1、B CReference numberISO/IEC 10373-5:1998(E)INTERNATIONALSTANDARDISO/IEC10373-5First edition1998-12-15Identification cards Test methods Part 5:Optical memory cardsCartes didentification Mthodes dessai Partie 5: Cartes mmoire optiqueAdopted by INCITS (InterNational Committee for Information Technology
2、Standards) as an American National Standard.Date of ANSI Approval: 6/10/02Published by American National Standards Institute,25 West 43rd Street, New York, New York 10036Copyright 2002 by Information Technology Industry Council (ITI).All rights reserved.These materials are subject to copyright claim
3、s of International Standardization Organization (ISO), InternationalElectrotechnical Commission (IEC), American National Standards Institute (ANSI), and Information Technology Industry Council(ITI). Not for resale. No part of this publication may be reproduced in any form, including an electronic re
4、trieval system, withoutthe prior written permission of ITI. All requests pertaining to this standard should be submitted to ITI, 1250 Eye Street NW,Washington, DC 20005.Printed in the United States of AmericaISO/IEC 10373-5:1998(E) ISO/IEC 1998All rights reserved. Unless otherwise specified, no part
5、 of this publication may be reproduced or utilized in any form or by any means, electronicor mechanical, including photocopying and microfilm, without permission in writing from the publisher.ISO/IEC Copyright Office Case postale 56 CH-1211 Genve 20 SwitzerlandPrinted in SwitzerlandiiContents1 Scope
6、 12 Normative references 13 Terms and Definitions .14 Default items applicable to the test methods .24.1 Test environment24.2 Pre-conditioning .24.3 Selection of test methods 24.4 Default tolerance.24.5 Total measurement uncertainty 35 Test methods35.1 Location of accessible optical area and referen
7、ce track35.1.1 Procedure .35.1.2 Test report 35.2 Skew.45.2.1 Apparatus .45.2.2 Procedure .45.2.3 Test report 55.3 Defects.55.3.1 Apparatus .55.3.2 Procedure .55.5.5 Test report 5ISO/IECISO/IEC 10373-5:1998(E)iiiForewordISO (the International Organization for Standardization) and IEC (the Internatio
8、nal Electrotechnical Commission)form the specialized system for worldwide standardization. National bodies that are members of ISO or IECparticipate in the development of International Standards through technical committees established by therespective organization to deal with particular fields of
9、technical activity. ISO and IEC technical committeescollaborate in fields of mutual interest. Other international organizations, governmental and non-governmental, inliaison with ISO and IEC, also take part in the work.In the field of information technology, ISO and IEC have established a joint tech
10、nical committee, ISO/IEC JTC 1.Draft International Standards adopted by the joint technical committee are circulated to national bodies for voting.Publication as an International Standard requires approval by at least 75 % of the national bodies casting a vote.International Standard ISO/IEC 10373-5
11、was prepared by Joint Technical Committee ISO/IEC JTC 1, Informationtechnology, Subcommittee SC 17, Identification cards and related devices.ISO/IEC 10373 consists of the following parts, under the general title Identification cards Test methods: Part 1: General characteristics tests Part 2: Cards w
12、ith magnetic stripes Part 3: Integrated circuit(s) cards Part 5: Optical memory cardsINTERNATIONAL STANDARD ISO/IEC ISO/IEC 10373-5:1998(E)1Identification cards Test methods Part 5:Optical memory cards1 ScopeISO/IEC 10373 defines test methods for characteristics of identification cards according to
13、the definition given inISO/IEC 7810. Each test method is cross-referenced to one or more base standards, which may be ISO/IEC 7810or one or more of the supplementary standards that define the information storage technologies employed inidentification cards applications.NOTE 1 - Criteria for acceptab
14、ility do not form part of ISO/IEC 10373 but will be found in the International Standards mentionedabove.NOTE 2 - Test methods described in ISO/IEC 10373 are intended to be performed separately. A given card is not required topass through all the tests sequentially.This part of ISO/IEC 10373 deals wi
15、th test methods which are specific to optical memory card technology.ISO/IEC 10373-1, General characteristics, deals with test methods which are common to one or more cardtechnologies and other parts deal with other technology-specific tests.2 Normative referencesThe following standards contain prov
16、isions which, through reference in this text, constitute provisions of this part ofISO/IEC 10373. At the time of publication, the editions indicated were valid. All standards are subject to revision,and parties to agreements based on this part of ISO/IEC 10373 are encouraged to investigate the possi
17、bility ofapplying the most recent editions of the standards listed below. Members of IEC and ISO maintain registers ofcurrently valid International Standards.ISO/IEC 7810:1995, Identification cards - Physical characteristics.ISO/IEC 11693:1994, Identification cards - Optical memory cards - General c
18、haracteristics.ISO/IEC 11694-1:1994, Identification cards - Optical memory cards - Linear recording method - Part 1: Physicalcharacteristics.ISO/IEC 11694-2:1995, Identification cards - Optical memory cards - Linear recording method - Part 2: Dimensionsand location of the accessible optical area.ISO
19、/IEC 11694-3:1995, Identification cards - Optical memory cards - Linear recording method - Part 3: Opticalproperties and characteristics.ISO/IEC 11694-4:1996, Identification cards - Optical memory cards - Linear recording method - Part 4: Logical datastructures.3 Terms and DefinitionsFor the purpose
20、s of this part of ISO/IEC 10373, the following terms and definitions apply.ISO/IEC 10373-5:1998(E)ISO/IEC23.1test methodmethod for testing characteristics of identification cards for the purpose of confirming their compliance withInternational Standards3.2testably functionalsurviving the action of s
