1、INTERNATIONAL STANDARD ISO/IEC 10536-I First edition 1992-09-I 5 Identification cards - Contactless integrated circuit(s) cards - Part 1: Physical characteristics Cartes didentification - Cartes B circuits intkgr this part does not define the nature, number and position of the contactless interfaces
2、. Annex A includes test methods and acceptance criteria for certain of the requirements. NOTE 1 Other types of contactless integrated circuit(s) cards, formats or interfaces, which offer a variety of operating distances, may be developed in the future which will call for additions to be made to this
3、 part of ISOAEC 10536 or will require other International Standards to be prepared. 2 Normative references The following standards contain provisions which, through reference in this text, constitute provisions of this part of ISO/IEC 10536. At the time of publication, the editions indicated were va
4、lid. All standards are subject to revision, and parties to agreements based on this part of ISOilEC 10536 are encouraged to investigate the possibility of applying the most recent editions of the standards listed below. Members of IEC and IS0 maintain registers of currently valid international Stand
5、ards. IS0 7810: 1985, /den tification cards - Physical characteristics. IS0 7811-I : 1985, identification cards - Recording technique - Part I: Embossing IS0 781 l-2: 1985, Identification cards - Recording technique Part 2: Magnetic stripe IS0 781 l-3: 1985, Identification cards - Recording techniqu
6、e - Part 3: Location of embossed characters on ID- 1 cards IS0 781 l-4: 1985, Identification cards - Recording technique - Part 4: Location of read-only magnetic tracks - Tracks 1 and 2 IS0 781 l-5: 1985, Identification cards - Recording technique - Part 5: Location of read-write magnetic track - Tr
7、ack 3 IS0 7812: 1987, Identification cards - Numbering system and registration procedure for issuer identifiers IS0 7813: 1985, Identification cards - Financial transaction cards IS0 7816-l : 1987, Identification cards - Integrated circuit(s) cards with contacts - Part 1: Physical characteristics IS
8、0 7816-2: 1988, Identification cards - Integrated circuit(s) cards with contacts - Part 2: Dimensions and location of the contacts 3 Definitions For the purposes of this part of ISO/IEC 10536, the following definitions apply 3.1 integrated circuit(s) (IC): Electronic component(s) designed to perform
9、 processing and/or memory functions, control of input/output functions. 3.2 contactless: Pertaining to the achievement of signal exchange with and power supply to the card without the use of galvanic elements (i.e. the absence of direct path from the external interfacing equipment to the integrated
10、circuit(s) contained within the card). 3.3 contactless integrated circuit(s) card (CICC): An ID-I card type (as specified in IS0 7810, IS0 7811 Parts 1 to 5, IS0 7812 and IS0 7813) into which integrated circuit(s) have been placed and in which the coupling to such integrated circuit(s) is done in a
11、contactless manner. 3.4 card coupling device (CCD): The device used to provide power and clock signal to, and data exchange with the CICC. 4 Physical characteristics 4.1 General ClCCs shall have physical characteristics according to the requirements specified for ID-1 cards in IS0 7810 and IS0 7813.
12、 The specification for thickness, however, shall be applicable to a non-embossed CICC. NOTE 2 Specific test methods applicable to several of these characteristics are described in the annex (informative). NOTE 3 Concerning “resistance to chemicals” (5.1.4 of IS0 7810) the attention of card issuers i
13、s drawn to the fact that informatlon held on a magnetic stripe or in the integrated circuit(s) may be rendered ineffective as a result of contamination. 1 ISOllEC 10536-1:1992(E) 4.2 Additional characteristics 4.2.1 Ultra-violet light This part of ISOAEC 10536 excludes requirements for protection of
14、 ClCCs against the effects of ultra-violet light levels greater than those in ordinary daylight at sea-level. Where greater protection is needed it shall be the responsibility of the card manufacturer to provide it and to state the tolerable level of ultra-violet light. 4.2.2 X-rays Exposure of eith
15、er face of the CICC to medium-energy X-radiation, with energy in the range 70 keV to 140 keV, of a cumulative dose of 0,l Gyoyr shall not cause a malfunction of the CICC. NOTE 4 This corresponds to approximately double the maximum acceptable dose to which humans may be exposed annually. 4.2.3 Surfac
16、e profile The difference in level between the areas incorporating the contactless interface with integrated circuits and the adjacent card surface shall be between 0,l mm below the surface and 0,05 mm above the surface. The protection area specified in subclause 5.3.3 of IS0 7810 shall be extended t
