1、g44g40g40g40g3g54g87g71g3g22g22g25g140g16g21g19g20g19g11g53g72g89g76g86g76g82g81g3g82g73g44g40g40g40g3g54g87g71g3g22g22g25g16g21g19g19g24g12g44g40g40g40g3g53g72g70g82g80g80g72g81g71g72g71g3g51g85g68g70g87g76g70g72g3g73g82g85g44g81g86g87g68g79g79g68g87g76g82g81g15g3g44g81g86g83g72g70g87g76g82g81g15g3
2、g68g81g71g3g55g72g86g87g76g81g74g73g82g85g3g38g79g68g86g86g3g20g40g3g51g82g90g72g85g15g3g44g81g86g87g85g88g80g72g81g87g68g87g76g82g81g15g68g81g71g3g38g82g81g87g85g82g79g3g40g84g88g76g83g80g72g81g87g3g68g87g3g49g88g70g79g72g68g85g41g68g70g76g79g76g87g76g72g86g44g40g40g40g3g51g82g90g72g85g3g9g3g40g81g
3、72g85g74g92g3g54g82g70g76g72g87g92g3g54g83g82g81g86g82g85g72g71g3g69g92g3g87g75g72g50g83g72g85g68g87g76g82g81g86g15g3g54g88g85g89g72g76g79g79g68g81g70g72g15g3g36g74g76g81g74g15g3g53g72g79g76g68g69g76g79g76g87g92g15g3g68g81g71g3g55g72g86g87g76g81g74g3g38g82g80g80g76g87g87g72g72g3g44g40g40g40g22g3g51g
4、68g85g78g3g36g89g72g81g88g72g3g49g72g90g3g60g82g85g78g15g3g49g60g3g20g19g19g20g25g16g24g28g28g26g15g3g56g54g36g3g3g22g19g3g54g72g83g87g72g80g69g72g85g3g21g19g20g19g22g22g25g55g48Copyright The Institute of Electrical and Electronics Engineers, Inc. Provided by IHS under license with IEEENot for Resal
5、eNo reproduction or networking permitted without license from IHS-,-,-Copyright The Institute of Electrical and Electronics Engineers, Inc. Provided by IHS under license with IEEENot for ResaleNo reproduction or networking permitted without license from IHS-,-,-IEEE Std 336-2010 (Revision of IEEE St
6、d 336-2005) IEEE Recommended Practice for Installation, Inspection, and Testing for Class 1E Power, Instrumentation, and Control Equipment at Nuclear Facilities Sponsor Operations, Surveillance, Aging, Reliability, and Testing Committee of the IEEE Power +1 978 750 8400. Permission to photocopy port
7、ions of any individual standard for educational classroom use can also be obtained through the Copyright Clearance Center. Copyright The Institute of Electrical and Electronics Engineers, Inc. Provided by IHS under license with IEEENot for ResaleNo reproduction or networking permitted without licens
8、e from IHS-,-,-Introduction This introduction is not part of IEEE Std 336-2010, IEEE Recommended Practice for Installation, Inspection, and Testing for Class 1E Power, Instrumentation, and Control Equipment at Nuclear Facilities. This recommended practice was originally published as a standard, and
9、it set forth requirements for installation, inspection, and testing of important instrumentation and electric equipment in a nuclear power generating station during its construction phase. This standard was prepared by the IEEE in response to a request by American National Standards Committee N45 on
10、 Reactor Plants and their Maintenance. The N45 committee was chartered to promote development of standards for location, design, construction, and maintenance of nuclear reactors and plants embodying nuclear reactors, including equipment, methods, and components specifically for this purpose. In May
11、 1969, the IEEE Joint Committee on Nuclear Power Standards (JCNPS) established an ad hoc committee on Installation, Inspection, and Testing of Electric and Instrumentation Equipment. The purpose of this committee was to prepare a standard for general industry use that would define requirements for i
12、nstallation, inspection, and testing of instrumentation and electric equipment necessary to ensure attainment of a safe and reliable nuclear power generating station. The ad hoc committee was composed of representatives of key segments of the nuclear industry, including utilities, reactor suppliers,
13、 construction contractors, component manufacturers, and consultants. In 1977, the standard was revised to provide clarity and simplification. In 1979, the standard was again revised to expand the scope to include operating plant modifications that are comparable in nature and extent with those relat
14、ed activities occurring during initial construction of the station. Subcommittee 8 of the Nuclear Power Engineering Committee (NPEC) developed these revisions. In 1985, this standard was then revised to allow application of the requirements to include nuclear facilities other than nuclear power gene
15、ration stations. Nuclear facilities include facilities for power generation, spent fuel storage, waste storage, fuel processing, plutonium processing, and fuel fabrication. In 2003, the NPEC directed its Working Group 3.1 to convert IEEE Std 336-1985 from a standard to a guide (to allow more flexibi
16、lity for selective guidance than mandatory requirements), to incorporate “lessons learned” from industry (in particular, for post-modification and post-maintenance testing), and to change the format to be more user-friendly. The guide was issued in 2005. This revision is converting IEEE Std 336-2005
