1、IEEE Std C62.11-2005(Revision of IEEE Std C62.11-1999)IEEE Standard forMetal-Oxide Surge Arresters forAC Power Circuits ( 1 kV)I E E E3 Park Avenue New York, NY 10016-5997, USA22 March 2006IEEE Power Engineering SocietySponsored by theSurge Protective Devices CommitteeCopyright The Institute of Elec
2、trical and Electronics Engineers, Inc. Provided by IHS under license with IEEENot for ResaleNo reproduction or networking permitted without license from IHS-,-,-Copyright The Institute of Electrical and Electronics Engineers, Inc. Provided by IHS under license with IEEENot for ResaleNo reproduction
3、or networking permitted without license from IHS-,-,-Recognized as an IEEE Std C62.11-2005 American National Standard (ANSI) (Revision of IEEE Std C62.11-1999) IEEE Standard for Metal-Oxide Surge Arresters for AC Power Circuits ( 1 kV) Sponsor Surge Protective Devices Committee of the IEEE Power Eng
4、ineering Society Approved 29 December 2005 American National Standards Institute Approved 22 September 2005 IEEE-SA Standards Board Copyright The Institute of Electrical and Electronics Engineers, Inc. Provided by IHS under license with IEEENot for ResaleNo reproduction or networking permitted witho
5、ut license from IHS-,-,-Abstract: This standard applies to metal-oxide surge arresters (MOSAs) designed to repeatedly limit the voltage surges on 48 Hz to 62 Hz power circuits (1000 V) by passing surge discharge current and automatically limiting the flow of system power current. This standard appli
6、es to devices for separate mounting and to devices supplied integrally with other equipment. The tests demonstrate that an arrester can survive the rigors of reasonable environmental conditions and system phenomena while protecting equipment and/or the system from damaging overvoltages caused by lig
7、htning, switching, and other undesirable surges. Keywords: discharge current, discharge voltage, duty-cycle voltage rating, lightning protection, maximum continuous operating voltage, MCOV, metal-oxide surge arrester, MOSA, surge arrester, valve arrester _ The Institute of Electrical and Electronics
8、 Engineers, Inc. 3 Park Avenue, New York, NY 10016-5997, USA Copyright 2006 by the Institute of Electrical and Electronics Engineers, Inc. All rights reserved. Published 22 March 2006. Printed in the United States of America. IEEE is a registered trademark in the U.S. Patent +1 978 750 8400. Permiss
9、ion to photocopy portions of any individual standard for educational classroom use can also be obtained through the Copyright Clearance Center. Copyright The Institute of Electrical and Electronics Engineers, Inc. Provided by IHS under license with IEEENot for ResaleNo reproduction or networking per
10、mitted without license from IHS-,-,-iv Copyright 2006 IEEE. All rights reserved. This introduction is not part of IEEE Std C62.11-2005, IEEE Standard for Metal-Oxide Surge Arresters for AC Power Circuits ( 1 kV).Introduction Metal-oxide surge arresters (MOSAs) described in this standard represent th
11、e most predominant surge arrester technology applied on ac power systems above 1 kV. This standard presents minimum criteria for the testing of such surge arresters. Matters of application of this type of surge arrester are covered in IEEE Std C62.22-1997. Testing and application of older technology
12、 silicon carbide surge arresters are covered in IEEE Std C62.1 and ANSI Std C62.2-1987, respectively. For testing and application of surge protective devices for use in low-voltage circuits (1 kV and below), other standards in the C62 series are available. This revision of IEEE Std C62.11 contains t
13、he following significant changes from the previous revision: Addition of partial discharge (PD) test requirements and elimination of internal ionization voltage test Addition of accelerated aging test of polymer-housed arresters with exposure to salt fog Addition of moisture ingress test requirement
14、s for polymer-housed arresters combined with maximum design cantilever load (MDCL) test Split of discharge-current withstand tests clause into two separate clauses: high-current short-duration withstand test and low-current long-duration withstand test Restructure of design test clauses and subclaus
15、es to provide consistency of format Revision of Table 2 to provide more helpful references to design test clauses for different classes and types of arrester Addition of definitions for electrical unit, mechanical unit, PD, and prospective short-circuit current Replacement of the terms watts loss an
16、d watt loss with power loss to provide consistency throughout the standard Replacement of the term creepage with leakage to provide consistency throughout the standard Editorial changes to correct a variety of errors of previous revision Notice to users Errata Errata, if any, for this and all other
