ANSI IEEE C63 12-2015 Recommended Practice for Electromagnetic Compatibility Limits and Test Levels.pdf

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1、 American National Standard Recommended Practice for Electromagnetic Compatibility Limits and Test Levels Accredited by the American National Standards Institute IEEE 3 Park Avenue New York, NY 10016-5997 USA Accredited Standards Committee C63Electromagnetic Compatibility ANSI C63.12-2015C63ANSI C63

2、.12-2015 (Revision of ANSI C63.12-1999) American National Standard Recommended Practice for Electromagnetic Compatibility Limits and Test Levels Accredited Standards Committee C63Electromagnetic Compatibility accredited by the American National Standards Institute Secretariat Institute of Electrical

3、 and Electronics Engineers, Inc. Approved 18 June 2015 American National Standards Institute Abstract: A rationale and recommendations for developing emission limits and immunity test levels are presented in this recommended practice. These limits and levels are representative of current practice an

4、d user needs. Emission limits are specified by national and international standards bodies. Emission limits for the most part are regulated and hence controlled, which is the case in the U.S. and Canada. Such regulatory limits take precedence, even if the limits are different from those considered i

5、n this document. For product immunity, while in some parts of the world this is regulated, for the U.S. and Canada, it is not regulated except for some types of safety equipment. In this way, adequate immunity is more a quality aspect of the product because it does not operate in its intended RF env

6、ironment, the user would deem it of poor design and quality. The immunity test levels described in this document are representative of common levels applied internationally. However, severe environments (in which levels of electromagnetic disturbance are high) require the consideration of applying h

7、igher test levels. This consideration is described in this recommended practice. Finally, it should be noted that the entire recommended practice does not contain normative requirements, as such practices remain optional. Keywords: ambient noise levels, ANSI C63.12, atmospheric noise, electromagneti

8、c compatibility (EMC), emissions, galactic noise, immunity, limits, man-made noise, test levels American National Standard The Institute of Electrical and Electronics Engineers, Inc. 3 Park Avenue, New York, NY 10016-5997, USA Copyright 2016 by The Institute of Electrical and Electronics Engineers,

9、Inc. All rights reserved. Published 29 January 2016. Printed in the United States of America. IEEE is a registered trademark in the U.S. Patent (978) 750-8400. Permission to photocopy portions of any individual standard for educational classroom use can also be obtained through the Copyright Clearan

10、ce Center. Errata Users are encouraged to check the IEEE Errata URL (http:/standards.ieee.org/findstds/errata/index.html), and the one for ASC C63at (http:/www.c63.org/explanations_interpretations_request.htm, for errata periodically. Interpretations (ASC C63standards) Current interpretations are es

11、sential to the understanding of all ASC C63standards. To assist in the meanings of requirements, informative interpretations are available at the following URL: (http:/www.c63.org/standards_development.htm). Users are cautioned that, although interpretations do not and cannot change the requirements

12、 of a standard, they serve to clarify the meanings of requirements. All interpretations are informative rather than normative, until such time as the standard is revised (consistent with ASC C63ANSI-accredited operating procedures) to incorporate the interpretation as a normative requirement. iv Cop

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36、nt of licensing fees, please contact Copyright Clearance Center, Customer Service, 222 Rosewood Drive, Danvers, MA 01923 USA; +1 978 750 8400. Permission to photocopy portions of any individual standard for educational classroom use can also be obtained through the Copyright Clearance Center. vi Cop

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39、 a revision process, it is reasonable to conclude that its contents, although still of some value, do not wholly reflect the present state of the art. Users are cautioned to check to determine that they have the latest edition of any IEEE standard. In order to determine whether a given document is t

40、he current edition and whether it has been amended through the issuance of amendments, corrigenda, or errata, visit the IEEE-SA Website at http:/ieeexplore.ieee.org/xpl/standards.jsp or contact IEEE at the address listed previously. For more information about the IEEE SA or IEEEs standards developme

41、nt process, visit the IEEE-SA Website at http:/standards.ieee.org. Errata Errata, if any, for all IEEE standards can be accessed on the IEEE-SA Website at the following URL: http:/standards.ieee.org/findstds/errata/index.html. Users are encouraged to check this URL for errata periodically. Patents A

42、ttention is called to the possibility that implementation of this standard may require use of subject matter covered by patent rights. By publication of this standard, no position is taken by the IEEE with respect to the existence or validity of any patent rights in connection therewith. If a patent

43、 holder or patent applicant has filed a statement of assurance via an Accepted Letter of Assurance, then the statement is listed on the IEEE-SA Website at http:/standards.ieee.org/about/sasb/patcom/patents.html. Letters of Assurance may indicate whether the Submitter is willing or unwilling to grant

44、 licenses under patent rights without compensation or under reasonable rates, with reasonable terms and conditions that are demonstrably free of any unfair discrimination to applicants desiring to obtain such licenses. Essential Patent Claims may exist for which a Letter of Assurance has not been re

45、ceived. The IEEE is not responsible for identifying Essential Patent Claims for which a license may be required, for conducting inquiries into the legal validity or scope of Patents Claims, or determining whether any licensing terms or conditions provided in connection with submission of a Letter of

46、 Assurance, if any, or in any licensing agreements are reasonable or non-discriminatory. Users of this standard are expressly advised that determination of the validity of any patent rights, and the risk of infringement of such rights, is entirely their own responsibility. Further information may be

47、 obtained from the IEEE Standards Association. vii Copyright 2016 IEEE. All rights reserved. Participants At the time this recommended practice was published, Accredited Standards Committee C63Electromagnetic Compatibility had the following membership: Daniel Hoolihan, Chair Dan Sigouin, Vice Chair

48、Jerry Ramie, Secretary Sue Vogel, Secretariat Organization Represented Name of Representative AlcatelLucent Dheena Moongilan American Council of Independent Laboratories (ACIL) . Harry H. Hodes John Repella (Alt.) American Radio Relay League (ARRL) Edward F. Hare .Kermit Carlson (Alt.) Apple, Inc. .

49、 Manjit Walia Indrandil Sen (Alt.) Blackberry Corporation . Masud Attayi Daoud Attayi (Alt.) Bureau Veritas . Jonathan Stewart Cisco Systems Andy Griffin Dave Case (Alt.) Dell Inc. . Richard Worley ETS-Lindgren Zhong Chen . Michael Foegelle (Alt.) Federal Communications Commission (FCC) . William Hurst Steve Jones (Alt.) Food and Drug Administration (FDA) . Jeffrey L. Silberberg . Donald M. Witters (Alt.) Industry Canada .Jason Nixon . Horia Popovici (Alt.) Information Technology Industry Council (ITIC) John Hirvela Joshua Rosenberg (Alt.) IEEE-Electromagnetic Co

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