1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Changes in accordance with NOR 5962-R103-93. 93-03-29 Monica L. Poelking B Redrawn with changes. Update drawing to current requirements. Editorial changes throughout. - gap 07-05-02 Robert M. Heber The original first sheet of this drawing has bee
2、n replaced. REV SHET REV SHET REV STATUS REV B B B B B B B B B B B B B OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 12 13 PMIC N/A PREPARED BY David W. Queenan DEFENSE SUPPLY CENTER COLUMBUS STANDARD MICROCIRCUIT DRAWING CHECKED BY Robert P. Evans COLUMBUS, OHIO 43218-3990 http:/www.dscc.dla.mil THIS DRA
3、WING IS AVAILABLE FOR USE BY ALL DEPARTMENTS APPROVED BY Michael A. Frye MICROCIRCUIT, DIGITAL, ECL, MULTIPLEXER, AND AGENCIES OF THE DEPARTMENT OF DEFENSE DRAWING APPROVAL DATE 88-01-29 MONOLITHIC SILICON AMSC N/A REVISION LEVEL B SIZE A CAGE CODE 67268 5962-87506 SHEET 1 OF 13 DSCC FORM 2233 APR 9
4、7 5962-E170-07 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87506 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing de
5、scribes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A. 1.2 Part or Identifying Number (PIN). The complete PIN is as shown in the following example: 5962-87506 01 E X Drawing number Device type (see 1.2.1) Case outline(
6、see 1.2.2) Lead finish(see 1.2.3)1.2.1 Device type(s). The device type(s) identify the circuit function as follows: Device type Generic number Circuit function 01 10H574 Dual 4-to-1 multiplexer 1.2.2 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline lette
7、r Descriptive designator Terminals Package style E GDIP1-T16 or CDIP2-T16 16 dual-in-line F GDFP2-F16 or CDFP3-F16 16 flat pack 2 CQCC1-N20 20 leadless square chip carrier 1.2.3 Lead finish. The lead finish is as specified in MIL-PRF-38535, appendix A. 1.3 Absolute maximum ratings. Supply voltage ra
8、nge -8.0 V dc to 0.0 V dc Input voltage range . 0.0 V dc to -5.2 V dc Storage temperature range . -65C to +165C Lead temperature (soldering, 10 seconds) +300C Junction temperature (TJ) +165C Maximum power dissipation (PD) 452 mW Thermal resistance, junction-to-case (JC) See MIL-STD-1835 1.4 Recommen
9、ded operating conditions. Supply voltage (VEE) -5.46 V dc minimum to -4.94 V dc maximum Ambient operating temperature range (TA) . -55C to +125C Minimum high level input voltage (VIH): TA= +25C -0.780 V dc TA= +125C -0.650 V dc TA= -55C . -0.840 V dc Maximum low level input voltage (VIL) . -1.950 V
10、dc Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87506 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 3 DSCC FORM 2234 APR 97 2. APPLICABLE DOCUMENTS 2.1 Government specific
11、ation, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38
12、535 - Integrated Circuits, Manufacturing, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Dr
13、awings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at http:/assist.daps.dla.mil/quicksearch/ or http:/assist.daps.dla.mil or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of p
14、recedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item req
15、uirements. The individual item requirements shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified herein. Product built to this drawing that is produced by a Qualified Manufacturer Listing (QML) certified and qualified manufacturer or a manufacturer
16、 who has been granted transitional certification to MIL-PRF-38535 may be processed as QML product in accordance with the manufacturers approved program plan and qualifying activity approval in accordance with MIL-PRF-38535. This QML flow as documented in the Quality Management (QM) plan may make mod
17、ifications to the requirements herein. These modifications shall not affect form, fit, or function of the device. These modifications shall not affect the PIN as described herein. A “Q“ or “QML“ certification mark in accordance with MIL-PRF-38535 is required to identify when the QML flow option is u
18、sed. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38535, appendix A and herein. 3.2.1 Case outlines. The case outlines shall be in accordance with 1.2.2 herein. 3.2.2 Terminal connections. The terminal connectio
19、ns shall be as specified on figure 1. 3.2.3 Truth table. The truth table shall be as specified on figure 2. 3.2.4 Logic diagram. The logic diagram shall be as specified on figure 3. 3.2.5 Test circuit and switching waveforms. The test circuit and switching waveforms shall be as specified on figure 4
20、. 3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are as specified in table I and shall apply over the full ambient operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the s
