1、 IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML Sponsored by the IEEE Standards Coordinating Committee 20 on Test and Diagnosis for Electronic Systems IEEE 3 Park Avenue New York, NY 10016-5997 USA 20 January 2011 IEEE Sta
2、ndards Coordinating Committee 20 IEEE Std 1671-2010(Revision ofIEEE Std 1671-2006) IEEE Std 1671-2010 (Revision of IEEE Std 1671-2006) IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML Sponsor IEEE Standards Coordinating Comm
3、ittee 20 on Test and Diagnosis for Electronic Systems Approved 30 September 2010 IEEE-SA Standards Board Approved 19 July 2011 American National Standards Institute Abstract: This document specifies a framework for the automatic test markup language (ATML) family of standards. ATML allows automatic
4、test system (ATS) and test information to be exchanged in a common format adhering to the extensible markup language (XML) standard. Keywords: ATE description, ATE test results, ATML, ATS, automatic test equipment, automatic test markup language, automatic test system, interface test adapter, ITA, S
5、I, synthetic instrumentation, test configuration, unit under test, UUT description, UUT maintenance, XML instance document, XML schemaThe Institute of Electrical and Electronics Engineers, Inc. 3 Park Avenue, New York, NY 10016-5997, USA Copyright 2011 by the Institute of Electrical and Electronics
6、Engineers, Inc. All rights reserved. Published 20 January 2011. Printed in the United States of America. IEEE is a registered trademark in the U.S. Patent +1 978 750 8400. Permission to photocopy portions of any individual standard for educational classroom use can also be obtained through the Copyr
7、ight Clearance Center. iv Copyright 2011 IEEE. All rights reserved. Introduction This introduction is not part of IEEE Std 1671-2010, IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML. Historical background In 2002, an automa
8、tic test markup language (ATML) focus group was formed (outside any formal standardization body) with a mission to “define a collection of XML extensible markup language schemas that allows ATE automatic test equipment and test information to be exchanged in a common format adhering to the XML stand
9、ard.” The scope of this effort was the standardization of test information, which would allow for test program (TP) and test asset interoperability, as well as unit under test (UUT) data (including results and diagnostics), to be interchanged between heterogeneous ATE systems. In 2004, the efforts o
10、f the focus group were brought into IEEE Standards Coordinating Committee 20 (SCC20), where the formal standardization process has taken place. Further refinements and updates to the work accomplished by the ATML focus group has (and continues to) take place within both the ATML focus group and IEEE
11、 SCC20. IEEE 1671 ATML family of standards The ATML family of standards supports TP, test asset, and UUT interoperability within an automatic test environment. This document provides an overview of the ATML goals, defines the ATML framework, defines the ATML family of standards, and specifies common
12、 ATML data elements, and common ATML schemas. Notice to users Laws and regulations Users of these documents should consult all applicable laws and regulations. Compliance with the provisions of this standard does not imply compliance to any applicable regulatory requirements. Implementers of the sta
13、ndard are responsible for observing or referring to the applicable regulatory requirements. IEEE does not, by the publication of its standards, intend to urge action that is not in compliance with applicable laws, and these documents may not be construed as doing so. v Copyright 2011 IEEE. All right
14、s reserved. Copyrights This document is copyrighted by the IEEE. It is made available for a wide variety of both public and private uses. These include both use, by reference, in laws and regulations, and use in private self-regulation, standardization, and the promotion of engineering practices and
15、 methods. By making this document available for use and adoption by public authorities and private users, the IEEE does not waive any rights in copyright to this document. Updating of IEEE documents Users of IEEE standards should be aware that these documents may be superseded at any time by the iss
16、uance of new editions or may be amended from time to time through the issuance of amendments, corrigenda, or errata. An official IEEE document at any point in time consists of the current edition of the document together with any amendments, corrigenda, or errata then in effect. In order to determin
17、e whether a given document is the current edition and whether it has been amended through the issuance of amendments, corrigenda, or errata, visit the IEEE Standards Association Web site at http:/ieeexplore.ieee.org/xpl/standards.jsp, or contact the IEEE at the address listed previously. For more in
