1、 American National Standard for Metric Practice Co-Sponsors ASTM Committee E43 on SI Practice and IEEE Standards Coordinating Committee 14 (Quantities, Units, and Letter Symbols) IEEE 3 Park Avenue New York, NY 10016-5997 USA IEEE/ASTM SI 10-2016 (Revision of IEEE/ASTM SI 10-2010) IEEE/ASTM SI 10-20
2、16 (Revision of IEEE/ASTM SI 10-2010) American National Standard for Metric Practice Co-Sponsors ASTM Committee E43 on SI Practice and IEEE Standards Coordinating Committee 14 (Quantities, Units, and Letter Symbols) Approved 22 September 2016 IEEE-SA Standards Board Approved 1 July 2016 ASTM Interna
3、tionalAbstract: Guidance for the use of the modern metric system is given. Known as the International System of Units (abbreviated SI), the system is the basis for worldwide standardization of measurement units. Information is included on SI, a list of units recognized for use with SI, and a list of
4、 conversion factors, together with general guidance on proper style and usage. Keywords: conversion factors, International System, International System of Units, metric practice, metric system, rounding, SI, SI 10, Systme International dUnits The Institute of Electrical and Electronics Engineers, In
5、c. 3 Park Avenue, New York, NY 10016-5997, USA ASTM International 100 Barr Harbor Drive, P.O. Box C700, West Conshohocken, PA 19428-2959, USA Copyright 2016 by The Institute of Electrical and Electronics Engineers, Inc. and ASTM International. All rights reserved. Published 10 March 2017. Printed in
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34、ment of such rights, is entirely their own responsibility. Further information may be obtained from the IEEE Standards Association. Copyright 2016 IEEE/ASTM. All rights reserved. 7 Participants This standard was developed by the IEEE/ASTM Committee for Maintaining IEEE/ASTM SI 10, a joint committee
35、established by the sponsoring organizations. The proposed standard generated by this joint committee was then formally adopted by the IEEE and ASTM before transmission to the American National Standards Institute for approval as an American National Standard. At the time this IEEE standard was compl
36、eted, the joint committee had the following membership. Nonvoting members at the time of publication are marked with an asterisk (*): Rodney Conn, Chair Terry Bates, Vice Chair James R. Frysinger, Secretary Gordon Aubrecht Bruce Barrow Lyle Bowman Robert Bushnell Mike Crewdson* Don Hillger Stanislav
37、 Jakuba John Nichols Jim Paschal* Richard Peppin* Howard Ressel* Terry Scott* Tom Walsh* The following members of the individual balloting committee voted on this standard. Balloters may have voted for approval, disapproval, or abstention. Samuel Aguirre Robert Aiello Mihaela Albu Dwight Alexander S
38、aleman Alibhay Roberto Asano Curtis Ashton Gordon Aubrecht Robert Ballard Peter Balma Bakul Banerjee Cleon Barker Thomas Barnes Bruce Barrow Frank Basciano Earle Bascom III Ronald Bennell Jean-Marc Biasse Thomas Bishop Thomas Blackburn William Bloethe Anne Bosma Kenneth Bow Harvey Bowles Riccardo Br
39、ama Daniel Brosnan Gustavo Brunello Paul Cardinal Yesenia Cevallos Michael Champagne Suresh Channarasappa Arvind Chaudhary Donald Cherry Keith Chow C. Clair Claiborne Larry Conrad Stephen Conrad Charles Cotton Geoffrey Darnton Matthew Davis Ronald Dean Davide de Luca Gary Donner Michael Dood Neal Do
