1、METRICMIL-PRF-49384B(CR)19 MAY 1997SUPERSEDINGMIL-I-49384A(CR)11 JUNE 1982PERFORMANCE SPECIFICATIONOPTICAL IMAGER, SU-121/UAThis performance specification is approved for use by USACECOM, Department of theArmy, and is available for use by all Departments and Agencies of the Department of Defense.1.
2、SCOPE1.1 Scope. This performance specification covers one type of common module, OpticalImager, SU-121/UA.2. APPLICABLE DOCUMENTS2.1 General. The documents listed in this section are specified in sections 3 and 4 of thisspecification. This section does not include documents in other sections of this
3、 specification orrecommended for additional information or as examples. While every effort has been made toensure the completeness of this list, document users are cautioned that they must meet allspecified requirements documents cited in sections 3 and 4 of this specification, whether or notthey ar
4、e listed.2.2 Government documents.2.2.1 Specifications, standards, and handbooks. The following specifications, standards,and handbooks form a part of this document to the extent specified herein. Unless otherwisespecified, the issues of these documents are those listed in the issue of the Departmen
5、t ofDefense Index of Specifications and Standards (DoDISS) and supplement thereto, cited in thesolicitation (see 6.2). Handbooks are for guidance only and therefore are not mandatory.AMSC N/A FSC 5855DISTRIBUTION STATEMENT A. Approved for public release; distribution is unlimited.Beneficial comments
6、 (recommendations, additions, deletions) and any pertinent data which maybe of use in improving this document should be addressed to: HQ, USA Communications-Electronics Command, ATTN: AMSEL-LC-LEO-E-EP, Fort Monmouth, NJ 07703 by using theStandardization Document Improvement Proposal (DD Form 1426)
7、appearing at the end of thisdocument or by letter.Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-MIL-PRF-49384B(CR)2HANDBOOKSDEPARTMENT OF DEFENSEMIL-HDBK-454 - Standard General Requirements for ElectronicEquipmentMIL-HDBK-742 - Disposal Method of P
8、ackaging Material(Unless otherwise indicated, copies of the above specifications, standards, and handbooksare available from the Standardization Document Order Desk, 700 Robbins Avenue, Building4D, Philadelphia, PA 19111-5094.)2.2.2 Other Government documents, drawings, and publications. The followi
9、ng otherGovernment documents, drawings, and publications form a part of this document to the extentspecified herein. Unless otherwise specified, the issues are those cited in the solicitation.DRAWINGSUS ARMY COMMUNICATIONS-ELECTRONICS COMMANDSM-D-657725 - Optical ImagerSM-D-657741 - Infrared Imager,
10、 Large, Outline Dimensions(Copies of specifications, standards, drawings, and publications required by contractors inconnection with specific procurement functions should be obtained from the procuring activity oras directed by the contracting officer.)2.3 Non-Government publications. The following
11、documents form a part of this documentto the extent specified herein. Unless otherwise specified, the issues of the documents which areDoD adopted are those listed in the issue of the DoDISS cited in the solicitation. Unlessotherwise specified, the issues of documents not listed in the DoDISS are th
12、e issues of thedocuments cited in the solicitation (see 6.2).AMERICAN NATIONAL STANDARDS INSTITUTE (ANSI)ANSI PH 3.35-1977 - Method of Designating and Measuring FocalLengths and Distances of Photographic Lenses.ANSI PH 3.29-1979 - Method of Designating and Measuring Aperturesand Related Quantities P
13、ertaining to PhotographicObjectives and Projection Lenses.(Application for copies should be addressed to American National Standards Institute, Inc.1430 Broadway, NY, NY 10018)Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-MIL-PRF-49384B(CR)3AMERICA
14、N SOCIETY FOR TESTING AND MATERIALS (ASTM)ASTM E 122-89 - Sample Size to Estimate a Measure of Qualityfor a Lot or Process.(Application for copies should be addressed to the American Society for Testing andMaterials, 1916 Race Street, Philadelphia, PA 19103-1187.)2.4 Order of precedence. In the even
15、t of a conflict between the text of this document andthe references cited herein, the text of this document takes precedence. Nothing in thisdocument, however, supersedes applicable laws and regulations unless a specific exemption hasbeen obtained.3. REQUIREMENTS3.1 First article. When specified, a
16、sample shall be subjected to first article inspection inaccordance with the contract or purchase order (see 4.2).3.2 Materials. The contractor shall select the materials, but the materials used shall befully capable of meeting all of the operational and environmental requirements specified herein.Th
