1、TINEIA STANDARD ANSI/TIA/EIA-455-69A-1991 Approved: July 2, 1991 Reaffirmed: September 14, 2000 FOTP-69 Test Procedure for Evaluating the Effect of Minimum and Maximum Exposure Temperatures on the Optical Performance of Optical Fibers TINEIA-455-69A (Revision of EIA-455-69) NOVEMBER 1991 TELECOMMUNI
2、CATIONS INDUSTRY ASSOCIATION Repmeiiing ibe tekcommuoiutionr induan 18 associauon wiih the Elecironic lndurtner 4Uiancr Elactronie industria Aiiialrcc Copyright Electronic Industries Alliance Provided by IHS under license with EIANot for ResaleNo reproduction or networking permitted without license
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7、 the responsibility of the user of this Standard to establish appropriate safety and health practices and to determine the applicability of regulatory limitations before its use. (From Standards Proposal No. 2418-RF1, formulated under the cognizance of the TIA FO-6.6 Subcommittee on Fibers and Mater
8、ials.) This Document was reaffirmed by the American National Standards Institute (ANSI) on September 14,2000, and by the TIA. Published by TELECOMMUNICATIONS INDUSTRY ASSOCIATION 1991 Standards and Technology Department 2500 Wilson Boulevard Arlington, VA 2220 1 PRICE: Please refer to current Catalo
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12、etworking permitted without license from IHS-,-,-FOTP-69 TEST PROCEDURE FOR EVALUATING THE EFFECT OF MINIMUM AND MAXIMUM EXPOSURE TEMPERATURES ON THE OPTICAL PERFORMANCE OF OPTICAL FIBERS CONTENTS Section Page 1. INTRODUCTION. 1 2. APPLICABLE DOCUMENTS . 1 3. APPARATUS 2 4. SAMPLING AND SPECIMENS 3
13、5. PROCEDURE 4 6. CALCULATIONS AND INTERPRETATION OF RESULTS 7 7. DOCUMENTATION 7 . 8. SPECIFICATION INFORMATION 8 FIGURE 1 - SUGGESTED PLOT FORMAT FOR REPORTING TEMPERATURE DEPENDENCE OF ATTENUATION 9 FIGURE 2 - SUGGESTED PLOT FORMAT FOR REPORTING CHANGE IN ATTENUATION COEFFICIENT OVER TIME AFTER E
14、XPOSURE TO HIGH TEMPERATURE . 10 ANNEX - SPECIFICATION GUIDELINES AND DISCUSSION REGARDING CHOICE OF MINIMUM AND MAXIMUM TEST TEMPERATURES 11 APPENDIX - COMPARISON BETWEEN THIS FOTP AND IEC AND CCITT REQUIREMENTS 13 Copyright Electronic Industries Alliance Provided by IHS under license with EIANot f
15、or ResaleNo reproduction or networking permitted without license from IHS-,-,-EIA/TIA-455-69A Page 1 FOTP-69 TEST PROCEDURE FOR EVALUATING THE EFFECT OF MINIMUM AND MAXIMUM EXPOSURE TEMPERATURES ON THE OPTICAL PERFORMANCE OF OPTICAL FIBERS (From EIA Standards Proposal No. 2418, formulated under the
16、cognizance of the TIA FO-6.6, Subcommittee on Optical Fibers and Materials.) This FOTP is part of the series of test procedures included within Recommended Standard EIA/TIA-455. NOTE: This FOTP was originally published in EIA-455-69 as FOTP-69. 1. INTRODUCTION This test is intended to determine the
17、ability of an optical fiber to maintain optical performance (attenuation and temperature dependence of attenuation) over an extended period of time after having been exposed to a specified range of high and low temperatures. This procedure is one of several FOTPs that, when selected on the basis of
18、a proposed application, assist in establishing a particular specification for minimum and maximum use temperature. This procedure has been shown to be applicable to all-glass optical fibers. Later this procedure may be shown to apply also to other classes of fibers. 2, APPLICABLE DOCUMENTS Test or i
19、nspection requirements may include, but are not limited to, the following references: FOTP-3 (EIA/TIA-455-3A) “Standard Test Procedures for Fiber Optic Fibers, Cables, Transducers, Sensors, Connecting and Terminating Devices, and Other Fiber Optic Components It “Procedure to Measure Temperature Cycl
20、ing Effects on Optical Fibers, Optical Cable, and Other Passive Fiber Optic Components“ Copyright Electronic Industries Alliance Provided by IHS under license with EIANot for ResaleNo reproduction or networking permitted without license from IHS-,-,-EIA/TIA-455-69A Page 2 FOTP-13 (RS-455-13) FOTP-46
21、 (EIA/TIA-455-46A) FOTP-53 (EIA/TIA-455-53A) FOTP-57 (EIA/TIA-455-57A) FOTP-61 (EIA/TIA-455-61) FOTP-70 (EIA/TIA-4S5-701) FOTP-75 (EIA-455-75) FOTP-78 (EIA/TIA-455-78A) “Visual and Mechanical Inspection of Fibers, Cables, Connectors, and/or Other Fiber Optic Devices“ “Spectral Attenuation Measuremen
