1、raising standards worldwideNO COPYING WITHOUT BSI PERMISSION EXCEPT AS PERMITTED BY COPYRIGHT LAWBSI Standards PublicationBS EN 62490-2:2010ESL measuring methodPart 2: Surface mount capacitors for use inelectronic equipmentBS EN 62490-2:2010 BRITISH STANDARDNational forewordThis British Standard is
2、the UK implementation of EN 62490-2:2010.It is identical to IEC 62490-2:2010.The UK participation in its preparation was entrusted to TechnicalCommittee EPL/40X, Capacitors and resistors for electronicequipment.A list of organizations represented on this committee can beobtained on request to its se
3、cretary.This publication does not purport to include all the necessaryprovisions of a contract. Users are responsible for its correctapplication. BSI 2010ISBN 978 0 580 63321 8ICS 31.060.01Compliance with a British Standard cannot confer immunity fromlegal obligations.This British Standard was publi
4、shed under the authority of theStandards Policy and Strategy Committee on 30 September 2010.Amendments issued since publicationDate Text affectedEUROPEAN STANDARD EN 62490-2 NORME EUROPENNE EUROPISCHE NORM September 2010 CENELEC European Committee for Electrotechnical Standardization Comit Europen d
5、e Normalisation Electrotechnique Europisches Komitee fr Elektrotechnische Normung Management Centre: Avenue Marnix 17, B - 1000 Brussels 2010 CENELEC - All rights of exploitation in any form and by any means reserved worldwide for CENELEC members. Ref. No. EN 62490-2:2010 E ICS 31.060.01 English ver
6、sion ESL measuring method - Part 2: Surface mount capacitors for use in electronic equipment (IEC 62490-2:2010) Mthode de mesure de lESL - Partie 2: Condensateurs pour montage en surface utiliss dans les quipements lectroniques (CEI 62490-2:2010) ESL-Messverfahren - Teil 2: Oberflchenmontierbare Kon
7、densatoren zur Verwendung in Gerten der Elektrotechnik und Elektronik (IEC 62490-2:2010) This European Standard was approved by CENELEC on 2010-09-01. CENELEC members are bound to comply with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European Standard the st
8、atus of a national standard without any alteration. Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the Central Secretariat or to any CENELEC member. This European Standard exists in three official versions (English, French, German
9、). A version in any other language made by translation under the responsibility of a CENELEC member into its own language and notified to the Central Secretariat has the same status as the official versions. CENELEC members are the national electrotechnical committees of Austria, Belgium, Bulgaria,
10、Croatia, Cyprus, the Czech Republic, Denmark, Estonia, Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia, Lithuania, Luxembourg, Malta, the Netherlands, Norway, Poland, Portugal, Romania, Slovakia, Slovenia, Spain, Sweden, Switzerland and the United Kingdom. EN 62490-2:2010
11、- 2 - Foreword The text of document 40/2045/FDIS, future edition 1 of IEC 60490-2, prepared by IEC TC 40, Capacitors and resistors for electronic equipment, was submitted to the IEC-CENELEC parallel vote and was approved by CENELEC as EN 62490-2 on 2010-09-01. Attention is drawn to the possibility t
12、hat some of the elements of this document may be the subject of patent rights. CEN and CENELEC shall not be held responsible for identifying any or all such patent rights. The following dates were fixed: latest date by which the EN has to be implemented at national level by publication of an identic
13、al national standard or by endorsement (dop) 2011-06-01 latest date by which the national standards conflicting with the EN have to be withdrawn (dow) 2013-09-01 Annex ZA has been added by CENELEC. _ Endorsement notice The text of the International Standard IEC 62490-2:2010 was approved by CENELEC a
14、s a European Standard without any modification. _ BS EN 62490-2:2010BS EN 62490-2:2010- 3 - EN 62490-2:2010 Annex ZA (normative) Normative references to international publications with their corresponding European publications The following referenced documents are indispensable for the application
15、of this document. For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments) applies. NOTE When an international publication has been modified by common modifications, indicated by (mod), the relevant EN/HD a
16、pplies. Publication Year Title EN/HD Year IEC 60384-1 2008 Fixed capacitors for use in electronic equipment - Part 1: Generic specification EN 60384-1 2009 BS EN 62490-2:2010 2 62490-2 IEC:2010 CONTENTS FOREWORD.3 1 Scope.5 2 Normative references .5 3 Terms and definitions .6 4 Test fixture and comp
