1、INCITS Technical Reportfor Information Technology Fibre Channel Methodologies for Jitter andSignal Quality Specification(FC-MJSQ)INCITS TR-35-2004INCITS TR-35-2004Copyright American National Standards Institute Provided by IHS under license with ANSINot for ResaleNo reproduction or networking permit
2、ted without license from IHS-,-,-iiCopyright American National Standards Institute Provided by IHS under license with ANSINot for ResaleNo reproduction or networking permitted without license from IHS-,-,-INCITS TR-35-2004INCITS Technical Reportfor Information Technology Fibre Channel Methodologies
3、for Jitter andSignal Quality Specification(FC-MJSQ)AbstractThis technical report enhances the jitter and signal specifications found in the Fibre Channel Physical layer standards and in the technical report Methodologies for Jitter Specification (MJS). It provides extended definitions and test metho
4、dologies to enable more effective execution of specifications relating to the phase timing features of high speed serial signals. A generalization of jitter concepts to include events that occur at other than the nominal receiver detection threshold provides a stronger coupling between the jitter me
5、asured in a signal and the errors produced by the receiver of the signal. The meth-odologies described use a structured approach to describe the tests that recognize the contributions from test fixtures, instrumentation and calibration schemes to the reported values. Although this report uses 1.0625
6、 GBd for some examples it is intended to be fully applicable to speeds well in excess of the exist-ing 4.25 GBd jitter specifications in FC-PI-n.Copyright American National Standards Institute Provided by IHS under license with ANSINot for ResaleNo reproduction or networking permitted without licens
7、e from IHS-,-,-Published byAmerican National Standards Institute25 West 43rd Street, New York, New York 10036Copyright 2004 by Information Technology Industry Council (ITI)All rights reserved.No part of this publication may be reproduced in anyform, in an electronic retrieval system or otherwise, wi
8、thout prior written permission of the publisher.Printed in the United States of AmericaINCITS Technical Report SeriesThis Technical Report is one in a series produced by the International Committeefor Information Technology Standards (INCITS). The secretariat for INCITS is heldby the Information Tec
9、hnology Industry Council (ITI), 1250 Eye Street, NW, Suite200, Washington, DC 2005.As a by-product of the standards development process and the resources ofknowledge devoted to it, INCITS from time to time produces Technical Reports.Such Technical Reports are not standards, nor are they intended to
10、be used assuch.INCITS Technical Reports are produced in some cases to disseminate thetechnical and logical concepts reflected in standards already published or underdevelopment. In other cases, they derive from studies in areas where it is foundpremature to develop a standard due to a still changing
11、 technology, orinappropriate to develop a rigorous standard due to the existence of a number ofviable options, the choice of which depends on the users particular requirements.These Technical Reports, thus, provide guidelines, the use of which can result ingreater consistency and coherence of inform
12、ation processing systems.When the draft Technical Report is completed, the Technical Committee approvalprocess is the same as for a draft standard. Processing by INCITS is also similarto that for a draft standard.PatentStatementCAUTION: The developers of this Technical Report have requested that hol
13、dersof patents that may be required for the implementation of the standard, disclosesuch patents to the publisher. However, neither the developers nor the publisherhave undertaken a patent search in order to identify which, if any, patents mayapply to this Technical Report. As of the date of publica
14、tion of this Technical Report and following calls for theidentification of patents that may be required for the implementation of theTechnical Report, no such claims have been made. No further patent search isconducted by the developer or the publisher in respect to any Technical Report itprocesses.
15、 No representation is made or implied that licenses are not required toavoid infringement in the use of this Technical Report.Copyright American National Standards Institute Provided by IHS under license with ANSINot for ResaleNo reproduction or networking permitted without license from IHS-,-,-Copy
16、right American National Standards Institute Provided by IHS under license with ANSINot for ResaleNo reproduction or networking permitted without license from IHS-,-,-ContentsPageForeword .xviIntroduction .xxi1 Scope 12 References 22.1 General . 22.2 Approved references . 22.3 References under develo
17、pment 32.4 Informative references 33 Definitions and conventions 53.1 Overview . 53.2 Conventions 53.3 Keywords 53.4 Acronyms 63.5 Definitions . 74 Background for MJSQ . 144.1 Overview . 144.2 Relationship to SONET and receiver tolerance requirements 144.3 Relationship to earlier FC standards . 154.