21、ubgroups specified in table II. The electrical tests for each subgroup are described in table I. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87506 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990
22、REVISION LEVEL B SHEET 4 DSCC FORM 2234 APR 97 3.5 Marking. Marking shall be in accordance with MIL-PRF-38535, appendix A. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers PIN may also be marked. For packages where marking of the entire SMD PIN number is not
23、 feasible due to space limitations, the manufacturer has the option of not marking the “5962-“ on the device. 3.5.1 Certification/compliance mark. A compliance indicator “C” shall be marked on all non-JAN devices built in compliance to MIL-PRF-38535, appendix A. The compliance indicator “C” shall be
24、 replaced with a “Q“ or “QML“ certification mark in accordance with MIL-PRF-38535 to identify when the QML flow option is used. 3.6 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see
25、6.6 herein). The certificate of compliance submitted to DSCC-VA prior to listing as an approved source of supply shall affirm that the manufacturers product meets the requirements of MIL-PRF-38535, appendix A and the requirements herein. 3.7 Certificate of conformance. A certificate of conformance a
26、s required in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this drawing. 3.8 Notification of change. Notification of change to DSCC-VA shall be required for any change that affects this drawing. 3.9 Verification and review. DSCC, DSCCs agent, and the acquir
27、ing activity retain the option to review the manufacturers facility and applicable required documentation. Offshore documentation shall be made available onshore at the option of the reviewer. 4. VERIFICATION 4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with
28、 MIL-PRF-38535, appendix A. 4.2 Screening. Screening shall be in accordance with method 5004 of MIL-STD-883, and shall be conducted on all devices prior to quality conformance inspection. The following additional criteria shall apply: a. Burn-in test, method 1015 of MIL-STD-883. (1) Test condition A
29、, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordanc
30、e with the intent specified in method 1015 of MIL-STD-883. (2) TA= +125C, minimum. b. Interim and final electrical test parameters shall be as specified in table II herein, except interim electrical parameter tests prior to burn-in are optional at the discretion of the manufacturer. Provided by IHSN
31、ot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87506 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Limits Test Symbo
32、l Conditions -55C TA +125C unless otherwise specified Group A subgroups Min Max Unit Cases E, F, and 2 Quiescent tests 1/ VIHVIL-0.780 -1.950 1 -1.010 -0.780 -0.650 -1.950 2 -0.860 -0.650 High level output voltage VOH-0.840 -1.950 3 -1.060 -0.840 V -0.780 -1.950 1 -1.950 -1.580 -0.650 -1.950 2 -1.95
33、0 -1.565 Low level output voltage VOL-0.840 -1.950 3 -1.950 -1.610 V -1.110 -1.480 1 -1.010 -0.780 -0.960 -1.465 2 -0.860 -0.650 High level threshold output voltage VOHA-1.160 -1.510 3 -1.060 -0.840 V -1.110 -1.480 1 -1.950 -1.580 -0.960 -1.465 2 -1.950 -1.565 Low level threshold output voltage VOLA
34、Outputs terminated through 100 to -2.0 V VCC= 0.0 V VEE= -5.2 V 2/ -1.160 -1.510 3 -1.950 -1.610 V 1 -73 Power supply drain current IEE4/ 2, 3 -80 mA 1, 2 420 IIH1Enable input 3 670 A 1, 2 300 High level input current IIH2VEE= -5.46 V VCC= 0.0 V VIH= -0.780 V at +25C -0.650 V at +125C -0.840 V at -5
35、5C All other inputs 3 475 A 1, 3 0.5 Low level input current IILVEE= -4.94 V VIL= -1.950 V VCC= 0.0 V 2 0.3 A See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87506 DEFENSE SUPPL
36、Y CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - Continued. Limits Test Symbol Conditions -55C TA +125C unless otherwise specified Group A subgroups Min Max Unit Cases E and F Rapid tests 3/ VIHVIL-0.799 -1.9
37、50 1 -1.027 -0.799 -0.670 -1.950 2 -0.879 -0.670 High level output voltage VOH-0.860 -1.950 3 -1.079 -0.860 V -0.799 -1.950 1 -1.950 -1.586 -0.670 -1.950 2 -1.950 -1.571 Low level output voltage VOL-0.860 -1.950 3 -1.950 -1.616 V -1.127 -1.486 1 -1.027 -0.799 -0.979 -1.471 2 -0.879 -0.670 High level
38、 threshold output voltage VOHA-1.179 -1.516 3 -1.079 -0.860 V -1.127 -1.486 1 -1.950 -1.586 -0.979 -1.471 2 -1.950 -1.571 Low level threshold output voltage VOLAOutputs terminated through 100 to -2.0 V VCC= 0.0 V VEE= -5.2 V 2/ -1.179 -1.516 3 -1.950 -1.616 V 1 -72 Power supply drain current IEE4/ 2
39、, 3 -79 mA 1, 2 405 IIH1Enable input 3 655 A 1, 2 285 High level input current IIH2VEE= -5.46 V VCC= 0.0 V VIH= -0.799 V at +25C -0.670 V at +125C -0.860 V at -55C All other inputs 3 460 A 1, 3 0.5 Low level input current IILVEE= -4.94 V VIL= -1.950 VCC= 0.0 V 2 0.3 A See footnotes at end of table.