17、standards can be accessed at the following URL: http:/ standards.ieee.org/reading/ieee/updates/errata/index.html. Users are encouraged to check this URL for errata periodically. Interpretations Current interpretations can be accessed at the following URL: http:/standards.ieee.org/reading/ieee/interp
18、/ index.html. Copyright The Institute of Electrical and Electronics Engineers, Inc. Provided by IHS under license with IEEENot for ResaleNo reproduction or networking permitted without license from IHS-,-,-v Copyright 2006 IEEE. All rights reserved. Patents Attention is called to the possibility tha
19、t implementation of this standard may require use of subject matter covered by patent rights. By publication of this standard, no position is taken with respect to the existence or validity of any patent rights in connection therewith. The IEEE shall not be responsible for identifying patents or pat
20、ent applications for which a license may be required to implement an IEEE standard or for conducting inquiries into the legal validity or scope of those patents that are brought to its attention. Participants At the time this standard was completed, the 3.3.11 Working Group had the following members
21、hip: Michael G. Comber, Chair Larry Vogt, Vice-chair H. Steve Brewer James Case Michael Champagne John DuPont Steven P. Hensley Raymond Hill Volker Hinrichsen David W. Jackson Bengt Johnnerfelt Joseph L. Koepfinger Gerald E. Lee Dennis W. Lenk Jody Levine Paul Lindemulder Iuda Morar Joe Osterhout Jo
22、hn B. Posey Mike Ramarge Thomas Rozek Paul Schaffer John Stein Keith Stump Eva Tarasiewicz Ed Taylor Rao Thallam James Wilson Jon Woodworth The following members of the individual balloting committee voted on this standard. Balloters may have voted for approval, disapproval, or abstention. Roy Alexa
23、nder Thomas Blair Mark Bushnell James Case Michael Comber Tommy Cooper Jerry Corkran R. Daubert Guru Dutt Dhingra Randall Dotson Charles Drexler Dana Dufield Amir El-Sheikh Clifford C. Erven Thomas Field Ernie Gallo Manuel Gonzalez David Goodwin Randall Groves Jeffrey Hartenberger Steven P. Hensley
24、Raymond Hill Edward Horgan, Jr. Ronald Hotchkiss David W. Jackson Bengt Johnnerfelt Wilhelm Kapp Yuri Khersonsky Joseph L. Koepfinger Stephen R. Lambert Benny Lee Dennis W. Lenk Boyd Leuenberger Jody Levine Jason Lin Paul Lindemulder Allan Ludbrook William A. Maguire Michael Maytum John McDaniel Nig
25、el McQuin G. Michel Richard Moore Abdul Mousa Jeffrey Nelson Joe Nims Ken Nolan Joe Osterhout Paulette Payne Thomas Pekarek Ralph Philbrook III John B. Posey Timothy Royster Thomas Rozek James Ruggieri Surya Santoso H. Jin Sim John Stein Keith Stump Tony Surtees Eva Tarasiewicz Daniel Ward Steven Wh
26、isenant Jeff Williams James Wilson Jan ZawadzkiCopyright The Institute of Electrical and Electronics Engineers, Inc. Provided by IHS under license with IEEENot for ResaleNo reproduction or networking permitted without license from IHS-,-,-C62.11/D, 2005E P12335.333/D4, February 2222 vi Copyright 200
27、6 IEEE. All rights reserved. When the IEEE-SA Standards Board approved this standard on 22 September 2005, it had the following membership: Steve M. Mills, Chair Richard H. Hulett, Vice Chair Don Wright, Past Chair Judith Gorman, Secretary Mark D. Bowman Dennis B. Brophy Joseph Bruder Richard Cox Bo
28、b Davis Julian Forster* Joanna N. Guenin Mark S. Halpin Raymond Hapeman William B. Hopf Lowell G. Johnson Herman Koch Joseph L. Koepfinger* David J. Law Daleep C. Mohla Paul Nikolich T. W. Olsen Glenn Parsons Ronald C. Petersen Gary S. Robinson Frank Stone Malcolm V. Thaden Richard L. Townsend Joe D
29、. Watson Howard L. Wolfman *Member Emeritus Also included are the following nonvoting IEEE-SA Standards Board liaisons: Satish K. Aggarwal, NRC Representative Richard DeBlasio, DOE Representative Alan H. Cookson, NIST Representative Don Messina IEEE Standards Project Editor Copyright The Institute o
30、f Electrical and Electronics Engineers, Inc. Provided by IHS under license with IEEENot for ResaleNo reproduction or networking permitted without license from IHS-,-,-vii Copyright 2006 IEEE. All rights reserved. Contents 1. Scope 1 2. Normative references 1 3. Definitions 3 4. Service conditions 6
31、4.1 Usual service conditions 6 4.2 Unusual service conditions 6 5. Standard voltage ratings: duty-cycle voltage and maximum continuous operating voltage (MCOV) . 6 6. Performance characteristics and tests . 6 7. Test requirements . 6 7.1 Complete arrester test samples 6 7.2 Prorated section . 6 7.3
32、Test measurements 6 7.4 Impulse test-wave tolerances. 6 7.5 Power-frequency test voltages. 6 8. Design tests. 6 8.1 Arrester insulation withstand test 6 8.2 Power-frequency sparkover test. 6 8.3 Discharge-voltage characteristics test 6 8.4 Impulse protective level voltage-time characteristic test. 6
