1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Add latch-up test requirements. Editorial changes throughout. 90-03-28 M. L. POELKING B Drawing updated to reflect current requirements. - ro 02-10-11 R. MONNIN THE ORIGINAL FIRST SHEET OF THIS DRAWING HAS BEEN REPLACED. REV SHET REV SHET REV STA
2、TUS REV B B B B B B B B B B B OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 PMIC N/A PREPARED BY CHARLES E. BESORE DEFENSE SUPPLY CENTER COLUMBUS STANDARD MICROCIRCUIT DRAWING CHECKED BY D. H. JOHNSON COLUMBUS, OHIO 43216 http:/www.dscc.dla.mil THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS APPROVED
3、 BY MICHAEL A. FRYE MICROCIRCUIT, LINEAR, BIPOLAR QUAD NTDS FAST / ANEW RECEIVER, MONOLITHIC SILICON AND AGENCIES OF THE DEPARTMENT OF DEFENSE DRAWING APPROVAL DATE 89-05-12 AMSC N/A REVISION LEVEL B SIZE A CAGE CODE 67268 5962-88584 SHEET 1 OF 11 DSCC FORM 2233 APR 97 5962-E001-03 DISTRIBUTION STAT
4、EMENT A. Approved for public release; distribution is unlimited.Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-88584 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 REVISION LEVEL B SHEET 2 DSCC FOR
5、M 2234 APR 97 1. SCOPE 1.1 Scope. This drawing describes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A. 1.2 Part or Identifying Number (PIN). The complete PIN is as shown in the following example: 5962-88584 01 E X Dra
6、wing number Device type (see 1.2.1) Case outline (see 1.2.2) Lead finish (see 1.2.3) 1.2.1 Device type(s). The device type(s) identify the circuit function as follows: Device type Generic number Circuit function 01 MOR1623K Quad NTDS Fast / ANEW receiver 1/ 1.2.2 Case outline(s). The case outline(s)
7、 are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style E GDIP1-T16 or CDIP2-T16 16 Dual-in-line F GDFP2-F16 or CDFP3-F16 16 Flat pack 2 CQCC1-N20 20 Square leadless chip carrier 1.2.3 Lead finish. The lead finish is as specified in MIL-PRF-38
8、535, appendix A. 1.3 Absolute maximum ratings. Supply voltage range +VS- -VS 20 V dc Input voltage range . +VS 20 V dc -VS+ 20 V dc Power dissipation (PD) . 453.2 mW 2/ Junction temperature (TJ) +175C Storage temperature range -65C to +150C Lead temperature (soldering, 10 seconds) +300C Thermal resi
9、stance, junction-to-case (JC) See MIL-STD-1835 Thermal resistance, junction-to-ambient (JA): Case E 75C/W Case F 135C/W Case 2 90C/W _ 1/ This circuit was designed to be compatible with Naval Tactical Data System (NTDS) of MIL-STD-1397 “Input / Output Interfaces, Standard Digital Data, Navy Systems”
10、, interfacing between TTL logic levels and those employed in Navy computers. “NTDS fast” refers to MIL-STD-1397, type B. “ANEW” refers to MIL-STD-1397, type C. 2/ Must withstand the added PDdue to short circuit test; e.g., IOS, for a maximum of 10 ms. Provided by IHSNot for ResaleNo reproduction or
11、networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-88584 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 REVISION LEVEL B SHEET 3 DSCC FORM 2234 APR 97 1.4 Recommended operating conditions. Positive supply voltage range (+VS) . +4.5 V dc to +5.5 V dc
12、 Negative supply voltage range (-VS) -4.5 V dc to -5.5 V dc Maximum low level (differential) . -1.9 V dc Minimum high level (differential) . -1.1 V dc Ambient operating temperature range (TA) -55C to +125C 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following
13、specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those listed in the issue of the Department of Defense Index of Specifications and Standards (DoDISS) and supplement thereto, cited in the
14、 solicitation. SPECIFICATION DEPARTMENT OF DEFENSE MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for. STANDARDS DEPARTMENT OF DEFENSE MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. MIL-STD-1397 - Inp
15、ut/Output Interfaces, Standard Digital Data, Navy Systems 1/ HANDBOOKS DEPARTMENT OF DEFENSE MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Unless otherwise indicated, copies of the specification, standards, and handbooks are available from the
16、 Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, sup
17、ersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified herein. Product built to this drawin