40、wling Edgar Dullni Robert Durham Sourav Dutta Douglas J. Edwards Heiko Ehrenberg Richard Ellis Hossam Fahmy Keith Flowers Joseph Foldi Gary Fox Avraham Freedman Nancy Frost James Frysinger David Fuschi Shawn Galbraith Michael Garrels George Gela John Geldman Frank Gerleve Gregg Giesler James Gilb Ja
41、lal Gohari Edwin Goodwin Chris Gorringe David Gregson J. Travis Griffith Randall Groves Michael Gundlach Bal Gupta Ajit Gwal Donald Hall J. Harlow Daryl Harmon Lee Herron Guido Hiertz Lauri Hiivala Werner Hoelzl Ronald Hotchkiss Richard Hulett Noriyuki Ikeuchi Magdi Ishac Atsushi Ito Richard Jackson
42、 Vincent Jones Adri Jovin Laszlo Kadar Shinkyo Kaku Innocent Kamwa Efthymios Karabetsos Piotr Karocki John Kay Stuart Kerry Vladimir Khalin Yuri Khersonsky Jean-Francois Kieffer Hermann Koch Richard Kolich Lawrence Kotewa Jim Kulchisky Saumen Kundu Thomas Kurihara Chung-Yiu Lam David Leciston 8 Copy
43、right 2016 IEEE/ASTM. All rights reserved. Wei-Jen Lee Yeou Song Lee John Lemon Arthur H Light Paul Lindemulder O. Malik Jouni Malinen Roger Marks Jorge Marquez Lee Matthews Edward McCall Thomas McCarthy Peter Megna Joseph Melanson John Merando John Miller Daniel Mulkey Ryan Musgrove K. R. M. Nair M
44、arie Nemier Gary Nissen Tim Olson Lorraine Padden Richard Paes Luke Parthemore Bansi Patel Mark Paulk Ronald Petersen Branimir Petosic Christopher Petrola Ghery Pettit David R. Phelps Percy Pool Alvaro Portillo Iulian Profir John Rama R. K. Rannow Sergio Rapuano Carl Reigart Annette Reilly Maximilia
45、n Riegel Michael Roberts Timothy Robirds Charles Rogers Ervin Root Terence Rout Thomas Rozek Daniel Sabin Bartien Sayogo Janek Schumann Mike Seavey Robert Seitz Mark Siira Carl Singer Jeffrey Sisson Jeremy Smith Jerry Smith Gary Smullin Ronald Stahara Joseph Stanco Thomas Starai Donald Steigerwalt J
46、ohn Stevens Brian Story Walter Struppler K. Stump Mark Sturza Marcy Stutzman Peter Sutherland David Tepen Phyllis Thomas Geoffrey Thompson Wayne Timm James Tomaseski Remi Tremblay Richard Tressler Thomas Tullia Joe Uchiyama James Van De Ligt John Vergis Matthew Wakeham David Walker Daniel Ward Joe W
47、atson John Webb Hung-Yu Wei Kenneth White Alan Wilks Jan Wittenber Terry Woodyard Forrest Wright Guangning Wu Richard Young Jian Yu Oren Yuen When the IEEE-SA Standards Board approved this standard on 22 September 2016, it had the following membership: John D. Kulick, Chair Jon Walter Rosdahl, Vice
48、Chair Richard H. Hulett, Past Chair Konstantinos Karachalios, Secretary Masayuki Ariyoshi Ted Burse Stephen Dukes Jean-Philippe Faure J. Travis Griffith Gary Hoffman Michael Janezic Joseph L. Koepfinger* David J. Law Hung Ling Andrew Myles T. W. Olsen Glenn Parsons Ronald C. Petersen Annette D. Reil
49、ly Stephen J. Shellhammer Adrian P. Stephens Yatin Trivedi Philip Winston Don Wright Yu Yuan Daidi Zhong *Member Emeritus 9 Copyright 2016 IEEE/ASTM. All rights reserved. Introduction This introduction is not part of IEEE/ASTM SI 10-2016, American National Standard for Metric Practice. Any measurable physical quantity can be represented in the International System of Units (SI) with the aid of just seven base unitsthe units for the quantities length, mass, time, electric current, temperature, amount of substance, and luminous intensityor by combinations (called derived uni