21、ome potentially destructive influence to the extent that:a) any magnetic stripe present on the card shows a relationship between signal amplitudes before and afterexposure that is in accordance with the base standardb) any integrated circuit(s) present in the card continues to show an Answer to Rese
22、t response1which conformsto the base standardc) any contacts associated with any integrated circuit(s) present in the card continue to show electrical resistanceand impedance which conform to the base standardd) any optical memory present in the card continue to show optical characteristics which co
23、nform to the basestandard3.3normal useuse as an Identification Card (see clause 4 of ISO/IEC 7810:1995), involving equipment processes appropriate tothe card technology and storage as a personal document between equipment processes4 Default items applicable to the test methods4.1 Test environmentUnl
24、ess otherwise specified, testing shall take place in an environment of temperature 23C 3C (73F 5F) andof relative humidity 40% to 60%.4.2 Pre-conditioningWhere pre-conditioning is required by the test method, the identification cards to be tested shall be conditioned tothe test environment for a per
25、iod of 24h before testing.4.3 Selection of test methodsUnless otherwise specified, the tests in this part of ISO/IEC 10373 shall be applied exclusively to optical memorycards defined in ISO/IEC 11693, ISO/IEC 116944.4 Default toleranceUnless otherwise specified, a default tolerence of 5% shall be ap
26、plied to the quantity values given to specify thecharacteristics of the test equipment (e.g. linear dimensions) and the test method procedures (e.g. test equipmentadjustments).1This part of ISO/IEC 10373 does not define any test to establish the complete functioning of integrated circuit(s) cards. T
27、hetest methods require only that the minimum functionality (testably functional) be verified. This may, in appropriatecircumstances, be supplemented by further, application specific functionality criteria which are not available in the generalcase.ISO/IECISO/IEC 10373-5:1998(E)34.5 Total measurement
28、 uncertaintyThe total measurement uncertainty for each quantity determined by these test methods shall be stated in the testreport.5 Test methods5.1 Location of accessible optical area and reference trackThe purpose of this test is to measure the location of the accessible optical area and the refer
29、ence track in the card(see ISO/IEC 11694-2:1994).5.1.1 ProcedureConstruct two perpendicular axes of reference x and y intersecting at o. Mark three reference points on the axes,points P2 and P3, measured 11,25 mm and 71,25 mm from o are marked on the x axis and point P1, 27,00 mmfrom o, on the y axi
30、s. Place the card to be tested, accessible optical area side up, on a flat hard surface. The cardshall be held down by a load of 2,2 N 0,2 N.Apply force F1(1 N to 2 N) and F2(2 N to 4 N) so that the reference edge of the card touches points P2 and P3 andthe left edge touches at P1 (see Figure 1).Mea
31、sure dimensions Xa, Xb, Y, C and D, with equipment having an accuracy of 0,05 mm.not to scaledimensions in millimetresF2F1Accessible optical areaReference trackC27,00DYP1P2P3yx71,2511,25XbXaOFigure 1 Location of accessible optical area and reference track5.1.2 Test reportThe test report shall give t
32、he values of the dimensions measured.ISO/IEC 10373-5:1998(E)ISO/IEC45.2 SkewThe purposes of this test is to measure the skew of the reference track to the bottom edge of the optical memorycard (see ISO/IEC 11694-2:1995)5.2.1 ApparatusThe apparatus is shown in Figure 2. It comprises:a) x-y stage with
33、 an xy position indicator.b) an optical microscopeMicroscopeEyepieceCardXY position indicatorx-ystage12345mmFigure 2 Apparatus for the Skew measurement5.2.2 ProcedurePlace the sample card to be tested, accessible optical area side up, on x-y stage, in flat.Look into the eyepiece of the microscope, m
34、ove the x-y stage so that the reference track in the left part of the cardcan be seen. (see figure 3), and adjust the x-y stage so that the xy-cross-point in the eyepiece agree with thereference track. Then record the xy coordinate value(X0,Y0).Next move the stage in the y-direction so that the bott
35、om edge of the card can be seen, adjust the stage and recordthe value (X0,Y2) similarly.And move the stage so that the reference track in the right part of the card can be seen, adjust the stage and recordthe coordinate value (X1,Y1). However the value of |X0-X1| shall be not less than 60 mm.Lastly
36、move the stage in the y-direction so that the bottom edge of the card can be seen, and record the value(X1,Y3) in the same way.The skew is calculated by the expression as:Skew = ABSarctan(Y1-Y0)/(X7-X0)-arctan(Y3-Y2)/(X1-X0)ISO/IECISO/IEC 10373-5:1998(E)5not to scaleO(X0,Y0)(X0,Y2)(X1,Y3)(X1,Y1)more
37、 than 60ReferenceBottom edgeFigure 3 Procedure for the Skew measurement5.2.3 Test reportThe test report shall give the values of the angle measured.5.3 DefectsThe purpose of this test is to measure defects of a card test sample (see ISO/IEC 11694-3)5.3.1 ApparatusDefects at the accessible optical ar
38、ea shall be measured by optical microscope.5.3.2 ProcedureCount the number of defects whose cross-section exceeds 2.5 m at the optical layer of accessible optical area andcalculate the total defect area of these defects. Divide the total defect area by the total area of the the accessibleoptical are
39、a to obtain the density of the raw uncorrected defect ratio within the accessible optical area.On the other hand, at the transparent layer of the accessible optical area, the existence of defects whose cross-section exceeds 100 m shall be recognized.5.5.5 Test reportThe test report shall give the density of defects at the optical layer of accessible optical area and the existence ofdefects at the transparent layer.ISO/IEC 10373-5:1998(E)ISO/IECICS 35.240.15Price based on 5 pages
