1、 IEEE Std 90003-2008 IEEE Std 90003-2008 IEEE Standard for Terminology and Test Methods for Analog-to-Digital Converters Sponsored by the Waveform Generation Measurement and Analysis Technical Committee IEEE 3 Park Avenue New York, NY 10016-5997 USA 14 January 2011 IEEE Instrumentation +1 978 750 84
2、00. Permission to photocopy portions of any individual standard for educational classroom use can also be obtained through the Copyright Clearance Center. Introduction This introduction is not part of IEEE Std 1241-2010, IEEE Standard for Terminology and Test Methods for Analog-to-Digital Converters
3、. This standard defines the terms, definitions, and test methods used to specify, characterize, and test analog-to-digital converters (ADCs). It is intended for the following: Individuals and organizations who specify ADCs to be purchased Individuals and organizations who purchase ADCs to be applied
4、 in their products Individuals and organizations whose responsibility is to characterize and write reports on ADCs available for use in specific applications Suppliers interested in providing high-quality and high-performance ADCs to acquirers This standard is designed to help organizations and indi
5、viduals Incorporate quality considerations during the definition, evaluation, selection, and acceptance of supplier ADCs for operational use in their equipment Determine how supplier ADCs should be evaluated, tested, and accepted for delivery to end users This standard is intended to satisfy the fol
6、lowing objectives: Promote consistency within organizations in acquiring third-party ADCs from component suppliers Provide useful practices on including quality considerations during acquisition planning Provide useful practices on evaluating and qualifying supplier capabilities to meet user require
7、ments Provide useful practices on evaluating and qualifying supplier ADCs Assist individuals and organizations judging the quality and suitability of supplier ADCs for referral to end users Several standards have previously been written that address the testing of analog-to-digital converters either
8、 directly or indirectly. These include IEEE Std 1057-2007, which describes the testing of waveform recorders. This standard has been used as a guide for many of the techniques described in this standard. IEEE Std 746-1984, which addresses the testing of analog-to-digital and digital-to-analog conver
9、ters used for PCM television video signal processing. JESD99-1, which deals with the terms and definitions used to describe analog-to-digital and digital-to-analog converters. This standard does not include test methods. IEEE Std 1241-2009 for analog-to-digital converters is intended to focus specif
10、ically on terms and definitions as well as test methods for ADCs for a wide range of applications. This standard is a revision of IEEE Std 1241-2000. This version has added additional test methods, improved guidance for selecting tests, and additional terms. Some terminology pertaining to signal-to-
11、noise ratio and related terms has been changed to be consistent with other standards. iv Copyright 2011 IEEE. All rights reserved. Notice to users Laws and regulations Users of these documents should consult all applicable laws and regulations. Compliance with the provisions of this standard does no
12、t imply compliance to any applicable regulatory requirements. Implementers of the standard are responsible for observing or referring to the applicable regulatory requirements. IEEE does not, by the publication of its standards, intend to urge action that is not in compliance with applicable laws, a
13、nd these documents may not be construed as doing so. Copyrights This document is copyrighted by the IEEE. It is made available for a wide variety of both public and private uses. These include both use, by reference, in laws and regulations, and use in private self-regulation, standardization, and t
14、he promotion of engineering practices and methods. By making this document available for use and adoption by public authorities and private users, the IEEE does not waive any rights in copyright to this document. Updating of IEEE documents Users of IEEE standards should be aware that these documents
15、 may be superseded at any time by the issuance of new editions or may be amended from time to time through the issuance of amendments, corrigenda, or errata. An official IEEE document at any point in time consists of the current edition of the document together with any amendments, corrigenda, or er
16、rata then in effect. In order to determine whether a given document is the current edition and whether it has been amended through the issuance of amendments, corrigenda, or errata, visit the IEEE Standards Association web site at http:/ieeexplore.ieee.org/xpl/standards.jsp, or contact the IEEE at t
17、he address listed previously. For more information about the IEEE Standards Association or the IEEE standards development process, visit the IEEE-SA web site at http:/standards.ieee.org. Errata Errata, if any, for this and all other standards can be accessed at the following URL: http:/standards.iee