22、t for Long-Length, Graded-Index Optical F i be r s “At tenua t i on by Substitution Measurement for Multimode Graded- Index Optical Fibers or Fiber Assemblies Used in Long-Length Communications Systems“ “Optical Fiber End Preparation and Evaluation“ “Measurement of Fiber or Cable Attenuation Using a
23、n OTDR“ “Advanced Aging Temperature for Optical Fibers“ “Fluid Immersion Test for Optical Waveguide Fibe r s “ I S pe c t r a 1 -At te nua t i on Cutback Measurement for Single-Mode Optical F i be r s I 3. APPARATUS 3.1 Sample Preparation Device This device prepares the test specimen in the desired
24、configuration and at zero tension. See also the considerations given in 4.2. Either of the following devices will work: 3.1.1 A coil-winding machine to fabricate loose coils with a minimum inside diameter of 200 mm (8 in). FOTP-75 illustrates a concept for the winding portion of such a machine. when
25、 this method is used, a clean container will be needed for each coil prepared. 3.1.2 A winding machine to produce zero tension on a reel, or a reel incorporating a tension-relief mechanism that produces a lin preparation Copyright Electronic Industries Alliance Provided by IHS under license with EIA
26、Not for ResaleNo reproduction or networking permitted without license from IHS-,-,-EIA/TIA-455-69A Page 3 wind with zero tension. in either case, provide a reel with a minimum diameter of 300 mm (12 in) and sufficient width such that no more than six layers of fiber are needed to accommodate the ent
27、ire length of the fiber. 3.2 Equipment for Evaluating fiinimum Exposure Temperature Use the equipment specified in FOTP-3. 3.3 Equipment for Evaluating Waximum Exposure Temperature 3.3.1 Test Chamber This is an oven of a size sufficient to hold the test specimens while providing adequate internal ci
28、rculation of air in the chamber. A combination freezer-oven may be used, provided it conforms to the requirements of both 3.2 and 3.3.1. Provide an oven capable of holding the set temperature to a tolerance of f SOC for the test duration. The oven meets tempera ture uniformity requirements if all te
29、mperature measurements taken anywhere within an “imaginary box,“ positioned 100 mm (4 in) away from all inside surfaces of the empty oven, do not deviate from one another by more than then replace in the oven. Copyright Electronic Industries Alliance Provided by IHS under license with EIANot for Res
30、aleNo reproduction or networking permitted without license from IHS-,-,-EIA/TIA-455-69A Page 6 Recommended Total Elapsed Time From Initial Exposure O day (i.e., just prior to initial exposure) 1 day 3 days 1 week 2 weeks 1 month 2 months (recommended duration of normal test) 4 months (only if requir
31、ed to achieve test validity) Whenever the test specimen is withdrawn from the oven for measurement, allow it to equilibrate at standard ambient conditions for the length of time, as determined in 5.1 from FOTP-3, before making a measurement. During any measurement sequence do not let the test specim
32、en remain outside the oven longer than two hours beyond the equilibration soak time. If the specimen remains outside the oven longer than this, adjust the test-time line accordingly. Continue remeasuring at the indicated intervals until either the maximum allowable attenuation coefficient increase h
33、as been exceeded, or the maximum test duration has been completed, whichever comes first. 5.8 Intermediate Temperature-Cycling Test (Optional) If desired, or if specified in the Detail Specification, run a temperature-cycling test after one (or more) of the exposure periods in 5.7, in the same manne
34、r as in 5.5. 5.9 Final Baseline Attenuation Measurement When the maximum-temperature testing has been completed, condition the test specimen for a minimum of 24 hours under the controlled ambient atmospheric conditions prescribed in EIA/TIA-455-A, Section 5. Then make a final baseline attenuation me
35、asurement under standard ambient conditions, as in 5.4. 5.10 Final Temperature-Cycling Test Run one complete and final cycle for temperature dependence of attenuation on the test specimen in order to determine what effect, if any, the long-term exposure to the high temperature may have had on perfor
