ANSI IEEE 930-2004 Guide for the Statistical Analysis of Electrical Insulation Breakdown Data.pdf

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1、 INTERNATIONAL STANDARD IEC62539First edition2007-07IEEE 930Guide for the statistical analysis of electrical insulation breakdown data Reference number IEC 62539(E):2007 IEEE Std 930-2004 Guide for the statistical analysis of electrical insulation breakdown data INTERNATIONAL STANDARD IEC62539First

2、edition2007-07IEEE 930Commission Electrotechnique InternationaleInternational Electrotechnical Commission THIS PUBLICATION IS COPYRIGHT PROTECTED Copyright 2007 IEEE All rights reserved. IEEE is a registered trademark in the U.S. Patent any IEC National Committee interested in the subject dealt with

3、 may participate in this preparatory work. International, governmental and non-governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely with the International Organization for Standardization (ISO) in accordance with conditions determined by agr

4、eement between the two organizations. 2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international consensus of opinion on the relevant subjects since each technical committee has representation from all interested IEC National Committees. 3) IEC

5、 Publications have the form of recommendations for international use and are accepted by IEC National Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC Publications is accurate, IEC cannot be held responsible for the way in which they are use

6、d or for any misinterpretation by any end user. 4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications transparently to the maximum extent possible in their national and regional publications. Any divergence between any IEC Publication and the co

7、rresponding national or regional publication shall be clearly indicated in the latter. 5) IEC provides no marking procedure to indicate its approval and cannot be rendered responsible for any equipment declared to be in conformity with an IEC Publication. 6) Attention is drawn to the possibility tha

8、t some of the elements of this IEC Publication may be the subject of patent rights. IEC shall not be held responsible for identifying any or all such patent rights. International Standard IEC/IEEE 62539 has been processed through Technical Committee 112: Evaluation and qualification of electrical in

9、sulating materials and systems. The text of this standard is based on the following documents: IEEE Std FDIS Report on voting 930 (2004) 112/59/FDIS 112/69A/RVD Full information on the voting for the approval of this standard can be found in the report on voting indicated in the above table. The com

10、mittee has decided that the contents of this publication will remain unchanged until the maintenance result date indicated on the IEC web site under “http:/webstore.iec.ch“ in the data related to the specific publication. At this date, the publication will be reconfirmed, withdrawn, replaced by a re

11、vised edition, or amended. Published by IEC under licence from IEEE. 2004 IEEE. All rights reserved. IEC 62539:2007(E)IEEE 930-2004(E) 4 IEC/IEEE Dual Logo International Standards This Dual Logo International Standard is the result of an agreement between the IEC and the Institute of Electrical and

12、Electronics Engineers, Inc. (IEEE). The original IEEE Standard was submitted to the IEC for consideration under the agreement, and the resulting IEC/IEEE Dual Logo International Standard has been published in accordance with the ISO/IEC Directives. IEEE Standards documents are developed within the I

13、EEE Societies and the Standards Coordinating Committees of the IEEE Standards Association (IEEE-SA) Standards Board. The IEEE develops its standards through a consensus development process, approved by the American National Standards Institute, which brings together volunteers representing varied vi

14、ewpoints and interests to achieve the final product. Volunteers are not necessarily members of the Institute and serve without compensation. While the IEEE administers the process and establishes rules to promote fairness in the consensus development process, the IEEE does not independently evaluate

15、, test, or verify the accuracy of any of the information contained in its standards. Use of an IEC/IEEE Dual Logo International Standard is wholly voluntary. The IEC and IEEE disclaim liability for any personal injury, property or other damage, of any nature whatsoever, whether special, indirect, co

16、nsequential, or compensatory, directly or indirectly resulting from the publication, use of, or reliance upon this, or any other IEC or IEEE Standard document. The IEC and IEEE do not warrant or represent the accuracy or content of the material contained herein, and expressly disclaim any express or

