1、IEEE Std C62.45-2002(Revision of IEEE Std C62.45-1992)IEEE StandardsC62.45TMIEEE Recommended Practice on SurgeTesting for Equipment Connected toLow-Voltage (1000 V and Less) ACPower CircuitsPublished by The Institute of Electrical and Electronics Engineers, Inc.3 Park Avenue, New York, NY 10016-5997
2、, USA11 April 2003IEEE Power Engineering SocietySponsored by theSurge Protective Devices CommitteeIEEE StandardsPrint: SH95060PDF: SS95060Recognized as anAmerican National Standard (ANSI)IEEE Std C62.45-2002 (R2008)(Revision ofIEEE Std C62.45-1992)IEEE Recommended Practice on Surge Testing for Equip
3、ment Connected to Low-Voltage (1000 V and Less) ACPower CircuitsSponsorSurge Protective Devices Committeeof thePower Engineering SocietyApproved 10 March 2003American National Standards InstituteReaffirmed 10 December 2008Approved 11 November 2002IEEE-SA Standards BoardIEEE thanks the International
4、Electrotechnical Commission (IEC) for permission to reproduce informationfrom its International Standard, IEC 61000-4-4 (1995)Figure 18 and Figure 19. All such excerpts arecopyright of IEC, Geneva, Switzerland. All rights reserved. Further information on the IEC is available fromhttp:/www.iec.ch. IE
5、C has no responsibility for the placement and context in which the excerpts andcontents are reproduced by IEEE; nor is IEC in any way responsible for the other content or accuracytherein. Abstract: The scope of this recommended practice is the performance of surge testing on electricaland electronic
6、 equipment connected to low-voltage ac power circuits, specifically using therecommended test waveforms defined in IEEE Std C62.41.2-2002. Nevertheless, theserecommendations are applicable to any surge testing, regardless of the specific surges that may beapplied.Keywords: low-voltage ac power circu
7、it, surge testing, surge withstand levelThe Institute of Electrical and Electronics Engineers, Inc.3 Park Avenue, New York, NY 10016-5997, USACopyright 2003 by the Institute of Electrical and Electronics Engineers, Inc.All rights reserved. Published 11 April 2003. Printed in the United States of Ame
8、rica.National Electrical Code and NECare both registered trademarks owned by the National Fire Protection Association, Inc.Print: ISBN 0-7381-3485-6 SH95060PDF: ISBN 0-7381-3486-4 SS95060No part of this publication may be reproduced in any form, in an electronic retrieval system or otherwise, withou
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25、andard or for conducting inquiries into the legal validity orscope of those patents that are brought to its attention.ivCopyright 2003 IEEE. All rights reserved.Introduction(This introduction is not part of IEEE Std C62.45-2002, IEEE Recommended Practice on Surge Testing for EquipmentConnected to Lo
26、w-Voltage (1000 V and Less) AC Power Circuits.)This recommended practice is the result of ten years of use as a guide, and it incorporates only minoradditions or updates of the original 1987 document, which was revised in 1992. These earlier versions werepublished independently, and not concurrently
27、 with their intended companion, IEEE Std C62.41-1991, withthe result that a “catch-up” situation was created as each document was separately updated.With the approval of the Surge-Protective Devices Committee, the companion IEEE Std C62.41-1991 wassplit into two separate documents, IEEE Std C62.41.1
28、-2002 and IEEE Std C62.41.2-2002. Together with thepresent recommended practice, the two IEEE Std C62.41.1-2002 and IEEE Std C62.41.2-2002 present a“Trilogy” concerning the occurrence, characterization, and testing of surges in low-voltage ac powercircuits, to be published concurrently and thus avoi
29、d the previous ambiguities of the catch-up updates.ParticipantsAt the time this recommended practice was completed, the Working Group on Surge Characterization onLow-Voltage Circuits had the following membership:Hans Steinhoff, ChairJames Funke, Co-ChairRaymond Hill, SecretaryFranois D. Martzloff, T
30、echnical EditorOther individuals who contributed review and comments in developing this recommended practice are:CAUTIONSurge testing of electrical equipment presents potentially hazardous situations forboth personnel and equipment. Safety directives promulgated by the laboratorywhere testing takes
31、place must be observed. Additional precautions are suggestedin 4.8 and 6.4.Rickard BentingerWilliam Bush Ernie Gallo Andrea Turner Haa Jim Harrison Michael Hopkins Deborah Jennings-ConnerPhilip JonesWilhem H. Kapp Joseph L. Koepfinger Richard OdenbergAlan W. RebeckMichael StringfellowMatt WakehamS.