40、Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87506 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 7 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics -
41、Continued. Limits Test Symbol Conditions -55C TA +125C unless otherwise specified Group A subgroups Min Max Unit Case 2 Rapid tests 3/ VIHVIL-0.807 -1.950 1 -1.035 -0.807 -0.680 -1.950 2 -0.887 -0.680 High level output voltage VOH-0.870 -1.950 3 -1.087 -0.870 V -0.807 -1.950 1 -1.950 -1.588 -0.680 -
42、1.950 2 -1.950 -1.574 Low level output voltage VOL-0.870 -1.950 3 -1.950 -1.619 V -1.135 -1.488 1 -1.035 -0.807 -0.987 -1.474 2 -0.887 -0.680 High level threshold output voltage VOHA-1.187 -1.519 3 -1.087 -0.870 V -1.135 -1.488 1 -1.950 -1.588 -0.987 -1.474 2 -1.950 -1.574 Low level threshold output
43、 voltage VOLAOutputs terminated through 100 to -2.0 V VCC= 0.0 V VEE= -5.2 V 2/ -1.187 -1.519 3 -1.950 -1.619 V 1 -72 Power supply drain current IEE4/ 2, 3 -79 mA 1, 2 405 IIH1Enable input 3 655 A 1, 2 285 High level input current IIH2VEE= -5.46 V VCC= 0.0 V VIH= -0.807 V at +25C -0.680 V at +125C -
44、0.870 V at -55C All other inputs 3 460 A 1, 3 0.5 Low level input current IILVEE= -4.94 V VCB= -1.950 V VCC= 0.0 V 2 0.3 A See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87506
45、DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 8 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - Continued. Limits Test Symbol Conditions -55C TA +125C unless otherwise specified Group A subgroups Min Max Unit Cases E, F, and 2 AC tests 9 0.50
46、 1.70 10 0.50 2.00 Transition time tTLH, tTHL11 0.40 1.65 ns 9 1.00 2.40 10 1.00 2.90 Propagation delay time, Xn to Z, Wn to W tPHH1, tPLL111 1.00 2.25 ns 9 1.50 2.90 10 1.50 3.60 Propagation delay time, A, B to Z, W tPHH2, tPLL2VEE= -2.94 V VCC= 2.0 V CL 5 pF RL= 100 See figure 4 11 1.40 2.75 ns 9
47、0.50 1.80 10 0.50 2.00 Propagation delay time, E to Z, W tPLH, tPHL11 0.50 1.70 ns 1/ The quiescent limits are determined after a device has reached thermal equilibrium. This is defined as the reading taken with the device in a socket with 500 LFPM of +25C, +125C or -55C (as applicable) air blowing
48、on the unit in a transverse direction with power applied for at least 4 minutes before the reading is taken. This method was used for theoretical limit establishment only. All devices shall be tested to the delta V (rapid test) conditions specified herein. The rapid test method is an equivalent method of testing quiescent conditions. 2/ The high and low level output current varies with temperature and can be calculated using the following formula: IOH= (-2.0 V - VOH)/100 ; IOL= (-2.0 V - VOL)/100 . 3/ The dc rapid test f