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18、 International Standard does not imply that there are no other ways to produce, test, measure, purchase, market, or provide other goods and services related to the scope of the IEC/IEEE Dual Logo International Standard. Furthermore, the viewpoint expressed at the time a standard is approved and issu

19、ed is subject to change brought about through developments in the state of the art and comments received from users of the standard. Every IEEE Standard is subjected to review at least every five years for revision or reaffirmation. When a document is more than five years old and has not been reaffi

20、rmed, it is reasonable to conclude that its contents, although still of some value, do not wholly reflect the present state of the art. Users are cautioned to check to determine that they have the latest edition of any IEEE Standard. In publishing and making this document available, the IEC and IEEE

21、 are not suggesting or rendering professional or other services for, or on behalf of, any person or entity. Neither the IEC nor IEEE is undertaking to perform any duty owed by any other person or entity to another. Any person utilizing this, and any other IEC/IEEE Dual Logo International Standards o

22、r IEEE Standards document, should rely upon the advice of a competent professional in determining the exercise of reasonable care in any given circumstances. Interpretations Occasionally questions may arise regarding the meaning of portions of standards as they relate to specific applications. When

23、the need for interpretations is brought to the attention of IEEE, the Institute will initiate action to prepare appropriate responses. Since IEEE Standards represent a consensus of concerned interests, it is important to ensure that any interpretation has also received the concurrence of a balance o

24、f interests. For this reason, IEEE and the members of its societies and Standards Coordinating Committees are not able to provide an instant response to interpretation requests except in those cases where the matter has previously received formal consideration. Comments for revision of IEC/IEEE Dual

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26、or interpretations should be addressed to: Secretary, IEEE-SA Standards Board, 445 Hoes Lane, P.O. Box 1331, Piscataway, NJ 08855-1331, USA and/or General Secretary, IEC, 3, rue de Varemb, PO Box 131, 1211 Geneva 20, Switzerland. Authorization to photocopy portions of any individual standard for int

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28、 MA 01923 USA; +1 978 750 8400. Permission to photocopy portions of any individual standard for educational classroom use can also be obtained through the Copyright Clearance Center. NOTE Attention is called to the possibility that implementation of this standard may require use of subject matter co

29、vered by patent rights. By publication of this standard, no position is taken with respect to the existence or validity of any patent rights in connection therewith. The IEEE shall not be responsible for identifying patents for which a license may be required by an IEEE standard or for conducting in

30、quiries into the legal validity or scope of those patents that are brought to its attention. Published by IEC under licence from IEEE. 2004 IEEE. All rights reserved. IEC 62539:2007(E)IEEE 930-2004(E) 5 IEEE Guide for the Statistical Analysis of Electrical Insulation Breakdown Data SponsorStatistica

31、l Technical Committeeof theIEEE Dielectrics and Electrical Insulation SocietyApproved 29 March 2005American National Standards InstituteApproved 23 September 2004IEEE-SA Standards BoardAbstract: This guide describes, with examples, statistical methods to analyze times to break downand breakdown volt

32、age data obtained from electrical testing of solid insulating materials, forpurposes including characterization of the system, comparison with another insulator system, andprediction of the probability of breakdown at given times or voltages.Keywords: breakdown voltage and time, Gumbel, Lognormal di

33、stributions, statistical methods,statistical confidence limits, WeibullPublished by IEC under licence from IEEE. 2004 IEEE. All rights reserved. IEC 62539:2007(E)IEEE 930-2004(E) 6 IEEE IntroductionEndurance and strength of insulation systems and materials subjected to electrical stress may be teste

34、d usingconstant stress tests in which times to breakdown are measured for a number of test specimens, andprogressive stress tests in which breakdown voltages may be measured. In either case it will be found that adifferent result is obtained for each specimen and that, for given test conditions, the

35、 data obtained may berepresented by a statistical distribution. Failure of solid insulation can be mostly described by extreme-value statistics, such as the Weibull andGumbel distributions, but, historically, also the lognormal function has been used. Methods for determiningwhether data fit to eithe

