1、MIL- C -50735(MU) 8 August 1973 MILITARY SPECIFICATION CIRCUIT CARD ASSEMBLY: 11 737334 (LOGIC) This specification is approved for use by all Departments and Agencies of the Department of Defense. 1, SCOPE 1. 1 This specification covers one type of electronic assembly known as Circuit Card Assembly:
2、 11737334 (Logic) (see 6.1). 2. APPLICABLE DOCUMENTS 2. 1 The following documents, of the issue in effect on date of invitation for bids or request for proposal, form a part of this specification to the extent specified herein. SPECIFICATIONS Military MIL-F- 13926 Fire Control Materiel: General Spec
3、ification Governing the Manufacture and Inspection of MIL-I- 456 07 MIL-S-45743 Inspection Equipment; Acquisition, Maintenance, and Disposition of Soldering, Manual Type, High Reliability Electrical, Electronic, Instrument, Communication, and Radar for Aerospace and Control Systems, Procedure for FS
4、C-1240 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-MIL-C-50735 12 3O6 0330367 O IB1 MIL-C - 50 7 3 5 (MU) 8 August 1973 MIL-S -46844 Solder Bath Soldering of Printed Wiring Assemblies, Automatic Machine Type STANDARDS Mi lita ry MIL-STD- 105 Samp
5、ling Procedures and Tables for Inspection by Attributes MIL-STD- 109 Quality Assurance Terms and Definitions MIL-STD-81 O Environmental Test Methods DRAWINGS U. S, Army, Frankford Arsenal F11737334 PACKAGING DATA SHEET 11737334 Circuit Card As sembly: 11737334 (Logic) Packaging of Circuit Card Assem
6、bly: 11 737334 (Logic) (Copies of specifications, standards, drawings, and packaging data sheets required by suppliers in connection with specific procurement functions should be obtained from the procuring activity or as directed by the contracting officer. ) 2 Provided by IHSNot for ResaleNo repro
7、duction or networking permitted without license from IHS-,-,-MIL-C-50735 12 = 7779906 0330368 2 _ MIL-C- 50735(MU) 8 August 1973 3. REQUIREMENTS 3. 1 Fabrication. The Circuit Card Assembly - (Logic), herein referred to as the assembly, shall be manufactured in accordance with Drawing F11737334 and d
8、rawings pertaining thereto. 3.2 General specification, The assembly shall meet the following requirements, where applicable, of MIL-F-13926: a. Order of precedence b. Dimensions and tolerances c, Part identification and marking d. Electrical and electronic assemblies e. Workmanship. 3.2.1 Soldering.
9、 Soldering shall be in accordance with MIL-S- 45743 or MIL-S-46844, except that bare copper wire exposure shall be permitted at clipped ends of component *ke.ads. % -? 3. 3 Performance. Unless otherwise specified, the assembly shall meet the performance requirements of this specification at standard
10、 ambien temperatures between 60 degrees Fahrenheit (OF) and 90F. 3.3.1 Loads, power, and signals. The assembly shall perform as specified herein when the loads, power, and signals of table I are applied as specified. 3.3. 1.1 Range light drive. With the logical one digital type-A signal (item 3. 1)
11、of table I applied to Pl-6, the voltage at Pl-23 shall be t15. O *l. O Vdc. With the logical zero digital type-A signal (item 3. i) of table I applied to Pl-6, the voltage at P1-23 shall be t0.4 IO.4 Vdc, 3.3.1.2 Manual reset signal. With no input signal applied to Pl-4 the voltages at PI-21. and PI
12、-22 shall be +4.2 *l. O Vdc, With the logical zero digital type-A signal (item 3.1) of table I applied to Pl-4, the voltages at Pl-21 and PI-22 shall be to. 2 *O. 2 Vdc. 3.3.1.3 Turn-off reset. The time interva between turn-off of the t15 Vdc power (item 2.2) of table i to P1-5 and the change in lev