18、e.org/ reading/ieee/updates/errata/index.html. Users are encouraged to check this URL for errata periodically. Interpretations Current interpretations can be accessed at http:/standards.ieee.org/reading/ieee/interp/index.html. Patents Attention is called to the possibility that implementation of thi
19、s standard may require use of subject matter covered by patent rights. By publication of this standard, no position is taken with respect to the existence or validity of any patent rights in connection therewith. The IEEE is not responsible for identifying Essential Patent Claims for which a license
20、 may be required, for conducting inquiries into the legal validity or scope of Patents Claims or determining whether any licensing terms or conditions provided in connection with submission of a Letter of Assurance, if any, or in any licensing agreements are reasonable or non-discriminatory. Users o
21、f this standard are expressly advised that determination of the validity of any patent rights, and the risk of infringement of such rights, is entirely their own responsibility. Further information may be obtained from the IEEE Standards Association. v Copyright 2011 IEEE. All rights reserved. vi Co
22、pyright 2011 IEEE. All rights reserved. Participants At the time this standard was submitted to the IEEE-SA Standards Board for approval, the Analog-to-Digital Converters Working Group had the following membership: Steve Tilden, Chair Solomon Max, Secretary Jerry Blair, Editor Francisco Alegria Eula
23、lia Balestrieri Niclas Bjrsell John Calvin Dominique Dallet Pasquale Daponte Luca De Vito Alexander Goncharenko Donald Greer Richard Liggiero Tom Linnenbrink* Sergio Rapuano Fang Xu *Chair, TC-10 Contributions were also made in prior years by: Pasquale Arpaia B. N. Suresh Babu Eulalia Balestrieri Al
24、lan Belcher David Bergman Niclas Bjrsell Jerry Blair Eric Blom William Boyer Steve Broadstone Paulo Carbone Giovanni Chiorboli Dominique Dallet Pasquale Daponte Luca De Vito John Deyst Robert Graham Philip Green David Hansen Fred Irons Dan Kien Dan Knierim Richard Kromer Yves Langard Richard Liggier
25、o Solomon Max W. Thomas Meyer Carlo Morandi Norris Nahman Bill Peterson Sergio Rapuano Pierre-Yves Roy Otis M. Solomon T. Michael Souders Steve Tilden The following members of the individual balloting committee voted on this standard. Balloters may have voted for approval, disapproval, or abstention
26、. Ali Al Awazi Martin J. Bishop Niclas Bjrsell Jerome Blair William Boyer Paolo Carbone Frans G. De Jong Alexander Goncharenko Ron Greenthaler Donald Greer Randall Groves Timothy Harrington Werner Hoelzl Piotr Karocki Jim Kulchisky Donald Larson Richard Liggiero Thomas Linnenbrink William Lumpkins S
27、. Max Scott Misha Michael S. Newman John Noonan Ulrich Pohl Sergio Rapuano Robert Robinson Bartien Sayogo Gil Shultz James Smith Joseph Stanco Walter Struppler Steven Tilden Stephen Webb Fang Xu When the IEEE-SA Standards Board approved this standard on 17 June 2010, it had the following membership:
28、 Robert M. Grow, Chair Richard H. Hulett, Vice Chair Steve M. Mills, Past Chair Judith Gorman, Secretary Karen Bartleson Victor Berman Ted Burse Clint Chaplin Andy Drozd Alexander Gelman Jim Hughes Young Kyun Kim Joseph L. Koepfinger* John Kulick David J. Law Hung Ling Oleg Logvinov Ted Olsen Ronald
29、 C. Petersen Thomas Prevost Jon Walter Rosdahl Sam Sciacca Mike Seavey Curtis Siller Don Wright *Member Emeritus Also included are the following nonvoting IEEE-SA Standards Board liaisons: Satish Aggarwal, NRC Representative Richard DeBlasio, DOE Representative Michael Janezic, NIST Representative L
30、isa Perry IEEE Standards Program Manager, Document Development Kathryn Bennett IEEE Standards Program Manager, Technical Program Development vii Copyright 2011 IEEE. All rights reserved. Contents 1. Overview 1 1.1 Scope . 1 1.2 Purpose 1 1.3 Document organization 2 1.4 Analog-to-digital converter ba
31、ckground 2 1.5 Guidance to the user 6 1.6 Manufacturer-supplied information . 7 2. Normative references 11 3. Definitions and symbols . 11 3.1 Definitions . 11 3.2 Symbols and acronyms 18 4. General test methods 20 4.1 Introductory information on test methods 20 4.2 Test setup . 20 4.3 Taking a reco
32、rd of data 22 4.4 Equivalent-time sampling and undersampling . 23 5. Sine-wave testing and fitting 28 5.1 Introductory information on sine-wave testing and fitting 28 5.2 Curve fitting test method . 28 5.3 Comment on three-parameter versus four-parameter sine fit 29 5.4 Choice of frequencies and rec
33、ord length . 29 5.5 Selecting signal amplitudes . 31 5.6 Presenting sine-wave data 31 5.7 Impurities of sine-wave sources 31 5.8 Estimating impurity problems from sine-fitting results . 32 5.9 Measuring and controlling sine-wave impurities . 33 6. Locating code transitions 34 6.1 Introductory inform
34、ation on locating code transitions . 34 6.2 Locating code transitions using a feedback loop . 35 6.3 Alternate code transition location method based on ramp histogram 37 6.4 Alternate code transition location method, based on sine-wave histogram . 39 6.5 Determining the static transfer curve . 42 7.
