YD T 3037.1-2023 通用集成电路卡（UICC）与终端间大容量存储接口特性测试方法 第1部分：终端.pdf

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YD T 3037.2-2023 通用集成电路卡（UICC）与终端间大容量存储接口特性测试方法 第2部分：UICC.pdf

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