18、g that is produced by a Qualified Manufacturer Listing (QML) certified and qualified manufacturer or a manufacturer who has been granted transitional certification to MIL-PRF-38535 may be processed as QML product in accordance with the manufacturers approved program plan and qualifying activity appr
19、oval in accordance with MIL-PRF-38535. This QML flow as documented in the Quality Management (QM) plan may make modifications to the requirements herein. These modifications shall not affect form, fit, or function of the device. These modifications shall not affect the PIN as described herein. A “Q“
20、 or “QML“ certification mark in accordance with MIL-PRF-38535 is required to identify when the QML flow option is used. _ 1/ As of April 22, 1998, MIL-STD-1397 is inactive for new design and is no longer used, except for replacement purposes. Provided by IHSNot for ResaleNo reproduction or networkin
21、g permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-88584 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 REVISION LEVEL B SHEET 4 DSCC FORM 2234 APR 97 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall
22、be as specified in MIL-PRF-38535, appendix A and herein. 3.2.1 Case outlines. The case outlines shall be in accordance with 1.2.2 herein. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1. 3.2.3 Test circuit and waveforms. The test circuit and waveforms shall be
23、as specified on figures 2 and 3. 3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are as specified in table I and shall apply over the full ambient operating temperature range. 3.4 Electrical test requirements. The electrical t
24、est requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are described in table I. 3.5 Marking. Marking shall be in accordance with MIL-PRF-38535, appendix A. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers PIN m
25、ay also be marked as listed in MIL-HDBK-103 (see 6.6 herein). For packages where marking of the entire SMD PIN number is not feasible due to space limitations, the manufacturer has the option of not marking the “5962-“ on the device. 3.5.1 Certification/compliance mark. A compliance indicator “C” sh
26、all be marked on all non-JAN devices built in compliance to MIL-PRF-38535, appendix A. The compliance indicator “C” shall be replaced with a “Q“ or “QML“ certification mark in accordance with MIL-PRF-38535 to identify when the QML flow option is used. 3.6 Certificate of compliance. A certificate of
27、compliance shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see 6.6 herein). The certificate of compliance submitted to DSCC-VA prior to listing as an approved source of supply shall affirm that the manufacturers product meets the requireme
28、nts of MIL-PRF-38535, appendix A and the requirements herein. 3.7 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this drawing. 3.8 Notification of change. Notification of change to DSCC-V
29、A shall be required in accordance with MIL-PRF-38535, appendix A. 3.9 Verification and review. DSCC, DSCCs agent, and the acquiring activity retain the option to review the manufacturers facility and applicable required documentation. Offshore documentation shall be made available onshore at the opt
30、ion of the reviewer. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-88584 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 REVISION LEVEL B SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performan
31、ce characteristics. Test Symbol Conditions -55C TA +125C +VS= 4.5 V to 5.5 V Group A subgroups Device type Limits Unit -VS= -4.5 V to -5.5 V unless otherwise specified Min Max Positive supply current ICCVRETURN VIN= -1.9 V, IOUT= 0 mA 1,2,3 01 19.2 34 mA Negative supply current IEEVRETURN VIN= -1.9
32、V, IOUT= 0 mA 1,2,3 01 -42 -24 mA Low level output voltage VOLInputs open 1,2,3 01 -0.5 +0.4 V Low level output voltage VOLVRETURN VIN= -1.9 V, IOUT= +1.6 mA 1,2,3 01 -0.5 +0.4 V High level output voltage VOHVRETURN VIN= -1.1 V, IOUT= -1.6 mA 1,2,3 01 2.4 V Input common 1/ 2/ mode voltage range (typ
33、es B and C) VCMVRETURN VIN= -1.9 V or 1.1 V 1,2,3 01 -7.5 +7.5 V Positive input current 1/ (type B) +IINVIN= 0 V, VRETURN= 0 V 1,2,3 01 1.5 mA Negative input current 1/ (type B) -IINVIN= -4.5 V, VRETURN= 0 V 1,2,3 01 -0.5 mA Positive input current 2/ (type C) +IRETVIN= 0 V, IOUT= 0 mA, VRETURN= 4.5
