IEEE SI 10-2016 en American National Standard for Metric Practice《公制实施规程的美国国家标准》.pdf

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1、American National Standard for Metric Practice Co-Sponsors ASTM Committee E43 on SI Practice and IEEE Standards Coordinating Committee 14 (Quantities, Units, and Letter Symbols) IEEE 3 Park Avenue New York, NY 10016-5997 USA IEEE/ASTM SI 10-2016 (Revision of IEEE/ASTM SI 10-2010) IEEE/ASTM SI 10-201

2、6 (Revision of IEEE/ASTM SI 10-2010)American National Standard for Metric Practice Co-Sponsors ASTM Committee E43 on SI Practice and IEEE Standards Coordinating Committee 14 (Quantities, Units, and Letter Symbols) Approved 22 September 2016 IEEE-SA Standards BoardApproved 1 July 2016ASTM Internation

3、al Abstract: Guidance for the use of the modern metric system is given. Known as the International System of Units (abbreviated SI), the system is the basis for worldwide standardization of measurement units. Information is included on SI, a list of units recognized for use with SI, and a list of co

4、nversion factors, together with general guidance on proper style and usage. Keywords: conversion factors, International System, International System of Units, metric practice, metric system, rounding, SI, SI 10, Systme International dUnits The Institute of Electrical and Electronics Engineers, Inc.

5、3 Park Avenue, New York, NY 10016-5997, USA ASTM International100 Barr Harbor Drive, P.O. Box C700, West Conshohocken, PA 19428-2959, USA Copyright 2016 by The Institute of Electrical and Electronics Engineers, Inc. and ASTM International. All rights reserved. Published 10 March 2017. Printed in the

6、 United States of America. IEEE is a registered trademark in the U.S. Patent fitness for a particular purpose; non-infringement; and quality, accuracy, effectiveness, currency, or completeness of material. In addition, IEEE disclaims any and all conditions relating to: results; and workmanlike effor

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29、x.html. Users are encouraged to check this URL for errata periodically. Patents Attention is called to the possibility that implementation of this standard may require use of subject matter covered by patent rights. By publication of this standard, no position is taken by the IEEE with respect to th

30、e existence or validity of any patent rights in connection therewith. If a patent holder or patent applicant has filed a statement of assurance via an Accepted Letter of Assurance, then the statement is listed on the IEEE-SA Website at http:/standards.ieee.org/about/sasb/patcom/patents.html. Letters

31、 of Assurance may indicate whether the Submitter is willing or unwilling to grant licenses under patent rights without compensation or under reasonable rates, with reasonable terms and conditions that are demonstrably free of any unfair discrimination to applicants desiring to obtain such licenses.

32、Essential Patent Claims may exist for which a Letter of Assurance has not been received. The IEEE is not responsible for identifying Essential Patent Claims for which a license may be required, for conducting inquiries into the legal validity or scope of Patents Claims, or determining whether any li

33、censing terms or conditions provided in connection with submission of a Letter of Assurance, if any, or in any licensing agreements are reasonable or non-discriminatory. Users of this standard are expressly advised that determination of the validity of any patent rights, and the risk of infringement

34、 of such rights, is entirely their own responsibility. Further information may be obtained from the IEEE Standards Association. Participants This standard was developed by the IEEE/ASTM Committee for Maintaining IEEE/ASTM SI 10, a joint committee established by the sponsoring organizations. The prop

35、osed standard generated by this joint committee was then formally adopted by the IEEE and ASTM before transmission to the American National Standards Institute for approval as an American National Standard. At the time of the approval of this revision, the joint committee had the following membershi

36、p. Nonvoting members at the time of publication are marked with an asterisk (*): Bruce Barrow, Chair James R. Frysinger, Vice Chair Robert H. Bushnell, Secretary Nancy Bale Dennis Brownridge* Rodney Conn* Anthony French Uri Gat Stan Jakuba Bill Potts Howard Ressel* John T. Scott Ralph Showers* Barry

37、 N. Taylor* Ambler Thompson Paul Trusten* Gerry Uttrachi* Matthew Zotter* At the time this IEEE standard was completed, the joint committee had the following membership. Nonvoting members at the time of publication are marked with an asterisk (*): Rodney Conn, Chair Terry Bates, Vice Chair James R.

