1、 American National Standard Recommended Practice for the Immunity Measurement of Electrical and Electronic Equipment Accredited by the American National Standards Institute IEEE 3 Park Avenue New York, NY 10016-5997 USA Accredited Standards Committee C63Electromagnetic Compatibility ANSI C63.15-2017
2、 (Revision of ANSI C63.15-20106) C63ANSI C63.15-2017 (Revision of ANSI C63.15-2010) American National Standard Recommended Practice for the Immunity Measurement of Electrical and Electronic Equipment Accredited Standards Committee C63Electromagnetic Compatibility accredited by the American National
3、Standards Institute Secretariat Institute of Electrical and Electronics Engineers, Inc. Approved 13 July 2017 American National Standards Institute 2 Copyright 2018 IEEE. All rights reserved. Abstract: This immunity testing and test instrumentation specifications recommended practice complements the
4、 procedures for making emission measurements as specified in ANSI C63.4 and in ANSI C63.10. These immunity test methods can be of use to manufacturers who want to maximize product reliability and reduce customer complaints by improving the immunity of their products, beyond that required by applicab
5、le regulations, or by correcting problems experienced in deployment that are not related to regulatory requirements. This recommended practice generally covers the frequency range 30 Hz to 10 GHz. Keywords: ANSI C63.15, electromagnetic compatibility, EMC, immunity testing, RF immunity The Institute
6、of Electrical and Electronics Engineers, Inc. 3 Park Avenue, New York, NY 10016-5997, USA Copyright 2018 by The Institute of Electrical and Electronics Engineers, Inc. All rights reserved. Published 1 March 2018. Printed in the United States of America. C63 is a registered trademark in the U.S. Pate
7、nt (978) 750-8400. Permission to photocopy portions of any individual standard for educational classroom use can also be obtained through the Copyright Clearance Center. Errata Users are encouraged to check the IEEE Errata URL (http:/standards.ieee.org/findstds/errata/index.html), and the one for AS
8、C C63at (http:/www.c63.org/explanations_interpretations_request.htm), for errata periodically. Interpretations (ASC C63standards) Current interpretations are essential to the understanding of all ASC C63standards. To assist in the meanings of requirements, informative interpretations are available a
9、t the URL: (http:/www.c63.org/ standards_development.htm). Users are cautioned that although interpretations do not and cannot change the requirements of a standard, they serve to clarify the meanings of requirements. All interpretations are informative rather than normative, until such time as the
10、standard is revised (consistent with ASC C63ANSI-accredited operating procedures) to incorporate the interpretation as a normative requirement. 4 Copyright 2018 IEEE. All rights reserved. Participants At the time this recommended practice was completed, the Accredited Standards Committee C63Electrom
11、agnetic Compatibility had the following membership: Daniel Hoolihan, Chair Dan Sigouin, Vice Chair Jerry Ramie, Secretary Sue Vogel, Secretariat Organization Represented Name of Representative American Council of Independent Laboratories (ACIL) . Richard Reitz American Radio Relay League (ARRL) Edwa
12、rd F. Hare . Kermit Carlson (Alt.) Apple, Inc. . Jyun-cheng Chen Michael ODwyer (Alt.) Bay Area Compliance Laboratories Corporation . Harry H. Hodes . Lisa Tang (Alt.) Bureau Veritas . Jonathan Stewart . Yunus Faziloglu (Alt.) Cisco Systems . Andy Griffin Dave Case (Alt.) Dell Inc. . Richard Worley
13、Element Materials Technology . Greg Kiemel Jeremiah Darden (Alt.) Ericsson AB Vladimir Bazhanov . Kenth Skoglund (Alt.) ETS-Lindgren Zhong Chen . Doug Kramer (Alt.) Federal Communications Commission (FCC) Steve Jones Food and Drug Administration (FDA) Jeffrey L. Silberberg Donald M. Witters (Alt.) H
14、earing Industries Association John Becker . Dave Preves (Alt.) Innovation, Science and Economic Development (ISED) Canada . Jason Nixon . Horia Popovici (Alt.) Information Technology Industry Council (ITIC) John Hirvela . Joshua Rosenberg (Alt.) IEEE Electromagnetic Compatibility Society (EMCS) John
15、 Norgard Henry Benitez (Alt.) Liberty Labs Mike Howard . Nate Potts (Alt.) Motorola Solutions, Inc. Deanna Zakharia Sze Khian Ho (Alt) National Institute of Standards and Technology (NIST) . William Young Jason Coder (Alt.) Nokia Dheena Moongilan PCTEST Engineering Laboratory Greg Snyder Dennis Ward
16、 (Alt.) Qualcomm Technologies, Inc. John Forrester Mark Klerer (Alt.) Society of Automotive Engineers (SAE) Rick Lombardi Poul Andersen (Alt.) Telecommunication Certification Body (TCB) Council Art Wall William Stumpf (Alt.) TV SD America, Inc. David Schaefer . William (Mac) Elliott (Alt.) Underwrit
17、ers Laboratories (UL) LLC . Robert DeLisi . Jeffrey Moser (Alt.) 5 Copyright 2018 IEEE. All rights reserved. U.S. Department of DefenseJoint Spectrum Center . Marcus Shellman Michael Duncanson (Alt.) U.S. Department of the NavySPAWAR . Chris Dilay . Tomasz Wojtaszek (Alt.) Individual Members . H. St
