1、Published by theInstitute of Electrical and Electronics Engineers, Inc.11 0 0IEE Recomended Practice forPowering andG rounding E l e c t ronic E q u i p m e n tIEEE Std 1100-2005(Revision ofIEEE Std 1100-1999)Recognized as anAmerican National Standard (ANSI)IEEE Std 1100-2005(Revision ofIEEE Std 110
2、0-1999)IEEE Recommended Practice forPowering and GroundingElectronic EquipmentSponsorPower Systems Engineering Committeeof theIndustrial and Commercial Power Systems Departmentof theIEEE Industry Applications SocietyApproved 9 December 2005IEEE-SA Standards BoardApproved 29 December 2005American Nat
3、ional Standards InstituteThe Institute of Electrical and Electronics Engineers, Inc.3 Park Avenue, New York, NY 10016-5997, USACopyright 2006 by the Institute of Electrical and Electronics Engineers, Inc.All rights reserved. Published 24 May 2006. Printed in the United States of America.IEEE is a re
4、gistered trademark in the U.S. Patent “TelecomCircuit Protection Trends,” M. J. Maytum, Power Innovations Limited, Passive Component Industry, January/February 2001, vol. 3, no. 1, for Figures 9J-1, 9J-2, 9J-3, 9J-4, 9J-5, 9J-5, 9J-6, and 9J-7. Figures 9J-1 and9J-2 also appear in IEC 61643-22, editi
5、on 1.0, 2004-11.Cooper Bussmann, Inc., for Figures 9-33 and 9-34.Emerson Network Power, “Emersons 2004 Power Seminar Presentations,” for Figures 9-26, 9-27, 9-29, 9-30,9-31, 9D-2, and 9D-8.EnerNex Corporation for Figure 8-5.EPRI Solutions Inc. EquiTech Corporation for Figures 9-75 and 9F-5.EYP Missi
6、on Critical Facilities, Inc., for Figures 4-1, 4-2, 4-3- 4-4, 4-23, 4-24, 4-25, 4-26, 4-28, 4-29, 4-30,4-31, 4-34, 4-35, 4-36, 4-37, 4-48- 4-49, 4-50, 4-53, 4-54, and 4-71.Liebert Corporation for Figures 7-6, 7-7, 7-8, 7-9, 7-10, 7-11, 7-13, 7-16, 7-17, 7-19, 7-20, 7-21, 7-22, 7-24,7-25, 7-26, 7-27,
7、 7-28, 7-29, 7-30, 7-31, 9-21, 9-22, 9-24, 9H-1, and 9H-2.D. R. MacGorman, M. W. Maier, and W. D. Rust, “Lightning Strike Density for the Contiguous United Statesfrom Thunderstorm Duration Records,” for Figure 3-3.A. McEachern, Handbook of Power Signatures, for Figure 4-42.National Electrical Manufa
8、cturers Association for Table 4-1.Nortel Networks (with clarity edit made by William Bush, SPGS, Inc.) for Figure 9-59.Protection Technologies, Inc., for Figures 9F-1 and 9F-2. Rockwell Automation, Inc., for Figures 9-13 and 9-15.Schneider Electric SA/Square D for Figures 10-1, 10-2, 10-3, 10-4, 10-
9、8, 10-17, 10-18, 10-19, 10-20, and10-21; Table 10-1.SEMI (Semiconductor Equipment and Materials International, Inc.), SEMI F47-0200, “Specification forSemiconductor Processing Equipment Voltage Sag Immunity,” February 2000, for Figure 3-13.Signals, Power +1 978 750 8400. Permission to photocopy port
10、ions of anyindividual standard for educational classroom use can also be obtained through the Copyright Clearance Center.NOTEAttention is called to the possibility that implementation of this standard may require use ofsubject matter covered by patent rights. By publication of this standard, no posi
11、tion is taken withrespect to the existence or validity of any patent rights in connection therewith. The IEEE shall not beresponsible for identifying patents for which a license may be required by an IEEE standard or forconducting inquiries into the legal validity or scope of those patents that are
12、brought to its attention.Copyright 2006 IEEE. All rights reserved.vIntroductionThis recommended practice is a publication of the Industry Applications Society (IAS) of the IEEE and isone of the IEEE Color Books, which relate to industrial and commercial power systems. The recommendedpractices descri
13、bed are intended to enhance equipment performance from an electric powering andgrounding standpoint, while maintaining a safe installation as prescribed by national and local electric coderequirements. The purpose of this recommended practice is to provide consensus recommended practices inan area w
14、here conflicting information and conflicting design philosophies have dominated.As the proliferation of digital electronic equipment continues to change the way society utilizes and relies onelectric power continuity, the need for standardized practices for power protection and grounding continuesto