13、el of the reset voltage at Pl-21 shall be as shown on figure 1 3 , Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-MIL-C-50735 12 m 9779706 03303b9 4 W MIL-C - 5073 5(MU) 8 August 1973 TABLE I LOADS, POWER, AND SIGNALS Item 1. . 1.1 1.2 1.3 1.4 1.5 1
14、.6 1.7 1.8 1.9 1.10 1.11 1.12 1.13 1 :14 1. 15 1.16 1.17 1.18 1.19 2. o 2, 1 2, 2 3. o 3.1 3.2 Conditions Loads Resistor Resistor . Resistor Te si stor Re sistor Resistor Resistor Re sis tor Rezistor Resistor NAND Gate NAND Gate NAND Gate NAND Gate NAND Gate NAND Gate NAND Gate NAND Gate NAND Gate P
15、ower Sources t5 Vdc t15 Vdc Signal Sources Digital Type -A Digital I Characteristics 620 Ohms(S1) f5 percent, 1/2 watt 62On f5 percent 62052 I5 percent 180n *5 percent ZOOS2 *5 percent 180Q *5 percent 18052 *5 percent 6252 I5 percent 6200. *5 percent 470052 *5 percent or equivalent or equivalent or
16、equivalent or equivalent or equivalent or equivalent or equivalent or equivalen1 or equivalent 1 Gate-DTpL 9946 12 Gates-DTpL 9946 3 Gates-DTpL 9946 3 Gates-DTpL 9946 3 Gates-DTpL 9946 1 Gate-DTpL 9946 1 Gate-DTpL 9946 1 Gate-DTpL 9946 5 Gates-DTpL 9946 Tolerance: 10.2 Vdc Ripple: 25 mV p-p Toleranc
17、e: to. 7 Vdc Ripple: 25 mV p-p Logical one: Logical zero: to. 2 to. 2V Logical one: t15, O *l. O V .Logical zero: +O. 5 *O. 5 V t4. O +1. OV 4 Connections Connected between the following pins: Pl-1 and P1-5 PI-2 and P1-5 P1-3 and Pl-5 Pi-19 and P1-5 PI-23 and Pi -5 P1-24 and P1-5 Pi -26 and P1-5 P1-
18、31 and P1-5 Pi -35 and P1-5. Pl-5 and Pl-17 Pl-20 and 11-17 Pi-21 and Pl-17 Pi-22 and P.1-17 Pl -25 and 11 -17 P1-27 and P1-17 Pi -28 and P1-17 Pl-29 and Pl-17 Il-30 and Pl-17 P1-32 and P1-17 Connected between the following pins P1-16(+) and Pl-17(-) P1-5(+) and Pl-17 (-1 Applied as speci- fied here
19、in. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,- MIL-C-5073532 777770b 0330373 2 TABLE II FIRST-SECOND-LAST LOGIC AND LIGHT DRIVE OUTPUTS Inputs to
20、Pins of PI ! Outputs at Pins c 4 7 I, 9 8 19 20 24 25 v4 v2 v1 v3 v1 v3 v1 v3 v1 v3 v4 v2 v1 v3 1 v3 (1) Item i NC O i NC NC 2 NC NC NC O 3 NC NC O NC 4 O NC NC NC NOTES: 1. Items 1 through 4 must be performed in sequence. 2. Input condition legend: O = Momentary logical zero, type-A 3. Output volta
21、ge legend: V1 = t15. O rtl. O Vdc NC = No connection V2 t4.2 f1.0 Vdc lJ3 = t0.25 f0.25 Vdc v4 = t1.8 *0.7 Vdc .Item 1 2 3 4 5 6 7 8 9 10 TABLE III MALFUNCTION LOGIC AND LIGHT DRIVE OUTPUTS - 36 NC NC I Inputs to Pins of pi “ 33 1 1 1 1 O O 1 1 1 1 10 1 1 O O -0 O 1 1 1 O 11 12 1 1 1 1 1 1 1 1 1 1 1
22、 1 1 1 1 O O 1 1 1 - 13 1 1 1 1 1 1 O O O 0 6 Out1 14 28 1 v5 v2 O v2 1 v2 v2 1 v5 1 v 1 v5 1 v5 O o 1 its at Pins of PI L9 Ir 5 5 v5 v v v V I5 v v5 - 31 v1 v1 v5 v1 v1 v6 v6 “6 v6 6 c Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-MIL-C-50735 12 7
23、779706 0330372 _ - _ Item 11 12 13 14 15 16 - - MIL- C - 50 7 35 (MU) 8 August 1973 TABLE III (Continued) 36 - NC 1 NC O - Inputs ta 33 10 1 1 1 1 1 O 1 1 1 O 1 O ins of PI I 1. I - 13 1 1 1 1 1 1 - - NOTES: 1. Input condition legend: 1 outpu 14 28 1 v2 1 v2 1 v2 v5 1 v2 v5 j at Pins of i(2) -0 2 I3
24、1 I = Logical one, Type-A Source impedance = 6K *15 percent O = Logical zero, Type-A V2 = 4-4.2 *leo Vdc V5 = t0.2 I0.2 Vdc Vg = t0.4 I0.4 Vdc NC = No Connecion 2. Output voltage legend: V1 = 4-15. O *l, O Vdc 3.3.1. 7 Blanking pulse. With the logical zero digital type-A signal (item 3.1) of table I
25、 applied to Pl-10, application of the waveform shown on figure 3 to pin PI-15 shall result in appearance of the output waveforms shown on figure 3 at the pins specified thereon (the signals may be re cur ring), 3. 3.1.8 Test switch. With the digital type-A and type-B signals (items 3.1 and 3.2, resp
