1、BRITISH STANDARDBS EN 60384-23-1:2005Fixed capacitors foruse in electronic equipment Part 23-1: Blank detail specification Fixed surface mount metallized polyethylene naphthalate film dielectric DC capacitors Assessment level EZ The European Standard EN 60384-23-1:2005 has the status of a British St
2、andardICS 31.060.10g49g50g3g38g50g51g60g44g49g42g3g58g44g55g43g50g56g55g3g37g54g44g3g51g40g53g48g44g54g54g44g50g49g3g40g59g38g40g51g55g3g36g54g3g51g40g53g48g44g55g55g40g39g3g37g60g3g38g50g51g60g53g44g42g43g55g3g47g36g58Licensed Copy: Wang Bin, na, Tue Aug 08 02:18:57 BST 2006, Uncontrolled Copy, (c)
3、 BSIBS EN 60384-23-1:2005This British Standard was published under the authority of the Standards Policy and Strategy Committee on 30 June 2006 BSI 2006ISBN 0 580 48726 1National forewordThis British Standard is the official English language version of EN 60384-23-1:2005. It is identical with IEC 60
4、384-23-1:2005.The UK participation in its preparation was entrusted to Technical Committee EPL/40X, Capacitors and resistors for electronic equipment, which has the responsibility to: A list of organizations represented on this committee can be obtained on request to its secretary.Cross-referencesTh
5、e British Standards which implement international or European publications referred to in this document may be found in the BSI Catalogue under the section entitled “International Standards Correspondence Index”, or by using the “Search” facility of the BSI Electronic Catalogue or of British Standar
6、ds Online.This publication does not purport to include all the necessary provisions of a contract. Users are responsible for its correct application. Compliance with a British Standard does not of itself confer immunity from legal obligations. aid enquirers to understand the text; present to the res
7、ponsible international/European committee any enquiries on the interpretation, or proposals for change, and keep UK interests informed; monitor related international and European developments and promulgate them in the UK.Summary of pagesThis document comprises a front cover, an inside front cover,
8、the EN title page, pages 2 to 13 and a back cover.The BSI copyright notice displayed in this document indicates when the document was last issued.Amendments issued since publicationAmd. No. Date CommentsLicensed Copy: Wang Bin, na, Tue Aug 08 02:18:57 BST 2006, Uncontrolled Copy, (c) BSIEUROPEAN STA
9、NDARD EN 60384-23-1 NORME EUROPENNE EUROPISCHE NORM February 2005 CENELEC European Committee for Electrotechnical Standardization Comit Europen de Normalisation Electrotechnique Europisches Komitee fr Elektrotechnische Normung Central Secretariat: rue de Stassart 35, B - 1050 Brussels 2005 CENELEC -
10、 All rights of exploitation in any form and by any means reserved worldwide for CENELEC members. Ref. No. EN 60384-23-1:2005 E ICS 31.060.10 English version Fixed capacitors for use in electronic equipment Part 23-1: Blank detail specification Fixed surface mount metallized polyethylene naphthalate
11、film dielectric DC capacitors Assessment level EZ (IEC 60384-23-1:2005) Condensateurs fixes utiliss dans les quipements lectroniques Partie 23-1: Spcification particulire-cadre Condensateurs fixes pour montage en surface pour courant continu dilectrique en film de polythylne naphtalate mtallis Nivea
12、u dassurance EZ (CEI 60384-23-1:2005) Festkondensatoren zur Verwendung in Gerten der Elektronik Teil 23-1: Vordruck fr Bauartspezifikation Oberflchenmontierbare metallisierte Polyethylen-Naphthalat-Folien-kondensatoren Qualittsbewertungsstufe EZ (IEC 60384-23-1:2005) This European Standard was appro
13、ved by CENELEC on 2005-02-01. CENELEC members are bound to comply with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standard without any alteration. Up-to-date lists and bibliographical references concerning such natio
14、nal standards may be obtained on application to the Central Secretariat or to any CENELEC member. This European Standard exists in three official versions (English, French, German). A version in any other language made by translation under the responsibility of a CENELEC member into its own language
15、 and notified to the Central Secretariat has the same status as the official versions. CENELEC members are the national electrotechnical committees of Austria, Belgium, Cyprus, Czech Republic, Denmark, Estonia, Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia, Lithuania, Lu
16、xembourg, Malta, Netherlands, Norway, Poland, Portugal, Slovakia, Slovenia, Spain, Sweden, Switzerland and United Kingdom. Licensed Copy: Wang Bin, na, Tue Aug 08 02:18:57 BST 2006, Uncontrolled Copy, (c) BSIEN 60384-23-1:2005 Foreword The text of document 40/1504/FDIS, future edition 1 of IEC 60384
17、-23-1, prepared by IEC TC 40, Capacitors and resistors for electronic equipment, was submitted to the IEC-CENELEC parallel vote and was approved by CENELEC as EN 60384-23-1 on 2005-02-01. The following dates were fixed: latest date by which the EN has to be implemented at national level by publicati
18、on of an identical national standard or by endorsement (dop) 2005-12-01 latest date by which the national standards conflicting with the EN have to be withdrawn (dow) 2008-02-01 Annex ZA has been added by CENELEC. _ Endorsement notice The text of the International Standard IEC 60384-23-1:2005 was ap
19、proved by CENELEC as a European Standard without any modification. _ 2Licensed Copy: Wang Bin, na, Tue Aug 08 02:18:57 BST 2006, Uncontrolled Copy, (c) BSI 3 EN 60384-23-1:2005 FIXED CAPACITORS FOR USE IN ELECTRONIC EQUIPMENT Part 23-1: Blank detail specification Fixed surface mount metallized polye