17、 to a recommended practice. The purpose for recategorizing IEEE Std 336 to a recommended practice is to elevate the importance of the subject matter for an industry that anticipates significant new construction. A recommended practice emphasis will allow reasonable flexibility with respect to the in
18、terpretation of the information provided but will use language that is more significant than a guide without the strict prescriptive language of a standard. iv Copyright 2010 IEEE. All rights reserved. Copyright The Institute of Electrical and Electronics Engineers, Inc. Provided by IHS under licens
19、e with IEEENot for ResaleNo reproduction or networking permitted without license from IHS-,-,-Notice to users Laws and regulations Users of these documents should consult all applicable laws and regulations. Compliance with the provisions of this standard does not imply compliance to any applicable
20、regulatory requirements. Implementers of the standard are responsible for observing or referring to the applicable regulatory requirements. IEEE does not, by the publication of its standards, intend to urge action that is not in compliance with applicable laws, and these documents may not be constru
21、ed as doing so. Copyrights This document is copyrighted by the IEEE. It is made available for a wide variety of both public and private uses. These include both use, by reference, in laws and regulations, and use in private self-regulation, standardization, and the promotion of engineering practices
22、 and methods. By making this document available for use and adoption by public authorities and private users, the IEEE does not waive any rights in copyright to this document. Updating of IEEE documents Users of IEEE standards should be aware that these documents may be superseded at any time by the
23、 issuance of new editions or may be amended from time to time through the issuance of amendments, corrigenda, or errata. An official IEEE document at any point in time consists of the current edition of the document together with any amendments, corrigenda, or errata then in effect. In order to dete
24、rmine whether a given document is the current edition and whether it has been amended through the issuance of amendments, corrigenda, or errata, visit the IEEE Standards Association web site at http:/ieeexplore.ieee.org/xpl/standards.jsp, or contact the IEEE at the address listed previously. For mor
25、e information about the IEEE Standards Association or the IEEE standards development process, visit the IEEE-SA web site at http:/standards.ieee.org. Errata Errata, if any, for this and all other standards can be accessed at the following URL: http:/standards.ieee.org/reading/ieee/updates/errata/ind
26、ex.html. Users are encouraged to check this URL for errata periodically. Interpretations Current interpretations can be accessed at the following URL: http:/standards.ieee.org/reading/ieee/interp/ index.html. v Copyright 2010 IEEE. All rights reserved. Copyright The Institute of Electrical and Elect
27、ronics Engineers, Inc. Provided by IHS under license with IEEENot for ResaleNo reproduction or networking permitted without license from IHS-,-,-vi Copyright 2010 IEEE. All rights reserved. Patents Attention is called to the possibility that implementation of this recommended practice may require us
28、e of subject matter covered by patent rights. By publication of this recommended practice, no position is taken with respect to the existence or validity of any patent rights in connection therewith. The IEEE is not responsible for identifying Essential Patent Claims for which a license may be requi
29、red, for conducting inquiries into the legal validity or scope of Patents Claims or determining whether any licensing terms or conditions provided in connection with submission of a Letter of Assurance, if any, or in any licensing agreements are reasonable or non-discriminatory. Users of this recomm
30、ended practice are expressly advised that determination of the validity of any patent rights, and the risk of infringement of such rights, is entirely their own responsibility. Further information may be obtained from the IEEE Standards Association. Participants At the time this recommended practice
31、 was submitted to the IEEE-SA Standards Board for approval, the Testing Working Group had the following membership: Ted Riccio, Chair Rachel B. Gunnett, Secretary Gopal Aravapalli George A. Ballassi John Beatty Tom Crawford Alireza Daneshpooy Larry Gradin Hamidreza R. Heidarisafa David A. Horvath Pe
32、ter J. Kang Jacob Kulangara James K. Liming Ken Miller Joseph Napper James Parello Mansoor H. Sanwarwalla Glen E. Schinzel Owen Scott Craig D. Sellers Barry Sloane John A. Stevens John H. Taylor Yvonne Williams Kiang Zee The following members of the Nuclear Power Engineering (NPEC) balloting committ
33、ee voted on this recommended practice. Balloters may have voted for approval, disapproval, or abstention. John D. MacDonald, Chair Satish K. Aggarwal, Vice Chair George A. Ballassi, Secretary Ijaz Ahmad George Attarian Farouk D. Baxter Mark D. Bowman Daniel F. Brosnan Nissen M. Burstein Robert C. Ca