17、ensation chip 6 4.1 Test fixture 6 4.2 The open, short, and load compensation chip9 4.2.1 The open compensation chip .9 4.2.2 The load compensation chip 9 4.2.3 The short compensation chip.9 5 Measuring method10 5.1 Measuring equipment 10 5.2 Measurement conditions10 5.3 Measurement points 10 5.4 Fr
18、equency and signal level10 5.5 Measurement procedure11 5.5.1 General .11 5.5.2 Open compensation.11 5.5.3 Load compensation .11 5.5.4 Short compensation.12 5.5.5 ESL measurement .13 6 Items to be indicated in the test result report 13 Annex A (informative) Theoretical ESL value of the short compensa
19、tion chip.14 Figure 1 Lead frame and thin coating types of surface mount capacitors and the specification of the dimensions (L, W, and H)5 Figure 2 Surface mount capacitors with face down terminal .5 Figure 3 Test fixture and terminals of test fixture .6 Figure 4 Connection diagram .7 Figure 5 Secti
20、onal view of the test fixture with an inserted surface mount capacitor pressured to the terminals of the test fixture .8 Figure 6 Example of surface mount capacitor mounted on terminals of test fixture.8 Figure 7 Front view of mounting position of objects on test fixture9 Figure 8 Measurement points
21、.10 Figure 9 Open compensation-chip position.11 Figure 10 Load compensation-chip position .12 Figure 11 Short compensation-chip position.12 Figure A.1 Points of contact of the short compensation chip and terminals of test fixture .15 Table A.1 The calculation results of inductance of the short compe
22、nsation chip.14 BS EN 62490-2:201062490-2 IEC:2010 3 INTERNATIONAL ELECTROTECHNICAL COMMISSION _ ESL MEASURING METHOD Part 2: Surface mount capacitors for use in electronic equipment FOREWORD 1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization compr
23、ising all national electrotechnical committees (IEC National Committees). The object of IEC is to promote international co-operation on all questions concerning standardization in the electrical and electronic fields. To this end and in addition to other activities, IEC publishes International Stand
24、ards, Technical Specifications, Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested in the subject dealt with may participate in this prepa
25、ratory work. International, governmental and non-governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely with the International Organization for Standardization (ISO) in accordance with conditions determined by agreement between the two organiz
26、ations. 2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international consensus of opinion on the relevant subjects since each technical committee has representation from all interested IEC National Committees. 3) IEC Publications have the form of
27、 recommendations for international use and are accepted by IEC National Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any misinterpretation
28、 by any end user. 4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications transparently to the maximum extent possible in their national and regional publications. Any divergence between any IEC Publication and the corresponding national or region
29、al publication shall be clearly indicated in the latter. 5) IEC itself does not provide any attestation of conformity. Independent certification bodies provide conformity assessment services and, in some areas, access to IEC marks of conformity. IEC is not responsible for any services carried out by
30、 independent certification bodies. 6) All users should ensure that they have the latest edition of this publication. 7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and members of its technical committees and IEC National Committees fo
31、r any personal injury, property damage or other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC Publications. 8) Attention is drawn to the Nor
32、mative references cited in this publication. Use of the referenced publications is indispensable for the correct application of this publication. 9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of patent rights. IEC shall not be held resp
33、onsible for identifying any or all such patent rights. International Standard IEC 62490-2 has been prepared by IEC technical committee 40: Capacitors and resistors for electronic equipment. The text of this standard is based on the following documents: FDIS Report on voting 40/2045/FDIS 40/2057/RVD
34、Full information on the voting for the approval of this standard can be found in the report on voting indicated in the above table. This publication has been drafted in accordance with the ISO/IEC Directives, Part 2. BS EN 62490-2:2010 4 62490-2 IEC:2010 A list of all the parts in the IEC 62490 seri
