1、 IEEE Standard for Software Interface for Maintenance Information Collection and Analysis (SIMICA): Exchanging Maintenance Action Information via the Extensible Markup Language (XML) Sponsored by the IEEE Standards Coordinating Committee 20 on Test and Diagnosis for Electronic Systems IEEE 3 Park Av
2、enue New York, NY 10016-5997 USA 1 February 2013 IEEE Standards Coordinating Committee 20IEEE Std 1636.2-2010IEEE Std 1636.2TM-2010 IEEE Standard for Software Interface for Maintenance Information Collection and Analysis (SIMICA): Exchanging Maintenance Action Information via the Extensible Markup L
3、anguage (XML) Sponsor IEEE Standards Coordinating Committee 20 on Test and Diagnosis for Electronic Systems Approved 30 September 2010 IEEE-SA Standards Board Approved as a Full-Use Standard 5 December 2012 IEEE-SA Standards Board Approved 6 June 2011 American National Standards Institue Abstract: I
4、nteroperability between components of automatic test systems (ATS) is promoted and facilitated. The standard facilitates the capture of maintenance action information (MAI) associated with the removal, repair, and replacement of a particular system component (e.g., unit(s) under test) in order to ma
5、intain/support that particular operational system. The MAI schema becomes a class of information that can be used within the SIMICA family of standards. The exchange format utilizes the XML formats. Keywords: automated test system (ATS), eXtensible markup language (XML), IEEE 1636.2, maintenance act
6、ion information (MAI), Software Interface for Maintenance Information Collection and Analysis (SIMICA), XML schema The Institute of Electrical and Electronics Engineers, Inc. 3 Park Avenue, New York, NY 10016-5997, USA Copyright 2013 by The Institute of Electrical and Electronics Engineers, Inc. All
7、 rights reserved. Published 1 February 2013. Printed in the United States of America. IEEE is a registered trademark in the U.S. Patent +1 978 750 8400. Permission to photocopy portions of any individual standard for educational classroom use can also be obtained through the Copyright Clearance Cent
8、er. iv Copyright 2013 IEEE. All rights reserved. Introduction This introduction is not part of IEEE Std 1636.2-2010, IEEE Standard for Software Interface for Maintenance Information Collection and Analysis (SIMICA): Exchanging Maintenance Action Information via the Extensible Markup Language (XML).
9、Maintainers of complex systems require the ability to capture and share the maintenance action information (MAI) in a way that supports such activities as performance analysis, post production product improvement, maintenance process improvement, and diagnostic maturation. Principal stakeholders of
10、this project include but are not limited to maintenance organizations within various departments/ministries of defense, the commercial airlines, the automotive industry, and the telecommunications industry. This standard is being developed as a component of the IEEE 1636 SIMICA project. SIMICAs purp
11、ose is to specify a software interface for access, exchange, and analysis of product diagnostic and maintenance information. MAI provides a subset of the data needed to satisfy SIMICIA requirements. The use of formal information models will facilitate exchanging historical maintenance information be
12、tween information systems and analysis tools. The models will facilitate creating open system software architectures for maturing system diagnostics. The XML schema described in this standard where appropriate utilizes and references components of the IEEE 1671 schema set. It is anticipated that the
13、se schemas will be used throughout industries that utilize diagnostic and maintenance data as an exchange format that can be understood by humans or machines. In order to ensure wide acceptance throughout the user community, the schemas have been designed to encompass a broad range of use cases. To
14、accommodate use cases beyond the released design, the schemas provide means for user extensibility. It is anticipated that the IEEE 1636.2 schema will be used throughout the automatic test equipment (ATE) industry as an exchange format that can be understood by humans or machines. In order to ensure