18、ephen Berger . Donald N. Heirman Daniel Hoolihan . John Lichtig Werner Schaefer . Dan Sigouin Dave Zimmerman Members Emeritus Warren Kesselman . Herbert Mertel H. R. (Bob) Hofmann At the time this recommended practice was completed, ASC C63Subcommittee 5 had the following membership: Ed Hare, Chair
19、Steve Whitesell, Vice Chair Jerry Ramie, Secretary H. Stephen Berger Craig Fanning Andy Griffin Donald N. Heirman Daniel Hoolihan Rick Lombardi Randy Long Dave Schaefer Jeffrey L. Silberberg Dave Zimmerman During the development of this recommended practice, the ASC C63SC-5 Project Working Group had
20、 the following membership: Donald N. Heirman, Chair Dave Zimmerman, Vice Chair Jerry Ramie, Secretary Tim Harrington, Technical Editor Allen Crumm Harry H. Hodes Rick Lombardi Jeffrey L. Silberberg Mark Terrien Derek Walton Steve Whitesell 6 Copyright 2018 IEEE. All rights reserved. Introduction Thi
21、s introduction is not part of ANSI C63.15-2017, American National StandardRecommended Practice for the Immunity Measurement of Electrical and Electronic Equipment. Background of ASC C63activity in preparing immunity standards TV immunity in the early 1980s In the early 1980s, television (TV) sets re
22、ceived their signals only over the air because cable and satellite reception were not available. The tuners had only limited shielding, if any. Radio-frequency signals from a variety of sources outside the TV bands interfered with TV reception. In 1982, legislation was passed by the U.S. Congress an
23、d President Reagan (Public Law 97-259) giving the Federal Communications Commission (FCC) the authority to require that home electronics equipment would have to meet radio-frequency interference susceptibility standards. This stemmed from the work at the time of Senator Barry Goldwater and House Rep
24、resentative Charles Vanik. Senator Goldwater was himself an amateur radio operator and certainly aware of the need for immunity of home electronics, especially to licensed broadcasters using frequencies outside of the TV bands. At the time, ASC C63was asked by the FCC to work with the Electronics In
25、dustry Association (EIA) to see if there were ways for manufacturers to add immunity to TVs so as not to require FCC regulations. A task force in ASC C63Subcommittee 1 was set up to address this matter. After extensive discussions, the TV industry came up with designs that significantly increased th
26、e immunity of TVs to out-of-band signals. This was one of the first times that the voluntary standards community helped to solve a problem, thus precluding the need for regulations. ASC C63commences immunity standards work The above background served to set the stage for the interest in ASC C63to co
27、nsider preparing immunity standard test methods. As such, the project was approved in Subcommittee 1 in the 1980s, for an addition to ANSI C63.4 for measurement methods, and an addition to ANSI C63.2 for measurement instrumentation. These would eventually be removed as additions of ANSI C63.4 and AN
28、SI C63.2 and made into ANSI C63.15 solely covering immunity. Don Heirman was named as the chairman of the WG on Immunity with the assistance of Ray Magnuson. A ballot was then taken of the work in 1983. The ballot had many comments but, more importantly, eight negative votes. Work then proceeded to
29、resolve the comments. Bill Hayes took over the measurement instrumentation portion of the task at that time. In parallel there was also major activity in immunity test methods starting by the International Electrotechnical Commission (IEC). This required decisions on how to proceed with the work of
30、ASC C63. The outcome was that the ASC C63work on immunity was stalled for several years. However, the WG did contribute in this timeframe to the military work on commercial off-the-shelf procurements, as well as immunity text for ANSI C63.12 in the mid-1990s. Further revisions were made to the ASC C
31、63draft during this time, headed by Steve Bloom, but at a slow rate because the work in the IEC was gaining speed. Draft standard renamed to ANSI C63.15 draft The Subcommittee 1 projects were called project 1-1.1 (Immunity measurement methods) and project 1-1.3 (Immunity instrumentation) for develop
32、ment of the overall standard. The projects were combined into one document and given the number C63.15 as early as 1999. In early 2000, another draft was ready for ballot; the C63.15 number was continued. The ballot was taken and the document still failed to get sufficient approval votes. At that ti
33、me, Herb Mertel assumed the WG chairmanship, working to prepare another draft, taking into account the comments that would require extensive changes to the draft standard. By 2003, it 7 Copyright 2018 IEEE. All rights reserved. was identified as a recommended practice. In 2004, Mike Windler took ove