15、 grow. The requirements of the digital society have essentially outgrown the capabilities of the present dayelectric power supply, and the need for practices that promote system compatibility of both the electricsupply and the connected equipment is important from the largest industrial facilities a
16、ll the way down tohome offices. The concept of system compatibility, which is covered extensively in this book, describes themechanisms of interaction and requirements necessary to ensure that not only does the electrical powerequipment connected to its power source operate properly even during mode
17、rate power fluctuations, but alsothat same equipment does not interfere with other equipment connected to the common power system. Theresponsibility for system compatibility is shared among all parties, including the electric suppliers, theequipment manufacturers, the building designers, the power c
18、onditioning equipment manufacturers, and thefacility equipment specifiers, and this document supplies methods to ensure that when a systemcompatibility problem is present, there are adequate means of investigating and resolving the concern. It isalso the intent of this document to supply power syste
19、m design guidelines and recommended practices thatwould minimize the potential for a system compatibility concern to occur.To address the topics detailed in the IEEE Emerald Book, the IEEE Working Group on Powering andGrounding Electronic Equipment was originally formed in 1986 to write a recommende
20、d practice. The firstIEEE Emerald Bookwas subsequently published in 1992, followed by a revision in 1999. The project wassponsored by the IAS Industrial and Commercial Power Systems Engineering Subcommittee. Thisrecommended practice is intended to complement other recommended practices in the IEEE C
21、olor Booksand has been coordinated with other related codes and standards.Notice to usersErrataErrata, if any, for this and all other standards can be accessed at the following URL: http:/standards.ieee.org/reading/ieee/updates/errata/index.html. Users are encouraged to check this URL forerrata peri
22、odically.InterpretationsCurrent interpretations can be accessed at the following URL: http:/standards.ieee.org/reading/ieee/interp/index.html.(This introduction is not part of IEEE Std 1100-2005, IEEE Recommended Practice for Powering and GroundingElectronic Equipment.)viCopyright 2006 IEEE. All rig
23、hts reserved.PatentsAttention is called to the possibility that implementation of this standard may require use of subject mattercovered by patent rights. By publication of this standard, no position is taken with respect to the existence orvalidity of any patent rights in connection therewith. The
24、IEEE shall not be responsible for identifyingpatents or patent applications for which a license may be required to implement an IEEE standard or forconducting inquiries into the legal validity or scope of those patents that are brought to its attention.ParticipantsThe following persons contributed t
25、o the revision of IEEE Recommended Practice for Powering andGrounding Electronic Equipment:Douglas S. Dorr,ChairChristopher J. Melhorn, SecretaryZade Shaw, Kate Langley,EditorsChapter 1: OverviewDouglas S. Dorr,ChairChapter 2: DefinitionsCarl E. Becker,Previous ChairChapter 3: General needs guidelin
26、esChristopher J. Melhorn,ChairChapter 4: FundamentalsRobert J. Schuerger,ChairChapter 5: InstrumentationDouglas S. Dorr,Previous ChairChapter 6: Site surveys and power analysisKenneth M. Michaels,Previous ChairChapter 7: Specifications and selection of equipment and materialsThomas M. Gruzs,ChairCha
27、pter 8: Recommended design and installation practicesMichael Butkiewicz,Previous ChairChapter 9: Telecommunications and distributed computingWilliam Bush,ChairChapter 10: Industrial systemsVan E. Wagner,ChairChapter 11: Case historiesMark Waller,ChairVladimir F. BaschJ. Allen ByrneDavid ChauJonathan
28、 CloughThomas G. CrodaPaul DobrowskiErnest M. Duckworth Jr.Addam FiedlJoaquin FusterLawrence GuzyJames R. HarveyMichael C. KeelingThomas S. KeyWilliam KimmelNicholas KorbelDon KovalRobert KretschmannCurtis LearyJ. M. LiptakPhillip LimRobert LounsburyMike LowensteinCarl MillerRalph MorrisonWilliam J.
