1、BRITISH STANDARD BS EN 60512-6-2:2002 Connectors for electronic equipment Tests and measurements Part 6-2: Dynamic stress tests Test 6b: Bump The European Standard EN 60512-6-2:2002 has the status of a British Standard ICS 31.220.10 NO COPYING WITHOUT BSI PERMISSION EXCEPT AS PERMITTED BY COPYRIGHT
2、LAWBS EN 60512-6-2:2002 This British Standard, having been prepared under the direction of the Electrotechnical Sector Policy and Strategy Committee, was published under the authority of the Standards Policy and Strategy Committee on 5 June 2002 BSI 5 June 2001 ISBN 0 580 39765 3 National foreword T
3、his British Standard is the official English language version of EN 60512-6-2:2002. It is identical with IEC 60512-6-2:2002. The UK participation in its preparation was entrusted by Technical Committee EPL/48, Electromechanical components and mechanical structures for electronic equipment, to Subcom
4、mittee EPL/48/2, Connectors for electronic equipment, which has the responsibility to: A list of organizations represented on this subcommittee can be obtained on request to its secretary. From 1 January 1997, all IEC publications have the number 60000 added to the old number. For instance, IEC 27-1
5、 has been renumbered as IEC 60027-1. For a period of time during the change over from one numbering system to the other, publications may contain identifiers from both systems. Cross-references The British Standards which implement international or European publications referred to in this document
6、may be found in the BSI Standards Catalogue under the section entitled “International Standards Correspondence Index”, or by using the “Find” facility of the BSI Standards Electronic Catalogue. A British Standard does not purport to include all the necessary provisions of a contract. Users of Britis
7、h Standards are responsible for their correct application. Compliance with a British Standard does not of itself confer immunity from legal obligations. aid enquirers to understand the text; present to the responsible international/European committee any enquiries on the interpretation, or proposals
8、 for change, and keep the UK interests informed; monitor related international and European developments and promulgate them in the UK. Summary of pages This document comprises a front cover, an inside front cover, the EN title page, pages 2 to 6, an inside back cover and a back cover. The BSI copyr
9、ight date displayed in this document indicates when the document was last issued. Amendments issued since publication Amd. No. Date CommentsEUROPEAN STANDARD EN 60512-6-2 NORME EUROPENNE EUROPISCHE NORM April 2002 CENELEC European Committee for Electrotechnical Standardization Comit Europen de Norma
10、lisation Electrotechnique Europisches Komitee fr Elektrotechnische Normung Central Secretariat: rue de Stassart 35, B - 1050 Brussels 2002 CENELEC - All rights of exploitation in any form and by any means reserved worldwide for CENELEC members. Ref. No. EN 60512-6-2:2002 E ICS 31.220.10 English vers
11、ion Connectors for electronic equipment - Tests and measurements Part 6-2: Dynamic stress tests - Test 6b: Bump (IEC 60512-6-2:2002) Connecteurs pour quipements lectroniques - Essais et mesures Partie 6-2: Essais de contraintes dynamiques - Essai 6b: Secousses (CEI 60512-6-2:2002) Steckverbinder fr
12、elektronische Einrichtungen - Mess- und Prfverfahren Teil 6-2: Prfungen mit dynamisch- mechanischer Beanspruchung - Prfung 6b: Dauerschocken (IEC 60512-6-2:2002) This European Standard was approved by CENELEC on 2002-04-01. CENELEC members are bound to comply with the CEN/CENELEC Internal Regulation
13、s which stipulate the conditions for giving this European Standard the status of a national standard without any alteration. Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the Central Secretariat or to any CENELEC member. This Eur
14、opean Standard exists in three official versions (English, French, German). A version in any other language made by translation under the responsibility of a CENELEC member into its own language and notified to the Central Secretariat has the same status as the official versions. CENELEC members are
15、 the national electrotechnical committees of Austria, Belgium, Czech Republic, Denmark, Finland, France, Germany, Greece, Iceland, Ireland, Italy, Luxembourg, Malta, Netherlands, Norway, Portugal, Spain, Sweden, Switzerland and United Kingdom.Foreword The text of document 48B/1139/FDIS, future editi
16、on 1 of IEC 60512-6-2, prepared by SC 48B, Connectors, of IEC TC 48, Electromechanical components and mechanical structures for electronic equipment, was submitted to the IEC-CENELEC parallel vote and was approved by CENELEC as EN 60512-6-2 on 2002-04-01. The following dates were fixed: latest date
17、by which the EN has to be implemented at national level by publication of an identical national standard or by endorsement (dop) 2003-01-01 latest date by which the national standards conflicting with the EN have to be withdrawn (dow) 2005-04-01 Annexes designated “normative“ are part of the body of
18、 the standard. In this standard, annex ZA is normative. Annex ZA has been added by CENELEC. _ Endorsement notice The text of the International Standard IEC 60512-6-2:2002 was approved by CENELEC as a European Standard without any modification. _ Page2 EN6051262:2002 BSI5June2002CONNECTORS FOR ELECTR
19、ONIC EQUIPMENT TESTS AND MEASUREMENTS Part 6-2: Dynamic stress tests Test 6b: Bump 1 General 1.1 Scope and object This part of IEC 60512, when required by the detail specification, is used for testing electromechanical components within the scope of IEC technical committee 48. This test may also be
20、used for similar devices when specified in a detail specification. The object of this test is to define a standard test method to assess the ability of components to withstand specified severities of bump. 1.2 Normative references The following normative documents contain provisions which, through r
