1、raising standards worldwideNO COPYING WITHOUT BSI PERMISSION EXCEPT AS PERMITTED BY COPYRIGHT LAWBSI Standards PublicationWB9423_BSI_StandardColCov_noK_AW:BSI FRONT COVERS 5/9/08 12:55 Page 1Organic light emitting diode(OLED) displays Part 1-1: Generic specificationsBS EN 62341-1-1:2009National fore
2、wordThis British Standard is the UK implementation of EN 62341-1-1:2009.It is identical to IEC 62341-1-1:2009. It supersedes BS IEC 62341-1-1:2009which is withdrawn.The UK participation in its preparation was entrusted to Technical CommitteeEPL/47, Semiconductors.A list of organizations represented
3、on this committee can be obtained onrequest to its secretary.This publication does not purport to include all the necessary provisions of acontract. Users are responsible for its correct application. BSI 2010ISBN 978 0 580 70151 1ICS 31.260Compliance with a British Standard cannot confer immunity fr
4、omlegal obligations.This British Standard was published under the authority of the StandardsPolicy and Strategy Committee on 31 July 2009Amendments/corrigenda issued since publicationDate Text affectedBRITISH STANDARDBS EN 62341-1-1:200930 2010 This corrigendum renumbers BS IEC 62341-1-1:2009 asBS E
5、N 62341-1-1:2009JuneEUROPEAN STANDARD EN 62341-1-1 NORME EUROPENNE EUROPISCHE NORM December 2009 CENELEC European Committee for Electrotechnical Standardization Comit Europen de Normalisation Electrotechnique Europisches Komitee fr Elektrotechnische Normung Central Secretariat: Avenue Marnix 17, B -
6、 1000 Brussels 2009 CENELEC - All rights of exploitation in any form and by any means reserved worldwide for CENELEC members. Ref. No. EN 62341-1-1:2009 E ICS 31.260 English version Organic light emitting diode (OLED) displays - Part 1-1: Generic specifications (IEC 62341-1-1:2009) Afficheurs diodes
7、 lectroluminescentes organiques (OLED) - Partie 1-1: Spcifications gnriques (CEI 62341-1-1:2009) Anzeigen mit organischen Leuchtdioden - Teil 1-1: Fachgrundspezifikation (IEC 62341-1-1:2009) This European Standard was approved by CENELEC on 2009-12-01. CENELEC members are bound to comply with the CE
8、N/CENELEC Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standard without any alteration. Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the Central Secretariat or to
9、 any CENELEC member. This European Standard exists in three official versions (English, French, German). A version in any other language made by translation under the responsibility of a CENELEC member into its own language and notified to the Central Secretariat has the same status as the official
10、versions. CENELEC members are the national electrotechnical committees of Austria, Belgium, Bulgaria, Cyprus, the Czech Republic, Denmark, Estonia, Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia, Lithuania, Luxembourg, Malta, the Netherlands, Norway, Poland, Portugal, Rom
11、ania, Slovakia, Slovenia, Spain, Sweden, Switzerland and the United Kingdom. Foreword The text of document 110/168/FDIS, future edition 1 of IEC 62341-1-1, prepared by IEC TC 110, Flat panel display devices, was submitted to the IEC-CENELEC parallel vote and was approved by CENELEC as EN 62341-1-1 o
12、n 2009-12-01. The following dates were fixed: latest date by which the EN has to be implemented at national level by publication of an identical national standard or by endorsement (dop) 2010-09-01 latest date by which the national standards conflicting with the EN have to be withdrawn (dow) 2012-12
13、-01 Annex ZA has been added by CENELEC. _ Endorsement notice The text of the International Standard IEC 62341-1-1:2009 was approved by CENELEC as a European Standard without any modification. In the official version, for Bibliography, the following notes have to be added for the standards indicated:
14、 IEC 60027-1 NOTE Harmonized as EN 60027-1:2006 (not modified). IEC 60027-4 NOTE Harmonized as EN 60027-4:2007 (not modified). ISO 1101 NOTE Harmonized as EN ISO 1101:2005 (not modified). _ EN 62341-1-1:2009 (E) 2 BS EN 62341-1-1:2009Annex ZA (normative) Normative references to international publica
15、tions with their corresponding European publications The following referenced documents are indispensable for the application of this document. For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments) appli
16、es. NOTE When an international publication has been modified by common modifications, indicated by (mod), the relevant EN/HD applies. Publication Year Title EN/HD Year IEC 60410 1973 Sampling plans and procedures for inspection by attributes - - IEC 60747-1 2006 Semiconductor devices - Part 1: Gener
17、al - - IEC 62341-1-2 -1)Organic light emitting diode displays - Part 1-2: Terminology and letter symbols EN 62341-1-2 20092)IEC 62341-5 2009 Organic Light Emitting Diode (OLED) displays - Part 5: Environmental testing methods EN 62341-5 2009 IEC 62341-6-1 -1)Organic light emitting diode (OLED) displ