18、4 Traditional measurement methodology risks 165 Jitter overview . 185.1 Serial transmissions 185.2 Jitter output context . 185.3 Jitter tolerance context 195.4 Jitter assumptions summary . 195.5 FC-0 and MJS(-1) interface overview . 205.6 Fibre channel physical architecture 216 Jitter fundamentals 2
19、56.1 Purpose of addressing all important signal levels . 256.2 Essential properties of signals 256.2.1 Introduction . 256.2.2 Signal amplitude vs. signal level . 256.2.3 Time, timing reference and jitter timing reference . 266.2.4 Considerations when using hardware basedjitter timing references . 26
20、i6.2.5 Jitter and noise relationship 266.2.6 Rising edges and falling edges 26Copyright American National Standards Institute Provided by IHS under license with ANSINot for ResaleNo reproduction or networking permitted without license from IHS-,-,-Page6.3 Number of events per bit-period . 286.4 Stat
21、istical distribution at a specific signal level . 296.5 Basic relationships within statistical jitter distributions 296.5.1 Overview . 296.5.2 Description of mathematical model . 326.5.3 Relationship between jitter and BER for random jitter distributions . 336.5.4 Effects of changing the standard de
22、viation for Gaussian PDFs . 356.5.5 Common mistakes relating to statistical properties of measurements . 356.5.6 Addition of deterministic jitter 366.6 Jitter eye mask methodology for signal quality specification 396.7 Signal measurements vs. jitter eye mask signal quality specifications . 416.8 Jit
23、ter timing reference at different signal levels during data acquisition 426.9 Example of a 2-dimensional jitter measurement . 426.10 Jitter timing reference frequency response requirements . 436.10.1 Overview . 436.10.2 Performance specification for a hardware implementation of a Golden PLL 496.11 J
24、itter frequency concepts 526.12 Jitter output measurement methodologies 536.12.1 Time domain 536.12.2 Frequency domain . 536.13 Effects of varying jitter distributions on BER . 536.14 Methodology for jitter and signal quality specification for “processed” signals . 546.14.1 Background . 546.14.2 Lin
25、k components that contain compensation properties (equalization) 546.14.2.1 Compensation. 546.14.2.2 Transmitter compensation 556.14.2.3 Interconnect compensation. 566.14.2.4 Receiver compensation 566.15 Determination of compliance 576.16 Extremely stressful data patterns and scrambling 587 Jitter c
26、auses and jitter distribution 597.1 Jitter contribution elements . 597.2 Jitter distribution 607.2.1 Basic types - bounded and unbounded, correlated and uncorrelated 607.2.2 Unbounded (definition, concept, quantitative description) 60ii7.2.3 Bounded (definition, concept, quantitative description) 60
27、Copyright American National Standards Institute Provided by IHS under license with ANSINot for ResaleNo reproduction or networking permitted without license from IHSPage7.2.3.1 Overview . 607.2.3.2 Duty cycle distortion (correlated) 617.2.3.3 Data dependent (correlated) . 617.2.3.3.1 Overview . 617.
28、2.3.3.2 Dispersion induced jitter 617.2.3.3.3 Reflection induced jitter. 627.2.3.3.4 Baseline wander induced jitter 627.2.3.3.5 High probability DDJ . 627.2.3.3.6 Low probability DDJ 627.2.3.4 Uncorrelated DJ . 627.2.3.4.1 Overview . 627.2.3.4.2 Power supply noise . 627.2.3.4.3 Crosstalk / external
29、noise 627.2.3.4.4 Applied sinusoidal . 637.2.4 Residual jitter and variance record 637.2.5 Summary of jitter taxonomy 638 Calculation of jitter compliance values (level 1) 658.1 Overview - separation of jitter components . 658.2 Examples comparing level 1 DJ with peak to peak DJ . 668.3 Methodology
30、details for calculating level 1 DJ and level 1 TJ . 699 Basic data forms, analysis, and separation of jitter components 709.1 Overview . 709.1.1 Introduction . 709.1.2 Basic data forms . 709.1.3 Data analysis methods 709.1.4 Summary of overview 709.1.5 Organization of the document relating to materi
31、al introduced in clause 9 739.2 Best fit of tails of histograms . 739.2.1 Introduction . 739.2.2 Tail fit jitter analysis method example . 749.2.2.1 Jitter separation through tail fit 749.2.2.2 Tail fit accuracy . 769.2.2.3 Tail fit application in serial data communication 769.2.2.4 DJ and RJ measur
32、ement (level 2). 789.2.2.5 Level 1 CDF measurement . 789.3 Frequency spectrum method 7910 Signal quality measurement methodologies . 8010.1 Overview . 8010.1.1 Non-jitter properties of signal quality . 8010.1.2 Overview of jitter related signal quality measurement methods 8010.1.3 Accuracy and verif
33、ication considerations 8110.1.3.1 Accuracy . 8110.1.3.2 Verification 8110.1.3.2.1 Overview . 81iii10.1.3.2.2 BERT method 81-,-,-Copyright American National Standards Institute Provided by IHS under license with ANSINot for ResaleNo reproduction or networking permitted without license from IHSPage10.
