1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Add figure 4. Change in terminal connections. Add subgroup 8 to Table II. Change vendor similar part number for case outline 2. Change IIL. Editorial changes throughout. mlp 89-03-07 Michael A. Frye B Changes to Table I and Table II and other cha
2、nges per NOR 5962-R026-92. tvn 91-11-26 Monica L. Poelking C Add package CDFP4-F16. Change document to current electronic format. Editorial changes throughout. les 98-02-04 Raymond Monnin D Figure 4 modified to be consistent with Table I. ljs 98-08-10 Raymond Monnin E Update to current requirements.
3、 Editorial changes throughout. - gap 06-02-17 Raymond Monnin The original first page of this drawing has been replaced. REV SHET REV SHET REV STATUS REV E E E E E E E E E E E E E OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 12 13 PMIC N/A PREPARED BY Monica L. Poelking DEFENSE SUPPLY CENTER COLUMBUS STAN
4、DARD MICROCIRCUIT DRAWING CHECKED BY Raymond Monnin COLUMBUS, OHIO 43218-3990 http:/www.dscc.dla.mil THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS APPROVED BY Michael A. Frye MICROCIRCUIT, DIGITAL, ECL, QUAD LINE AND AGENCIES OF THE DEPARTMENT OF DEFENSE DRAWING APPROVAL DATE 87-11-10 RECEIVE
5、R, MONOLITHIC SILICON AMSC N/A REVISION LEVEL E SIZE A CAGE CODE 67268 5962-87501 SHEET 1 OF 13 DSCC FORM 2233 APR 97 5962-E201-06 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87501 DEFENSE SUPPLY CENTER C
6、OLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL E SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing describes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A. 1.2 Part or Identifying Number (PIN). The compl
7、ete PIN is as shown in the following example: 5962-87501 01 E X Drawing number Device type (see 1.2.1) Case outline(see 1.2.2) Lead finish(see 1.2.3)1.2.1 Device type(s). The device type(s) identify the circuit function as follows: Device type Generic number Circuit function 01 10H515 Quad line rece
8、iver 1.2.2 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style E GDIP1-T16 or CDIP2-T16 16 Dual-in-line F GDFP2-F16 or CDFP3-F16 16 Flat package X CDFP4-F16 16 Flat package 2 CQCC1-N20 20 Square chip car
9、rier 1.2.3 Lead finish. The lead finish is as specified in MIL-PRF-38535, appendix A. 1.3 Absolute maximum ratings. Supply voltage range (VEE) . -8.0 V dc to 0.0 V dc Input voltage range . -5.2 V dc to 0.0 V dc Storage temperature range -65C to +165C Lead temperature (soldering, 10 seconds) +300C Ju
10、nction temperature (TJ) +165C Maximum power dissipation (PD) 196 mW Thermal resistance, junction-to-case (JC) See MIL-STD-1835 1.4 Recommended operating conditions. Supply voltage range (VEE) . -5.46 V dc minimum to -4.94 V dc maximum Supply voltage range (VCC . -0.02 V dc to 0.02 V dc or 1.98 V dc
11、to 2.02 V dc Ambient operating temperature range (TA) . -55C to +125C Minimum high level input voltage (VIH): TA= +25C -0.780 V TA= +125C -0.650 V TA= -55C . -0.840 V Maximum low level input voltage (VIL) . -1.950 V Provided by IHSNot for ResaleNo reproduction or networking permitted without license
12、 from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87501 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL E SHEET 3 DSCC FORM 2234 APR 97 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks
13、form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for. DEPARTMENT OF DEFE
14、NSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are a
15、vailable online at http:/assist.daps.dla.mil;quicksearch/ or www.dodssp.daps.mil or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cit
16、ed herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements shall be in accordance with MIL-PRF-38535, append
17、ix A for non-JAN class level B devices and as specified herein. Product built to this drawing that is produced by a Qualified Manufacturer Listing (QML) certified and qualified manufacturer or a manufacturer who has been granted transitional certification to MIL-PRF-38535 may be processed as QML pro