26、ectively) of table I applied as specified in table IV, the voltages at the output terminals shall be as specified in table IV for the associated input conditions. 3. 3.1 9 Continuity. With neither power nor signals applied, a short circuit condition (resistance less than O. 3 ohm) shall exist betwee
27、n Pl-33 and P1-34. 7 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-Source impedance = 6K *15 percent OA = Logical zero, type-A OB = Logical zero, type-B NC = No connection 2. Output voltage legend: Vi = t15. O *l. O Vdc Vq = t1.8 *0.7 Vdc V7 = t0.8
28、 *0.4 Vdc NA = Not Applicable 8 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-MIL-C- 50735(MU) 8 August 1973 3.3.2 Environmental 3.3.2.1 Storage temperature. The assembly shalL meet the requirements of 3.3.1 at ambient temperature after exposure to
29、 and thermal stabilization at -80“ F and t160“ F. 3.3.2,2 Operaing temperatures. The assembly shall meet the requirements of 3.3.1 while exposed to and thermally stabilized at -40F and t1Z5“F1 subsequent to which the requirements of 3.3.1 shall be met at ambient emperature, 3.3.2. 3 Vibration. The a
30、ssembly shall show no physical failure and shall meet the requirements of 3.3.1 after being exposed to the following vibratory conditions: a, Amplitude: 1/64 inch, constant (1/32 inch double amplitude) b. Vibratory motion: Simple harmonic c. Sweep time: 5 to 55 to 5 Hertz in a five- minute period d.
31、 Vibration cycling: Three linear or logarithmic sweeps applied to each of the three mutually perpendicular axe s. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-Provided by IHSNot for ResaleNo reproduction or networking permitted without license fro
32、m IHS-,-,-MIL-C -50735 (MU) 8 August 1973 4.3 Inspection provisions 4; 3.1 Submission of product, Unless otherwise specified herein, or by the contracting officer, inspection lot size, lot formation and presentation of lots shall be in accordance with inspection and sampling procedures herein and su
33、bmission of product provisions of MIL-STD-105. 4.3.2 Examination and tests. 4.3.2.1 Components and subassemblies. All components and sub- assemblies shall be inspected in accordance with the inspection provisions contained in the respective specifications and Supplementary Quality Assur- ance Provis
34、ions (SQAPI listed in the technical data package (TDP), In the absence of SQAPs, the applicable quality assurance provisions of MIL-F- 13926 shall apply. 4.3.2. 3 Functional tests. shall be inspected on a 100 percent basis. The requirements and tests in table V All examinations and tests shall be co
35、nducted at the standard ambient temperature. TABLE V FUNCTIONAL TESTS Cla s sifi- cation 101. 102. 103. 104, 105. 106. 107. 108. 109. Chara cteri s tics Range light drive Manual reset signal Turn-off reset Turn-on reset First - s econd -Ias t logic and light drive Malfunction logic and light drive B
36、lanking pulse Test switch Conti nuit y Requirements 3. 3.1.1 3. 3.1.2 3.3.1.3 3. 3.1.4 3. 3.1. 5 3. 3.1.6 3. 3.1.7 3. 3.1; 8 3.3, I * 9 11 T est Paragraph 4.6.2 4.6. 3 4.6.4 4.6.5 4.6.6 4.6.7 4.6.8 4.6.9 4.6.1 O Provided by IHSNot for ResaleNo reproduction or networking permitted without license fro
37、m IHS-,-,-MIL-C-50735 12 9777906 0330377 3 MIL-C 507 3 5( MU) 8 August 1973 4.4 Special sampling!. The selection of. samples shall be in accordance with section 7 of MIL-STD-105. 4.4.1 Generai. Oiie assembly shall be selected at random by a Government representative as a control sample from each 50