17、o the area between B and C shown in the figure in IS0 7810. 4.2.4 Mechanical strength When tested by the methods described in A.1 and A.2, the CICC shall meet the criteria for acceptability specified therein. 4.2.5 Electromagnetic compatibility The CICC shall be so constructed that the following req
18、uirements are met. a) The electromagnetic disturbance generated by the CICC alone or in association with its coupling device shall not exceed a level that is liable to prevent radio and telecommunications equipment and other apparatus from operating as intended. b) It has an adequate level of intrin
19、sic immunity to electromagnetic disturbance to enable it to operate as intended. 4.2.6 Electromagnetic interference between magnetic stripe and electronic components If the card carries a magnetic stripe, protection shall be provided so that the electronic components within the card will not malfunc
20、tion, be damaged or be altered after reading, writing or erasing of the magnetic stripe. Conversely protection shall also be provided, so that the contactless operation of the card will not cause a malfunction of the magnetic stripe. 4.2.7 Electrical and electromagnetic interference between contact
21、interface and electronic components If the card carries a contact interface, protection shall be provided so that the electronic components within the card will not malfunction, be damaged or unintentionally be altered due to the use of the contact interface. Conversely protection shall also be prov
22、ided, so that the contactless operation of the card will not cause a malfunction of the contact interface. 4.2.8 Magnetic fields After exposure of the CICC to a static 79,5 kA/m magnetic field, the contactless interface and the integrated circuits shall continue to function normally. WARNING: The da
23、ta content of a magnetic stripe might be erased by such a field. 4.2.9 Static electricity When exposed in accordance with the test in A.3, the performance of the CICC shall not be degraded. 4.2.10 Operating temperature The CICC shall be designed and manufactured to operate at least in an ambient tem
24、perature range of 0 “C to 50 OC. 4.2.11 Surface temperature The temperature of any part of the surface of an operating CICC shall not exceed 85 C. ISOllEC 10536-1:1992(E) Annex A (informative) Test methods A.1 Bending proper-ties A.l.l Procedure Place the CICC between the jaws of a machine, as shown
25、 in figure A.I. Bend a) the long side with a deflection, f, of 20 mm, at a rate of 30 bendings per minute; and then b) the short side, with a deflection, f, of IO mm, at a rate of 30 bendings per minute. Check the functioning of the CICC in the writing and/or reading mode every 125 bendings. The CIC
26、C should then be placed in the machine with the other face up and the above procedure repeated. The recommended test duration is at least 250 bendings in each of the four test orientations. Short or long side of the card I D Fixed point Moving part Figure A.1 - Bending test arrangement A.l.2 Criteri
27、a for acceptability The CICC shall continue to function and shall not show any cracked part after 250 bendings in each of the four test orientations. ISOllEC 10536-1:1992(E) A.2 Torsion properties A.2.1 Procedure Place the CfCC in a machine which applies torsion to its short sides, the maximum displ
28、acement being through 15” k 1 o in alternate directions at a rate of 30 torsions per minute. Check the correct functioning of the CICC in the writing and/or reading mode (as appropriate) every 125 torsions. Long side of the card Figure A.2 - CICC under torsion A.2.2 Criteria for acceptability The CI
29、CC shall continue to function and shall not show any cracked part after 1000 torsions 4 ISOllEC 10536-1:1992(E) A.3 Static electricity A.3.1 Procedure Discharge a capacitor of 100 pF, initially charged to 10 kV, through a 500 n resistor, as shown in figure A.3, to each of the 20 test zones consecuti
30、vely with a 10 s interval between each discharge; conduct the test with one polarity and then repeat with reverse polarity. If the card has contacts, the above test shall be done in a manner such that the Round-Tip Probe does not discharge through the contacts. NOTE 5 Surface of the CICC to be free
31、from graphic design or surface-mounted foils during testing Round-Tip 500 Q Probe of nominal 5mm radius I LCICC IOOpF -I 1 Conductive Plate I I I + + + + - - - I I +-+ I I +-+ I I +-+ I I +-+ I I - Plan of CICC (20 test zones) Figure A.3 - Static electricity test arrangement A.3.2 Criteria for Accep
32、tability The functioning of the integrated circuit(s) in the writing and/or reading modes shall be verified at the end of the test. 5 ISO/IEC 10536-1:1992(E) UDC 351.755.62:621.3.049.77 Descriptors: data processing, data srorace devicas, identification cards, intqyatea circuit cards, specifications, physic&l properties. Price based on 5 Daaes