33、 8.5 Accelerated aging procedure . 6 8.6 Accelerated aging test of polymer-housed distribution arresters with exposure to light and electrical stress 6 8.7 Accelerated aging test of polymer-housed arresters with exposure to salt fog 6 8.8 Contamination test. 6 8.9 Distribution arrester seal integrit
34、y design test . 6 8.10 Radio-influence voltage (RIV) test 6 8.11 Partial discharge (PD) test . 6 8.12 High-current short-duration withstand test 6 8.13 Low-current long-duration withstand test 6 8.14 Duty-cycle test. 6 8.15 Temporary overvoltage (TOV) test . 6 8.16 Pressure-relief test for station a
35、nd intermediate arresters 6 8.17 Short-circuit test for porcelain-housed distribution arresters.6 8.18 Short-circuit test for polymer-housed distribution arresters 6 8.19 Failure mode test for liquid-immersed arresters 6 Copyright The Institute of Electrical and Electronics Engineers, Inc. Provided
36、by IHS under license with IEEENot for ResaleNo reproduction or networking permitted without license from IHS-,-,-viii Copyright 2006 IEEE. All rights reserved. 8.20 Deadfront arrester failure mode test 6 8.21 Distribution arrester disconnector test . 6 8.22 Maximum design cantilever load (MDCL) and
37、moisture ingress test for polymer-housed arresters . 6 8.23 Ultimate mechanical strength-static (UMS-static) test for porcelain-housed arresters 6 9. Conformance tests 6 9.1 Power-frequency sparkover test. 6 9.2 Front-of-wave impulse protective level. 6 9.3 Discharge-voltage test . 6 9.4 RIV test 6
38、10. Construction . 6 10.1 Identification data 6 10.2 Standard mountings . 6 10.3 Iron and steel parts. 6 10.4 Terminal connections. 6 10.5 Housing leakage distance 6 11. Protective characteristics 6 12. Certification test procedures for arresters applied to unit substations 6 12.1 General 6 12.2 Tes
39、ts. 6 12.3 Evaluation procedure. 6 12.4 Certification. 6 12.5 Production monitoring and product retest requirements 6 13. Routine tests . 6 13.1 Current sharing test 6 13.2 Discharge-voltage test . 6 13.3 PD test . 6 13.4 Seal test 6 13.5 Power-frequency test . 6 13.6 Power-frequency sparkover . 6 A
40、nnex A (informative) Basis for accelerated aging procedure. 6 Annex B (informative) Surge arrester classification prescribed test requirements. 6 Annex C (informative) Accelerated aging tests for polymer-housed arresters. 6 C.1 Samples. 6 C.2 Initial measurements . 6 C.3 Procedure 6 C.4 Evaluation .
41、 6 Copyright The Institute of Electrical and Electronics Engineers, Inc. Provided by IHS under license with IEEENot for ResaleNo reproduction or networking permitted without license from IHS-,-,-IEEE Standard for Metal-Oxide Surge Arresters for AC Power Circuits (1 kV) 1. 2. Scope This standard appl
42、ies to metal-oxide surge arresters (MOSAs) designed to repeatedly limit the voltage surges on 48 Hz to 62 Hz power circuits (1000 V) by passing surge discharge current and automatically limiting the flow of system power current. This standard applies to devices for separate mounting and to devices s
43、upplied integrally with other equipment. NOTEThese tests demonstrate that an arrester can survive the rigors of reasonable environmental conditions and system phenomena while protecting equipment and/or the system from damaging overvoltages caused by lightning, switching, and other undesirable surge
44、s.1Normative references The following referenced documents are indispensable for the application of this standard. For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments or corrigenda) applies. ANSI Std C3
45、7.42-1996, American National Standard for Switchgear-Distribution Cutouts and Fuse Links-Specifications.2ANSI Std C62.2-1987, Guide for the Application of Gapped Silicon-Carbide Surge Arresters for Alternating Current Systems. ANSI Std C84.1-1995 (Reaff 2001), American National Standard Voltage Rati
46、ngs for Electric Power Systems and Equipment (60 Hz). ASTM A153/153M-04, Specification for Zinc Coating (Hot-Dip) on Iron and Steel Hardware.31Notes in text, tables, and figures are given for information only and do not contain requirements needed to implement this standard. 2ANSI publications are a
47、vailable from the Sales Department, American National Standards Institute, 25 West 43rd Street, 4th Floor, New York, NY 10036, USA (http:/www.ansi.org). This particular standard is also available in the Circuit Breakers, Switchgear, Substations, Fuses Supplement Collection from the Institute of Elec
48、trical and Electronics Engineers, 445 Hoes Lane, Piscataway, NJ 08854, USA (http:/standards.ieee.org). 3ASTM publications are available from the American Society for Testing and Materials, 100 Barr Harbor Drive, West Conshohocken, PA 19428-2959, USA (http:/www.astm.org). 1 Copyright 2006 IEEE. All rights reserved. Copyright The Institute of Electrical and Electronics Engineers, Inc. Provided by IHS under license with IEEENot for ResaleNo reproduction or networking permitted without license from IHS-,-,-IEEE Std C62.11-2005 IEEE Standa
