1、ANSI INCITS 199-1991 (R2002)(formerly ANSI X3.199-1991 (R1997)for Information Systems -356mm Optical Disk Cartridge(Write-Once) -Test Methods forMedia CharacteristicsANSI x3.199-1991 American National Standard for Information Systems - 356-mm Optical Disk Cartridge (Write-Once) - Test Methods for Me
2、dia Characteristics Secretariat Computer and Business Equipment Manufacturers Association Approved June 4,199l American National Standards Institute, Inc. AmericanNationalStandardApproval of an American National Standard requires review by ANSI that therequirements for due process, consensus, and ot
3、her criteria for approval havebeen met by the standards developer.Consensus is established when, in the judgment of the ANSI Board of StandardsReview, substantial agreement has been reached by directly and materiallyaffected interests. Substantial agreement means much more than a simplemajority, but
4、 not necessarily unanimity. Consensus requires that all views andobjections be considered, and that a concerted effort be made toward theirresolution.The use of American National Standards is completely voluntary; their existencedoes not in any respect preclude anyone, whether he has approved the st
5、andardsor not, from manufacturing, marketing, purchasing, or using products, processes,or procedures not conforming to the standards.The American National Standards Institute does not develop standards and will inno circumstances give an interpretation of any American National Standard.Moreover, no
6、person shall have the right or authority to issue an interpretation ofan American National Standard in the name of the American National StandardsInstitute. Requests for interpretations should be addressed to the secretariat orsponsor whose name appears on the title page of this standard.CAUTION NOT
7、ICE: This American National Standard may be revised orwithdrawn at any time. The procedures of the American National StandardsInstitute require that action be taken periodically to reaffirm, revise, or withdrawthis standard. Purchasers of American National Standards may receive currentinformation on
8、 all standards by calling or writing the American National StandardsInstitute.Published byAmerican National Standards Institute11 West 42nd Street, New York, New York 10036Copyright 1992 by Information Technology Industry Council (ITI)All rights reserved.No part of this publication may be reproduced
9、 in anyform, in an electronic retrieval system or otherwise,without prior written permission of ITI, 1250 Eye Street NW,Washington, DC 20005.Printed in the United States of AmericaContents Page Foreword . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
10、 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ii 1 Scope . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
11、1 2 Normative references . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1 3 Definitions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
12、 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2 4 Testing environment . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2 5 Definitions of air cleanliness . . . . . . . . . . . .
13、. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3 6 Test items , 7 7 Test methods . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
14、. . . 7 Tables 1 Definitions and environmental conditions; Mechanical characteristics of disk, carrier, caddy; Optical, write, and read characteristics . . . . . . . . . . . . . . 8 2 Recorded format, tracking, and servo technique . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 10 Fi
15、gures 1 Mechanical test conditions . .4 2 Particle-size distribution curve for class 1000 . .5 3 Particle-size distribution curve for class 5000 . .6 4 Particle-size distribution curve for class 100 000 . .6 5 Apparent axial runout test method .l 0 6 Residual focus error gauge-Completed disk assembl
16、y .ll 7 Residual focus error gauge-Protective layer component . .12 8 Double-pass retardation test method .15 9 Reflected beam modulation .I6 10 Definition of write pulse shape .17 11 Residual tracking error test method .20 Foreword (This foreword is not part of American National Standard X3.1 99-l
17、991.) The ever-increasing demands for higher performance and greater capacity information storage systems are satisfied by the standard for 356-mm Optical Disk Cartridge-Write Once. This test methods standard provides the means by which manufacturers of 356-mm write-once optical media can judge conf
18、ormance to the associated standard to the end that data inter- changeability is achieved. It is widely recognized that a test methods standard adds significantly to the value of the parent standard because a specification that cannot be measured is useless. This standard provides a description of th
19、e testing environment and certain aspects of the testing equipment. In addition, it lists all items to be tested for conformance and provides an existing stan- dard test reference or a test method for each item that cannot be measured using some “accepted industry practice” (A.I.P.). Technical Commi
20、ttee X3B11 of Accredited Standards Committee X3 devel- oped this standard under X3E311 project number 679-D. The participants in the development of this standard include representatives from approximate- ly 18 companies and agencies. It should be noted that this standard applies specifically to 356-
21、mm Write-Once Optical Disk Cartridges of either configuration of protective layer accommodated in the related standard. Test methods standards for other format optical disk cartridges are current- ly under development. Requests for interpretation, suggestions for improvement or addenda, or defect re
22、ports are welcome. They should be sent to the X3 Secretariat, _ Computer and Business Equipment Manufacturers Association, 311 First Street, NW, Suite 500, Washington, DC 20001. This standard was processed and approved for submittal to ANSI by the Accredited Standards Committee on Information Proces
23、sing Systems, X3. Committee approval of the standard does not necessarily imply that all committee members voted for its approval. At the time it approved this standard, the X3 committee had the following members: Richard Gibson, Chair Donald C. Loughry, Vice-Chair Joanne Flanagan, Administrative Se
24、cretary Organization Represented Name of Representative Allen-Bradley . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Ronald H. Reimer American Library Association . . . . . . . . . . . . . . . . . . . . . . .
