microfilms, sans laccord crit de la CEI ou

5、du Comit national de la CEI du pays du demandeur. Si vous avez des questions sur le copyright de la CEI ou si vous dsirez obtenir des droits supplmentaires sur cette publication, utilisez les coordonnes ci-aprs ou contactez le Comit national de la CEI de votre pays de rsidence. IEC Central Office 3,

6、 rue de Varemb CH-1211 Geneva 20 Switzerland Email: inmailiec.ch Web: www.iec.ch About the IEC The International Electrotechnical Commission (IEC) is the leading global organization that prepares and publishes International Standards for all electrical, electronic and related technologies. About IEC

7、 publications The technical content of IEC publications is kept under constant review by the IEC. Please make sure that you have the latest edition, a corrigenda or an amendment might have been published. Catalogue of IEC publications: www.iec.ch/searchpub The IEC on-line Catalogue enables you to se

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9、cations released. Available on-line and also by email. Electropedia: www.electropedia.org The worlds leading online dictionary of electronic and electrical terms containing more than 20 000 terms and definitions in English and French, with equivalent terms in additional languages. Also known as the

10、International Electrotechnical Vocabulary online. Customer Service Centre: www.iec.ch/webstore/custserv If you wish to give us your feedback on this publication or need further assistance, please visit the Customer Service Centre FAQ or contact us: Email: csciec.ch Tel.: +41 22 919 02 11 Fax: +41 22

11、 919 03 00 A propos de la CEI La Commission Electrotechnique Internationale (CEI) est la premire organisation mondiale qui labore et publie des normes internationales pour tout ce qui a trait llectricit, llectronique et aux technologies apparentes. A propos des publications CEI Le contenu technique

12、des publications de la CEI est constamment revu. Veuillez vous assurer que vous possdez ldition la plus rcente, un corrigendum ou amendement peut avoir t publi. Catalogue des publications de la CEI: www.iec.ch/searchpub/cur_fut-f.htm Le Catalogue en-ligne de la CEI vous permet deffectuer des recherc

13、hes en utilisant diffrents critres (numro de rfrence, texte, comit dtudes,). Il donne aussi des informations sur les projets et les publications retires ou remplaces. Just Published CEI: www.iec.ch/online_news/justpub Restez inform sur les nouvelles publications de la CEI. Just Published dtaille deu

14、x fois par mois les nouvelles publications parues. Disponible en-ligne et aussi par email. Electropedia: www.electropedia.org Le premier dictionnaire en ligne au monde de termes lectroniques et lectriques. Il contient plus de 20 000 termes et dfinitions en anglais et en franais, ainsi que les termes

15、 quivalents dans les langues additionnelles. Egalement appel Vocabulaire Electrotechnique International en ligne. Service Clients: www.iec.ch/webstore/custserv/custserv_entry-f.htm Si vous dsirez nous donner des commentaires sur cette publication ou si vous avez des questions, visitez le FAQ du Serv

16、ice clients ou contactez-nous: Email: csciec.ch Tl.: +41 22 919 02 11 Fax: +41 22 919 03 00 IEC 62490-2 Edition 1.0 2010-07 INTERNATIONAL STANDARD NORME INTERNATIONALE ESL measuring method Part 2: Surface mount capacitors for use in electronic equipment Mthode de mesure de lESL Partie 2: Condensateu

17、rs pour montage en surface utiliss dans les quipements lectroniques INTERNATIONAL ELECTROTECHNICAL COMMISSION COMMISSION ELECTROTECHNIQUE INTERNATIONALE N ICS 31.060.01 PRICE CODE CODE PRIX ISBN 978-2-88912-069-7 Registered trademark of the International Electrotechnical Commission Marque dpose de l

18、a Commission Electrotechnique Internationale colour inside 2 62490-2 IEC:2010 CONTENTS FOREWORD.3 1 Scope.5 2 Normative references .5 3 Terms and definitions .6 4 Test fixture and compensation chip 6 4.1 Test fixture6 4.2 The open, short, and load compensation chip9 4.2.1 The open compensation chip