15、 wide acceptance throughout the user community, the schemas have been designed to encompass a broad range of use cases. Notice to users Laws and regulations Users of IEEE Standards documents should consult all applicable laws and regulations. Compliance with the provisions of any IEEE Standards docu
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22、d at the following URL: http:/standards.ieee.org/findstds/errata/index.html. Users are encouraged to check this URL for errata periodically. Patents Attention is called to the possibility that implementation of this standard may require use of subject matter covered by patent rights. By publication
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26、al validity or scope of Patents Claims, or determining whether any licensing terms or conditions provided in connection with submission of a Letter of Assurance, if any, or in any licensing agreements are reasonable or non-discriminatory. Users of this standard are expressly advised that determinati
27、on of the validity of any patent rights, and the risk of infringement of such rights, is entirely their own responsibility. Further information may be obtained from the IEEE Standards Association. vi Copyright 2013 IEEE. All rights reserved. Participants At the time this standard was submitted to th
28、e IEEE-SA Standards Board for approval, the Diagnostics and Maintenance Control (DMC) Working Group had the following membership: Mark Kaufman, Chair John Sheppard, Co-Chair Timothy Wilmering, Co-Chair Sherif Abdelwahed Tony Alwardt Keith Beard Michael Bodkin Malcolm Brown Darryl Busch James Darling
29、ton Timothy Davis Samuel Dreyer David Droste James Dumser Tamara Einspanjer Keith Ellis Oscar Fandino Ken Finklea Melissa Ford Ken Fox Robert Fox Brit Frank Thomas Gaudette Scott Gearhart William Gerstein Chris Gorringe Michelle Harris Alicia Helton Luis Hernandez Ashley Hulme Anand Jain Denton Jarv
30、is Patrick Kalgren Link Le Jay Lindsey Teresa Lopes David Mills Scott Misha Mukund Modi Ion Neag Steven ODonnell Leslie Orlidge Duy-Huan Pham Hugh Pritchett John Ralph Narayanan Ramachandran Peter Richardson David Rohacek William Ross Mike Seavey Mark Skiba Joseph StancoIn addition, acknowledgement
31、is made of the valuable contributions made by the following: Kevin Masur Melissa Romanus The following members of the individual balloting committee voted on this standard. Balloters may have voted for approval, disapproval, or abstention. Anthony Lee Alwardt Ali Al Awazi Keith Chow Tommy Cooper Dav
32、id Droste James Dumser William Frank Chris Gorringe Randall Groves Werner Hoelzl Ashley Hulme Anand Jain Lars Juhlin Piotr Karocki Mark Kaufman Teresa Lopes Robert McGarvey Scott Misha Mukund Modi Ion Neag Charles Ngethe Leslie Orlidge Ulrich Pohl John Ralph David Rohacek Edward Rowe Bartien Sayogo
33、Mike Seavey John Sheppard Gil Shultz Joseph Stanco Walter Struppler Thomas Tullia Timothy Wilmering Oren Yuen vi Copyright 2013 IEEE. All rights reserved. When the IEEE-SA Standards Board approved this standard on 30 September 2010, it had the following membership: Robert M. Grow, Chair Richard H. H
34、ulett, Vice Chair Steve M. Mills, Past Chair Judith Gorman, Secretary Karen Bartleson Victor Berman Ted Burse Clint Chaplin Andy Drozd Alexander Gelman Jim Hughes Young Kyun Kim Joseph L. Koepfinger* John Kulick David J. Law Hung Ling Oleg Logvinov Ted Olsen Ronald C. Petersen Thomas Prevost Jon Wal
35、ter Rosdahl Sam Sciacca Mike Seavey Curtis Siller Don Wright *Member Emeritus Also included are the following nonvoting IEEE-SA Standards Board liaisons: Satish K. Aggarwal, NRC Representative Richard DeBlasio, DOE Representative Michael Janezic, NIST Representative Lisa Perry IEEE Standards Program
36、 Manager, Document Development Soo H. Kim IEEE Standards Program Manager, Technical Program Development vii Copyright 2013 IEEE. All rights reserved. Contents 1. Overview 1 1.1 Scope . 1 1.2 Purpose 1 1.3 General 2 1.4 Application 2 1.5 Conventions used in this standard . 2 2. Normative references 3
