1、BSI Standards PublicationFibre optic active com-ponents and devices Performance standardsPart 2: 850 nm discrete vertical cavity surface emitting laser devicesBS EN 62149-2:2014National forewordThis British Standard is the UK implementation of EN 62149-2:2014. It is identical to IEC 62149-2:2014. It
2、 supersedes BS EN 62149-2:2009 which is withdrawn.The UK participation in its preparation was entrusted by TechnicalCommittee GEL/86, Fibre optics, to Subcommittee GEL/86/3, Fibre optic systems and active devices.A list of organizations represented on this committee can be obtained onrequest to its
3、secretary.This publication does not purport to include all the necessary provisions ofa contract. Users are responsible for its correct application. The British Standards Institution 2014.Published by BSI Standards Limited 2014ISBN 978 0 580 81908 7ICS 33.180.20Compliance with a British Standard can
4、not confer immunity fromlegal obligations.This British Standard was published under the authority of theStandards Policy and Strategy Committee on 31 August 2014.Amendments/corrigenda issued since publicationDate Text affectedBRITISH STANDARDBS EN 62149-2:2014EUROPEAN STANDARD NORME EUROPENNE EUROPI
5、SCHE NORM EN 62149-2 August 2014 ICS 33.180.20 Supersedes EN 62149-2:2009 English Version Fibre optic active components and devices - Performance standards - Part 2: 850 nm discrete vertical cavity surface emitting laser devices (IEC 62149-2:2014) Composants et dispositifs actifs fibres optiques - N
6、ormes de performances - Partie 2: Dispositifs discrets laser 850 nm cavit verticale mettant en surface (CEI 62149-2:2014) Aktive Lichtwellenleiterbauelemente und gerte - Betriebsverhalten - Teil 2: Oberflchenemittierende 850-nm-Laserbauelemente mit Vertikalresonator (IEC 62149-2:2014) This European
7、Standard was approved by CENELEC on 2014-06-30. CENELEC members are bound to comply with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standard without any alteration. Up-to-date lists and bibliographical references con
8、cerning such national standards may be obtained on application to the CEN-CENELEC Management Centre or to any CENELEC member. This European Standard exists in three official versions (English, French, German). A version in any other language made by translation under the responsibility of a CENELEC
9、member into its own language and notified to the CEN-CENELEC Management Centre has the same status as the official versions. CENELEC members are the national electrotechnical committees of Austria, Belgium, Bulgaria, Croatia, Cyprus, the Czech Republic, Denmark, Estonia, Finland, Former Yugoslav Rep
10、ublic of Macedonia, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia, Lithuania, Luxembourg, Malta, the Netherlands, Norway, Poland, Portugal, Romania, Slovakia, Slovenia, Spain, Sweden, Switzerland, Turkey and the United Kingdom. European Committee for Electrotechnical Standardizat
11、ion Comit Europen de Normalisation Electrotechnique Europisches Komitee fr Elektrotechnische Normung CEN-CENELEC Management Centre: Avenue Marnix 17, B-1000 Brussels 2014 CENELEC All rights of exploitation in any form and by any means reserved worldwide for CENELEC Members. Ref. No. EN 62149-2:2014
12、E BS EN 62149-2:2014EN 62149-2:2014 - 2 - Foreword The text of document 86C/1146/CDV, future edition 2 of IEC 62149-2, prepared by SC 86C “Fibre optic systems and active devices” of IEC/TC 86 “Fibre optics“ was submitted to the IEC-CENELEC parallel vote and approved by CENELEC as EN 62149-2:2014. Th
13、e following dates are fixed: latest date by which the document has to be implemented at national level by publication of an identical national standard or by endorsement (dop) 2015-03-30 latest date by which the national standards conflicting with the document have to be withdrawn (dow) 2017-06-30 T
14、his document supersedes EN 62149-2:2009. Attention is drawn to the possibility that some of the elements of this document may be the subject of patent rights. CENELEC and/or CEN shall not be held responsible for identifying any or all such patent rights. Endorsement notice The text of the Internatio
15、nal Standard IEC 62149-2:2014 was approved by CENELEC as a European Standard without any modification. In the official version, for Bibliography, the following notes have to be added for the standards indicated: IEC 60191 NOTE Harmonized in EN 60191 Series. IEC 60747-5-1 NOTE Harmonized as EN 60747-
16、5-1. IEC 60749 NOTE Harmonized in EN 60749 Series. IEC 60825 NOTE Harmonized in EN 60825 Series. IEC 60874 NOTE Harmonized in EN 60874 Series. IEC 61280-1-3 NOTE Harmonized as EN 61280-1-3. IEC 62007-1 NOTE Harmonized as EN 62007-1. IEC 62007-2 NOTE Harmonized as EN 62007-2. IEC 62148-1 NOTE Harmoni
