1、American National StandardDeveloped byfor Information Technology Conformance Testing MethodologyStandard for Patron FormatsConforming to INCITS 398-2008,Information Technology Common Biometric Exchange FormatsFramework (CBEFF)INCITS 473-2011INCITS 473-2011Copyright American National Standards Instit
2、ute Provided by IHS under license with ANSI Not for ResaleNo reproduction or networking permitted without license from IHS-,-,-Copyright American National Standards Institute Provided by IHS under license with ANSI Not for ResaleNo reproduction or networking permitted without license from IHS-,-,-IN
3、CITS 473-2011American National Standardfor Information Technology Conformance Testing Methodology Standardfor Patron Formats Conforming toINCITS 398-2008, Information Technology Common Biometric Exchange FormatsFramework (CBEFF)SecretariatInformation Technology Industry CouncilApproved March 30, 201
4、1American National Standards Institute, Inc.Copyright American National Standards Institute Provided by IHS under license with ANSI Not for ResaleNo reproduction or networking permitted without license from IHS-,-,-Approval of an American National Standard requires review by ANSI that therequirement
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8、erican NationalStandard. Moreover, no person shall have the right or authority to issue aninterpretation of an American National Standard in the name of the AmericanNational Standards Institute. Requests for interpretations should beaddressed to the secretariat or sponsor whose name appears on the t
9、itlepage of this standard.CAUTION NOTICE: This American National Standard may be revised orwithdrawn at any time. The procedures of the American National StandardsInstitute require that action be taken periodically to reaffirm, revise, orwithdraw this standard. Purchasers of American National Standa
10、rds mayreceive current information on all standards by calling or writing the AmericanNational Standards Institute.American National StandardPublished byAmerican National Standards Institute, Inc.25 West 43rd Street, New York, NY 10036Copyright 2011 by Information Technology Industry Council (ITI)Al
11、l rights reserved.No part of this publication may be reproduced in anyform, in an electronic retrieval system or otherwise,without prior written permission of ITI, 1101 K Street NW, Suite 610, Washington, DC 20005. Printed in the United States of AmericaCAUTION: The developers of this standard have
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13、of publication of this standardand following calls for the identification of patents that may be required for the implementation ofthe standard, no such claims have been made. No further patent search is conducted by the de-veloper or publisher in respect to any standard it processes. No representat
14、ion is made or impliedthat licenses are not required to avoid infringement in the use of this standard.Copyright American National Standards Institute Provided by IHS under license with ANSI Not for ResaleNo reproduction or networking permitted without license from IHS-,-,-iContentsPageForeword .iii
15、0 Introduction 11 Scope. 32 Conformance . 33 Normative References . 34 Terms and Definitions 45 Conformance Testing Levels . 55.1 General Considerations . 55.2 Conformance Testing Types 55.3 Conformance Testing Hierarchy 55.4 Conformance Testing Level. 55.4.1 Level 1 - Data Format Conformance 55.4.2
16、 Level 2 - Internal Consistency Checking 65.5 Test Reports 66 Assertion Elements for Level 1 and 2 Testing . 66.1 Introduction 66.2 Assertion Element Descriptions. 76.2.1 Field Names. 76.2.2 Operators. 76.2.3 Operands . 86.2.4 Other Assertion Elements 9AnnexesA Test Assertions for INCITS 398-2008 Pa
17、tron Format A. 10B Test Assertions for INCITS 398-2008 Patron Format C - The BioAPI Biometric Identification Record (BIR) Conforming to INCITS 358-2002, The BioAPI Specification 15C Test Assertions for INCITS 398-2008 Patron Format D - ICAO LDS 16D Test procedures for INCITS 398-2008 Patron Format P
18、IV - NIST Personal Identify Verification (PIV). 19E Test assertions for INCITS 398-2008 Patron Format ITL - NIST/ITL Type-99 Data Record . 20Copyright American National Standards Institute Provided by IHS under license with ANSI Not for ResaleNo reproduction or networking permitted without license f
19、rom IHS-,-,-iiPageF Example test cases for certain patron formats 22F.1 Test cases for Patron Format A. 22F.2 Test cases for Patron Format C (BioAPI) 36F.3 Test cases for Patron Format ITL 39F.4 Test cases for Level 1 and Level 2 testing of optional fields of Patron Format D - ICAO LDS 52G Bibliogra