18、ays - Part 6-1: Measuring methods of optical and electro-optical parameters - - IEC QC 001002 Series IEC quality assessment system for electronic components (IECQ) - Rules of procedure - - ISO 2859 Series Sampling procedures for inspection by attributes - - 1)Undated reference. 2)Valid edition at da
19、te of issue. 3 EN 62341-1-1:2009 (E)BS EN 62341-1-1:2009CONTENTS 1 Scope.6 2 Normative references .6 3 Terms, definitions, units and symbols .6 4 Technical aspects.6 4.1 Order of precedence .6 4.2 Standard atmospheric conditions.7 4.3 Marking .7 4.3.1 Device identification 7 4.3.2 Device traceabilit
20、y .7 4.3.3 Packing .7 4.4 Categories of assessed quality7 4.5 Screening8 4.6 Handling8 5 Quality assessment procedures8 5.1 Eligibility for qualification approval 8 5.2 Primary stage of manufacture8 5.3 Commercially confidential information .8 5.4 Formation of inspection lots.9 5.5 Structurally simi
21、lar devices9 5.6 Subcontracting 9 5.7 Validity of release9 6 Quality approval procedure.9 6.1 Granting of qualification approval 9 6.2 Quality conformance inspection requirements9 6.2.1 Division into groups and subgroups .9 6.2.2 Quality conformance Inspection requirements11 6.2.3 Supplementary proc
22、edure for reduced inspection 12 6.2.4 Sampling requirements for small lots .12 6.2.5 Certified records of released lots (CRRL) 12 6.2.6 Delivery of devices subjected to destructive or non-destructive test.12 6.2.7 Delayed deliveries .12 6.2.8 Supplementary procedure for deliveries.12 6.3 Statistical
23、 sampling procedures .13 6.3.1 AQL sampling plans.13 6.3.2 LTPD sampling plans.13 6.4 Endurance tests 13 6.4.1 General .13 6.4.2 Endurance tests where the failure rate is specified 13 6.5 Accelerated test procedures 14 7 Capability approval procedure 14 8 Test and measurement procedures.15 8.1 Stand
24、ard environmental conditions15 8.1.1 Dark room condition 15 8.1.2 Standard setup condition .15 8.1.3 Standard atmospheric conditions for measurements 15 EN 62341-1-1:2009 (E) 4 BS EN 62341-1-1:20098.2 Physical examination.15 8.2.1 Visual examination 15 8.2.2 Dimensions .15 8.2.3 Weight.15 8.2.4 Perm
25、anence of marking.15 8.3 Electrical and optical measurement .15 8.3.1 General conditions and precautions.16 8.4 Environmental test 16 8.5 Endurance test 16 Annex A (informative) Lot tolerance percentage defective (LTPD) sampling plans .17 Bibliography22 Table A.1 LTPD sampling plans .19 Table A.2 Hy
26、pergeometric sampling plans for small lot sizes of 200 or less .20 Table A.3 AQL and LTPD sampling plans.21 5 EN 62341-1-1:2009 (E)BS EN 62341-1-1:2009ORGANIC LIGHT EMITTING DIODE (OLED) DISPLAYS Part 1-1: Generic specifications 1 Scope This part of IEC 62341 is a generic specification for organic l
27、ight emitting diode (OLED) displays. It defines general procedures for quality assessment to be used in the IECQ-CECC system and establishes general rules for methods of electrical and optical measurements, environmental and mechanical tests and endurance tests. 2 Normative references The following
28、referenced documents are indispensable for the application of this document. For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments) applies. IEC 60410:1973, Sampling plans and procedures for inspection by
29、 attributes IEC 60747-1:2006, Semiconductor devices Part 1: General IEC 62341-1-2, Organic light emitting diode displays Part 1-2: Terminology and letter symbols IEC 62341-51, Organic light emitting diode (OLED) displays Part 5: Environmental testing methods IEC 62341-6-12, Organic light emitting di
30、ode (OLED) displays Part 6-1: Measuring methods of optical and electro-optical parameters IEC QC 001002 (all parts), IEC Quality Assessment System for Electronic components (IECQ) Rules of Procedure ISO 2859 (all parts), Sampling procedures for inspection by attributes 3 Terms, definitions, units an
31、d symbols For the purposes of this document, the terms, definitions, units and symbols given in IEC 62341-1-2 apply. 4 Technical aspects 4.1 Order of precedence Where there are conflicting requirements, documents shall rank in the following order of authority: a) the detail specification; b) the bla
32、nk detail specification; 1In preparation. 2In preparation. EN 62341-1-1:2009 (E) 6 BS EN 62341-1-1:2009c) the family specification, if any; d) the sectional specification; e) the generic specification; f) the basic specification; g) the IECQ rules of procedure; h) any other international (e.g. IEC)
33、documents to which reference is made; i) a national document. The same order of precedence shall apply to equivalent national documents. 4.2 Standard atmospheric conditions Preferred values of temperature, humidity and pressure for the measurement characteristics and tests, for operating condition,
