1、MIL-PRF-4qL72B 9999906 2044293 406 Jersey, 07703 by using the self-addressed Standardization document Improvement Proposai (DD - Form 1426) appearing at the end of this document or by letter. . MIL-PRF-49 172B(CR) 9 June 1997 SUPERSEDING 18 January 1982 MIL-D-49 172A(CR) PERFORMANCE SPECIFICATION DE
2、TECTOR-DEWAR DT-594KJA This specification is approved for use by USACECOM, Department of the Army and is available for use by all Departments and Agencies of the Department of Defense. 1. SCOPE 1.1 Scope. This specification establishes the technical and operational performance characteristics, manuf
3、acturing, quality assurance, and test requirements for a Detector-Dewar DT-594LJA, which is one type of common module (see 6.1). 2. APPLICABLE DOCUMENTS 2,l General. The documents listed in this section are specified in sections 3 anci 4 of this specification. This section does not include documents
4、 cited in other sections of this specification or recommended for additional information or as examples. While every effort has been made to ensure the completeness of this list, document users are cautioned that they must meet all specified requirements documents cited in sections 3 and 4 of this s
5、pecification, whether or not they are listed. DISTRIBUTION STATEMENT A. Approved for public release, distribution is unlimited. /- Copyright Communications - Electronics Command Provided by IHS under license with CRAINot for ResaleNo reproduction or networking permitted without license from IHS-,-,-
6、MIL-PRF-49 172B(CR) 2.2 Government documents. 2.2.1 Specifications, standards, and handbooks. The following specifications and standards form a part of this document to the extent specified herein. Unless otherwise specified, the issues of these documents are those listed in the issue of the Departm
7、ent of Defense Index of Specifications and Standards (DoDISS) and supplement thereto cited in the solicitation (see 6.2). (Unless otherwise indicated, copies of the above specifications, standards, and handbooks are available from the Standardization Document Order Desk, 700 Robbins Avenue, Building
8、 4D, Philadelphia, PA 19 1 1 1-5094). 2.2.2 Other government documents, drawings. and publications. The following other Government documents, drawings, and publications form a part of this document to the extent specified herein. Unless otherwise specified, the issues are those cited in the solicita
9、tion. (Unless otherwise indicated, copies of the above specifications, standards, and handbooks are available from the Defense Printing Service Detachment Office, 700 Robbins Avenue, Building 4D, Philadelphia, PA 191 11-5093.) 2.3 Nongovernment publications. The following document forms a part of th
10、is document to the extent specified herein. Unless otherwise specified, the issues of the documents which are DoD adopted are those listed in the issue of the DoDISS, cited in the solicitation. Unless otherwise specified, the issues of documents not listed in the DoDISS are the issues are the issues
11、 of the documents cited in the solicitation (see 6.2). Standard Procedures for Testing Infrared Detectors and Their Performance, R. C. Jones, D. Goodwin, and G. Pullen, dated 12 September 1960, Office of the Director of Defense Research and Engineering. 2.4 Order of Precedence. In the event of a con
12、flict between the text of this document and the references cited herein, the text of this document takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 First article. When specified (see 6.2
13、) in the contract or purchase order, a sample shall be subjected to first article inspection in accordance with 4.4. 3.2 Materials. The Detector-Dewar shall use a 180-element detector array of photoconductive mercury-cadmium-telluride. Recovered materiais shall be used to the maximum extent possible
14、. 2 Copyright Communications - Electronics Command Provided by IHS under license with CRAINot for ResaleNo reproduction or networking permitted without license from IHS-,-,- MIL-PRF-49172B 9999906 2044293 289 . MIL-PRF-49 172B(CR) 3.3 Design. The Detector-Dewar DT-594AJA (Detector-Dewar) is an opto-
15、electronic device sensitive to radiation in the 7.5-to 12.0-micrometer spectral region and intended for use in infrared systems. The Detector-Dewar components shall meet the following design performance requirements. 3.3.1 Detector array. 180-elements with detector bias resistors an integral part. 3
16、.3.2 Power source. +5.0 33.2 Volts Direct Current (Vdc). 3.3.3 Electricallv activated getters. At least two reusable electrically activated getters shall be an integral part of the Detector-Dewar for periodic maintenance of the vacuum (see 6.2). The getter activation current (amperes) and time (minu
17、tes) shall be provided on the label specified on Drawing SM-D-80656 1. 3.3.4 Detector orientation. The detector array orientation with respect to the Dewar mounting flange shall be variable through 360-degrees. 3.3.5 Operating temDerature. Unless otherwise specified herein, the Detector-Dewar shall