38、Frysinger, Secretary Gordon Aubrecht Bruce Barrow Lyle Bowman Robert Bushnell Mike Crewdson* Don Hillger Stanislav Jakuba John Nichols Jim Paschal* Richard Peppin* Howard Ressel* Terry Scott* Tom Walsh* The following members of the individual balloting committee voted on this standard. Balloters may

39、 have voted for approval, disapproval, or abstention. Samuel Aguirre Robert Aiello Mihaela Albu Dwight Alexander Saleman Alibhay Roberto Asano Curtis Ashton Gordon Aubrecht Robert Ballard Peter Balma Bakul Banerjee Cleon Barker Thomas Barnes Bruce Barrow Frank Basciano Earle Bascom III Ronald Bennel

40、l Jean-Marc Biasse Thomas Bishop Thomas Blackburn William Bloethe Anne Bosma Kenneth Bow Harvey Bowles Riccardo Brama Daniel Brosnan Gustavo Brunello Paul Cardinal Yesenia Cevallos Michael Champagne Suresh Channarasappa Arvind Chaudhary Donald Cherry Keith Chow C. Clair Claiborne Larry Conrad Stephe

41、n Conrad Charles Cotton Geoffrey Darnton Matthew Davis Ronald Dean Davide de Luca Gary Donner Michael Dood Neal Dowling Edgar Dullni Robert Durham Sourav Dutta Douglas J. Edwards Heiko Ehrenberg Richard Ellis Hossam Fahmy Keith Flowers Joseph Foldi Gary Fox Avraham Freedman Nancy Frost James Frysing

42、er David Fuschi Shawn Galbraith Michael Garrels George Gela John Geldman Copyright 2016 IEEE/ASTM. All rights reserved. 7 Frank Gerleve Gregg Giesler James Gilb Jalal Gohari Edwin Goodwin Chris Gorringe David Gregson J Travis Griffith Randall Groves Michael Gundlach Bal Gupta Ajit Gwal Donald Hall J

43、. Harlow Daryl Harmon Lee Herron Guido Hiertz Lauri Hiivala Werner Hoelzl Ronald Hotchkiss Richard Hulett Noriyuki Ikeuchi Magdi Ishac Atsushi Ito Richard Jackson Vincent Jones Adri Jovin Laszlo Kadar Shinkyo Kaku Innocent Kamwa Efthymios Karabetsos Piotr Karocki John Kay Stuart Kerry Vladimir Khali

44、n Yuri Khersonsky Jean-Francois Kieffer Hermann Koch Richard Kolich Lawrence Kotewa Jim Kulchisky Saumen Kundu Thomas Kurihara Chung-Yiu Lam David Leciston Wei-Jen Lee Yeou Song Lee John Lemon Arthur H Light Paul Lindemulder O. Malik Jouni Malinen Roger Marks Jorge Marquez Lee Matthews Edward McCall

45、 Thomas McCarthy Peter Megna Joseph Melanson John Merando John Miller Daniel Mulkey Ryan Musgrove K. R. M. Nair Marie Nemier Gary Nissen Tim Olson Lorraine Padden Richard Paes Luke Parthemore Bansi Patel Mark Paulk Ronald Petersen Branimir Petosic Christopher Petrola Ghery Pettit David R. Phelps Per

46、cy Pool Alvaro Portillo Iulian Profir John Rama R. K. Rannow Sergio Rapuano Carl Reigart Annette Reilly Maximilian Riegel Michael Roberts Timothy Robirds Charles Rogers Ervin Root Terence Rout Thomas Rozek Daniel Sabin Bartien Sayogo Janek Schumann Mike Seavey Robert Seitz Mark Siira Carl Singer Jef

47、frey Sisson Jeremy Smith Jerry Smith Gary Smullin Ronald Stahara Joseph Stanco Thomas Starai Donald Steigerwalt John Stevens Brian Story Walter Struppler K. Stump Mark Sturza Marcy Stutzman Peter Sutherland David Tepen Phyllis Thomas Geoffrey Thompson Wayne Timm James Tomaseski Remi Tremblay Richard

48、 Tressler Thomas Tullia Joe Uchiyama James Van De Ligt John Vergis Matthew Wakeham David Walker Daniel Ward Joe Watson John Webb Hung-Yu Wei Kenneth White Alan Wilks Jan Wittenber Terry Woodyard Forrest Wright Guangning Wu Richard Young Jian Yu Oren Yuen 8 Copyright 2016 IEEE/ASTM. All rights reserv

49、ed. When the IEEE-SA Standards Board approved this on 22 September 2016, it had the following membership: John D. Kulick, Chair Jon Walter Rosdahl, Vice Chair Richard H. Hulett, Past Chair Konstantinos Karachalios, Secretary Masayuki Ariyoshi Ted Burse Stephen Dukes Jean-Philippe Faure J. Travis Griffith Gary Hoffman Michael Janezic Joseph L. Koepfinger* David J. Law Hung Ling Andrew Myles T. W. Olsen Glenn Parsons Ronald C. Petersen Annette D. Reilly Stephen J. Shellhammer Adrian P. Stephens Yatin Trivedi Philip Winston Don Wright Yu Yuan Daidi Zhong *Member Emeritus 9 Copyri

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