36、r of these distributions, graphical and computer-based techniques for estimating themost likely parameters of the distributions, computer-based techniques for estimating statistical confidenceintervals, and techniques for comparing data sets and some case studies are addressed in this guide.Notice t

37、o usersErrataErrata, if any, for this and all other standards can be accessed at the following URL: http:/standards.ieee.org/reading/ieee/updates/errata/index.html. Users are encouraged to check this URL forerrata periodically.InterpretationsCurrent interpretations can be accessed at the following U

38、RL: http:/standards.ieee.org/reading/ieee/interp/index.html.PatentsAttention is called to the possibility that implementation of this standard may require use of subject mattercovered by patent rights. By publication of this standard, no position is taken with respect to the existence orvalidity of

39、any patent rights in connection therewith. The IEEE shall not be responsible for identifyingpatents or patent applications for which a license may be required to implement an IEEE standard or forconducting inquiries into the legal validity or scope of those patents that are brought to its attention.

40、This introduction in not part of IEEE Std 930-2004, IEEE Guide for the Statistical Analysis of Electrical InsulationBreakdown Data.Published by IEC under licence from IEEE. 2004 IEEE. All rights reserved. IEC 62539:2007(E)IEEE 930-2004(E) 7 GUIDE FOR THE STATISTICALANALYSIS OF ELECTRICAL INSULATIONB

41、REAKDOWN DATA1. ScopeElectrical insulation systems and materials may be tested using constant stress tests in which times to break-down are measured for a number of test specimens, and progressive stress tests in which breakdownvoltages may be measured. In either case, it will be found that a differ

42、ent result is obtained for each speci-men and that, for given test conditions, the data obtained may be represented by a statistical distribution.This guide describes, with examples, statistical methods to analyze such data.The purpose of this guide is to define statistical methods to analyze times

43、to breakdown and breakdownvoltage data obtained from electrical testing of solid insulating materials, for purposes includingcharacterization of the system, comparison with another insulator system, and prediction of the probabilityof breakdown at given times or voltages.Methods are given for analyz

44、ing complete data sets and also censored data sets in which not all the speci-mens broke down. The guide includes methods, with examples, for determining whether the data is a goodfit to the distribution, graphical and computer-based techniques for estimating the most likely parameters ofthe distrib

45、ution, computer-based techniques for estimating statistical confidence intervals, and techniquesfor comparing data sets and some case studies. The methods of analysis are fully described for the Weibulldistribution. Some methods are also presented for the Gumbel and lognormal distributions. All the

46、examplesof computer-based techniques used in this guide may be downloaded from the following web site “http:/grouper.ieee.org/groups/930/IEEEGuide.xls.” Methods to ascertain the short time withstand voltage or oper-ating voltage of an insulation system are not presented in this guide. Mathematical t

47、echniques contained inthis guide may not apply directly to the estimation of equipment life.2. ReferencesThe following publications may be used when applicable in conjunction with this guide. When the followingstandards are superseded by an approved revision, the revision shall apply.ASTM D149-97a(2

48、004) Standard Test Method for Dielectric Breakdown Voltage and Dielectric Strength ofSolid Electrical Insulating Materials at Commercial Power Frequencies.11ASTM publications are available from the American Society for Testing and Materials, 100 Barr Harbor Drive, West Conshohocken,PA 19428-2959, US

49、A (http:/www.astm.org/). Published by IEC under licence from IEEE. 2004 IEEE. All rights reserved. IEC 62539:2007(E)IEEE 930-2004(E) 8 BS 2918-2, Methods of test for electric strength of solid insulating materials.2IEC 60243 series, Electrical strength of insulating materialsTest MethodsPart 1: Tests at power frequencies.33. Steps required for analysis of breakdown data3.1 Data acquisition3.1.1 Commonly used testing techniquesThere are two commonly used breakdown tests for electrical insulation: constant stress

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