25、. . . . . . . . . . . . . . . . . . . . . . Paul Peters American Nuclear Society . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Geraldine C. Main AMP, Inc. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
26、 . . . . . . . . . . . . . . . . . . . . . . . . . . . . Edward Kelly Patrick Lannon (Alt.) Apple . . . . . . . . . . . . . . . . . . . . . . . . . . .? . . . . . . . . . . . . . . . . . . . _ Karen Higginbottom Association of the Institute for Certification of Computer Professionals . . . . . . . .
27、 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Kenneth Zemrowski Eugene M. Dwyer (Alt.) ATC;W ScNHilton (Apex Systems) Robert Krenik (Mountain Computer) John E. Kulakowski (IBM) Charles Mortensen (3M) William Nugent (Library of Congress) Jim OReilly WW Fernando Podio
28、(National Institute of Standards and Technology) Chris Steenbergen Charlene Gawlak (Alt.) Derk Visser (Alt.) (Philips - Pulse width modulation; - 10 Mbit/s data rate; - Delay Modulation Mark (i.e., MFM (1,3) encoding; - Mark edge detection; - Banded CAV (r/min constant within a band); - Sampled-data
29、 tracking system. Such a 356-mm optical disk cartridge compris- es three parts: an optical disk, a carrier, and a caddy. The carrier is for capture and equip- ment handling of the optical disk. The optical disk and carrier are contained by the caddy, which provides protection from contaminants durin
30、g operation and human handling. In addi- tion, the test methods described in this stan- dard apply to 356-mm optical disks having a protective layer thickness of either 90 pm or 1.2 mm. 1.2 Purpose This standard provides test methods and test procedures for media characteristics. Unless otherwise no
31、ted, these procedures are required to verify conformance with the pro- posed related media standard, ANSI X3.200.) The original dimensions and quantities for all numeric values in this standard are units of the International System of Units (SI). 1.3 Conformance Interchange parties complying with AN
32、SI X3.200) and this standard should be able to achieve compatibility without the need for additional exchange of technical information. 2 Normative references The following standards contain provisions which, through reference in this text, constitute provisions of this American National Standard. A
33、t the time of publication, the editions indicated were valid. All standards are subject to revi- sion, and parties to agreements based on this American National Standard are encouraged to investigate the possibility of applying the most recent editions of the standards indicated below. ANSI X3.200,
34、information Systems - 356mm optical disk cartridge (write-once) - Optical media unit for digital information interchange) I) This standard is currently under development. Contact the secretariat for more recent information. 1 ANSI X3.1 99-l 991 ANSI Y14.5M-1982 (R1988), Dimensioning and tolerancing
35、ANSI UL 94-1990, Tests for flammability of plastic materials for parts in devices and appli- ances USA Federal Standard 209B, Cleanroom and workstation requirements - Controlled environ- ments 2, 3 Definitions The terms used in this test method shall be in conformance to those of the ANSI X3.200.) I
36、n addition, the following definitions apply: 3.1 central aperture method: The reflected light is collected by the same objective lens through which the illumination passes. The reflected light is then directed onto a detector by an optical system with the same or larger aperture as the objective len
37、s. The detector is larger than the redirected spot and the total light power in this spot is the reflected light signal. 3.2 gated second derivative method: The amplified photodetector signal produced by the reflected light is low-pass filtered by a 5-pole Bessel filter with bandwidth at 0.75 times