19、.9 4.2.2 The load compensation chip 9 4.2.3 The short compensation chip.9 5 Measuring method10 5.1 Measuring equipment 10 5.2 Measurement conditions10 5.3 Measurement points 10 5.4 Frequency and signal level10 5.5 Measurement procedure11 5.5.1 General .11 5.5.2 Open compensation.11 5.5.3 Load compen

20、sation .11 5.5.4 Short compensation.12 5.5.5 ESL measurement .13 6 Items to be indicated in the test result report 13 Annex A (informative) Theoretical ESL value of the short compensation chip.14 Figure 1 Lead frame and thin coating types of surface mount capacitors and the specification of the dime

21、nsions (L, W, and H)5 Figure 2 Surface mount capacitors with face down terminal .5 Figure 3 Test fixture and terminals of test fixture .6 Figure 4 Connection diagram .7 Figure 5 Sectional view of the test fixture with an inserted surface mount capacitor pressured to the terminals of the test fixture

22、 .8 Figure 6 Example of surface mount capacitor mounted on terminals of test fixture.8 Figure 7 Front view of mounting position of objects on test fixture9 Figure 8 Measurement points.10 Figure 9 Open compensation-chip position.11 Figure 10 Load compensation-chip position .12 Figure 11 Short compens

23、ation-chip position.12 Figure A.1 Points of contact of the short compensation chip and terminals of test fixture .15 Table A.1 The calculation results of inductance of the short compensation chip.14 62490-2 IEC:2010 3 INTERNATIONAL ELECTROTECHNICAL COMMISSION _ ESL MEASURING METHOD Part 2: Surface m

24、ount capacitors for use in electronic equipment FOREWORD 1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising all national electrotechnical committees (IEC National Committees). The object of IEC is to promote international co-operation on

25、 all questions concerning standardization in the electrical and electronic fields. To this end and in addition to other activities, IEC publishes International Standards, Technical Specifications, Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC Pu

26、blication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested in the subject dealt with may participate in this preparatory work. International, governmental and non- governmental organizations liaising with the IEC also participate in this preparation

27、. IEC collaborates closely with the International Organization for Standardization (ISO) in accordance with conditions determined by agreement between the two organizations. 2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international consensus o

28、f opinion on the relevant subjects since each technical committee has representation from all interested IEC National Committees. 3) IEC Publications have the form of recommendations for international use and are accepted by IEC National Committees in that sense. While all reasonable efforts are mad

29、e to ensure that the technical content of IEC Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any misinterpretation by any end user. 4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications transpa

30、rently to the maximum extent possible in their national and regional publications. Any divergence between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in the latter. 5) IEC itself does not provide any attestation of conformity. Independent cer

31、tification bodies provide conformity assessment services and, in some areas, access to IEC marks of conformity. IEC is not responsible for any services carried out by independent certification bodies. 6) All users should ensure that they have the latest edition of this publication. 7) No liability s

32、hall attach to IEC or its directors, employees, servants or agents including individual experts and members of its technical committees and IEC National Committees for any personal injury, property damage or other damage of any nature whatsoever, whether direct or indirect, or for costs (including l

33、egal fees) and expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC Publications. 8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is indispensable for the correct application of this p

34、ublication. 9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of patent rights. IEC shall not be held responsible for identifying any or all such patent rights. International Standard IEC 62490-2 has been prepared by IEC technical committee

35、 40: Capacitors and resistors for electronic equipment. The text of this standard is based on the following documents: FDIS Report on voting 40/2045/FDIS 40/2057/RVD Full information on the voting for the approval of this standard can be found in the report on voting indicated in the above table. Th

36、is publication has been drafted in accordance with the ISO/IEC Directives, Part 2. 4 62490-2 IEC:2010 A list of all the parts in the IEC 62490 series, under the general title ESL measuring method, can be found on the IEC web site. The committee has decided that the contents of this publication will