18、duct in accordance with the manufacturers approved program plan and qualifying activity approval in accordance with MIL-PRF-38535. This QML flow as documented in the Quality Management (QM) plan may make modifications to the requirements herein. These modifications shall not affect form, fit, or fun
19、ction of the device. These modifications shall not affect the PIN as described herein. A “Q“ or “QML“ certification mark in accordance with MIL-PRF-38535 is required to identify when the QML flow option is used. 3.2 Design, construction, and physical dimensions. The design, construction, and physica
20、l dimensions shall be as specified in MIL-PRF-38535, appendix A and herein. 3.2.1 Case outline(s). The case outline(s) shall be in accordance with 1.2.2 herein. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1. 3.2.3 Truth table(s). The truth table(s) shall be a
21、s specified on figure 2. 3.2.4 Logic diagram(s). The logic diagram(s) shall be as specified on figure 3. 3.2.5 Test circuit and switching waveforms. Test circuit and switching waveforms shall be as specified on figure 4. 3.3 Electrical performance characteristics. Unless otherwise specified herein,
22、the electrical performance characteristics are as specified in table I and shall apply over the full ambient operating temperature range. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87501 DEFENSE SUPPLY C
23、ENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL E SHEET 4 DSCC FORM 2234 APR 97 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are described in table I. 3.5 Marking. Marking shall be in a
24、ccordance with MIL-PRF-38535, appendix A. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers PIN may also be marked. For packages where marking of the entire SMD PIN number is not feasible due to space limitations, the manufacturer has the option of not markin
25、g the “5962-“ on the device. 3.5.1 Certification/compliance mark. A compliance indicator “C” shall be marked on all non-JAN devices built in compliance to MIL-PRF-38535, appendix A. The compliance indicator “C” shall be replaced with a “Q“ or “QML“ certification mark in accordance with MIL-PRF-38535
26、 to identify when the QML flow option is used. 3.6 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see 6.6 herein). The certificate of compliance submitted to DSCC-VA prior to listing
27、as an approved source of supply shall affirm that the manufacturers product meets the requirements of MIL-PRF-38535, appendix A and the requirements herein. 3.7 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38535, appendix A shall be provided with each lot of microc
28、ircuits delivered to this drawing. 3.8 Notification of change. Notification of change to DSCC-VA shall be required for any change that affects this drawing. 3.9 Verification and review. DSCC, DSCCs agent, and the acquiring activity retain the option to review the manufacturers facility and applicabl
29、e required documentation. Offshore documentation shall be made available onshore at the option of the reviewer. 4. VERIFICATION 4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38535, appendix A. 4.2 Screening. Screening shall be in accordance with
30、method 5004 of MIL-STD-883, and shall be conducted on all devices prior to quality conformance inspection. The following additional criteria shall apply: a. Burn-in test, method 1015 of MIL-STD-883. (1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under docu
31、ment revision level control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1015 of MIL-STD-883. (2) TA= +125C, minimum
32、. b. Interim and final electrical test parameters shall be as specified in table II herein, except interim electrical parameter tests prior to burn-in are optional at the discretion of the manufacturer. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,
33、-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87501 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL E SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test Symbol Conditions -55C TA+125C unless otherwise specified Group A subgroups Limits Unit Min M