34、rruth John P. Carter John Disosway Dennis Dellinger Stephen Fleger Robert J. Fletcher Robert B. Fuld James F. Gleason Dale T. Goodney Daryl Harmon Dirk C. Hopp David A. Horvath Paul R. Johnson Thomas Koshy Harvey C. Leake J. Scott Malcolm Alexander Marion Michael H. Miller James Parello Mansoor H. S
35、anwarwalla Glen E. Schinzel James E. Stoner, Jr. James E. Thomas Marek Tengler Paul L. Yanosy, Sr. David J. Zaprazny Copyright The Institute of Electrical and Electronics Engineers, Inc. Provided by IHS under license with IEEENot for ResaleNo reproduction or networking permitted without license from
36、 IHS-,-,-At the time this recommended practice was completed, NPEC Subcommittee 3 had the following membership: Gopal Aravapalli George A. Ballassi John Beatty Tom Crawford Alireza Daneshpooy Rachel B. Gunnett Hamidreza R. Heidarisafa Sharon Honecker David A. Horvath Peter J. Kang Jacob Kulangara Ja
37、mes K. Liming Kirklyn Melson Joseph Napper James Parello Ted Riccio Mansoor H. Sanwarwalla Glen E. Schinzel Owen Scott Craig D. Sellers Barry Sloane John A. Stevens John H. Taylor Yvonne Williams Kiang Zee The following members of the individual balloting committee voted on this recommended practice
38、. Balloters may have voted for approval, disapproval, or abstention. William J. Ackerman Satish K. Aggarwal Stan Arnot George A. Ballassi Farouk D. Baxter Robert Beavers William Bloethe Wesley Bowers Daniel Brosnan Robert C. Carruth Suresh Channarasappa Garry Chapman Tom Crawford Alireza Daneshpooy
39、John Disosway Richard Doyle Gary Engmann Wells Fargo Stephen Fleger Robert J. Fletcher James Gleason Dale T. Goodney Ron Greenthaler Randall Groves Ajit Gwal Daryl Harmon Wolfgang Haverkamp Hamidreza R. Heidarisafa Werner Hoelzl David A. Horvath Randy Jamison Ronald Jarrett Paul Johnson James Jones
40、Chad Kiger Joseph L. Koepfinger Robert Konnik Harvey C. Leake Bruce Lory G. Luri Kimberly Mosley Michael S. Newman Iulian Profir Ted Riccio Bartien Sayogo Glen E. Schinzel Gil Shultz James Smith Robert Stark Gary Stoedter S. Thamilarasan James Thompson John Vergis Yvonne Williams Paul Yanosy David J
41、. Zaprazny vii Copyright 2010 IEEE. All rights reserved. Copyright The Institute of Electrical and Electronics Engineers, Inc. Provided by IHS under license with IEEENot for ResaleNo reproduction or networking permitted without license from IHS-,-,-When the IEEE-SA Standards Board approved this reco
42、mmended practice on 17 June 2010, it had the following membership: Robert M. Grow, Chair Richard H. Hulett, Vice Chair Steve M. Mills, Past Chair Judith Gorman, Secretary Karen Bartleson Victor Berman Ted Burse Clint Chaplin Andy Drozd Alexander Gelman Jim Hughes Young Kyun Kim Joseph L. Koepfinger*
43、 John Kulick David J. Law Hung Ling Oleg Logvinov Ted Olsen Ronald C. Petersen Thomas Prevost Jon Walter Rosdahl Sam Sciacca Mike Seavey Curtis Siller Don Wright *Member Emeritus Also included are the following nonvoting IEEE-SA Standards Board liaisons: Satish K. Aggarwal, NRC Representative Richar
44、d DeBlasio, DOE Representative Michael Janezic, NIST Representative Michelle Turner IEEE Standards Program Manager, Document Development Matthew J. Ceglia IEEE Standards Program Manager, Technical Program Development viii Copyright 2010 IEEE. All rights reserved. Copyright The Institute of Electrica
45、l and Electronics Engineers, Inc. Provided by IHS under license with IEEENot for ResaleNo reproduction or networking permitted without license from IHS-,-,-Contents 1. Overview 1 1.1 Scope . 1 1.2 Purpose 1 1.3 Applicability 2 1.4 Responsibility 2 2. Normative references 2 3. Definitions 3 4. Genera
46、l considerations for initial construction, modification, and maintenance 3 4.1 General 3 4.2 Configuration management . 4 4.3 Planning. 4 4.4 Closeout tracking. 5 4.5 Procedures . 5 4.6 Measuring and test equipment . 6 4.7 Personnel qualification 6 4.8 Test data evaluation . 6 4.9 Results . 6 4.10 N
47、onconforming items 6 4.11 Records 6 5. Pre-installation constructability review 7 6. Installation/construction . 7 6.1 Equipment placement 7 6.2 Engineering procedures and specifications 7 6.3 Verification during installation 8 6.4 Post-installation inspections 8 6.5 Inspections of temporary conditi
48、ons 9 7. Testing 9 7.1 General 9 7.2 Material source testing. 9 7.3 Electrical tests 9 7.4 Radiation and chemical tests . 10 7.5 Mechanical tests 10 7.6 Equipment tests 10 7.7 System tests . 11 7.8 Post-modification/maintenance testing plan (PMTP) 11 8. Supplementary provisions for multi-unit facili
49、ties . 12 8.1 General 12 8.2 Planning and preparation . 12 8.3 Work tagging considerations . 12 8.4 Protection of existing unit(s) . 12 8.5 Common area caution 12 Annex A (informative) Bibliography . 13 ix Copyright 2010 IEEE. All rights reserved. Copyright The Institute of Electrical and Electronics Engineers, Inc. Provided by IHS under license wit