35、es, under the general title ESL measuring method, can be found on the IEC web site. The committee has decided that the contents of this publication will remain unchanged until the stability date indicated on the IEC web site under “http:/webstore.iec.ch“ in the data related to the specific publicati
36、on. At this date, the publication will be reconfirmed, withdrawn, replaced by a revised edition, or amended. IMPORTANT The colour inside logo on the cover page of this publication indicates that it contains colours which are considered to be useful for the correct understanding of its contents. User
37、s should therefore print this document using a colour printer. BS EN 62490-2:201062490-2 IEC:2010 5 ESL MEASURING METHOD Part 2: Surface mount capacitors for use in electronic equipment 1 Scope This part of IEC 62490 provides the ESL measuring method for the surface mount capacitors for use in elect
38、ronic equipment. W H L W L H IEC 1732/10 IEC 1731/10 Figure 1a Lead frame electrode terminal Figure 1b Thin coating electrode terminal Figure 1 Lead frame and thin coating types of surface mount capacitors and the specification of the dimensions (L, W, and H) The ESL measurement method can be applic
39、able to the surface mount capacitors with the following properties, but not limited to these: a) capacitance range: 10 F to 1 000 F; b) size: L W = 3,2 mm 1,6 mm to 7,3 mm 4,3 mm, H = 4,0 mm; c) ESL range: 5 nH or less. NOTE The surface mount capacitors in this document are limited to capacitors wit
40、h lead frame or with thin coated terminals, see Figure 1. The scope of this document does not include capacitors with face down terminals, see Figure 2. 1IEC 1733/10 Key 1 terminals (shaded section) Figure 2 Surface mount capacitors with face down terminal 2 Normative references The following refere
41、nced documents are indispensable for the application of this document. For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments) applies. IEC 60384-1:2008, Fixed capacitors for use in electronic equipment Pa
42、rt 1: Generic specification BS EN 62490-2:2010 6 62490-2 IEC:2010 3 Terms and definitions For the purpose of this document, the terms and definitions given in IEC 60384-1 and the following apply. 3.1 equivalent series inductance L ESL inductive part of the impedance of capacitors NOTE The unit of ES
43、L is Henry (H). 4 Test fixture and compensation chip 4.1 Test fixture (Low ESL measuring equipment) Lc Lp Hp Hc Lc Lp Hc Hp Terminal of test fixture Capacitor to be measured Zoom 0,5 0,1 1,0 0,1IEC 1734/10 Dimensions in millimetres Figure 3a Top view of test fixture Figure 3b Enlarge view of the ter
44、minals of test fixture Figure 3 Test fixture and terminals of test fixture The test fixture shall have the following features. a) The test fixture has a 4-terminal structure. The capacitors can be mounted on the test fixture as shown in Figure 3. The terminals of the test fixture shall be connected
45、to the low current terminal (Lc), the low voltage terminal (Lp), the high current terminal (Hc), and the high voltage terminal (Hp). BS EN 62490-2:201062490-2 IEC:2010 7 Hp Lp Hc Lc Lp Lc Hp Hc 1 2 4 3 7* 5 6 3 IEC 1735/10 Key 1 one of fixture terminals (shaded section) 2 capacitor (dashed line) 3 c
46、apacitor terminal (dotted section) 4 fixture (within dashed-dotted line) * Connect sheaths of 4 coaxial cables to each other within very short distance of fixture terminals 5 coaxial cables (dotted section) 6 ESL measuring equipment (thick line) 7 connect shielding wire (dotted line) Figure 4 Connec
47、tion diagram b) Anchoring the capacitor with pressure terminals which make stable contact provides high repeatability and reproducibility (see Figure 5). BS EN 62490-2:2010 8 62490-2 IEC:2010 * *2 5 1 Pressure Pressure 3 4 5 3 4 IEC 1736/10 Key 1 lid of test fixture for fixing capacitor (thick line)
48、 2 capacitor (dashed line) 3 capacitor terminal (dotted section) * 0,5 mm 0,1 mm * See Figure 3. 4 terminals of test fixture (shaded section) 5 guides for capacitor (shaded section) Figure 5 Sectional view of the test fixture with an inserted surface mount capacitor pressured to the terminals of the
49、 test fixture c) Figure 6 is an example of surface mount capacitor mounted on terminals of test fixture. See Figure 3 13 2 4531 3Lc Lp HcHp2 3 IEC 1737/10 Key for Figure 6a 1 one of fixture terminals (shaded section) 2 capacitor (dashed line) 3 capacitor terminal (dotted section) Key for Figure 6b 1 fixture terminal (shaded section) 2 capacitor (dashed line) 3 capacitor terminal (dotted section) 4 low side terminals (sha