20、thylene naphthalate film dielectric DC capacitors Assessment level EZ Blank detail specification A blank detail specification is a supplementary document to the sectional specification and contains requirements for style, layout and minimum content of detail specifications. Detail specifications not
21、 complying with these requirements may not be considered as being in accordance with IEC specifications nor shall they so be described. In the preparation of detail specifications the content of 1.4 of the sectional specification shall be taken into account. The numbers between brackets on the first
22、 page correspond to the following information which shall be inserted in the position indicated. Identification of the detail specification 1 The “International Electrotechnical Commission“ or the National Standards Organisation under whose authority the detail specification is drafted. 2 The IEC or
23、 National Standards number of the detail specification, date of issue and any further information required by the national system. 3 The number and issue number of the IEC or national generic specification. 4 The IEC number of the blank detail specification. Identification of the capacitor 5 A short
24、 description of the type of capacitor. 6 Information on typical construction (when applicable). 7 Outline drawing with main dimensions which are of importance for interchangeability and/or reference to the national or international documents for outlines. Alternatively, this drawing may be given in
25、an appendix to the detail specification. 8 Application or group of applications covered and/or assessment level. NOTE The assessment level(s) to be used in a detail specification are selected from 3.5.4 of the sectional specification This implies that one blank detail specification may be used in co
26、mbination with several assessment levels, provided the grouping of the tests does not change. 9 Reference data on the most important properties, to allow comparison between the various capacitor types. Licensed Copy: Wang Bin, na, Tue Aug 08 02:18:57 BST 2006, Uncontrolled Copy, (c) BSIEN 60384-23-1
27、:2005 4 1 IEC 60384-23-1-XXX QC 30YYYYXXXXXX 2 IEC 60384-23-1 4 QC 30YYYY ELECTRONIC COMPONENTS OF ASSESSED QUALITY IN ACCORDANCE WITH: 3 FIXED METALLIZED POLYETHYLENE NAPHTHALATE FILM DIELECTRIC CHIP DC 5 CAPACITORS 6 Outline drawing: see table 1 . angle projection 7 Other shapes are permitted with
28、in the dimensions given Assessment level(s): EZ 8 For Notes 1 to 9 see preceding page. 9 Information on the availability of components qualified to this detail specification is given in the IEC QC 001005. 1 General data 1.1 Recommended method(s) of mounting (to be inserted) See 1.4.2 of IEC 60384-23
29、. 1.2 Dimensions Table 1 Dimensions Dimensions mm Case size reference L1W1H1L2L3L4 When there is no case size reference, Table 1 may be omitted and the dimensions shall be given in Table 2, which then becomes Table 1. The dimensions shall be given as maximum dimensions or as nominal dimensions with
30、a tolerance. Licensed Copy: Wang Bin, na, Tue Aug 08 02:18:57 BST 2006, Uncontrolled Copy, (c) BSI 5 EN 60384-23-1:2005 1.3 Ratings and characteristics Capacitance range (see Table 2) Tolerance on rated capacitance Rated voltage (see Table 2) Category voltage (if applicable) (see Table 2) Climatic c
31、ategory Rated temperature Max. AC voltage (if applicable) Max pulse load (if applicable) Tangent of loss angle Insulation resistance Table 2 Values of capacitance and of voltage related to case sizes Rated voltage Category voltage1)Case size Case size Case size Case size Rated capacitance F 1) If di
32、fferent from the rated voltage. 1.4 Normative references IEC 60384-1:1999, Fixed capacitors for use in electronic equipment Part 1: Generic specification IEC 60384-23, Fixed capacitors for use in electronic equipment Part 23: Sectional specification 1.5 Marking The marking of the capacitor and the p
33、ackage shall be in accordance with the requirements of 1.6 of IEC 60384-23. The details of the marking of the component and package shall be given in full in the detail specification. 1.6 Ordering information Orders for capacitors covered by this specification shall contain, in clear or in coded for
34、m, the following minimum information: a) rated capacitance; b) tolerance on rated capacitance; c) rated DC voltage; d) number and issue reference of the detail specification and style reference; e) packaging instructions. Licensed Copy: Wang Bin, na, Tue Aug 08 02:18:57 BST 2006, Uncontrolled Copy,
35、(c) BSIEN 60384-23-1:2005 6 1.7 Certified records of released lots Required/non required. 1.8 Additional information (not for inspection purposes) 1.9 Additional or increased severities or requirements to those specified in the generic or sectional specification NOTE Additions or increased requireme
36、nts should be specified only when essential. Table 3 Other characteristics This table is to be used for defining characteristics which are additional to or more severe than those given in the sectional specification. 2 Inspection requirements 2.1 Procedures 2.1.1 For qualification approval, the proc
37、edures shall be in accordance with 3.4 of the sectional specification, IEC 60384-23. 2.1.2 For quality conformance inspection, the test schedule (Table 4) includes sampling, periodicity, severities and requirements. The formation of inspection lots is covered by 3.5.1 of the sectional specification.