18、be operated at 80 (+5, -20) Kelvin (K). 3.4 Weight. The weight of the DT-594A shall not exceed 0.75 pound including the bias resistor. 3.5 Performance characteristics. 3.5.1 Detector-Dewar defects. The Detector-Dewar shall contain no more than 12 defective elements as defined in 6.3.2, with no more
19、than 4 hard defects. 3.5.1. I Central element defects. In the central 18 elements of the array there shall be no hard defects and no more than 2 soft defects. The central 36 elements shall containno hard defects and no more than 4 soft defects. A maximum of two hard defects may be located in element
20、s 1-72 and a maximum of two may be located in elements 109-180. 3.5.1.2 Defect separation. Hard defects shall be separated from one another by 4 elements and shall be electrically strapped to an adjacent element with common ground. Soft defects located within the central 36 elements shall be separat
21、ed from any other defect by at least 4 nondefective channels. Soft defects shall not be strapped (see 6.3.3) unless the strapping is from an adjacent hard defect at the end of a group of 5 commonly grounded elements (see 6.3.2.1 and 6.3.2.2). 3.5.2 Time constant. The time constant for each detector
22、element shall not be greater than 2 microseconds. 3.5.3 Sensitive area. The sensitive area of the detector elements shall fall within the dimensions. SM-D-80656 1 may be used for guidance. 3 Copyright Communications - Electronics Command Provided by IHS under license with CRAINot for ResaleNo reprod
23、uction or networking permitted without license from IHS-,-,- - MIL-PRF-491726 999990b 2044294 115 MIL-PRF-49 I72B(CR) 3.5.4 Crosstalk. The crosstalk signal level between any two elements shall be less than -26 dB. 3.5.5 Specific detectivity D*). The 500k blackbody specific detectivity of all nondefe
24、ctive elements shall be not less than 8.5 x IO9 cm Hz?hW“. The average specific detectivity of all elements of the array, which are not hard defects shall be greater than 1.1 x 10“ cm Hz?hW- (see 6.3.2). 3.5.5.1 Noise. The detector noise of each element shall be not less than 2.5 x volts rms Hz-“ (s
25、ee 6.3.2). 3.5.6 Detector resistance. The detector resistance of each element shall be not less than 20 ohms and not greater than 150 ohms (see 6.3.2). 3.5.7 Responsivitv. The average of the 500 K blackbody responsivities of the acceptable elements shail be not less than 8.3 x lo3 volts/watt nor gre
26、ater than 20 x lo3 volts/watt. The blackbody responsivity of each element shall not vary from the mean by more than Xi0 percent of the mean value (see 6.4). 3.5.8 Temuerature sensors. At least two calibrated 2N2222 temperature sensor chips shall be installed at or near the detector array location in
27、 the Dewar to provide an electrical signal which is an analog of temperature. The temperature sensor shall have a junction voltage of 1.060, kO.015 volt with a 1 ma *.O1 mA forward current when the Detector-Dewar is operated at 77, k3 K. The voltage shall be recorded on the appropriate label on the
28、detector. 3.5.9 Swctral response. Each element of the Detector-Dewar shall have a spectral sensitivity of 7.7, S.3 to 11.7 M.5 micrometers. .C 3.5.10 Detector bias. The current shall not exceed 4.0 milliamperes on any single element. The total bias power dissipated by the array shall not exceed 100
29、milliwatts. The detector resistor bias pack shall be operated at +5.0, M.2 Vdc. Each detector element shall be biased with current flow in the same direction. 3.5.1 1 Dewar warm and cold shields. The clear aperture (warm shield) shall meet the following requirements: Cold shielding is optional (at t
30、he discretion of the detector manufacturer) but, when used, shall also conform to these same requirements. a. In the direction of the axis of the array (either (1) or (2). . (1) For each element, the cold shield(s) shall allow no vignetting of any ray to the center point on the detector surface with
31、in an angle of 18 degrees measured from and on either side of a line perpendicular to the arrays axis and parallel to the optical axis. 4 Copyright Communications - Electronics Command Provided by IHS under license with CRAINot for ResaleNo reproduction or networking permitted without license from I
32、HS-,-,- MIh-PRF-49172B W 9999906 2044295 051 . MIL-PRF-49 172B(CR) J (2) Each element shall be allowed to accept radiation from a 1 .OO, S.05 inch diameter stop centered on the Detector-Dewars optical axis and located a maximum of 1.60 inches behind the plane of the detectors. b. In the direction pe
33、mendicular to the axis of the array. The cold shield(s) shall allow for each element, no vignetting of any ray to any point on the detector surface within an angle of 23 degrees measured from and on either side of a line perpendicular to the arrays axis and parallel to the optical axis. 3.5.12 Heat
34、load. The detector heat load shall not exceed 0.40 watt when all 180 detector elements are operating at their final bias current and the Dewar is cooled to 80, fiK. 3.5.13 Vacuum integrity. The Dewar shall comply with heat load requirements of paragraph 3.5.12 for a period of at least one (1) year.