38、produced. The control sample shall meet the requirements and tests in table VI. 4.4. 2 .Environmental. Three assemblies shall be selected at random by a Government representative as a control sample from each 50 produced or from each months production, whichever occurs first. The contrbl samples sha
39、ll meet the requirements and tests in table VII. TABLE VI SPECIAL SAMP-LING - GENERAL Classifi- cation Control Tests Requirements Test Paragraph 301. Fabrication 3. i Applicable drawings - 302. General specifi- 3.2 MIL-F-13926 - visual visual cation TABLE VI1 SPECIAL SAMPLING - ENVIRONMENTAL Cla s s
40、ifi- cation Control Tests Requirements Test Pa rag raph 30 3. Storage temperature 3.3 2.1 4. 6.11. 1 30 4, Operating tempera- 3. 3.2.2 4. 6.11 . 1 30 5. Vibra ti on 3. 3.2. 3 4. 6.11.2 ture Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-MIL-C- 5073
41、5(MU) 8 August 1973 4.4-3 Acceptance and rejection. Rejected lots shall be screened for all defective characteristics. Removal or correction of defective units and resubmittance of rejected lots shall be in accordance with the acceptance and rejection criteria specified in MIL-STD-105. 4. 5 Inspecti
42、on equipment. Except as otherwise provided for by the contract, the contractor shall supply and maintain inspection equip- ment in accordance with the appljcable requirements of MIL-1-45607. The inspection equipment liated in table VI11 shall be utilized in performing the tests specified herein. 4.5
43、.1 Government furnished inspection equipmen. Where the contract provides for Government furnished inspection equipment, and maintenance of inspection equipment shall be in accordance with the applicable requirements of MIL-1-45607. supply 4.5.2 Contractor furnished inspection equipment 4.5.2.* 1 Gov
44、ernment design. Unless otherwise specified in the contract, all inspection equipment specified by drawing number in specifications or SQAPs forming a part of the contract shall be supplied by the contractor in accordance with applicable technical data listed in the TDP. 4.5.2.2 Contractor design. Th
45、e contractor shall design and supply inspection equipment compatible with the test methods and procedures specified in 4.6 of this specification and with the component inspection procedures specified in examination and test facilities requirements of MIL-F-13926. sidered to be within 10 percent of t
46、he product derance for which it is intended, this inheren error in the inspection equipment design must be considered as part of the prescribed product tolerance limit, cept, construction, mate rials, dimensions, and tolerances used in the design of inspection equipment shall be so selected and cont
47、rolled as to insure that the inspection equipment will reliably indicate acceptability of a product which does not exceed 90 percent of the prescribed tolerance limit and permit positive rejection when non-conforming. Construction ehall be such as to facilitate routine calibration of inspection equi
48、pment. Since tolerance of inspection equipment is normally con- Thus, con- Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-MIL- C - 507 35 (MU) 8 August 1973 TABLE VI11 INSPECTION EQUIPMENT Item 1. 2. 3. 4. - Nomenclature Dc power supply Dc power supply Dc voltmeter SignaLsources Description t5. O *O. 2 Vdc, Ripple: 25 mV p-p maximum t15.0 *0.7 VdC, Ripple: 25 mV p-p maximum Range of O to 20 Vdc Accuracy: fl percent Capable of providing dc levels and waveforms specified in items 3.1 and 3.2 of table I
