1、BRITISH STANDARD BS IEC 60319:1999 Presentation and specification of reliability data for electronic components ICS 31.020BSIEC60319:1999 This BritishStandard, having been prepared under the directionof the Management Systems Sector Committee, waspublished under the authorityof the Standards Committ
2、ee and comes intoeffecton 15December1999 BSI04-2000 ISBN 0 580 35685 X National foreword This BritishStandard reproduces verbatim IEC60319:1999 and implements it as the UK national standard. The UK participation in its preparation was entrusted by Technical Committee DS/1, Dependability and terotech
3、nology, to Subcommittee DS/1/1, Dependability, which has the responsibility to: aid enquirers to understand the text; present to the responsible international/European committee any enquiries on the interpretation, or proposals for change, and keep the UK interests informed; monitor related internat
4、ional and European developments and promulgate them in the UK. A list of organizations represented on this subcommittee can be obtained on request to its secretary. From1January1997, all IEC publications have the number60000 added to the old number. For instance, IEC27-1 has been renumbered as IEC60
5、027-1. For a period of time during the change over from one numbering system to the other, publications may contain identifiers from both systems. Cross-references The BritishStandards which implement international publications referred to in this document may be found in the BSI Standards Catalogue
6、 under the section entitled “International Standards Correspondence Index”, or by using the “Find” facility of the BSI Standards Electronic Catalogue. A British Standard does not purport to include all the necessary provisions of a contract. Users of British Standards are responsible for their corre
7、ct application. Compliance with a British Standard does not of itself confer immunity from legal obligations. Summary of pages This document comprises a front cover, an inside front cover, pagesi andii, theIEC title page, pages ii to iv, pages1 to13 and a back cover. This standard has been updated (
8、see copyright date) and may have had amendments incorporated. This will be indicated in the amendment table on the inside front cover. Amendments issued since publication Amd. No. Date CommentsBSIEC60319:1999 BSI 04-2000 i Contents Page National foreword Inside front cover Foreword iii Text of IEC 6
9、0319 1ii blankBS IEC60319:1999 ii BSI 04-2000 Contents Page Foreword iii Introduction 1 1 Scope 1 2 Normative references 1 3 Definitions 1 4 Requirements for presenting reliability data 1 4.1 General 1 4.2 Identification of components tested 1 4.3 Component technology 2 4.4 Electrical specification
10、of components 2 4.5 Environmental specification of components 2 4.6 Method of selection of sample components 2 4.7 Test related issues 2 4.8 Data on failures 2 5 Presentation of reliability data 3 5.1 General 3 5.2 Presentation of summary data 3 5.3 Presentation of detailed data 3 Annex A (informati
11、ve) Examples of reports 5 A.1 Example of a summary report 5 A.2 Example of a detailed report 6 Annex B (informative) Data analysis techniques 7 B.1 Primary data 7 B.2 Graphical methods 8 B.3 Numerical methods 11 Figure B.1 Scatter diagram plot (example) 8 Figure B.2 Probability chart plot (example)
12、9 Figure B.3 Percentile plot (example) 10 Table B.1 Primary data (example) 7 Table B.2 Grouped frequencies (data from Table B.1) 11 Table B.3 Statistical parameters (data from Table B.1) 13 Table B.4 Correlation coefficients (data from Table B.1) 13BSIEC60319:1999 BSI 04-2000 iii Foreword 1) The IEC
13、 (International Electrotechnical Commission) is a worldwide organization for standardization comprising all national electrotechnical committees (IEC National Committees). The object of the IEC is to promote international co-operation on all questions concerning standardization in the electrical and
14、 electronic fields. To this end and in addition to other activities, the IEC publishes International Standards. Their preparation is entrusted to technical committees; any IEC National Committee interested in the subject dealt with may participate in this preparatory work. International, governmenta
15、l and non-governmental organizations liaising with the IEC also participate in this preparation. The IEC collaborates closely with the International Organization for Standardization (ISO) in accordance with conditions determined by agreement between the two organizations. 2) The formal decisions or
16、agreements of the IEC on technical matters express, as nearly as possible, an international consensus of opinion on the relevant subjects since each technical committee has representation from all interested National Committees. 3) The documents produced have the form of recommendations for internat
17、ional use and are published in the form of standards, technical specifications, technical reports or guides and they are accepted by the National Committees in that sense. 4) In order to promote international unification, IEC National Committees undertake to apply IEC International Standards transpa
18、rently to the maximum extent possible in their national and regional standards. Any divergence between the IEC Standard and the corresponding national or regional standard shall be clearly indicated in the latter. 5) The IEC provides no marking procedure to indicate its approval and cannot be render
19、ed responsible for any equipment declared to be in conformity with one of its standards. 6) Attention is drawn to the possibility that some of the elements of this International Standard may be the subject of patent rights. The IEC shall not be held responsible for identifying any or all such patent
20、 rights. International Standard IEC60319 has been prepared by IEC technical committee56: Dependability. This third edition cancels and replaces the second edition published in1978. This third edition constitutes a technical revision. The text of this standard is based on the following documents: Ful
21、l information on the voting for the approval of this standard can be found in the report on voting indicated in the above table. This publication has been drafted in accordance with the ISO/IEC Directives, Part3. Annex A and Annex B are for information only. The committee has decided that this publi
22、cation remains valid until2004. At this date, in accordance with the committees decision, the publication will be reconfirmed; withdrawn; replaced by a revised edition, or amended. FDIS Report on voting 56/665/FDIS 56/671/RVDiv blankBSIEC60319:1999 BSI 04-2000 1 Introduction This International Stand
23、ard provides guidance for the collection and presentation of data relating to the reliability of electronic components. It is considered that, if such guidance is followed, the accuracy and completeness of reporting are enforced and the quality of the monitored items and their parts can be improved.