34、V 1,2,3 01 2.5 mA Negative input current 2/ (type C) -IRETVIN= 0 V, IOUT= 0 mA, VRETURN= 0 V 1,2,3 01 -2.5 mA Short circuit current IOSVIN= VRETURN= 0 V, only one channel shorted for a maximum of 10 ms 1,2,3 01 -100 mA Differential input 1/ 2/ threshold (types B and C) VTH1,2,3 01 -1.9 -1.1 V See fo
35、otnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-88584 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 REVISION LEVEL B SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical perfo
36、rmance characteristics Continued. Test Symbol Conditions -55C TA +125C +VS= 4.5 V to 5.5 V Group A subgroups Device type Limits Unit -VS= -4.5 V to -5.5 V unless otherwise specified Min Max +VSopen, negative latch LATCH +VS= open, -VS= -5 V, Inputs = GND 1,2,3 01 -100 mA +VSopen / +5 V, positive lat
37、ch LATCH +VSopen then +VSto +5 V, -VS= -5 V, Inputs = GND 1,2,3 01 100 mA +VSopen / +5 V negative latch LATCH +VSopen then +VSto +5 V, -VS= -5 V, Inputs = GND 1,2,3 01 -100 mA +VSat GND positive latch LATCH +VS= GND, -VS= -5 V, Inputs = GND 1,2,3 01 100 mA +VSat GND negative latch LATCH +VS= GND, -V
38、S= -5 V, Inputs = GND 1,2,3 01 -100 mA +VSat GND / +5 V, positive latch LATCH +VS= GND then +VSto +5 V, -VS= -5 V, Inputs = GND 1,2,3 01 100 mA +VSat GND / +5 V negative latch LATCH +VS= GND then +VSto +5 V, -VS= -5 V, Inputs = GND 1,2,3 01 -100 mA -VSopen negative latch LATCH +VS= +5 V, -VSopen, In
39、puts = GND 1,2,3 01 -100 mA -VSopen / -5 V negative latch LATCH +VS= +5 V, -VSopen then, -VSto 5 V 1,2,3 01 -100 mA -VSopen / -5 V positive latch LATCH +VS= +5 V, -VSopen then, -VSto 5 V, Inputs = GND 1,2,3 01 100 mA -VSat GND negative latch LATCH +VS= +5 V, -VS= GND, Inputs = GND 1,2,3 01 -100 mA S
40、ee footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-88584 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 REVISION LEVEL B SHEET 7 DSCC FORM 2234 APR 97 TABLE I. Electrical
41、performance characteristics Continued. Test Symbol Conditions -55C TA +125C +VS= 4.5 V to 5.5 V Group A subgroups Device type Limits Unit -VS= -4.5 V to -5.5 V unless otherwise specified Min Max -VSat GND positive latch LATCH +VS= +5 V, -VS= GND, Inputs = GND 1,2,3 01 100 mA -VSat GND / -5 V positiv
42、e latch LATCH +VS= +5 V, -VS= GND then -VSto 5 V Inputs = GND 1,2,3 01 100 mA -VSat GND / -5 V negative latch LATCH +VS= +5 V, -VS= GND then -VSto 5 V Inputs = GND 1,2,3 01 -100 mA Propagation delay time low to high tPLHSee figures 2 and 3 9 01 200 ns 10,11 3/ 200 Propagation delay time high to low
43、tPHLSee figures 2 and 3 9 01 200 ns 10,11 3/ 200 1/ MIL-STD-1397, type B (NTDS fast). 2/ MIL-STD-1397, type C (ANEW). 3/ Guaranteed, if not tested, to the limits specified in table I herein. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MI
44、CROCIRCUIT DRAWING SIZE A 5962-88584 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 REVISION LEVEL B SHEET 8 DSCC FORM 2234 APR 97 Device type 01 Case outlines E and F 2 Terminal number Terminal symbol 1 +VSNC 2 OUTPUT C +VS3 RETURN C OUTPUT C 4 INPUT C RETURN C 5 GROUND INPUT C 6 OUTPUT B
45、 NC 7 RETURN B GND 8 INPUT B OUTPUT B 9 OUTPUT A RETURN B 10 -VSINPUT B 11 RETURN A NC 12 INPUT A OUTPUT A 13 GROUND -VS14 INPUT D RETURN A 15 RETURN D INPUT A 16 OUTPUT D NC 17 - GND 18 - INPUT D 19 - RETURN D 20 - OUTPUT D NC = No connection FIGURE 1. Terminal connections. Provided by IHSNot for R
46、esaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-88584 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 REVISION LEVEL B SHEET 9 DSCC FORM 2234 APR 97 FIGURE 2. Test circuit and waveforms ( type B ). FIGURE 3. Test circuit an
47、d waveforms ( type C ). Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-88584 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 REVISION LEVEL B SHEET 10 DSCC FORM 2234 APR 97 4. QUALITY ASSURANCE PROV
48、ISIONS 4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38535, appendix A. 4.2 Screening. Screening shall be in accordance with method 5004 of MIL-STD-883, and shall be conducted on all devices prior to quality conformance inspection. The following additional criteria shall apply: a. Burn-in test, method 1015 of MIL-STD-883. (1) Test condition C. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to the preparing or