32、Frank Waterer Don WordenP. P. BarkerT. R. ConradC. DhoogeD. Dorr H. E. FoelkerW. GrafG. L. GoeddeP. Hasse T. S. KeyG. KohnJ. Levine A. Mansoor D. MessinaJ. E. NaneviczR. W. NorthropK. O. PhippsV. A. Rakov A. RousseauE. F. VanceS. Van VreedeS. G. Whisenant W. J. ZischankCopyright 2003 IEEE. All right
33、s reserved. vThe following members of the balloting committee voted on this standard. Balloters may have voted forapproval, disapproval, or abstention. At the time this document went to ballot, the Accredited Standards Committee on Surge Arresters, C62, hadthe following membership:Joseph L. Koepfing
34、er, ChairS. Choinski, SecretaryVacant, NEMA Co-SecretaryNaeem Ahmad, IEEE Co-SecretaryOrganization Represented Name of RepresentativeElectric Light the complexities of the real world need to be simplified to produce a manageable set ofstandard surge tests. To this end, a surge environment classifica
35、tion scheme is presented inIEEE Std C62.41.2-2002. This classification provides a practical basis for the selection of waveforms andamplitudes for surge-voltages and surge-currents that may be applied to evaluate the surge withstand level2capability of equipment connected to these power circuits. It
36、 is important to recognize that proper coordinationof equipment capability and environment characteristics is required: each environment and the equipment tobe protected have to be characterized and the two have to be reconciled.2See Annex B for complementary notes on items appearing in bold italics
37、 in the text.Figure 1Guiding considerations for surge testingIEEE Std C62.41.2-2002IEC 61000-4-xx series*Or other*See Annex D for bibliographic citations of several IEC standards on test methods.IEEEEQUIPMENT CONNECTED TO LOW-VOLTAGE (1000 V AND LESS) AC POWER CIRCUITS Std C62.45-2002Copyright 2003
38、IEEE. All rights reserved. 3Regardless of the particular surge specification, equipment connected to the power system have to be capableof satisfactory operation, or at least survival, under these surge voltages or surge currents, with or withoutadditional protection as the case may be. The assignme
39、nt of withstand level remains the prerogative andresponsibility of the users of this document. Surge testing is therefore required to demonstrate this capability.To illustrate the process of surge testing procedures, Figure 1 shows a flow diagram of the guidingconsiderations that are essential to ob
40、taining reliable test results while enhancing operator safety.Note that the assignment of withstand levels for equipment is not included in the scope of this recommendedpractice. Surge testing on signal or data interfaces is also not included in the scope of this recommendedpractice, but should not
41、be overlooked in the complete evaluation of specific equipment.2. ReferencesIn this document, two types of “references” are used: those that are directly related to the subject beingdiscussed and often necessary to consult when using this guidetrue referencesand those that providesupporting informat
42、ion to the subject being discussedbibliographic citations. For the convenience of thereader in not breaking the pace of reading to look up the citation, yet have some indication on what matter isbeing referenced, “references” and “citations” are briefly identified in the text as described below.The
43、first type, references, contains information that is implicitly adopted in the present document. Completeimplementation of any recommendations or validation of a statement made in this recommended practicewould require the reader to consult that reference for the details of the subject. This first t
44、ype is introduced inthe text as (Document identity), and the listing is provided below, in this clause.The second type, bibliographic citations, is not essential to implementation of a recommendation orcomprehensive validation, but it is provided for the use of readers seeking more detailed informat
45、ion orjustification. This second type is introduced in the text as (Author, date B#), and the listing is provided inAnnexD.This recommended practice shall be used in conjunction with the following publications. If the followingpublications are superseded by an approved revision, the revisions shall
46、apply.IEC 60060-2 (1994), High voltage test technologiesPart 2: Measuring systems.3IEEE Std 4-1995, Standard Techniques for High Voltage Testing.4, 5IEEE Std C62.41.1-2002, IEEE Guide on the Surge Environment in Low-Voltage (1000 V and Less) ACPower Circuits.IEEE Std C62.41.2-2002, IEEE Recommended
47、Practice on Characterization of Surges in Low-Voltage(1000 V and Less) AC Power Circuits.NFPA 70-1999, National Electrical Code.6UL Std 1449, Standard for SafetyTransient Voltage Surge Suppressors, Second Edition, 1996.73IEC publications are available from the Sales Department of the International E
48、lectrotechnical Commission, Case Postale 131, 3, ruede Varemb, CH-1211, Genve 20, Switzerland/Suisse (http:/www.iec.ch/). IEC publications are also available in the United Statesfrom the Sales Department, American National Standards Institute, 11 West 42nd Street, 13th Floor, New York, NY 10036, USA
49、.4The IEEE standards or products referred to in Clause 2 are trademarks owned by the Institute of Electrical and Electronics Engineers,Incorporated.5IEEE publications are available from the Institute of Electrical and Electronics Engineers, 445 Hoes Lane, P.O. Box 1331, Piscataway,NJ 08855-1331, USA (http:/standards.ieee.org/).6NFPA publications are published by the National Fire Protection Association, Batterymarch Park, Quincy, MA 02269, USA(http:/www.nfpa.org/).IEEEStd C62.45-2002 IEEE RECOMMENDED PRACTICE ON SURGE TESTING FOR4 Copyright 2003 IEEE. All