20、phy . 56Copyright American National Standards Institute Provided by IHS under license with ANSI Not for ResaleNo reproduction or networking permitted without license from IHS-,-,-iiiForeword (This foreword is not part of American National Standard INCITS 473-2011.)INCITS (The InterNational Committee
21、 for Information Technology Standards) is theANSI-recognized Standards Development Organization for information technologywithin the United States of America. Members of INCITS are drawn from Govern-ment, Corporations, Academia, and other organizations with a material interest in thework of INCITS a
22、nd its Technical Committees. INCITS does not restrict membershipand attracts participants in its technical work from 13 different countries, and oper-ates under the rules of the American National Standards Institute.In the field of Biometrics, INCITS has established the Technical Committee M1. Stan-
23、dards developed by this Technical Committee have reached consensus throughoutthe development process and have been thoroughly reviewed through several publicreview processes. In addition, the INCITS Executive Board and the ANSI Board ofStandards Review have approved this American National Standard f
24、or publication asan INCITS Standard.This standard contains seven annexes. Annexes A, B, C, and E are normative andare considered part of this standard. Annexes D, F, and G are informative and arenot considered part of this standard.Requests for interpretation, suggestions for improvement or addenda,
25、 or defect re-ports are welcome. They should be sent to InterNational Committee for InformationTechnology Standards (INCITS), ITI, 1101 K Street, NW, Suite 610, Washington, DC20005.This standard was processed and approved for submittal to ANSI by INCITS. Com-mittee approval of this standard does not
26、 necessarily imply that all committee mem-bers voted for its approval. At the time it approved this standard, INCITS had thefollowing members:Don Wright, ChairJennifer Garner, SecretaryOrganization Represented Name of RepresentativeAdobe Systems, Inc Scott Foshee Steve Zilles (Alt.)AIM Global, Inc.
27、. Dan Mullen Charles Biss (Alt.)Apple Computer, Inc. . Kwok Lau Helene Workman (Alt.)David Singer (Alt.)Distributed Management Task Force John Crandall Jeff Hilland (Alt.)Electronic Industries Alliance . Edward Mikoski, Jr. Henry Cuschieri (Alt.)EMC Corporation . Gary RobinsonFarance, Inc. Frank Far
28、anceTimothy Schoechle (Alt.)GS1 US . Ray Delnicki Frank Sharkey (Alt.)James Chronowski (Alt.)Mary Wilson (Alt.)Hewlett-Packard Company Karen Higginbottom Paul Jeran (Alt.)IBM Corporation Gerald Lane Robert Weir (Alt.)Arnaud Le Hors (Alt.)Debra Borland (Alt.)Steve Holbrook (Alt.)Copyright American Na
29、tional Standards Institute Provided by IHS under license with ANSI Not for ResaleNo reproduction or networking permitted without license from IHS-,-,-ivOrganization Represented Name of RepresentativeIEEE . Bill Ash Jodie Haasz (Alt.)Bob Labelle (Alt.)Intel Philip Wennblom Grace Wei (Alt.)Stephen Bal
30、ogh (Alt.)Lexmark International. Don Wright Dwight Lewis (Alt.)Paul Menard (Alt.)Jerry Thrasher (Alt.)Microsoft Corporation . Jim Hughes Dick Brackney (Alt.)John Calhoun (Alt.)National Institute of Standards it specifies data element and abstract value definitions that may be used in specifying a pa
31、rticular SBH format specification (called a “patron format”). CBEFF thus enables the definition of SBH formats and contents that are “tuned” to their intended environment (called “the Domain of Use” or “DOU” by CBEFF). INCITS 398-2008 specifies two patron formats in its annexes, and documents, in ad
32、ditional annexes, several patron formats that have been standardized and published by various organizations. CBEFF provides a process for new patron formats to be standardized. End users of biometric systems desire to use these patron formats to ensure that BIRs of one biometric system can be interc
33、hanged with other biometric systems with a minimum of effort. In order to achieve this, it is critical that implementations claiming conformance to a particular patron format actually are conformant, and thus there is a need for conformance testing standards for each of the patron format specificati
34、ons, in order to provide a reasonable degree of assurance that a conformance claim has validity. In fact, no test can be absolutely comprehensive and prove that a given implementation is conformant under all possible circumstances, especially when there are optional data elements of the patron forma