35、 Analog input . 43 7.1 Input characteristics . 43 7.2 Static input impedance versus input signal level . 44 7.3 Static input current . 44 7.4 Static gain and offset . 44 viii Copyright 2011 IEEE. All rights reserved. 8. Linearity . 46 8.1 General comments on linearity 46 8.2 Integral nonlinearity 46
36、 8.3 Absolute accuracy error . 47 8.4 Differential nonlinearity and missing codes 47 8.5 Example INL and DNL data 48 8.6 Monotonicity . 49 8.7 Hysteresis 50 8.8 Harmonic and spurious distortion 51 8.9 Intermodulation distortion . 57 8.10 Noise power ratio . 60 9. Noise (total) 65 9.1 General comment
37、s concering noise . 65 9.2 Signal-to-noise-and-distortion ratio (SINAD) . 65 9.3 Signal-to-noise ratio (SNR) . 66 9.4 Effective number of bits (ENOB) 67 9.5 Random noise 70 10. Step response parameters 73 10.1 Step response definition . 73 10.2 Test method for acquiring an estimate of the step respo
38、nse 73 10.3 Slew rate limit 73 10.4 Settling time parameters 74 10.5 Transition duration of step response 75 10.6 Overshoot and precursors 75 11. Frequency response parameters 76 11.1 Bandwidth (BW) 76 11.2 Gain error (gain flatness) . 78 11.3 Frequency response and gain from step response 78 12. Di
39、fferential gain and phase . 81 12.1 Introductory information on differential gain and phase . 81 12.2 Method for testing a general purpose ADC . 81 12.3 Method for testing a special purpose ADC 84 12.4 Comments on differential phase and differential gain testing . 85 13. Aperture effects 86 13.1 Int
40、roductory information on aperture effects . 86 13.2 Aperture duration . 86 13.3 Aperture delay . 91 13.4 Aperture jitter 92 14. Additional tests and specification . 94 14.1 Digital logic signals . 94 14.2 Pipeline delay 94 ix Copyright 2011 IEEE. All rights reserved. x Copyright 2011 IEEE. All right
41、s reserved. 14.3 Out-of-range recovery . 94 14.4 Differential input specifications . 95 14.5 Comments on reference signals . 97 14.6 Power supply parameters . 98 Annex A (informative) ADC architectures 101 A.1 Integrating ADCs .101 A.2 Flash ADCs 102 A.3 Pipelined and Subranging ADCs .103 A.4 SAR AD
42、Cs 104 A.5 - ADCs 105 A.6 Time-Interleaved ADCs .106 A.7 Folding and Interpolating ADCs 107 Annex B (informative) Sine-wave fitting algorithms 108 B.1 An algorithm for three-parameter (known frequency) least-squares fit to sine-wave data 108 B.2 An algorithm for four-parameter least-squares fit to s
43、ine-wave data .109 Annex C (normative) Discrete Fourier transforms and windowing 112 C.1 The windowed DFT and spectral leakage 114 C.2 Some useful windows and their characteristics 116 C.3 Window selection .117 Annex D (informative) Presentation of sine-wave data .118 D.1 ENOB presentation 118 D.2 P
44、resentation of residuals 119 D.3 Other examples of presentations of sine-wave test results .121 Annex E (informative) Bibliography .125 IEEE Standard for Terminology and Test Methods for Analog-to-Digital Converters IMPORTANT NOTICE: This standard is not intended to ensure safety, security, health,
45、or environmental protection. Implementers of the standard are responsible for determining appropriate safety, security, environmental, and health practices or regulatory requirements. This IEEE document is made available for use subject to important notices and legal disclaimers. These notices and d
46、isclaimers appear in all publications containing this document and may be found under the heading “Important Notice” or “Important Notices and Disclaimers Concerning IEEE Documents.” They can also be obtained on request from IEEE or viewed at http:/standards.ieee.org/IPR/disclaimers.html. 1. Overvie
47、w 1.1 Scope The material presented in this standard is intended to provide common terminology and test methods for the testing and evaluation of analog-to-digital converters (ADCs). This standard considers only those ADCs whose output values have discrete values at discrete times, i.e., they are qua
48、ntized and sampled. In general, this quantization is assumed to be nominally uniform (the input-output transfer curve is approximately a straight line) as discussed further in 1.3, and the sampling is assumed to be at a nominally uniform rate. Some but not all of the test methods in this standard ca
49、n be used for ADCs that are designed for non-uniform quantization. 1.2 Purpose This standard identifies ADC error sources and provides test methods with which to perform the required error measurements. The information in this standard is useful both to manufacturers and to users of ADCs in that it provides a basis for evaluating and comparing existing devices, as well as providing a template for writing specifications for the procurement of new ones. In some applications, the information provided by the tests described in this standard can