38、the bit rate. A transition is detected when the absolute value of the first derivative of the sig- nal is greater than one-third of the incident power multiplied by the bit rate and the abso- lute value of the second derivative of the sig- nal is less than 1% of the incident power multi- plied by th
39、e square of the bit rate. 3.3 preemphasis: Preemphasis is the time interval that the writing optical pulses are lengthened (or shortened) as measured at the 50% amplitude level. If the encoder generates a 100-11s pulse, 6 ns of preemphasis would cause the laser to emit a 106-ns pulse, both pulses be
40、ing measured at the 50% amplitude levels. The purpose of preemphasis is to align the optimum write power with the recording power that produces the best combination of signal amplitudes, linearity, signal-to-noise ratio, track-to-track cross-talk and recording power latitude. 3.4 postemphasis: Poste
41、mphasis is the time interval by which the digitized signal is lengthened (or shortened) as measured at its 50% amplitude level. The purpose of postem- phasis is to correct for a systematic shortening (or lengthening) of the mark lengths read back. This effect is due to the convolution of the gaussia
42、n read spot line spread function with the mark geometry. The proper amount of postemphasis is determined by comparing the detected mark lengths using a highly resolving read back technique. 4 Testing environment 4.1 General Unless otherwise specified, tests and mea- surements made on the optical dis
43、k cartridge to check the requirements of this standard shall be carried out under the following condi- tions: Temperature 23C 312C Relative humidity 45 to 55% Atmospheric pressure 100 kPa +_ 3.5 kPa Conditioning before testing 48 hours minimum No condensation on or within the disk shall be allowed t
44、o occur. Measurement precision shall conform to the following description of the Performance- Tolerance Ratio (P/T) where P/T 5 0.2: P,T _ 6 *St. dev. - tolerance where: st. dev. is the measurement standard devia- tion; tolerance is the specification upper bound - lower bound. 4.2 Mechanical test co
45、nditions I The following test conditions shall be observed: - The surface of the support sleeve that contacts the optical disk at datum target Al during testing shall have a maximum peak- *) Available from the General Services Administration, Specifications Activity, Printed Materials Supply Divisio
46、n, Building 197, Naval Weapons Plant, Washington, DC 20407. 2 to-peak physical displacement perpendicular to the datum target Al of 0.0025 mm; - A clamping force f, I 125 N shall be applied uniformly over the clamp zone. - A typical mechanical clamping method is shown-in figure 1. The following valu
47、es shall apply: - The centering cone angle (As) shall 1O”f lo. - The centering cone force (F,) shall 15.6 N + 2.2 N. 4.3 Testing of read/write characteristics be be Read/write characteristics shall be tested under the following conditions: 4.3.1 Recording and reading Wavelength (h) 830nm+5nm Numeric
48、al aperture 0.5 + 0.01 Filling of the lens aperture (RI WI) 0.8 + 0.1 Beam circularity into objective lens (WY/ Wx) 1 .O + 0.1 Wavefront at recording layer 10.045 h rms and Coma3 5: jO.lO( h Astig3 4 IO.131 h Spher3 I IO.351 h NOTE 2R is the diameter of the objective lens aperture; 2W, is the l/$ di
49、ameter of the Gaussian beam in the x dimension of the objective lens pupil coordi- nates; 2W is the l/g diameter of the Gaussian beam in the? dimension of the objective lens pupil coordi- nates. Coma3 = third-order coma aberration; Astig3 = third-order astigmatism aberration; Spher3 = third-order spherical aberration. 4.3.2 Polarization Polarization of the light shall be circular. 4.3.3 Detection method The detection method shall collect the reflect- ed light by the central aperture method and transitions shall be detected by the gated sec- ond derivative method. ANSI X3.