34、1.3.2.3 Calibrated signal source method 8210.1.4 Summary of signal quality measurement methods . 8210.2 Equivalent time oscilloscope methods 8710.2.1 Introduction . 8710.2.2 Equivalent time sampling 8710.2.2.1 Overview. 8710.2.2.2 Asychronous equivalent time sampling 8810.2.2.3 Sequential equivalent
35、 time sampling 8910.2.3 Waveform eye mask measurements 8910.2.4 Repeated pattern measurement using an equivalent time oscilloscope 9110.3 Enhanced equivalent time oscilloscope 9210.3.1 Overview . 9210.3.2 Signal edge models 9310.3.3 Periodic jitter frequency analysis beyond the Nyquist rate . 9310.3
36、.4 General process for extracting the CDF . 9310.3.4.1 Overview. 9310.3.4.2 Correlated Jitter 9410.3.4.3 Uncorrelated Jitter 9410.3.4.4 Aggregate Deterministic Jitter (DJ). 9510.3.5 Level 1 CDF output . 9510.4 BERT scan 9610.4.1 Basic BERT scan 9610.4.2 Alternate combined process to extract level 1
37、DJ and TJ . 9710.4.3 BERT eye contour measurements 9810.4.4 BERT with reference channel . 9910.5 Time interval analysis . 10010.5.1 Introduction . 10010.5.2 Jitter measurements with a “bit clock” (level 1) . 10110.5.3 Jitter measurements with a “pattern marker” (level 1) 10310.5.4 Jitter measurement
38、s with no clock and no marker (level 2) 10710.5.4.1 Overview. 10710.5.4.2 TIA data reduction procedure . 10910.5.4.3 Total jitter calculation 11010.5.4.4 Data dependent jitter measurement (level 2) 11110.5.5 Power density spectrum of jitter (level 2) 11210.6 Real time oscilloscope methods . 11510.6.
39、1 Overview . 11510.6.2 Clock recovery and waveform eye diagram 11610.6.3 Spectrum approach to jitter measurements 11710.6.3.1 Overview. 11710.6.3.2 RJ/DJ analysis (level 2) 11810.6.3.3 Analyzing DJ components (level 2) 11810.6.3.4 Obtaining the jitter eye opening 11910.6.3.5 Deterministic jitter and
40、 total jitter (level 1). 12010.6.3.6 Jitter eye diagram . 12010.6.4 Jitter noise floor of RT scope oscilloscope waveform data . 12011 Jitter / signal tolerance measurement methodologies 121iv-,-,-Copyright American National Standards Institute Provided by IHS under license with ANSINot for ResaleNo
41、reproduction or networking permitted without license from IHS-,-,-Page11.1 Overview . 12111.2 Jitter tolerance test methodologies . 12311.2.1 Overview . 12311.2.2 General methodology 12311.2.3 Sinusoidal jitter modulation . 12411.2.4 Jitter / signal tolerance sources . 12511.2.4.1 Overview . 12511.2
42、.4.2 Optical jitter / signal tolerance source example. 12611.2.4.3 Electrical jitter / signal tolerance source example . 12711.2.5 Calibration of a jitter tolerance signal source 12711.2.6 Direct time synthesis . 12911.2.7 BER measurements 12912 Example use of jitter specification methodology for FC
43、-PI-n 13012.1 Overview . 13012.2 Dependence on signal properties other than jitter output at the average signal level 13012.3 Jitter output budget and jitter tolerance budget . 13112.3.1 Overview . 13112.3.2 Example jitter output budget tables . 13212.3.3 Jitter tolerance specification 13213 Practic
44、al measurements 13413.1 Level 1 and level 2 measurements . 13413.2 System considerations 13413.3 Component considerations . 13513.4 Instrumentation considerations . 13613.4.1 General . 13613.4.2 FC compliant . 13613.4.3 Non-FC compliant . 13613.5 Reference standards / calibration considerations . 13
45、613.6 Test fixture compensation and calibration issues . 13713.6.1 Overview . 13713.6.2 Compensating and non-compensating test fixtures 13713.6.3 Detection and correction of test fixture degradation effects 13813.6.4 Correction for golden test fixture effects . 13813.6.5 Connector type adapters . 13
46、813.7 Data output format considerations . 13914 Detailed implementation examples . 14014.1 TIA for optical gamma T at switching threshold for FC Ports 14014.1.1 Overview of measurement and strategy . 14014.1.2 Test fixtures and measurement equipment . 14114.1.3 Option 1 - optical TIA no clock, no ma
47、rker 14214.1.3.1 Option 1 overview . 14214.1.3.2 Option 1 test fixture . 142v14.1.3.3 Option 1 measurement equipment 142Copyright American National Standards Institute Provided by IHS under license with ANSINot for ResaleNo reproduction or networking permitted without license from IHSPage14.1.3.4 Op
48、tion 1 calibration. 14414.1.3.5 Option 1 measurement procedure 14414.1.3.6 Option 1 data output format 14514.1.3.7 Option 1 acceptable values 14614.1.4 Option 2 - TIA with Golden PLL bit clock 14714.1.4.1 Option 2 overview . 14714.1.4.2 Option 2 test fixture. 14714.1.4.3 Option 2 measurement equipme
49、nt . 14714.1.4.4 Option 2 calibration procedure 14714.1.4.5 Option 2 measurement procedure 14714.1.5 Option 2 data output format 14814.1.5.1 Option 2 acceptable values 15114.1.6 Option 3 - TIA with arming on bit sequence 15114.1.6.1 Option 3 overview . 15114.1.6.2 Option 3 test fixture. 15214.1.6.3 Option 3 measurement equipment . 15214.1.6.4 Option 3 calibration pr