29、 MoylanCharles Perry IIIBill PetersenElliott Rappaport Melvin SandersLynn F. SaundersTom SchaunessyMichael SimonSonny SiuDouglas C. Smith Devendra SoniPaul Spain Mark StephensNicholas TulliusS. F. WatererBaskar VairamohenChristopher WeathersGeorge ZeiglerCopyright 2006 IEEE. All rights reserved.viiS
30、ince the initial publication, many IEEE standards have added functionality or provided updates to materialincluded in this recommended practice. The following is a historical list of participants who have dedicatedtheir valuable time, energy, and knowledge to the creation of this material:Past Emera
31、ld Book ChairsThomas S. Key(1992) and Thomas M. Gruzs(1999)Past Emerald Book SecretariesWarren H. Lewis, Christopher J. Melhorn, Van E. WagnerEditorsBradford Connatser, Nanette Jones, Michael C. Keeling, Kate Langley, Franois Martzloff,Zade ShawPast Chapter ChairsVladimir F. Basch, Carl E. Becker, W
32、illiam Bush, Michael Butkiewicz, EdwardG. Cantwell, Jane M. Clemmensen, Douglas S. Dorr, Thomas M. Gruzs, J. Frederick Kalbach,Michael C. Keeling, Thomas S. Key, Warren H. Lewis, Franois Martzloff, Kenneth M. Michaels,Raymond M. Waggoner, Donald W. ZipseFormer Working Group members and contributors:
33、The following members of the individual balloting committee voted on this recommended practice. Ballot-ers may have voted for approval, disapproval, or abstention.Math BollenJames A. CanhamWendall CarterJohn E. CurlettJohn B. DagenhartJohn G. DaltonDennis DarlingRobert J. DeatonMichael J. DemartiniW
34、illiam E. DewittThomas W. DillibertiFrancis J. FiederleinNorman FowlerJeff FranklinArthur FreundDavid A. FuhrmanPhillip E. GannonDavid C. GriffithJoseph GroeschJoseph J. HumphreyJ. Frederick KalbachKenneth B. KeelsRobert KeisPrem KheraDon. O. KovalEmanuel E. LandsmanRalph H. LeeAlexander McEachernWi
35、lliam A. MoncriefAllen MorinecEduard MulhadiRichard L. NailenHugh O. NashRaymond NerenbergPat ODonnellSteve PierrePercy E. PooleTom PooleCharles D. PottsMarek J. SamotyjRichard E. SingerMurray SlaterWilliam M. SmithAnthony W. St. JohnMeil ThorlaClarence P. TsungTimothy D. UnruhDavid B. VannoyJohn J.
36、 WatermanDavid AhoJacob Ben AryDavid BaronThomas BlairWilliam BloetheStuart BoucheyKenneth BowRichard BrownWilliam BrumsickleReuben BurchTed BurseWilliam BushKeith ChowBryan ColeLarry ColemanJoseph S. ColluraTommy CooperRandall GrovesThomas M. GruzsErich GuntherGeorge GurlaskieLarry GuzyAjit GwalPau
37、l HamerDennis HansenJames R. HarveyGilbert HensleySteven HensleyAjit HiranandaniRobert HoeraufEdward Horgan Jr.Dennis HorwitzDarin HuculRobert InghamGary MichelWilliam A. MoncriefCharles MorseAbdul MousaWilliam J. MoylanMichael NewmanRick OKeefeGregory OlsonThomas OrtmeyerLorraine PaddenGary PeeleEl
38、liot RappaportLarry RayRadhakrishna RebbapragadaJohannes RickmannMichael RobertsviiiCopyright 2006 IEEE. All rights reserved.The final conditions for approval of this standard were met on 9 December 2005. This standard was condi-tionally approved by the IEEE-SA Standards Board on 22 September 2005,
39、with the following membership:Steve M. Mills,ChairRichard H. Hulett, Vice ChairDon Wright, Past ChairJudith Gorman,Secretary*Member EmeritusAlso included are the following nonvoting IEEE-SA Standards Board liaisons:Satish K. Aggarwal, NRC RepresentativeRichard DeBlasio, DOE RepresentativeAlan H. Coo