37、 3. Definitions, acronyms, and abbreviations 4 3.1 Definitions . 4 3.2 Acronyms and abbreviations . 4 4. Maintenance action information schema 5 4.1 General 5 4.2 Elements 5 4.3 Complex types . 11 5. Conformance 16 6. Extensibility 16 Annex A (normative) Maintenance action information model . 17 A.1
38、 AssociatedTestEvent . 17 A.2 Code 18 A.3 FailureCode 18 A.4 Observation . 18 A.5 ParameterValue . 18 A.6 Qualifier 18 A.7 RelativeSkill . 19 A.8 SequenceCode. 19 A.9 Category 19 A.10 MaintenanceActionValue . 20 A.11 MaintenanceType . 20 A.12 EquipmentDescription 20 A.13 Equipment . 20 A.14 InstallA
39、ction . 21 A.15 Maintainer . 21 A.16 MaintenanceAction . 22 A.17 MaintenanceActionInformation 23 A.18 MaintenanceActionStatus . 24 A.19 MaintenanceDelay 24 A.20 MaintenanceEvent 25 A.21 NoAction 26 A.22 Parameter 26 A.23 Reason 27 A.24 RemoveAction 28 A.25 RepairAction . 28 A.26 Resource . 28 A.27 T
40、estResult . 29 A.28 MAI model EXPRESS-G diagrams 30 viii Copyright 2013 IEEE. All rights reserved. Annex B (normative) SimicaCommon XML schema 34 B.1 SchemaSimicaCommon.xsd . 34 Annex C (normative) SIMICA common information model . 43 C.1 Abbreviation . 43 C.2 AddressComponent . 43 C.3 Date . 43 C.4
41、 DateTime 44 C.5 DescriptionType 44 C.6 Duration 44 C.7 EmailAddress 44 C.8 Exclusion 45 C.9 Identifier 45 C.10 IdentifierType . 45 C.11 NameType . 45 C.12 SequenceCode . 45 C.13 PhoneNumber . 46 C.14 URL 46 C.15 Uuid 46 C.16 Version 46 C.17 DescriptionOrReference 46 C.18 Contact 47 C.19 DiagnosticC
42、ontextModel 47 C.20 Document 48 C.21 HardwareInstance . 48 C.22 IdentificationNumber 49 C.23 ItemDescription . 49 C.24 MailingAddress . 49 C.25 MaintenanceLevel . 50 C.26 ManufacturerIdNumber 51 C.27 Organization 51 C.28 Person 52 C.29 PowerOn . 52 C.30 QualifiedIdNumber . 52 C.31 SoftwareInstance .
43、 53 C.32 SystemInstance . 53 C.33 TestResultsAndSessionInformation 55 C.34 Warranty . 55 C.35 WorkOrder 56 C.36 SIMICA COMMON Model EXPRESS-G diagrams 57 Annex D (informative) Maintenance Action Information instance documents (.XML files) and user examples . 61 D.1 Maintenance Action Information ins
44、tance documents (.XML files) 61 D.2 User examples . 62 Annex E (informative) Bibliography 66 IEEE Std 1636.2-2010 IEEE Standard for Software Interface for Maintenance Information Collection and Analysis (SIMICA): Exchanging Maintenance Action Information via the Extensible Markup Language (XML) 1 Co
45、pyright 2013 IEEE. All rights reserved. IEEE Standard for Software Interface for Maintenance Information Collection and Analysis (SIMICA): Exchanging Maintenance Action Information via the Extensible Markup Language (XML) IMPORTANT NOTICE: IEEE Standards documents are not intended to ensure safety,
46、health, or environmental protection, or ensure against interference with or from other devices or networks. Implementers of IEEE Standards documents are responsible for determining and complying with all appropriate safety, security, environmental, health, and interference protection practices and a
47、ll applicable laws and regulations. This IEEE document is made available for use subject to important notices and legal disclaimers. These notices and disclaimers appear in all publications containing this document and may be found under the heading “Important Notice” or “Important Notices and Discl
48、aimers Concerning IEEE Documents.” They can also be obtained on request from IEEE or viewed at http:/standards.ieee.org/IPR/disclaimers.html. 1. Overview 1.1 Scope The scope of this standard is the definition of an exchange format, utilizing XML, for exchanging maintenance action information (MAI) a
49、ssociated with the removal, repair, and replacement of system components to maintain/support an operational system. 1.2 Purpose The purpose of this standard is to promote and facilitate interoperability between components of a test system and applications in a maintenance environment where MAI needs to be shared. The standard will facilitate the capture and exchange of unit under test (UUT) specific maintenance information, facilitating online and offline analysis of the maintenance process. The maintenance action schema defines a class of information to be used wit