24、 Moreover, such effort will facilitate the interchange of reliability information among all interested parties. 1 Scope This International Standard gives guidance for the collection and presentation of data necessary to understand the reliability characteristics of a component. It also gives guidanc
25、e to component users as to how they should specify their reliability requirements to component manufacturers. It makes no distinction between data on failures or operation without failures or faults. Such factual information, derived from laboratory tests, should be available to the circuit and equi
26、pment designers to enable evaluation of the reliability of circuits and systems. 2 Normative references The following normative documents contain provisions which, through reference in this text, constitute provisions of this International Standard. For dated references, subsequent amendment to or r
27、evisions of any of these publications do not apply. However, parties to agreements based on this International Standard are encouraged to investigate the possibility of applying the most recent editions of the normative documents indicated below. For undated references, the latest edition of the nor
28、mative document referred to applies. Members of IEC and ISO maintain registers of currently valid International Standards. IEC60050(191):1990, International Electrotechnical Vocabulary (IEV) Chapter191:Dependability and quality of service. IEC61360-4:1997, Standard data element types with associated
29、 classification scheme for electric components Part4: IEC reference collection of standard data element types, component classes and terms. 3 Definitions For the purposes of this International Standard, the terms and definitions of IEC60050(191) apply. 4 Requirements for presenting reliability data
30、4.1 General Where possible, information should be obtained by the use of standard reliability tests. However, if some of the required data do not exist then steps should be taken to obtain them by the use of dedicated tests. If this is not possible, then generic estimates or data from equivalent dev
31、ices may be used assuming that this is stated in the data presentation. The following or similar data should be supplied by the component manufacturer or requested by the component user: component identification, component technology, electrical specification, environmental specification, methods fo
32、r selection of sample components, test related issues, data on failures. 4.2 Identification of components tested 4.2.1 General The information supplied to identify the components should be in accordance with the relevant IEC publication for the component type under test whenever possible. If IEC pub
33、lications are not available, then other component specifications should be used and the source of the specifications stated. As a minimum, the following information should be given. Only information applicable to a particular component type should be supplied. 4.2.2 Component identification a) A des
34、cription of the component type with sufficient details to uniquely identify the component type, for example N-channel V-MOS transistor. When available, specification numbers should be given. b) The component part number. If available, a universal part number, for example stock number, should be give
35、n; otherwise a part number specific to the component manufacturer may be given. c) Name of the manufacturer and place of manufacture. The purpose of these references is to allow access to more detailed information if required. d) The date of manufacture or lot number or other production batch relate
36、d identification. This information will allow access to other components that were produced at the same time as the sample should a problem arise. e) The production status of the component, for example development sample, pre-production, standard production, mature technology.BSIEC60319:1999 2 BSI 0
37、4-2000 f) Information regarding compliance with other recognized standards should be given whenever possible. 4.3 Component technology a) A description of the basic component technology, for example metal film resistor. b) A general description of the production process, for example ion beam epitaxy
38、. c) Packaging information, for example plastic, hermetic weld, etc. d) Thermal resistance, for example R th,j-a,R th,j-c . e) Complexity of circuit. f) Method of termination, for example endcaps, DIL, SMD. 4.4 Electrical specification of components a) Relevant information about ratings and characte
39、ristics should be supplied. These references taken from the applicable component specifications will depend on the type of test performed. For example, if power cycling tests are performed then the ratings for power dissipation should be given. b) Information should be given about any pre-test scree
40、ning the components to be tested may have undergone. The results of such screening should be given. 4.5 Environmental specification of components Information should be given regarding the maximum environmental conditions the components can withstand, for example temperature, humidity, acceleration.
41、4.6 Method of selection of sample components A description of the procedure of the sample selection should be given, for example drawn at a rate of10parts per week over a10-week period or100pieces selected at random from a purchased lot of10000. 4.7 Test related issues The test conditions should be
42、those described in the relevant IEC publications for the components under test whenever possible. If IEC publications are not available, then other test specifications should be used and the source of the specifications stated. The following minimum information should be supplied. a) The source of t
43、he results, for example the quality assurance department of the manufacturer. b) A description of the test conditions used, for example the electrical, mechanical and environmental conditions. The test conditions should be identified by quoting the relevant IEC or other test specifications where pos
44、sible. c) The number of components under test. Where a component is available in a number of different values, for example resistors, capacitors, the values tested and the quantity of each value should be stated. d) A description of the characteristic measured, for example resistance, and the measur
45、ing conditions. Where the measurement conditions are specified by IEC or other specifications, then the specification number should be given. e) If more than one method of characteristic measurement is permissible then a description of the method used should be given. This description should contain
46、 all relevant details. f) The test start date, duration and measurement intervals should be stated. g) Where a delay exists between the cessation of the test and the commencement of measurements, then the time duration should be stated. The storage conditions during this delay should also be stated.
47、 Any conditioning stress applied to the components before measurement should also be stated. 4.8 Data on failures 4.8.1 General requirements a) The number of failures observed, categorized by test conditions and type of failure, for example failure modes and parameter tolerances exceeded see4.8.2 a)
48、. b) The times at which the failures occurred or were verified. c) Special events during testing, for example events which might have affected the results. d) Statement about failure mechanism, if known. e) Data from tests should be presented whenever possible. Methods for presenting such data are g
49、iven in Annex B. f) If data from tests are discarded, these data and the reasons why they are not given in the presentation or results, should be given separately.BSIEC60319:1999 BSI 04-2000 3 4.8.2 Additional requirements a) Failure criteria Failure criteria for the components (for degradation failures as well as for catastrophic failures), are normally defined by the requirements given by the specification to which reference is made in the test report. If failure criteria for the components are not given by the reference specification, they shou