40、kson, NIST RepresentativeDon MessinaIEEE Standards Project EditorWilliam CurryStephen DareR. DaubertAndrew DettloffGary Di TroiaDoug DorrNeal DowlingMark DrabkinDonald DunnGary EngmannClifford C. ErvenDan EvansJay FischerRabiz FodaCarl FredericksJames FunkeEdgar GalyonWilliam GoldbachManuel Gonzalez
41、David W. JacksonJoseph JancauskasMark KempkerYuri KhersonskyJoseph L. KoepfingerDon KovalEdwin KramerJason LinAl MaguireWilliam MajeskiKeith MalmedalJesus MartinezStephen McCluerWilliam McCoyMark McGranaghanNigel McQuinChris MelhornBryan MelvilleJames MichalecThomas RozekDaniel SabinBob SaintMelvin
42、SandersSteven SanoRobert SchuergerH. Jin SimMichael SimonDavid SingletonDevendra SoniTimothy UnruhRaul VelazquezHemant VoraVan WagnerDaniel WardSteven WhisenantJames WikstonJames WilsonAhmed ZobaaMark D. BowmanDennis B. BrophyJoseph BruderRichard CoxBob DavisJulian Forster*Joanna N. GueninMark S. Ha
43、lpinRaymond HapemanWilliam B. HopfLowell G. JohnsonHerman KochJoseph L. Koepfinger*David J. LawDaleep C. MohlaPaul NikolichT. W. OlsenGlenn ParsonsRonald C. PetersenGary S. RobinsonFrank StoneMalcolm V. ThadenRichard L. TownsendJoe D. WatsonHoward L. WolfmanCopyright 2006 IEEE. All rights reserved.i
44、xContentsChapter 1Overview. 11.1 Scope 11.2 Purpose. 11.3 Background 11.4 Text organization . 21.5 Bibliography 4Chapter2Definitions . 52.1 Introduction 52.2 Alphabetical listing of terms 52.3 Words avoided . 132.4 Acronyms and abbreviations 142.5 Normative references. 182.6 Bibliography 19Chapter3G
45、eneral needs guidelines 213.1 Introduction 213.2 Power quality considerations . 233.3 Grounding considerations 333.4 Protection of susceptible equipment 383.5 Information technology equipment (ITE) 403.6 Shielded, filtered, enclosed EMI/EMC areas. 463.7 Safety systems 473.8 Coordination with other c
46、odes, standards, and agencies . 483.9 Normative references. 503.10 Bibliography 51Chapter4Fundamentals 534.1 Introduction 534.2 Electric power suppliers distribution system voltage disturbances 544.3 Voltage disturbancessubtractive 564.4 Voltage surges and interferenceAdditive. 634.5 Steady-state vo
47、ltage/current wave shape distortion. 814.6 High- and low-frequency regimes defined 984.7 Impedance considerations 1034.8 Grounding subsystems. 1214.9 Shielding concepts . 1504.10 Surge protective devices 1544.11 Normative references. 1584.12 Bibliography 158Chapter 5Instrumentation . 1635.1 Introduc
48、tion 1635.2 Range of available instrumentation . 1635.3 Voltage and current measurements 1635.4 Descriptions of site survey tools 169xCopyright 2006 IEEE. All rights reserved.5.5 Measurement considerations 1765.6 Normative references. 1795.7 Bibliography 179Chapter6Site surveys and site power analys
49、es 1816.1 Introduction 1816.2 Objectives and approaches. 1816.3 Coordinating involved parties 1826.4 Conducting a site survey 1836.5 Harmonic current and voltage measurements 2016.6 Applying data to select cost-effective solutions 2026.7 Long-term power monitoring. 2036.8 Conclusions 2036.9 Normative references. 2046.10 Bibliography 205Chapter7Specification and selection of equipment and materials. 2077.1 Introduction 2077.2 Commonly used power correction devices 2077.3 Equipment specifications. 2367.4 Procurement specifications 2437.5 Ve