17、zed as EN 62148-1. IEC 62149-1 NOTE Harmonized as EN 62149-1. BS EN 62149-2:2014- 3 - EN 62149-2:2014 Annex ZA (normative) Normative references to international publications with their corresponding European publications The following documents, in whole or in part, are normatively referenced in thi
18、s document and are indispensable for its application. For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments) applies. NOTE 1 When an International Publication has been modified by common modifications, in
19、dicated by (mod), the relevant EN/HD applies. NOTE 2 Up-to-date information on the latest versions of the European Standards listed in this annex is available here: www.cenelec.eu. Publication Year Title EN/HD Year IEC 60749-6 - Semiconductor devices - Mechanical and climatic test methods - Part 6:
20、Storage at high temperature EN 60749-6 - IEC 60749-7 - Semiconductor devices - Mechanical and climatic test methods - Part 7: Internal moisture content measurement and the analysis of other residual gases EN 60749-7 - IEC 60749-10 - Semiconductor devices - Mechanical and climatic test methods - Part
21、 10: Mechanical shock EN 60749-10 - IEC 60749-11 - Semiconductor devices - Mechanical and climatic test methods - Part 11: Rapid change of temperature - Two-fluid-bath method EN 60749-11 - IEC 60749-12 - Semiconductor devices - Mechanical and climatic test methods - Part 12: Vibration, variable freq
22、uency EN 60749-12 - IEC 60749-25 - Semiconductor devices - Mechanical and climatic test methods - Part 25: Temperature cycling EN 60749-25 - IEC 60749-26 - Semiconductor devices - Mechanical and climatic test methods - Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HB
23、M) EN 60749-26 - IEC 60825-1 - Safety of laser products - Part 1: Equipment classification and requirements EN 60825-1 - IEC 60950-1 - Information technology equipment - Safety - Part 1: General requirements EN 60950-1 - IEC 61300-2-4 - Fibre optic interconnecting devices and passive components - Ba
24、sic test and measurement procedures - Part 2-4: Tests - Fibre/cable retention EN 61300-2-4 - IEC 61300-2-19 - Fibre optic interconnecting devices and passive components - Basic test and measurement procedures - Part 2-19: Tests - Damp heat (steady state) EN 61300-2-19 - BS EN 62149-2:2014EN 62149-2:
25、2014 - 4 - Publication Year Title EN/HD Year IEC 61300-2-48 - Fibre optic interconnecting devices and passive components - Basic test and measurement procedures - Part 2-48: Tests - Temperature-humidity cycling EN 61300-2-48 - IEC 62148-15 - Fibre optic active components and devices - Package and in
26、terface standards - Part 15: Discrete vertical cavity surface emitting laser packages EN 62148-15 - IEC Guide 107 - Electromagnetic compatibility - Guide to the drafting of electromagnetic compatibility publications - - BS EN 62149-2:2014 2 IEC 62149-2:2014 IEC 2014 CONTENTS INTRODUCTION . 6 1 Scope
27、 7 2 Normative references 7 3 Terms, definitions, symbols and abbreviations . 8 3.1 Terms and definitions 8 3.2 Symbols and abbreviations . 9 4 Product parameters . 9 4.1 Absolute limiting ratings 9 4.2 Operating environment 10 4.3 Functional specification. 10 4.4 Diagrams 10 5 Testing 10 5.1 Genera
28、l . 10 5.2 Characterization testing 10 5.3 Performance testing 10 6 Environmental specifications . 10 6.1 General safety 10 6.2 Laser safety 10 6.3 Electromagnetic compatibility (EMC) requirements 11 Annex A (normative) Specifications for multimode 850-nm VCSEL device without a monitor photodiode (C
29、ase a) . 12 A.1 Absolute limiting ratings 12 A.2 Operating environment 12 A.3 Functional specification. 12 A.4 Diagrams 13 A.5 Testing . 13 A.5.1 Characterization testing . 13 A.5.2 Performance testing. 13 Annex B (normative) Specifications for multimode 850 nm VCSEL device with a monitor photodiode
30、 (Case b) . 16 B.1 Absolute limiting ratings 16 B.2 Operating environment 16 B.3 Functional specification. 16 B.4 Diagrams 17 B.5 Testing . 17 B.5.1 Characterization testing . 17 B.5.2 Performance testing. 18 Bibliography 20 Table 1 Operating environment 10 Table A.1 Absolute limiting ratings . 12 T
31、able A.2 Operating conditions for functional specification . 12 Table A.3 Functional specification 13 Table A.4 Performance test plan 14 BS EN 62149-2:2014IEC 62149-2:2014 IEC 2014 3 Table A.5 Recommended performance test failure criteria . 15 Table B.1 Absolute limiting ratings . 16 Table B.2 Opera
32、ting conditions for functional specification . 16 Table B.3 Functional specification 17 Table B.4 Performance test plan 18 Table B.5 Recommended performance test failure criteria . 19 BS EN 62149-2:2014 6 IEC 62149-2:2014 IEC 2014 INTRODUCTION Fibre optic laser devices are used to convert electrical
33、 signals into optical signals. This part of IEC 62149 covers the performance specification for 850 nm discrete vertical cavity surface emitting laser devices in fibre optic telecommunication and optical data transmission applications. BS EN 62149-2:2014IEC 62149-2:2014 IEC 2014 7 FIBRE OPTIC ACTIVE