37、remain unchanged until the stability date indicated on the IEC web site under “http:/webstore.iec.ch“ in the data related to the specific publication. At this date, the publication will be reconfirmed, withdrawn, replaced by a revised edition, or amended. IMPORTANT The colour inside logo on the cove

38、r page of this publication indicates that it contains colours which are considered to be useful for the correct understanding of its contents. Users should therefore print this document using a colour printer. 62490-2 IEC:2010 5 ESL MEASURING METHOD Part 2: Surface mount capacitors for use in electr

39、onic equipment 1 Scope This part of IEC 62490 provides the ESL measuring method for the surface mount capacitors for use in electronic equipment. W H L W L H IEC 1732/10 IEC 1731/10 Figure 1a Lead frame electrode terminal Figure 1b Thin coating electrode terminal Figure 1 Lead frame and thin coating

40、 types of surface mount capacitors and the specification of the dimensions (L, W, and H) The ESL measurement method can be applicable to the surface mount capacitors with the following properties, but not limited to these: a) capacitance range: 10 F to 1 000 F; b) size: L W = 3,2 mm 1,6 mm to 7,3 mm

41、 4,3 mm, H = 4,0 mm; c) ESL range: 5 nH or less. NOTE The surface mount capacitors in this document are limited to capacitors with lead frame or with thin coated terminals, see Figure 1. The scope of this document does not include capacitors with face down terminals, see Figure 2. 1 IEC 1733/10 Key

42、1 terminals (shaded section) Figure 2 Surface mount capacitors with face down terminal 2 Normative references The following referenced documents are indispensable for the application of this document. For dated references, only the edition cited applies. For undated references, the latest edition of

43、 the referenced document (including any amendments) applies. IEC 60384-1:2008, Fixed capacitors for use in electronic equipment Part 1: Generic specification 6 62490-2 IEC:2010 3 Terms and definitions For the purpose of this document, the terms and definitions given in IEC 60384-1 and the following

44、apply. 3.1 equivalent series inductance L ESL inductive part of the impedance of capacitors NOTE The unit of ESL is Henry (H). 4 Test fixture and compensation chip 4.1 Test fixture (Low ESL measuring equipment) Lc Lp Hp Hc Lc Lp Hc Hp Terminal of test fixture Capacitor to be measured Zoom 0,5 0,1 1,

45、0 0,1 IEC 1734/10 Dimensions in millimetres Figure 3a Top view of test fixture Figure 3b Enlarge view of the terminals of test fixture Figure 3 Test fixture and terminals of test fixture The test fixture shall have the following features. a) The test fixture has a 4-terminal structure. The capacitor

46、s can be mounted on the test fixture as shown in Figure 3. The terminals of the test fixture shall be connected to the low current terminal (Lc), the low voltage terminal (Lp), the high current terminal (Hc), and the high voltage terminal (Hp). 62490-2 IEC:2010 7 Hp Lp Hc Lc Lp Lc Hp Hc 1 2 4 3 7* 5

47、 6 3 IEC 1735/10 Key 1 one of fixture terminals (shaded section) 2 capacitor (dashed line) 3 capacitor terminal (dotted section) 4 fixture (within dashed-dotted line) * Connect sheaths of 4 coaxial cables to each other within very short distance of fixture terminals 5 coaxial cables (dotted section)

48、 6 ESL measuring equipment (thick line) 7 connect shielding wire (dotted line) Figure 4 Connection diagram b) Anchoring the capacitor with pressure terminals which make stable contact provides high repeatability and reproducibility (see Figure 5). 8 62490-2 IEC:2010 * * * 2 5 1 Pressure Pressure 3 4

49、 5 3 4 IEC 1736/10 Key 1 lid of test fixture for fixing capacitor (thick line) 2 capacitor (dashed line) 3 capacitor terminal (dotted section) * 0,5 mm 0,1 mm * See Figure 3. 4 terminals of test fixture (shaded section) 5 guides for capacitor (shaded section) Figure 5 Sectional view of the test fixture with an inserted surface mount capacitor pressur

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