34、ax Cases E, F, 2 and X Quiescent tests 1/ VIHVIL-0.780 -1.950 1 -1.010 -0.780 -0.650 -1.950 2 -0.860 -0.650 High level output voltage VOHOutputs terminated through 100 to -2 V -0.840 -1.950 3 -1.060 -0.840 V -0.780 -1.950 1 -1.950 -1.580 -0.650 -1.950 2 -1.950 -1.565 Low level output voltage VOLVCC=
35、 0.0 V, VEE= -5.2 V 2/ -0.840 -1.950 3 -1.950 -1.610 V -1.110 -1.480 1 -1.010 -0.780 -0.960 -1.465 2 -0.860 -0.650 High level threshold output voltage VOHA-1.160 -1.510 3 -1.060 -0.840 V -1.110 -1.480 1 -1.950 -1.580 -0.960 -1.465 2 -1.950 -1.565 Low level threshold output voltage VOLA-1.160 -1.510
36、3 -1.950 -1.610 V Power supply drain IEEVEE= -5.46 V, VCC= 0.0 V 1 -26 mA current 3/ VIH= -0.780 V at +25C 2,3 -29 High level input current IIH-0.650 V at +125C 1 95 A -0.840 V at -55C 2, 3 150 1, 2 -1.0 Input leakage current ICBOVEE= -5.46 V 3/ VCB= -5.2 V, VCC= 0.0 V 3 -1.5 A Reference bias supply
37、 VBBVEE= -5.46 V, 1 -1.37 -1.25 V voltage VCC= 0.0 V 2 -1.31 -1.19 3 -1.41 -1.27 Functional tests See 4.3.1c 7, 8A, 8B See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87501 DEFE
38、NSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL E SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - Continued. Test Symbol Conditions -55C TA +125C unless otherwise specified Group A subgroups Limits Unit Min Max Cases E, F and X Rapid tests 4/ VIHVI
39、L-0.788 -1.950 1 -1.017 -0.788 -0.659 -1.950 2 -0.868 -0.659 High level output voltage VOHOutputs terminated through 100 to -2 V -0.849 -1.950 3 -1.068 -0.849 V -0.788 -1.950 1 -1.950 -1.582 -0.659 -1.950 2 -1.950 -1.568 Low level output voltage VOLVCC= 0.0 V VEE= -5.2 V 2/ -0.849 -1.950 3 -1.950 -1
40、.613 V -1.117 -1.482 1 -1.017 -0.788 -0.968 -1.468 2 -0.868 -0.659 High level threshold output voltage VOHA-1.168 -1.513 3 -1.068 -0.849 V -1.117 -1.482 1 -1.950 -1.582 -0.968 -1.468 2 -1.950 -1.568 Low level threshold output voltage VOLA-1.168 -1.513 3 -1.950 -1.613 V 1 -25 Power supply drain curre
41、nt 3/ IEEVEE= -5.46 V, VCC= 0.0 V VIH= -0.788 V at +25C 2, 3 -28 mA High level input current IIH-0.659 V at +125C 1 80 A -0.849 V at -55C 2, 3 135 1, 2 -1.0 Input leakage current ICBOVEE= -5.46 V 3/ VCB= -5.2 V, VCC= 0.0 V 3 -1.5 A Reference bias supply VBBVEE= -5.46 V 1 -1.377 -1.257 V voltage VCC=
42、 0.0 V 2 -1.317 -1.197 3 -1.417 -1.277 Functional tests See 4.3.1c 7, 8A, 8B See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87501 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO
43、43218-3990 REVISION LEVEL E SHEET 7 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - Continued. Test Symbol Conditions -55C TA +125C unless otherwise specified Group A subgroups Limits Unit Min Max Case 2 Rapid tests 4/ VIHVIL-0.793 -1.950 1 -1.022 -0.793 -0.665 -1.950 2 -0.87
44、4 -0.665 High level output voltage VOHOutputs terminated through 100 to -2 V -0.855 -1.950 3 -1.074 -0.855 V -0.793 -1.950 1 -1.950 -1.584 -0.665 -1.950 2 -1.950 -1.570 Low level output voltage VOLVCC= 0.0 V VEE= -5.2 V 2/ -0.855 -1.950 3 -1.950 -1.615 V -1.122 -1.484 1 -1.022 -0.793 -0.974 -1.470 2
45、 -0.874 -0.665 High level threshold output voltage VOHA-1.174 -1.515 3 -1.074 -0.855 V -1.122 -1.484 1 -1.950 -1.584 -0.974 -1.470 2 -1.950 -1.570 Low level threshold output voltage VOLA-1.174 -1.515 3 -1.950 -1.615 V Power supply drain IEEVEE= -5.46 V, VCC= 0.0 V 1 -25 mA current 3/ VIH= -0.793 V a
46、t +25C 2, 3 -28 High level input current IIH-0.665 V at +125C 1 80 A -0.855 V at -55C 2, 3 135 1, 2 -1.0 Input leakage current ICBOVEE= -5.46 V 3/ VCB= -5.2 V, VCC= 0.0 V 3 -1.5 A Reference bias supply VBBVEE= -5.46 V 1 -1.381 -1.261 V voltage VCC= 0.0 V 2 -1.322 -1.202 3 -1.422 -1.281 Functional te
47、sts See 4.3.1c 7, 8A, 8B See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87501 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL E SHEET 8 DSCC FORM 2234 A
48、PR 97 TABLE I. Electrical performance characteristics - Continued. Test Symbol Conditions -55C TA +125C unless otherwise specified Group A subgroups Limits Unit Min MaxCases E, F, 2 and X AC tests 9 0.45 1.40 10 0.50 1.70 Transition time tTLH, tTHLVEE= -2.94 V VCC= 2.0 V CL 5 pF 11 0.50 1.40 ns 9 0.45 1.20 10 0.50 1.80 Propagation delay time, input to output tPLH, tPHL, tPLL, tPHHLoad all outpu