17、e materials specified in the applicable drawings are recommended, but are not mandatory.Selection criteria of the class, grade or type part shall be that the material will be able to performits intended function when it is assembled. Verification of the supplier meeting the overallperformance requir
18、ements shall be the governing acceptance standard. Recovered materials shallbe used to the maximum extent possible.3.3 Description. The Optical Imager, SU-121/UA, referred to herein as the “Imager”,consists of thermally compensated optical elements which focus the IR energy from a mechanicalscanner
19、onto the detector array of an infrared system.3.3.1 Design. The Imager shall meet the form, fit, function in accordance withSM-D-657725 and interface requirements specified herein.3.3.2 Dimensions. The Imager shall meet the dimensions and dimensional tolerances ofDrawing SM-D-657741 to ensure that i
20、tems built IAW with this specification properly interfacewith existing hardware.3.3.3 Weight. The weight of the Imager shall be 0.522 kg or less when weighed by a scalehaving an accuracy of 99% or better.3.4 Components. The Imager shall consist of optical elements, a flat mirror and a housing.Provid
21、ed by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-MIL-PRF-49384B(CR)43.5 Performance characteristics.3.5.1 Effective Focal Length (EFL). The EFL of the Imager in the 7.6 to 11.75 micrometerspectral region shall be 67.9, 0.7 millimeters at the nominal flange
22、focal distance (see 3.5.6).Perform 4.5.1 for acceptance.3.5.2 f/number. The f/number of the Imager shall be f/1.19 or faster, set by the clearaperture of the first lens element (see Figure 3). Perform 4.5.2 for acceptance.3.5.3 Linear distortion. The geometric (linear) distortion of the Imager shall
23、 be between 0to -3 percent at the edge of the field. Perform 4.5.3 for acceptance.3.5.4 Modulation transfer function (MTF). The MTF of the Imager shall be not less thanthe MTF given in Figures 1 and 2, as measured in a flat-field focal plane and parallel to surface Ain Figure 3. Perform 4.5.4 for ac
24、ceptance.3.5.5 Relative illumination (RI). The RI of the Imager shall not be less than 60 percent atthe edge of the field, for a field diameter of 20 millimeters at the image plane. Perform 4.5.5 foracceptance.3.5.6 Flange focal distance (FD). The FD shall be set to a nominal of 17.71mm, adjustable
25、0.47mm at ambient temperature (see 6.3.2). Perform 4.5.6 for acceptance.3.5.7 Field of view (FOV). The Imager shall have a FOV sufficient to fill a circularformat with a diameter of 20 mm as measured as part of the relative illumination requirement of3.5.5. Perform 4.5.7 for acceptance.3.5.8 Optical
26、 transmittance. The optical transmittance of the Imager, measured in the 7.6 -11.75 micrometer spectral region shall be at least 85% at ambient temperature (see 6.3.2).Perform 4.5.8 for acceptance.3.5.9 Deviation. The optical axis of the Imager shall not deviate from 90 by more than 0.5. Perform 4.5
27、.9 for acceptance.3.6 Environmental conditions.3.6.1 Temperature shock. The Imager shall not be damaged (6.3.1) by sudden changes intemperature between -54C and +71C (See 4.6.1).3.6.2 High temperature. The Imager shall not be damaged by storage to +95C oroperation to +71C (See 4.6.2).3.6.3 Low tempe
28、rature. The Imager shall not be damaged by operation to -54C or storageto -62C (See 4.6.3).Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-MIL-PRF-49384B(CR)53.6.4 Shock. The Imager shall not be damaged by high intensity shocks of 100 gs peakamplitud
29、e with 11 milliseconds duration duration and by bench handling (See 4.6.4).3.6.5 Vibration. The Imager shall not be damaged after sustaining vibration over afrequency spectrum at the specified “g” levels and amplitudes shown in Figure 3 (See 4.6.5).3.6.6 Altitude. The Imager shall not be damaged by
30、operation at altitudes up to 10,000feet above sea level or storage to 50,000 feet above sea level (See 4.6.6).3.7 Treatment and painting. Unless otherwise specified, the Imager shall have an externalsurface of a composition or surface treatment which will prevent rust, corrosion, and fungusgrowth in
31、 the full range of environmental requirements. External color and surface shine shallreduce light reflection and reduce recognition. Adherence must be assured through the full rangeof environmental and use factors.3.8 Nameplates and product marking. The Imager shall be marked for identification.MIL-
32、HDBK-454 may be used for guidance in marking3.9 Workmanship. All optical parts shall be free of material defects such as bubbles,seeds, cracks, feathers, milkiness and other imperfections. Manufacturing defects such asblisters, burns, chips, dirt and other like defects shall be cause for rejection o
33、f the component orfinal assembly.4. VERIFICATION4.1 Classification of inspections. Inspections shall be classified as follows:a. First article inspection (see 4.2).b. Conformance inspection (see 4.3).4.2 First article inspection. First article inspection shall be performed by the contractor ona numb