35、3.5.14 Microuhonics. When cooled to a temperature of 60-80 K, biased in accordance with paragraph 3.5.10, and vibrated in accordance with paragraph 4.6.14.1, all elements of the Detector-Dewar shall have no noise peaks above the white noise reference value greater than 8dB from 300 to 10,000 Hz, and
36、 12dB from 10,001 to 20,000 Hz (see 6.3.2). 3.5.15 Cooldown. When mated to a cryogenic cooler (MIL-C-49175) capable of cooling a test mass of 1440 (+25, -0) Joules of copper thermal mass (300 K to 80 K) from ambient to 80 K in not less than 12 nor greater than 14 minutes, the dewar cooldown time, fr
37、om ambient temperature to 80 K shall not exceed the time achieved with the test mass. 3.6 Environmental considerations. 3.6.1 Temuerature shock. The Detector-Dewar shall not be damaged (see 6.3.6).by sudden changes in temperature between -54C and +7 1 “C. 3.6.2 High temuerature. The Detector-Dewar s
38、hall not be damaged by storage or operation to +7 1 “C. 3.6.3 Low temuerature. The Detector-Dewar shall not be damaged by operation to -54C or storage to -62C. 3.6.4 Shock. The Detector-Dewar shall not be damaged by high intensity shocks of 100 gs peak amplitude with 11 milliseconds duration and by
39、bench handling tests. 3.6.5 Vibration. The Detector-Dewar shall not be damaged by vibration over the frequency spectrum at the specified g levels and amplitudes shown in figure 1. 3.7 Reliability. The Detector-Dewar shall have a specified mean time between failure (MTBF) of a least 27,600 hours. 5 C
40、opyright Communications - Electronics Command Provided by IHS under license with CRAINot for ResaleNo reproduction or networking permitted without license from IHS-,-,-MIL-PRF-49 172B(CR) 3.8 Treatment and painting. The Detector-Dewar shaI1 be treated and painted so that it is suitable for the envir
41、onment. SM-D-806561 may be used as a guide. 3.9 Preconditioning. Each Detector-Dewar shall be subjected to random vibration and temperature cycling in accordance with figure 2 prior to group A testing. 3.10 Nameplates and Droduct marking. Unless otherwise specified, the Detector-Dewar module, parts,
42、 components, subassemblies, and assemblies thereof shall be marked for identification and reference designation markings. SM-D-80656 1 may be used as a guide. 3.1 1 Workmanship. The equipment shall be free from defects that will affect equipment serviceability, interchangeability, or appearance. MIL
43、-HDBK-454 may be used as a guide(see 6.2). 4. VERIFICATION 4.1 Classification of ,;isuection. Inspection shall be classified as follows: a. First article inspection (see 4.3). b. Conformance inspection (see 4.4). 4.2 Insuection conditions. Unless otherwise specified herein, the Detector-Dewar shall
44、meet the specified performance requirements at an ambient temperature of +23“C, SOC, when operated at a temperature of 80, SIC, and biased to -5.0, W.2 Vdc. 4.3 First article inspection. When specified in the contract, the first article inspection shall be performed by the contractor on a minimum of
45、 5 preconditioned sample Detector-Dewars. Each selected detector shall be preconditioned by subjecting it to random vibration and temperature cycling in accordance with figure 2 prior to Group A testing. 4.3.1 InsDections. All materials, parts, processes and assemblies shall be examined for conforma
46、nce by visual inspection as noted in Table I. 6 Copyright Communications - Electronics Command Provided by IHS under license with CRAINot for ResaleNo reproduction or networking permitted without license from IHS-,-,-MIL-PRF-49 172B(CR) Inspection Requirement Any part or component missing or damaged
47、 Marking not as specified Workmanship not as specified Treatment and painting not as specified Dimensions not as specified Weight not as specified Getters and label not as specified Detector orientation range not as specified Sensitive area not as specified Dewar warm and cold shields not as specifi
48、ed Requirement Paragraph 3.1 1 3.4 3.10 3.1 1 3.8 3.12 3.3.3 3.3.4 3.5.3 3.5.1 1 Insriection 4.5.1 4.5.2 4.5.3 4.5.4 4.5.5 4.5.5 4.5.6 4.5.7 4.5.8 4.5.9 4.5.1 O 4.5.11 4.5.12 4.5.13 I 4.5.14 4.5.15 4.6.1 4.6.2 4.6.3 4.6.4 Criteria (see 6.2) MIL-STD-252 * 3.6.5 3.7 MIL-STD-252 * 4.6.5 4.7 MIL-STD-454
49、 * SM-D-80656 1 * SM-D-80656 1 * SM-D-80656 1 * SM-D-80656 1 * * May be used for guidance. 4.3.2 m. First article inspection shall be conducted upon units which have successfully completed the inspections specified in 4.3.1. Tests may be conducted in any order, except that microphonics shall be performed after shock and vibration (4.6.4 and 4.6.5). Failure of any tests shall constitute first article failure. TABLE II. First article inspec
