1、MIL-fl-50747 12 M 7993706 0330578 2 II Y f - r- - _- MIL-M - 5 0747(MU) 8 August 1973 MILITARY SPECIFICATION MALF 3 BUFFER LOGIC: 11738803 This specification is approvelaintenance, and Disposition of Sqldering, Manual Type, High ?Pliability Electrical, Electronic, Ixstrument, Communication, and 3ada
2、r for Aerospace and Control S:;stems, Procedures for Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-MIL- M- 50747 (MU) 8 August 1974 MIL-S-46841 Solder Bath Soldering of Printed Wiring Assemblies, Automatic Machine Type STANDARDS Military MIL-STD- 1
3、 O5 Sampling Procedures and Tables for Inspection by Attributes Quality Assurance Terms and Definitions MIL-STD-1 O” MIL-STD-83 CI Environmental Test Methods DRA WINGS U, S. A.rmy, Frail-ford Arsenal F11738803 MALF 3 Buffer Logic: 11738803 PACKAGING DATA SHEET 11738803 Packaging of MALF 3 Buffer Log
4、ic: 11 738803 (Copies of specifications, c:zndards, drawings, and packaging data sheets required by suppliers in ccrxction with specific procurement functions should be obtained from the ?rocuring activity or as directed by the contracting officer. ) Provided by IHSNot for ResaleNo reproduction or n
5、etworking permitted without license from IHS-,-,-MIL-M-50747(MU) 8 August 1973 3. REQUIREMENTS 3.1 Fabrication. The MALF 3 Buffer-Logic, herein referred to as the assembty, shali be manufactured in accordance with Drawing F11738803 and d-rawings- pertaining thereto, . 3.2 General specification. The
6、assembly shall meet the . following reqzrements, where applicable, of MIL- F- 13926: .a. Order of precedence b. Dimensions and tolerances c Part identification and marking d. Electrical and electronic assemblies e. Part ident.ification and marking f. Wo rkmanship. 3.2.1 Solde ring. Soldering shall b
7、e in accordance with MIL-S- 45743 or MIL-S-46844, except that bare copper wire exposure shall be permitted at clipped ends of component leads. 3,3 Performance. Unless otherwise specified, the assembly shall meet the performance requirements of this specification at standard ambient temperatures betw
8、een 60 degrees Fahrenheit (O F) and 90” F. . - 3.3.1 Loads, power, and signals. The assembly shall perform as specified herein when the loads, power, and signals of table I are applied as specified, . 3. 3.1 1 Reset signal, I) applied to Pl-10 as shown in figure 1, the output at Pi-29 and Pl-30 shal
9、l be as shown in figure 1. With the type-B signal (item 3. 3 of table (These signals may be recurring.) Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-MIL-M-50747(MU) 8 August 1973 Item 1. - 1.1 1.2 1 .-3 1.4 1.5 2. 2.1 3. 3.1 3.2 3.3 TABLE I LOADS,
10、 POWER, AND SIGNALS C ondit ions Loads Impedance Impedance Impedance NAND Gate NAND Gate Power Source t5 vac Signal Sources Digital Type -A Digital Type -A 1 Digital Type -B Cha ra ct e ri s tic s , 16052 k5 percent in series with 62 pf f10 percent 16052 k5 percent in series with 62 pf f10 percent 1
11、6OQ i5 percent in series with 62 pf f10 percent 1 Gate-DTpL 9946 or equivale nt 2 Gates-DTpL 9946 or e q ui val e nt Tolerance: LO.2 Vdc Ripple: - 25 mV p-p Logical one: t4. O *l. OV Sour ce impedance : 6K62 *15 percent Logical zero: to. 2 *O. 2V Pulse width and PRF as s pe c ified he re in. Logical
12、 one: t4. O rtl, OV Source impedance: 68052 I30 percent Logical zero: +O. 2 *O. 2V Pulse width and PRF as specified herein. Logical one: t4. O *l. OV Source impedance : 150 S2 I30 percent Logical zero: +O. 2 *O. 2V Pulse width and PRF as s peci fied her ein. Connections Connected between the followi
13、ng pins: Pl-30 and Pl-29 P1-I6 and P1-I7 Pl-19 and Pl-18 PI -3 and P1-7 P1-32 and P1-7 P1-5(t) and PI -7 (- 1 Applies as speci- fied herein. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-MIL-M- 50747(MU) 8 August 1973 Input to P1-10 _ - - - - - Log
14、ical one - - - - - - - - - - - Logical zero 1-4 I I 1. 0 rt. 1 psec t and t 40 nanoseconds (ns) (10 and 90 percent amplitude points) I r f- 41 - iysec - - - t3.5rt1.5v - - - - +0.4*0.4 v l I- I I O tit put f I oin i. O rt0.2 ysec I 1-4 . P1-29 I I I I I I I 1 t3.5 *l. 5 v - - - - - - - - - tO.4IO.4
15、v - Output from I I P1-30 Figiire 1. Reset Signal Waveforms 3. 3. 1.2 Range signal. With no input signal applied to P1-1, the output at P1-3 shall be f5. O *1. O Vdc. With P1-1 connected to P1-7, the output at PI -3 shall be to. 2 *O. 2 V. and P1-2 connected to P1-7, the output at P1-3 shall be +O.