18、formation about the IEEE Standards Association or the IEEE standards development process, visit the IEEE-SA Web site at http:/standards.ieee.org. Errata Errata, if any, for this and all other standards can be accessed at the following URL: http:/standards.ieee.org/reading/ieee/updates/errata/index.h
19、tml. Users are encouraged to check this URL for errata periodically. Interpretations Current interpretations can be accessed at the following URL: http:/standards.ieee.org/reading/ieee/interp/ index.html. Patents Attention is called to the possibility that implementation of this standard may require
20、 use of subject matter covered by patent rights. By publication of this standard, no position is taken with respect to the existence or validity of any patent rights in connection therewith. The IEEE is not responsible for identifying Essential Patent Claims for which a license may be required, for
21、conducting inquiries into the legal validity or scope of Patents Claims or determining whether any licensing terms or conditions provided in connection with submission of a Letter of Assurance, if any, or in any licensing agreements are reasonable or nondiscriminatory. Users of this standard are exp
22、ressly advised that determination of the validity of any patent rights, and the risk of infringement of such rights, is entirely their own responsibility. Further information may be obtained from the IEEE Standards Association. vi Copyright 2011 IEEE. All rights reserved. Participants The following
23、Test Information Integration (TII) Subcommittee members contributed to the development and preparation of this standard: Chris Gorringe, Co-Chair Teresa Lopes, Co-Chair Anthony Alwardt Malcolm Brown Matt Conrish Timothy W. Davis Robert Fox Jose Gonzalez Michelle Harris Ashley Hulme Anand Jain Ion Ne
24、ag Dan Pleasant William Ross Mike Seavey Dave Sharone Ronald Taylor The following member of the individual balloting committee voted on this standard. Balloters may have voted for approval, disapproval, or abstention. Stephen Allen Anthony Alwardt H. Stephen Berger Malcom Brown Keith Chow David Dros
25、te James Dumser Sourav Dutta Anthony Geneva Chris Gorringe Randall Groves Werner Hoelzl Ashley Hulme Anand Jain Adam Ley Teresa Lopes Robert Mcgarvey Mukund Modi Ion Neag Leslie Orlidge Gordon Robinson David Rohacek Bartien Sayogo Mike Seavey John Sheppard Gil Shultz Joseph Stanco Walter Struppler R
26、onald Taylor Timothy Wilmering Oren Yuen When the IEEE-SA Standards Board approved this standard on 30 September 2010, it had the following membership: Robert M. Grow, Chair Richard H. Hulett, Vice Chair Steve M. Mills, Past Chair Judith Gorman, Secretary Karen Bartleson Victor Berman Ted Burse Clin
27、t Chaplin Andy Drozd Alexander Gelman Jim Hughes Young Kyun Kim Joseph L. Koepfinger* John Kulick David J. Law Hung Ling Oleg Logvinov Ted Olsen Ronald C. Petersen Thomas Prevost Jon Walter Rosdahl Sam Sciacca Mike Seavey Curtis Siller Don Wright *Member Emeritus Also included are the following nonv
28、oting IEEE-SA Standards Board liaisons: Satish Aggarwal, NRC Representative Richard DeBlasio, DOE Representative Michael Janezic, NIST Representative Lisa Perry IEEE Standards Program Manager, Document Development Soo H. Kim IEEE Standards Program Manager, Technical Program Development Contents 1. O
29、verview 1 1.1 General 1 1.2 Scope . 2 1.3 Purpose 2 1.4 Application 3 1.5 Conventions used in this document . 4 2. Normative references 6 3. Definitions, acronyms, and abbreviations 7 3.1 Definitions . 7 3.2 Acronyms and abbreviations . 10 4. Automatic test system (ATS) architecture 12 4.1 Automatic
30、 test equipment (ATE) . 12 4.2 Test program set (TPS) 15 4.3 Automatic diagnosis and testing 18 5. Automatic test markup language (ATML) . 19 5.1 ATS architecture elements addressed by ATML . 20 6. The ATML framework . 22 6.1 External interfaces . 22 6.2 Internal models 23 6.3 Services 23 7. ATML sp
31、ecification techniques . 25 7.1 ATML common element partitioning 25 7.2 ATML XML schemas 28 7.3 XML schemas and their use in ATML 28 7.4 UML models 28 8. The ATML framework subdomains . 29 8.1 The ATML framework and ATML family component standards . 29 8.2 ATML subdomains 29 9. ATML XML schema names
32、 and locations . 36 10. ATML XML schema extensibility . 39 11. Conformance 40 11.1 ATML family XML schemas 40 11.2 The ATML framework 40 Annex A (normative) XML schema style guidelines . 46 A.1 Naming conventions . 46 A.2 XML declaration . 48 A.3 ATML namespaces . 48 A.4 Versioning 50 A.5 Documentat
33、ion 51 A.6 Design . 52 vii Copyright 2011 IEEE. All rights reserved. viii Copyright 2011 IEEE. All rights reserved. Annex B (normative) ATML common element schemas . 55 B.1 Common element schemaCommon.xsd 55 B.2 Common element schemaHardwareCommon.xsd .136 B.3 Common element schemaTestEquipment.xsd