34、er of samples specified in the contract or purchase order, when a first article sample isrequired (see 3.1). This inspection shall include the examination of 4.4 and the tests of 4.2.1 and4.2.2.4.2.1 Visual examination. All materials, parts, and assemblies shall be examined forconformance to the app
35、licable specification or drawing as indicated. Inspections shall be madeusing ASTM E 122-89 sampling procedures.Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-MIL-PRF-49384B(CR)6TABLE I. Visual inspections.Inspection RequirementparagraphVerification
36、 paragraphAny as specified part or componentmissing or damaged 3.4, 6.4.1 4.2.1Weight not as specified 3.3.3 4.2.1Marking not as specified 3.8 4.2.1Workmanship not as specified 3.9 4.2.1Treatment and paintingnot as specified 3.7 4.2.1Dimensions not as specified 3.3.2 4.2.1Flange diameter 3.3.1 4.2.1
37、Flange mounting hole pattern 3.3.1 4.2.14.2.2 Tests. Upon successful completion of inspections specified in 4.2.1, perform thetests in Table II in any order. Failure to meet any performance requirement shall constitute firstarticle failure.TABLE II. First article inspection.Inspection Requirement pa
38、ragraph Test paragraphEffective focal length 3.5.1 4.5.1f/number 3.5.2 4.5.2Linear distortion 3.5.3 4.5.3Modulation transfer function 3.5.4 4.5.4Relative illumination 3.5.5 4.5.5Flange focal distance 3.5.6 4.5.6Field of view 3.5.7 4.5.7Optical transmittance 3.5.8 4.5.8Deviation 3.5.9 4.5.9Temperatur
39、e shock 3.6.1 4.6.1High temperature 3.6.2 4.6.2Low temperature 3.6.3 4.6.3Shock 3.6.4 4.6.4Vibration 3.6.5 4.6.5Altitude 3.6.6 4.6.64.2.3 Disposition of first article samples. First article samples shall not be considered aspart of the procurement quantities (see 6.2).4.3 Conformance inspection.4.3.
40、1 Inspection. Inspection shall be as specified in 4.2.1.Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-MIL-PRF-49384B(CR)74.3.2 Group Inspections.4.3.2.1 Group A inspection. Group A inspection shall be conducted at ambienttemperature (see 6.4.1) on
41、all Imagers following the inspection of 4.3.1. Group A tests listed inTable III may be performed in any order. Failure of any requirement shall be cause for rejectionof that unit.TABLE III. Group A inspection.Inspection Requirement paragraph Test paragraphModulation transfer function 3.5.4 4.5.4Flan
42、ge focal distance 3.5.6 4.5.64.3.2.2 Group B inspection. Not required.4.3.2.3 Group C inspection. Group C inspection shall be conducted on Imagers selectedfrom units which have passed the tests in 4.3.2.1. The sample(s) shall be tested in accordancewith the inspections listed in Table IV. Samples sh
43、all be selected in accordance with 4.3.2.3.1.Group C tests listed in Table IV may be performed in any order.4.3.2.3.1 Sampling for Group C inspection. Group C inspection samples shall be selectedfrom monthly lots in accordance with ASTM E 122-89 and as specified in the contract (see6.2.f).TABLE IV.
44、Group C inspection.Inspection RequirementparagraphTest paragraphEffective focal length 3.5.1 4.5.1Relative illumination 3.5.5 4.5.5Optical transmittance 3.5.8 4.5.8Deviation 3.5.9 4.5.9Temperature shock 3.6.1 4.6.1Vibration 3.6.5 4.6.54.3.2.3.2 Group C failures. Actions required relative to group C
45、failures shall be asspecified in the contract (see 6.2).4.3.2.3.3 Disposition of group C samples. Group C samples shall be accepted on contractsubsequent to the tests of Table III.4.4 Examination. Each Imager shall be examined for compliance with the requirementsspecified in 3.3 through 3.9. Any red
46、esign or modification of the contractors standard product tocomply with specified requirements or any necessary redesign or modification following failureto meet the specified requirements shall receive particular attention for adequacy and suitability.Provided by IHSNot for ResaleNo reproduction or
47、 networking permitted without license from IHS-,-,-MIL-PRF-49384B(CR)8This element of inspection shall encompass all visual examinations and dimensionalmeasurements. Noncompliance with any specified requirements or presence of one or moredefects preventing or lessening maximum efficiency shall const
48、itute cause for rejection.4.5 Methods of inspection.4.5.1 Effective Focal Length (EFL). EFL measurements are defined by ANSI PH 3.35,paragraph 4. Failure to meet the requirements of 3.5.1 shall constitute failure of this test.4.5.2 f/number. f/number measurements are defined by ANSI PH 3.29, paragra
49、ph 2.6.Also, see paragraph 6.2.i for additional testing information pertaining to f/number. Failure tomeet the requirements of 3.5.2 shall constitute failure of this test.4.5.3 Linear distortion. Linear distortion is defined by Method 27 or 28 per the documentnoted in paragraph 6.2.i. Failure to meet the requirements of 3.5.3 shall constitute failure of thistest.4.5.4 Modular tra