16、2 +O. 2 V. With P1-1 disconnected from P1-7 and 3. 3. 1. 3 Test range. applied to P1-23 and P1-24, the output at P1-6 shall. be as shown in figure 2. With the type-B signals shown in figure 2 (This signal may be recurring. ) 3. 3. 1. 4 A-trigger signal. With the type-A signal shown in figure 3 appli
17、ed to Pl-35, the outputs at Pl-17 and Pl-16 shall be as shown in figure 3. (These signals may be recurring. ) Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-MIL-U-50747 12 ST777Ob 0330583 b MIL-M- 50747(MU) 8 August 1973 Input to - - - - - - - - - L
18、ogical one P1-23 - - - - Logical zero I- l.OfO.l ps I I tr and tf (40 ns (10 and 90 percent amplitude points) I I - - - - - Logical one I 1 7 Input to P1-24 - I I-I-,- -Logical Ler o tt- 1.0fO.2 ps - -+3.5*1.0 v - - - - - - - - -+0.2 f0.2 v I - Output from -d Pl -6 C 51lns Figure 2. Test Range Input
19、/Output Signal- Waveforms - - - - - - Logical one I Input to Pl-35 -1 u-,- - - Logical zero f- 1.0.*0.1 ps tr and t 40 ns (10 and 90 percent amplitude points) f- 4 i-3. 5 fl. 5 V - - - - - -to.4 *o. 4 v - - -*- I Output from I- 1.0 fO.2 ps t3.5 rtl. 5 v +o. 4 *o. 4 v - $ P1-17 Output from P1-16 4 15
20、0 t!s Figure 3, A-trigge r Input/Output Signal Waveforms 6 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,- - MIL-M-SOW LE! m vvmb OSAS- T = MIL-M- 5074
21、7(MU) 8 August 1973 -4 - - - - L - - ,Logical one - - - -. - ,Logicai one - - - - - - - - - ,Logical Aero Pulse widths = 1. O fO. 2 ps Figure 5. MALF 3 Input Signal Waveforms 3. 3. 2 Environmental 3. 3.2. 1 Storage temperature. The assembly shall meet the requirements of 3. 3.1 at ambient temperatur
22、e after exposure to and thermal stabilization at -80“ F and t160OF. 3. 3.2.2 Operating temperatures. The assembly shall meet the requirements of 3. 3. 1 while exposed to and thermally stabilized at -40F and t125OF, subsequent to which the requirements of 3.3.1 shall be met at ambient temperature. 3.
23、 3.2. 3 Vibration. The assembly shall show no physical failure and shall meet the requirements of 3. 3. 1 after being exposed to the following vibratory conditions: a. Amplitude: 1 /64 inch, constant (1 / 32 inch double amplitude) b. Vibratory motion: Simple harmonic c. Sweep time: 5 to 55 to 5 Hert
24、z in a five- minute period d. Vibration cycling: Three linear or logarithmic sweeps applied to each of the three mutually perpendicular axe s. 8 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-MIL-M-50747(MU) 8 August 1973 4. QUALITY ASSURANCE PROVIS
25、IONS 4. 1 Responsibility for inspection. Unless otherwise specified in the contract or purchase order, the supplier is responsible for the per- formance of all inspection requirements as specified herein. Except as otherwise specified, the supplier may utilize his own or any other facilities suitabl
26、e for the performance of the inspection requirements specified here- in, unless disapproved by the Government. The Government reserves the right to perform any of the inspections set forth in the specification where such inspections are deemed necessary to assure supplies and services conform to pre
27、scribed requirements. 4. 1. 1 General provisions. The component and subassembly inspec- tion requirements of MIL-F-13926 form a part of the quality assurance provisions of this specification. as listed in MIL-STD-109. Definitions of inspection terms shall be 4. 2 First article (initial production) a
28、pproval. The requirements for first article approval and the responsibility (Government or contractor) for first article testing shall be as specified in the contract. for first article approval tests shall consist of three assemblies. sample shall be manufactured in the same manner, using the same
29、materials, equipment, processes, and procedures as used in regular production. All parts and materials, including packaging and packing, shall be obtained from the same source of supply as used in regular production. The sample The 4. 2. 1 Government testing. When the Government is responsible for c
30、onducting first article approval tests, the contractor prior to submit- ting the sanipie to the Government, conformance to all the requirements of this specification. of this inspection, inc tuding certificates of conformance for materials, shall be submitted with the sample. shall inspect the sampl
31、e to insure A record 4. 2. 2 Contractor testing. When the contractor is responsible for conducting first article approval tests, the sample shall be inspected by the contractor for all the requirements of this specification. The sample and a record of this inspection, including certificates of con-
32、formance for materials, shall be submitted to the Government for approval. inspection. The Government reserves the right to witness the contractors Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-MIL-M- 50747(MU) 8 August 1973 4.3 Inspection provisio