34、.227 Annex C (normative) ATML internal model schemas 258 C.1 ATML internal model schemaCapabilities.xsd 258 C.2 ATML internal model schemaWireLists.xsd .260 Annex D (normative) ATML runtime services .267 D.1 Messages 267 D.2 Executive system service .267 D.3 Example WSDL service definition 268 Annex
35、 E (informative) Pins, ports, connectors, and wire lists in ATML 269 E.1 Introduction 269 E.2 Overview of the base types 270 E.3 Using ports, pins, and connectors together .273 E.4 Ports, pins, and capabilities 275 E.5 Wire lists 278 Annex F (informative) ATML capabilities 283 F.1 Introduction 283 F
36、.2 Overview 285 F.3 Describing instrument capabilities .289 F.4 Describing ATS capabilities .328 F.5 Capability information in ATML Test Description 332 Annex G (informative) IEEE download Web site material associated with this document 339 Annex H (informative) ATS architectures 340 H.1 ATS archite
37、ctures utilization of published standards .340 H.2 ATS architectural relationships to IEEE SCC20-based standards .343 H.3 ATS architectural ATML subdomain relationship to SIMICA standards .343 Annex I (informative) Architecture examples .347 I.1 Instruments 347 I.2 Test descriptions 348 I.3 Complete
38、 testing scenario .350 I.4 Integrated ATML system 363 Annex J (informative) UML models .367 J.1 Generic ATS testing of a UUT 367 J.2 ATML XML schema relationships .369 Annex K (informative) Glossary .372 Annex L (informative) Bibliography .375 IEEE Standard for Automatic Test Markup Language (ATML)
39、for Exchanging Automatic Test Equipment and Test Information via XML IMPORTANT NOTICE: This standard is not intended to ensure safety, security, health, or environmental protection. Implementers of the standard are responsible for determining appropriate safety, security, environmental, and health p
40、ractices or regulatory requirements. This IEEE document is made available for use subject to important notices and legal disclaimers. These notices and disclaimers appear in all publications containing this document and may be found under the heading “Important Notice” or “Important Notices and Disc
41、laimers Concerning IEEE Documents.” They can also be obtained on request from IEEE or viewed at http:/standards.ieee.org/IPR/disclaimers.html. 1. Overview 1.1 General Automatic test markup language (ATML) is a collection of IEEE standards and associated extensible markup language (XML) schemas that
42、allows automatic test system (ATS) and test information to be exchanged in a common format adhering to the XML standard.1The ATML framework and the ATML family of standards have been developed and are maintained under the guidance of the Test Information Integration (TII) Subcommittee of IEEE Standa
43、rds Coordinating Committee 20 (SCC20) to serve as a comprehensive environment for integrating design data, test strategies, test requirements, test procedures, test results management, and test system implementations, while allowing test program (TP), test asset interoperability, and unit under test
44、 (UUT) data to be interchanged between heterogeneous systems. 1This information is given for the convenience of users of this standard and does not constitute an endorsement by the IEEE of this consortium standard. Equivalent standards or products may be used if they can be shown to lead to the same
45、 results. 1 Copyright 2011 IEEE. All rights reserved. IEEE Std 1671-2010 IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML 1.1.1 ATML framework referenced IEEE standard The ATML framework can reference IEEE Std 1641 B29.2This
46、 referenced IEEE standard, when utilized, is then considered part of the ATML framework. 1.1.2 Application of this documents annexes This document includes twelve annexes. Of these twelve, four are normative (Annex A, Annex B, Annex C, and Annex D). Annex A contains style guidelines for the ATML fam
47、ily XML schemas. Annex A guidelines shall be followed by ATML XML schema developers and maintainers during the development and maintenance of all ATML family XML schemas, including the XML schemas associated with this document. Annex B contains XML schema element description and definitions for the
48、ATML common element XML schemas. Annex B shall be utilized by ATML XML schema developers, maintainers, and ATML users. Annex B shall be referenced during the development and maintenance of all ATML family XML schemas, including the XML schemas associated with this document. Annex C contains XML sche
49、ma element description and definitions for the ATML internal model XML schemas. Annex C shall be utilized by ATML XML schema developers, maintainers, and ATML users. Annex C shall be referenced during the creation and development of ATML Capabilities or ATML WireLists documents. Annex D contains guidelines for ATML services. Annex D shall be referenced by ATML users implementing an ATML framework. Annex E through Annex L are informative and thus are provided strictly as information for both users and maintainers of this document. 1.2 Scope ATML defines a stan