35、t. A well-designed conformance test can, however, test all of the most likely sources of problems and ensure that the implementation under test conforms under a reasonable set of circumstances, giving assurance, but not a guarantee, of conformance. Copyright American National Standards Institute Pro
36、vided by IHS under license with ANSI Not for ResaleNo reproduction or networking permitted without license from IHS-,-,-INCITS 473-2011 2 There are many different types of conformance testing that may be appropriate for the various patron format specifications. Some of them are highly specific to ea
37、ch patron format but some of them have common elements across all of the formats. Therefore, the body of this standard describes the different types of conformance testing. It then goes on to provide details of the common elements for defining test assertions for Level 1 and Level 2 testing, as they
38、 are defined in Clause 5, which have many similarities among different patron format specifications. Finally, it provides guidelines for conducting the tests and reporting the results of the tests. Test assertions for patron formats A, C, and F specified in INCITS 398-2008 as well as test assertions
39、 for patron format D specified in the same standard (for applications other than MRTD and other ICAO applications) are included in four normative annexes (test assertions). An informative annex contains test cases for patron formats A, C, and F specified in INCITS 398-2008 as well as test cases for
40、the optional fields of patron format D specified in the same standard. One additional annex includes references to tests specified by the organization that developed the NIST PIV patron format (Annex E of INCITS 398-2008). ANSI/INCITS standard, INCITS 423, Information Technology Conformance Testing
41、Methodology Standard for Biometric Data Interchange Format Standards, defines testing techniques and requirements for conformance of selected standardized BDB structures; that standard specifically excludes testing of full CBEFF BIRs and patron formats from its scope, although it assumes that comple
42、te BIRs are part of the implementation under test. This standard defines techniques and requirements for testing the conformance of the SBH portion of a BIR to its patron format specification, the consistency of the BIR structure and any required sequence of SBH fields as the patron format may requi
43、re. Specification of BDB and SB format conformance testing methodologies is not part of this standard. Copyright American National Standards Institute Provided by IHS under license with ANSI Not for ResaleNo reproduction or networking permitted without license from IHS-,-,-INCITS 473-2011 3 1 Scope
44、This standard specifies the concepts, test types and a conformance testing methodology to test conformance of CBEFF Biometric Information Records (BIR) claiming to be conformant to patron formats A, the BioAPI BIR or the NIST/ITL Type 99 data record specified in INCITS 398-2008 annexes as well as th
45、e LDS patron format for applications other than MRTD and other ICAO applications. The testing methodology specifies testing of the consistency of the BIR structure and any required sequence of SBH fields that may be specified by the patron formats. Conformance testing methodologies for the LDS patro
46、n format (for MRTD and other ICAO applications), the PIV patron format documented in INCITS 398-2008 as well as conformance testing methodologies for CBEFF BDB and SB formats are not part of this standard. 2 Conformance Biometric patron format conformance tests that claim conformance to this standar
47、d shall satisfy the normative requirements specified in Clause 5. Tests shall use the assertion types defined in Clause 6 together with the specific assertions specified in the normative annexes of this standard corresponding to the patron format being tested (patron formats A, C, or F specified in
48、INCITS 398-2008 or patron format D of INCITS 398-2008 for applications other than MRTD and other ICAO applications). BIR implementations of CBEFF patron format A, C, or F specified in an annex of INCITS 398-2008 that have been tested in accordance with the methodology specified in this standard shal
49、l be able to claim conformance only to those requirements specified in that CBEFF patron format. This also applies to patron format D of INCITS 398-2008 for applications other than MRTD and other ICAO applications. 3 Normative References The following standards contain provisions which, through reference in this text, constitut