33、ns. 4.3.1 Submission of product, Unless otherwise specified herein, or by the contracting officer, inspection lot size, lot formation and presentation of lots shall be in accordance with inspection and sampling procedures herein and submission of product provisions of MIL-STD-105. 4.3.2 Examination
34、and tests. 4.3.2.1 Components and subassemblies. AL1 components and subassemblies shall be inspected in accordance with the inspection pro- visions contained in the respective specifications and Supplementary Quality Assurance Provisions (SQAP) listed in the technical data package (TDP). In the abse
35、nce of SQAPs the applicable quality assurance p rovisions of MIL- F- 13926 shall apply. 4.3.2.2 Functional tests. The requirements and tests in table II shall be inspected on a 100 percent basis. shall be conducted at the standard ambient temperature. All examinations and tests TABLE II FUNCTIONAL T
36、ESTS Clas sifi - cation 101 102 103 104 105 106 I07 Characteristics R e s et s ignal Range signal Te st range A-trigger signal Video signal MALF 3 signal Continuity Require me nt s 3.3.1.1 3.3. 1.2 3.3.1.3 3. 3. 1.4 3.3.1.5 3. 3. 1.6 3.3.1.7 10 ,- - y Test Pa rag raph 4.6. 2 4. 6. 3 4.6.4 4.6. 5 4.6
37、.6 4.6.7 4.6.8 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-MIL -M - 5 O 7 4 7 (MU) 8 August 1973 4.4 Special sampling. The selection of samples shall be in accordance with section 7 of MIL-STD-105. 4.4. 1 General. One assembly shall be selected a
38、t random by a .Government representative as a control sample from each 50 produced, The control sample shall meet the requirements and tests in table III. 4.4. 2 Environmental. Three assemblies shall be selected at random by a Government representative as a control sample from each 50 produced or fr
39、om each months production, whichever occurs first, The control samples shall meet the requirements and tests in table IV. 4.4. 3 Acceptance and rejection. Rejected lots shall be screened for all defective characteristics. units and resubmittance of rejected lots shaLl be in accordance with the accep
40、tance and rejection criteria specified in MIL-STD-105. Removal or correction of defective TABLE III SPECIAL SAMPLING - GENERAL Classifi- cat ion 301 302 C la s s ifi- cation 30 3 304 305 1 I I Test Pa rag raph I Control Tests R e qui r ement s Fa b r icat ion 3.1 Applicable draw ings- visual General
41、 3. 2 MIL-F-13926 Spec if i cat ion visual A TABLE IV SPECIAL SAMPLING - ENVIRONMENTAL Control Tests Storage temp eratu r e Operating temper ature Vibration 11 Requirements 3.3. 2.1 3. 3. 2.2 3. 3-2. 3 Test Pa rag raph 4.6. 9. 1 4.6.9. 1 4.6.9.2 Provided by IHSNot for ResaleNo reproduction or networ
42、king permitted without license from IHS-,-,-MIL-M- 50747(MU) 8 August 1973 4. 5 Inspection equipment. Except as otherwise provided for by the contract, the contractor shall supply and maintain inspection equipment in accordance with the applicable requirements of MIL-1-45607. inspection equipment li
43、sted in table V shall be utilized in performing the tests specified herein. The 4. 5. 1 Government furnished inspection equipment. Where the contract provides for Government furnished inspection equipment, and maintenance of inspection equipment shall be in accordance with the applicable requirement
44、s of MIL-1-45607. supply 4. 5. 2 4. 5. 2. 1 Contractor furnished inspection equipment. Government design. Unless otherwise specified in the. contract, all inspection equipment specified by drawing number in speci- fications or SQAPs forming a part of the contract shall be supplied by the contractor
45、in accordance with applicable technical data listed in the TDP. 4.5. 2. 2 Contractor design. The contractor shall design and supply inspection equipment compatible with the test methods and procedures specified in 4. 6 of this specification and with the component inspection pro- cedures specified in
46、 examination and test facilities provisions of MIL-F- 13926. to be within 10 percent of the product tolerance for which intended, this inherent error in the inspection equipment design must be considered as part of the prescribed product tolerance limit. Thus, concept, con- struction, materials, dim
47、ensions, and tolerances used in the design of inspection equipment shall be so selected and controlled as to insure that the inspection equipment will reliably indicate acceptability of a product which does not exceed 90 percent of the prescribed tolerance limit and per- mit positive rejection when
48、non-conforming. Construction shall be such as to facilitate routine calibration of inspection equipment. Since tolerance of inspection equipment is normally considered 4.6 Test methods and procedures. 4. 6. 1 Test conditions. Unless otherwise specified, the test conditions shall be in accordance with the test facilities provisions of MIL-F-13926. 12 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-MIL-M-50747 12 M 7777906 0330570 3 Mi MIL-M- 50747(MU) 8 August 1973 TAB INSPE CTIOI Nomenclature DC Power Supply D