36、mance. Use FOTP-3 and the test temperatures specified in the Detail Specification. Copyright Electronic Industries Alliance Provided by IHS under license with EIANot for ResaleNo reproduction or networking permitted without license from IHS-,-,-EIA/TIA-455-69A Page 7 5.11 inspection Inspect each tes
37、t specimen for possible changes in the coating such as cracking, increased tackiness, discoloration, and embrittlement, using FOTP-13. In the test report note any changes, and when they were first noticed. 5.12 Upset Locations (Optional) If the test results indicate the possible presence of upsets i
38、n the test specimen, or any other anomalous behavior, an (optional) OTDR measurement may prove useful for diagnosing the situation. Use FOTP-59. 6, CALCULATIONS OR INTERPRETATION OF RESULTS 6.1 Calculate the temperature dependence of attenuation from the measurements made at the start of the test cy
39、cle and at the end. Compare the values to the maximum allowable specified value. See Figure 1 for a suggested format for graphing the data. 6.2 Using the equations in the appropriate test procedure, calculate the attenuation coefficients for the test specimen at every stage of the maximum use temper
40、ature testing portion of the program. Calculate the difference in attenuation coefficient from that measured at the start of the testing program, and compare it to the specified maximum allowable value. Also calculate and plot the maximum temperature-dependence value measured in 5.5, 5.8 (optional),
41、 and 5.10. See Figure 2 for a suggested format for graphing and extrapolating the data. 6.3 If accelerated testing is performed on the test specimen, convert the test results to the values for the maximum rated exposure temperature by using a conversion factor derived from characterization testing o
42、f similar fiber samples conducted by FOTP-70. See A.2.1. of the Annex for further discussion. 7. DOCUMENTATION 7.1 Report the following information for each test: 7.1.1 Test date. 7.1.2 identity and length of test specimen. 7.1.3 Temperature conditions applied and conversion factor used (if accelera
43、ted testing is performed). Copyright Electronic Industries Alliance Provided by IHS under license with EIANot for ResaleNo reproduction or networking permitted without license from IHS-,-,-EIA/TIA-455-69A Page 8 7.1.4 Test results: calculated changes in attenuation coefficients, by wavelength, for e
44、ach test; and maximum temperature dependence of attenuation, when measured. 7.1.5 Any noticeable changes in coating appearance or condition. 7.1.6 OTDR traces or descriptions of anomalies found (if the optional procedure of 5.12 is used). 7.2 United States military applications require that the foll
45、owing information also be reported for each test. For other (non-military) applications, this information ,need not be reported, but shall be available for review upon request: 7.2.1 Test personnel. 7.2.2 Brief description of all key equipment used for evaluating minimum use test temperature. 7.2.3
46、Brief description of all key equipment used for evaluating maximum use temperature: test chamber, and attenuation measurement equipment. 7.2.4 Brief description of equipment used to prepare the specimens for test. 7.2.5 Number and title of exposure-temperature procedure, and the attenuation coeffici
47、ent procedure used. Include launch conditions. 7.2.6 Configuration of test specimen (coil or reel). 8. SPECIFICATION INFORMATION The following shall be specified in the Detail Specification: 8.1 Acceptance or failure criteria: Maximum allowable attenuation coefficient change for the duration of the
48、maximum exposure temperature program; and maximum allowable increase in temperature dependence before and after high-temperature testing. 8.2 Minimum exposure temperature, and the test temperature associated with it. 8.3 Maximum exposure temperature, and the test temperature associated with it. 8.4
49、Duration of maximum exposure temperature test program. 8.5 Test wavelength(s). 8.6 Other requirements. Copyright Electronic Industries Alliance Provided by IHS under license with EIANot for ResaleNo reproduction or networking permitted without license from IHS-,-,-I Maximum Specified Allowable Change After Exposure to High Temperature Maximum Specified Allowable Change Before Exposure to High Temperature