34、COMPONENTS AND DEVICES PERFORMANCE STANDARDS Part 2: 850 nm discrete vertical cavity surface emitting laser devices 1 Scope This part of IEC 62149 covers the performance specification for 850-nm discrete vertical cavity surface emitting laser (VCSEL) devices of transverse multimode types used for fi
35、bre optic telecommunication and optical data transmission applications. The performance standard contains a definition of the product performance requirements together with a series of sets of tests and measurements with clearly defined conditions, severities, and pass/fail criteria. The tests are i
36、ntended to be run on a “once-off” basis to prove any products ability to satisfy the performance standards requirements. A product that has been shown to meet all the requirements of a performance standard can be declared as complying with the performance standard, but should then be controlled by a
37、 quality assurance/quality conformance program. Depending on the modulation speeds, sub-categorized specifications are defined. Types A1, A2, A3 and A4 correspond to 1,25 Gbit/s, 2,5 Gbit/s, 4,25 Gbit/s and 10 Gbit/s VCSELs, respectively. Each sub-categorized specification is also defined by separat
38、e details depending on the device types, such as specifications for a VCSEL device without a monitor photodiode (case a) and for a VCSEL device with a monitor photodiode (case b). 2 Normative references The following documents, in whole or in part, are normatively referenced in this document and are
39、 indispensable for its application. For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments) applies. IEC 60749-6, Semiconductor devices Mechanical and climatic test methods Part 6: Storage at high temperat
40、ure IEC 60749-7, Semiconductor devices Mechanical and climatic test methods Part 7: Internal moisture content measurement and the analysis of other residual gases IEC 60749-10, Semiconductor devices Mechanical and climatic test methods Part 10: Mechanical shock IEC 60749-11, Semiconductor devices Me
41、chanical and climatic test methods Part 11: Rapid change of temperature Two-fluid-bath method IEC 60749-12, Semiconductor devices Mechanical and climatic test methods Part 12: Vibration, variable frequency IEC 60749-25, Semiconductor devices Mechanical and climatic test methods Part 25: Temperature
42、cycling BS EN 62149-2:2014 8 IEC 62149-2:2014 IEC 2014 IEC 60749-26, Semiconductor devices Mechanical and climatic test methods Part 26: Electrostatic discharge (ESD) sensitivity testing Human body model (HBM) IEC 60825-1, Safety of laser products Part 1: Equipment classification and requirements IE
43、C 60950-1, Information technology equipment Safety Part 1: General requirements IEC 61300-2-4, Fibre optic interconnecting devices and passive components Basic test and measurement procedures Part 2-4: Tests Fibre/cable retention IEC 61300-2-19, Fibre optic interconnecting devices and passive compon
44、ents Basic test and measurement procedures Part 2-19: Tests Damp heat (steady state) IEC 61300-2-48, Fibre optic interconnecting devices and passive components Basic test and measurement procedures Part 2-48: Tests Temperature-humidity cycling IEC 62148-15, Fibre optic active components and devices
45、Package and interface standards Part 15: Discrete vertical cavity surface emitting laser packages IEC Guide 107, Electromagnetic compatibility Guide to the drafting of electromagnetic compatibility publications 3 Terms, definitions, symbols and abbreviations For the purposes of this document, the fo
46、llowing terms, definitions, symbols and abbreviations apply. NOTE Terminology concerning physical concepts, types of devices, general terms, and that related to ratings and characteristics of semiconductor devices can be found in IEC 60747-5-1. In addition, definitions for essential ratings and char
47、acteristics of semiconductor optoelectronic devices for fibre optic system applications can be found in IEC 62007-1. Terminology and test methods for laser wavelength and spectral width of VCSEL devices are also found in IEC 61280-1-3. 3.1 Terms and definitions The following terms are defined for th
48、e specific characteristics of VCSEL devices. 3.1.1 operating wavelength peak centre laser wavelength of the vertical cavity surface emitting laser device when it is operated at the normal operating conditions specified in the sectional specification of the VCSEL 3.1.2 transverse mode electromagnetic
49、 mode of a laser diode characterized by its power or field distribution in a section perpendicular to the direction of propagation, and in the direction perpendicular to the junction Note 1 to entry: Depending on the mode behaviour (multi-mode or single-mode), the package type of the VCSEL device is also defined. 3.1.3 multi-mode cross-section transverse mode of the laser beam profile with mode number greater t