21、eference in this text, constitute provisions of this part of IEC 60512. For dated references, subsequent amendments to, or revisions of, any of these publications do not apply. However, parties to agreements based on this part of IEC 60512 are encouraged to investigate the possibility of applying th
22、e most recent editions of the normative documents indicated below. For undated references, the latest edition of the normative document referred to applies. Members of IEC and ISO maintain registers of currently valid International Standards. IEC 60068-2-29:1987, Environmental testing Part 2: Tests
23、Test Eb and guidance: Bump IEC 60512-1-1, Connectors for electronic equipment Tests and measurements Part 1-1: General examination Test 1a: Visual examination IEC 60512-2-1, Connectors for electronic equipment Tests and measurements Part 2-1: Electrical continuity and contact resistance tests Test 2
24、a: Contact resistance Millivolt level method IEC 60512-2-5, Connectors for electronic equipment Tests and measurements Part 2-5: Electrical continuity and contact resistance tests Test 2e: Contact disturbance IEC 60512-7:1993, Connectors for electronic equipment Tests and measurements Part 7: Sealin
25、g tests 2 Preparation of the specimen Specimens shall be equipped with their normal accessories, mounted and wired as specified in the detail specification. Page3 EN6051262:2002 BSI5June2002Specimens shall be tested in a manner such that all mechanical features, such as panel-mounting arrangements,
26、locking and retaining devices, are fully utilized. Details of the monitoring circuit, including the method and attachment points of sensors on the specimen shall be specified. A minimum of 200 mm of wire or cable shall be unsupported on both ends of the specimen, unless otherwise specified in the de
27、tail specification. The wire or cable shall be secured to the bump fixture bottom plate (or similar location). 3 Test method This test shall be carried out in accordance with IEC 60068-2-29, Test Eb: Bump, using the degree of severity specified in the detail specification. 4 Measurements 4.1 Initial
28、 measurements shall be carried out as specified by the detail specification. 4.2 Measurements during the test Unless otherwise specified by the detail specification, during the last 200 bumps, monitoring of electrical continuity shall be carried out according to IEC 60512-2-5, Test 2e: Contact distu
29、rbance. The contacts and screen shall be connected in series as specified in the detail specification when monitoring continuity. The electrical load condition shall be 100 mA for all contacts, unless otherwise specified. The limit of duration of contact disturbance shall be specified in the detail
30、specification. 4.3 Final measurements The specimen shall be electrically and mechanically checked by the following tests, unless otherwise specified in the detail specification. Visual examination: IEC 60512-1-1, Test 1a. The specimen shall be visually examined without dismantling. There shall be no
31、 loosening, displacement of parts or mechanical damage such as to impair operation. Contact resistance Millivolt level method: IEC 60512-2-1, Test 2a. The contact resistance shall not exceed the maximum specified value. Sealing (if applicable): IEC 60512-7, Test 14b or other tests of Part 14: Sealin
32、g tests, according to IEC 60512-1-100, as specified in the detail specification. Page4 EN6051262:2002 BSI5June2002The leakage rate across all seals, including panel seals, shall be not greater than specified in the detail specification. Operational check The mechanical operational characteristics sh
33、all be checked according to the detail specification. 5 Details to be specified When this test is required by the detail specification, the following details shall be specified: a) method of mounting the specimen and associated cable(s)/wire bundle, including the unsupported length of cable from con
34、tact to first clamp; b) test severity (acceleration level and pulse duration); c) number of bumps per direction; d) limit of duration of contact disturbance; e) contact resistance, maximum value; f) maximum leakage rate; g) operational characteristics to be checked; h) any deviation from the standar
35、d test method. Page5 EN6051262:2002 BSI5June2002Annex ZA (normative) Normative references to international publications with their corresponding European publications This European Standard incorporates by dated or undated reference, provisions from other publications. These normative references are
36、 cited at the appropriate places in the text and the publications are listed hereafter. For dated references, subsequent amendments to or revisions of any of these publications apply to this European Standard only when incorporated in it by amendment or revision. For undated references the latest ed
37、ition of the publication referred to applies (including amendments). NOTE When an international publication has been modified by common modifications, indicated by (mod), the relevant EN/HD applies. Publication Year Title EN/HD Year IEC 60068-2-29 + corr. 1987 Basic environmental testing procedures
38、Part 2: Tests - Test Eb and guidance: Bump EN 60068-2-29 1993 IEC 60512-1-1 - 1) Connectors for electronic equipment - Tests and measurements Part 1-1: General examination - Test 1a: Visual examination EN 60512-1-1 2002 2) IEC 60512-2-1 - 1) Part 2-1: Electrical continuity and contact resistance tes
39、ts - Test 2a: Contact resistance - Millivolt level method EN 60512-2-1 2002 2) IEC 60512-2-5 - 3) Connectors for electronic equipment - Tests and measurements Part 2-5: Electrical continuity and contact resistance tests - Test 2e: Contact disturbance - IEC 60512-7 1993 Electromechanical components f
40、or electronic equipment - Basic testing procedures and measuring methods Part 7: Mechanical operating tests and sealing tests -1)Undated reference. 2)Valid edition at date of issue. 3)In preparation. Page6 EN6051262:2002 BSI5June2002BS EN 60512-6-2:2002 BSI 389 Chiswick High Road London W4 4AL BSI B
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