34、r the task of editing the document. The ballot again failed in 2005 with substantial negative comments. At that time the project was shifted to Subcommittee 5 because that subcommittee deals with immunity standards with its genesis to handle the TV interference issue as noted above. In 2006, a ballo
35、t was taken and that time it passed in the parent committee. The final editing was completed in Fall 2008, with ANSI and IEEE processing completed for publication in 2010. After publication in 2010, a working group was assembled to update the material and to include more on automotive immunity testi
36、ng as well as an additional quasi-static test among other new material. The results of this work are contained in this edition of the document. The major additions and modifications are listed as follows: a) Automotive immunity testing; conducted testing is in 5.10 and 5.11, radiated testing is in 6
37、.9 and 6.10 b) Immunity to nearby RF wireless communications equipment (proximity fields), in 6.7 c) Quasi-static immunity testing; the test method is in 6.8 d) More complete specification of the contents of the evaluation (test) report (Clause 7) e) An annex (i.e., Annex C) identifying applicable i
38、nformation sources by standard, clause, figure, and table Acknowledgments The Working Group thanks the International Electrotechnical Commission (IEC) for permission to reproduce Information from its International Standards IEC 60601-1-2:2007, IEC 60601-4-2:2016, IEC 61000-4-4:2012, IEC 61000-4-5:20
39、14, and IEC 61000-6-1:2005. All such extracts are copyright of IEC, Geneva, Switzerland. All rights reserved. Further information on the IEC is available from www.iec.ch. IEC has no responsibility for the placement and context in which the extracts and contents are reproduced by the author, nor is I
40、EC in any way responsible for the other content or accuracy therein. Grateful acknowledgment is made to the International Standardization Organization for permission to reprint and modify material from ISO 7637-2:2004, ISO 7637-2:2011, and ISO 16750-2:2012. Grateful acknowledgment is made to the Soc
41、iety for Automotive Engineers for permission to reprint and modify material from SAE J1113-22:2003 and SAE J1113-26:2014. 8 Copyright 2018 IEEE. All rights reserved. Contents 1. Overview 9 2. References 10 3. Definitions, acronyms, and abbreviations 13 3.1 Definitions . 13 3.2 Acronyms and abbreviat
42、ions . 15 4. General considerations . 17 4.1 Safety precautions 17 4.2 Measurement tolerances 17 4.3 Input power requirements 17 4.4 Step size and dwell time 17 5. Conducted immunity 18 5.1 General 18 5.2 Power-line immunity, 30 Hz to 150 kHz . 19 5.3 Conducted RF immunity on power and I/O (signal)
43、lines . 19 5.4 Communications receiver antenna input immunity (receivers other than broadcast), 30 Hz to 10 GHz 24 5.5 Receiver antenna input immunity for TVs and VCRs, 0.5 MHz to 30 MHz . 27 5.6 Power/interconnection-line surge voltage immunity . 27 5.7 Electrical fast transient/burst immunity . 28
44、 5.8 Telecommunications terminal equipment line voice band line immunity, 10 kHz to 30 MHz 29 5.9 Telecommunications telephone terminal equipment, immunity requirements for equipment having an acoustic output, 150 kHz to 30 MHz . 32 5.10 Electrical disturbance by conduction for road vehiclestransien
45、t immunity test . 33 5.11 Environmental conditions and testing for electrical and electronic equipment for automotive testingElectrical loads 40 6. Radiated immunity . 45 6.1 Uniform magnetic field immunity, Helmholtz coil, 30 Hz to 100 kHz . 45 6.2 Magnetic field immunity, point source, 30 Hz to 10
46、0 kHz 46 6.3 Power-frequency magnetic induction field 47 6.4 Spike-inductive fields immunity 48 6.5 Electric field immunity in a TEM cell, 10 kHz to 80 MHz . 50 6.6 Electric field immunity, 80 MHz to 10 GHz . 50 6.7 Electric field immunity, proximity fields from RF wireless communications equipment
47、. 51 6.8 Quasi-static electric field immunity test 53 6.9 Magnetic field test for automobiles . 54 6.10 Fields from overhead power lines 60 7. Evaluation reports . 63 Annex A (informative) Immunity testing tutorial . 65 Annex B (informative) Recommended test equipment for test methods where test pro
48、cedure is in a referenced document 76 Annex C (informative) Cross-references 85 9 Copyright 2018 IEEE. All rights reserved. American National Standard Recommended Practice for the Immunity Measurement of Electrical and Electronic Equipment 1. Overview This recommended practice is intended to: a) Ide
49、ntify preferred or optional immunity test methods b) Describe specific measurement techniques c) Suggest product performance criteria as applicable to general and specific products d) Identify test instrumentation specifications Wherever possible, existing voluntary standards are used and summarized. It should be noted that the techniques listed herein should in no way limit the user to a particular method to increase product immunity. The immunity levels in this document are recommendations. Should product classifications and types have other