38、 Table 4 Test schedule for quality conformance inspection IL n c Subclause number and test (see NOTE 1) D or ND Conditions of test (see NOTE 1) (see NOTE 3) Performance requirements (see NOTE 1) GROUP A INSPECTION (lot-by-lot) Subgroup A0 4.3.2 Capacitance 4.3.3 Tangent of loss angle 4.3.1 Voltage p
39、roof (Test A) 4.3.4 Insulation resistance (Test A) ND Frequency: 1 kHz for all capacitance values Method: . Measuring point 1a Measuring point 1a 100 % (see NOTE 4) Within specified tolerance As in 4.3.3.2 No breakdown or flashover. Self-healing breakdowns allowed. As in 4.3.4.3 Subgroup A1 4.2.1 Vi
40、sual examination ND S-4 NOTE 2 0 As in 4.2.2 Legible marking (if applicable) and as specified in 1.5 of this specification Subgroup A2 4.2 Dimensions (see NOTE 5) ND S-3 NOTE 2 0 As specified in Table 1 of this specification Licensed Copy: Wang Bin, na, Tue Aug 08 02:18:57 BST 2006, Uncontrolled Cop
41、y, (c) BSI 7 EN 60384-23-1:2005 Table 4 (continued) IL n c Subclause number and test (see NOTE 1) D or ND Conditions of test (see NOTE 1) (see NOTE 3) Performance requirements (see NOTE 1) GROUP B INSPECTION (lot-by-lot) Subgroup B1 4.7 Solderability 4.7.2 Final measurements D No ageing Method: . Vi
42、sual examination S-3NOTE 2 0 As in 4.7.2 Subgroup B2 4.14 Solvent resistance of the marking (if applicable) (see NOTE 6) D Solvent: . Solvent temperature: . Method 1 Rubbing material: cotton woolRecovery: . S-3 NOTE 2 0 Legible marking Sample size and acceptance criterion (see NOTE 3) Subclause numb
43、er and test (see NOTE 1) D or ND Conditions of test (see NOTE 1) p n c Performance requirements (see NOTE 1) GROUP C INSPECTION (periodic) Subgroup C1 4.6 Resistance to soldering heat 4.6.1 Initial measurements 4.6.2 Test conditions 4.6.3 Final measurements 4.13 Component solvent resistance (if appl
44、icable) D Method: . Capacitance Duration: . If Method 1 is applied immersion and withdrawal speed shall be 25 mm/s 2,5 mm/s Recovery: 24 h 2 h Visual examination Capacitance Solvent: . Solvent temperature: . Method 2 Recovery: . 3 12 0NOTE 7As in 4.6.3 C/C 3 % for Grade 1 and Grade 2 5 % for Grade 3
45、of value measured in 4.6.1 See detail specification Licensed Copy: Wang Bin, na, Tue Aug 08 02:18:57 BST 2006, Uncontrolled Copy, (c) BSIEN 60384-23-1:2005 8 Table 4 (continued) Sample size and acceptance criterion (see NOTE 3) Subclause number and test (see NOTE 1) D or ND Conditions of test (see N
46、OTE 1) p n c Performance requirements (see NOTE 1) Subgroup C2 4.5 Substrate bending test 4.5.1 Initial measurements 4.5.2 Final inspection D Capacitance Capacitance (with board in bent position) Visual examination 3 12 0NOTE 7C/C 2 % for Grade 1 and Grade 2 5 % for Grade 3 of value measured in 4.5.
47、1 No visible damage Subgroup C3 4.1 Mounting (see NOTE 8) 4.2.1 Visual examination 4.3.2 Capacitance 4.3.3 Tangent of loss angle 4.3.4 Insulation resistance D Substrate material: .Frequency: 1 kHz (for all capacitance values) 10 kHz for capacitors with CR 1 F (in addition, see 4.3.3.3) As in detail
48、specificationC/C 2 % of the value measured before mounting As in 4.3.3.2 (Reference values for final measurements in Subgroup C3.1, C3.3 and C3.4) As in 4.3.4.3 _ When different substrate materials are used for the individual subgroups, the detail specification shall indicate which substrate materia
49、l is used in each subgroup. Licensed Copy: Wang Bin, na, Tue Aug 08 02:18:57 BST 2006, Uncontrolled Copy, (c) BSI 9 EN 60384-23-1:2005 Subgroup C3.1 4.4 Shear 4.4.1 Intermediate inspection 4.8 Rapid change of temperature 4.8.1 Initial measurements 4.8.2 Test conditions 4.8.3 Intermediate inspection D Visual examination Not required, see Subgroup C3 TA= Lower category temperature TB= Upper catego