34、are specified in 8.1.3. Unless otherwise specified, all measurement and tests shall be carried out under the condition described in 8.1.3. 4.3 Marking 4.3.1 Device identification The marking on the device shall enable clear identification of the device. The order of priority for marking on small pro
35、ducts shall be specified in the detail specification. 4.3.2 Device traceability The device shall be provided with a traceability code, which enables back-tracing of the device to certain production or inspection lot. 4.3.3 Packing Marking on the packing shall state: a) the device identification code
36、; b) the traceability code(s) of the enclosed devices; c) the number of enclosed devices; d) the required precautions, if any. This marking shall be in accordance with custom regulations. 4.4 Categories of assessed quality This generic specification provides three categories of assessed quality. The
37、 devices are grouped in an identified inspection lot in accordance with IEC QC 001002-3, 3.3, which is tested to the specified quality categories. The AQL (acceptance quality levels) or LTPD (lot tolerance percentage defective) associated with the same inspection group may vary for each category and
38、 shall be as specified in the detail specification. The minimum requirements of the categories are as follows: Category I The type shall meet the requirements of qualification approval of categories II or III. Each lot shall meet the inspection requirements of group A, which includes functional test
39、s. Every three months, one lot shall meet the inspection requirements for interconnection ability. Annually, one lot shall meet the group B and group C inspection requirements (see 6.2.1) 7 EN 62341-1-1:2009 (E)BS EN 62341-1-1:2009Category II The type shall meet the requirements of group A, group B,
40、 group C and group D if needed, for qualification approval. The lot shall meet the inspection requirements of group A and group B on a lot-by-lot basis, and of group C on a periodic basis. Category III The type shall meet the requirements of group A, group B, group C and group D if needed, for quali
41、fication approval. The lot is 100 % screened and shall meet the inspection requirements of group A and group B on a lot-by-lot basis, and of group C on a periodic basis. The sectional or blank detail specification shall define the minimum requirements for each category. A detail specification may co
42、ntain requirements, including screening requirements, additional to those given in the generic, sectional or blank or any other relevant detail specification. 4.5 Screening A screening is an examination or test applied to all devices in a lot. When required by the detail specification, all devices i
43、n the lot shall be screened by submitting them to one of the sequences given in the relevant sectional or blank detail specification, and all defectives shall be removed. Other sequences not specified in this standard are applicable only where the above sequences are not correlated or are in contrad
44、iction with failure mechanisms. When a part of the screening process as given in the sectional or blank detail specification forms part of the manufacturing process in the prescribed sequence, these procedures need not be repeated. 4.6 Handling See IEC 60747-1, Clause 8. Adequate warning shall be di
45、splayed in the case of harmful products. 5 Quality assessment procedures Quality assessment comprises the procedure for obtaining qualification approval followed by quality conformance inspection on a lot-by-lot basis (including screening if required) and on a periodic basis as qualified in the deta
46、il specification. The quality assessment tests are subdivided into group A, B and C tests; these are performed lot by lot or periodically, group D (see 6.2.1.5) tests may also be specified, for example, for qualification approval. 5.1 Eligibility for qualification approval A type of device becomes e
47、ligible for qualification approval when the rules of procedure of IEC QC 001002-3, Clause 3, are satisfied. 5.2 Primary stage of manufacture The primary stage of manufacture is defined in the sectional or blank detail specification. 5.3 Commercially confidential information If any part of the manufa
48、cturing process is commercially confidential, this shall be suitably identified, and the designated management representative (DMR) shall demonstrate to the satisfaction of the National Supervising Inspectorate (NSI) that the requirements of the rules of procedure given in 2.3.3.1 of IEC QC 001002-3
49、, have been complied with. EN 62341-1-1:2009 (E) 8 BS EN 62341-1-1:20095.4 Formation of inspection lots See the rules of procedure given in IEC QC 001002-3, 3.3.1. 5.5 Structurally similar devices See the rules of procedure given in IEC QC 001002-3, 3.3.2. Details concerning grouping are given in the relevant sectional or blank detail specification. 5.6 Subcontracting The use of subcontracting is permitted for quality assessments procedures. To use the subcontracting, see the rules of pr
