1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Table I, change condition for EDDtest. Update document. Editorial changes throughout. 93-01-26 K. A. Cottongim B Update drawing. 06-09-06 Raymond Monnin THE ORIGINAL FIRST SHEET OF THIS DRAWING HAS BEEN REPLACED. REV SHEET REV SHEET REV STATUS RE
2、V B B B B B B B B B B B B B B OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 12 13 14 PMIC N/A PREPARED BY Gary Zahn DEFENSE SUPPLY CENTER COLUMBUS STANDARD MICROCIRCUIT DRAWING CHECKED BY Robert M. Heber POST OFFICE BOX 3990 COLUMBUS, OHIO 43218-3990 http:/www.dscc.dla.mil THIS DRAWING IS AVAILABLE FOR US
3、E BY ALL DEPARTMENTS APPROVED BY William K. Heckman MICROCIRCUIT, HYBRID, LINEAR, 8-BIT, FLASH, ANALOG TO DIGITAL CONVERTER AND AGENCIES OF THE DEPARTMENT OF DEFENSE DRAWING APPROVAL DATE 90-11-15 AMSC N/A REVISION LEVEL B SIZE A CAGE CODE 67268 5962-89979 SHEET 1 OF 14 DSCC FORM 2233 APR 97 5962-E6
4、40-06Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89862 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing describes de
5、vice requirements for class H hybrid microcircuits to be processed in accordance with MIL-PRF-38534 and a choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). 1.2 PIN. The PIN shall be as shown in the following example: 5962-89979 01 X X
6、Drawing number Device type Case outline Lead finish (see 1.2.1) (see 1.2.2) (see 1.2.3) 1.2.1 Device type(s). The device type(s) shall identify the circuit function as follows: Device type Generic number Circuit function 01 SP1078B 8-bit, flash, analog to digital converter 1.2.2 Case outline(s). The
7、 case outline(s) shall be as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style X See figure 1 24 Dual-in-line 1.2.3 Lead finish. The lead finish shall be as specified in MIL-PRF-38534. 1.3 Absolute maximum ratings. Digital supply voltage (VCC) +
8、7.0 V dc Positive analog supply voltage (+VAN) +7.0 V dc Negative analog supply voltage (-VAN). -7.0 V dc Supply voltage differential (VCC- +VAN) 0.5 V dc Ground differential (AGND - DGND) 1.0 V dc Digital input voltage range . -0.6 V dc to +5.5 V dc Analog input voltage range -VAN- 0.6 V dc to +VAN
9、+ 0.6 V dc Power dissipation, TC= +125C (PD) . 3.0 W Storage temperature range -65C to +150C Lead temperature (soldering, 10 seconds). +300C Thermal resistance, junction-to-case (JC) . 40C/W Junction temperature (TJ) +150C 1.4 Recommended operating conditions. Digital supply voltage range. +4.75 V d
10、c to +5.25 V dc Positive analog supply voltage range. +4.75 V dc to +5.25 V dc Negative analog supply voltage range . -4.9 V dc to -5.5 V dc Convert pulse width low (tPWL) 8.0 ns minimum Convert pulse width high (tPWH) 8.0 ns minimum Clock frequency range (fCLK) DC to 40 MHz Case operating temperatu
11、re range (TC). -55C to +125C Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89862 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 3 DSCC FORM 2234 APR 97 2. APPLICABLE DOCUMEN
12、TS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENS
13、E SPECIFICATION MIL-PRF-38534 - Hybrid Microcircuits, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard for Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard
14、 Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at http:/assist.daps.dla.mil/quicksearch/ or http:/assist.daps.dla.mil or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.
15、) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREME
16、NTS 3.1 Item requirements. The individual item performance requirements for device class H shall be in accordance with MIL-PRF-38534. Compliance with MIL-PRF-38534 may include the performance of all tests herein or as designated in the device manufacturers Quality Management (QM) plan or as designat
17、ed for the applicable device class. The manufacturer may eliminate, modify or optimize the tests and inspections herein, however the performance requirements as defined in MIL-PRF-38534 shall be met for the applicable device class. In addition, the modification in the QM plan shall not affect the fo
18、rm, fit, or function of the device for the applicable device class. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38534 and herein. 3.2.1 Case outline(s). The case outline(s) shall be in accordance with figure 1
19、and 1.2.2 herein. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 2. 3.2.3 Functional diagram. The functional diagram shall be as specified on figure 3. 3.2.4 Output coding table. The output coding table shall be as specified on figure 4. 3.2.5 Timing diagram(s).
20、 The timing diagram(s) shall be as specified on figure 5. 3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are as specified in table I and shall apply over the full specified operating temperature range. 3.4 Electrical test req
21、uirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are defined in table I. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89862 D
22、EFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 4 DSCC FORM 2234 APR 97 3.5 Marking of device(s). Marking of device(s) shall be in accordance with MIL-PRF-38534. The device shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers vendor similar
23、 PIN may also be marked. 3.6 Data. In addition to the general performance requirements of MIL-PRF-38534, the manufacturer of the device described herein shall maintain the electrical test data (variables format) from the initial quality conformance inspection group A lot sample, for each device type
24、 listed herein. Also, the data should include a summary of all parameters manually tested, and for those which, if any, are guaranteed. This data shall be maintained under document revision level control by the manufacturer and be made available to the preparing activity (DSCC-VA) upon request. 3.7
25、Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to supply to this drawing. The certificate of compliance (original copy) submitted to DSCC-VA shall affirm that the manufacturers product meets the performance requirements of MIL-PRF-38534 and here
26、in. 3.8 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38534 shall be provided with each lot of microcircuits delivered to this drawing. 4. VERIFICATION 4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38534 or as mo
27、dified in the device manufacturers Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein. 4.2 Screening. Screening shall be in accordance with MIL-PRF-38534. The following additional criteria shall apply: a. Burn-in test, method
28、 1015 of MIL-STD-883. (1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to either DSCC-VA or the acquiring activity upon request. Also, the test circuit shall specify the inputs, outputs, biase
29、s, and power dissipation, as applicable, in accordance with the intent specified in method 1015 of MIL-STD-883. (2) TCas specified in accordance with table I of method 1015 of MIL-STD-883. b. Interim and final electrical test parameters shall be as specified in table II herein, except interim electr
30、ical parameter tests prior to burn-in are optional at the discretion of the manufacturer. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89862 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISIO
31、N LEVEL A SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Limits Test Symbol Conditions -55C TC +125C +4.75 V dc VCC +5.25 V dc unless otherwise specified Group A subgroups Device type Min Max Unit Resolution RES 1,2,3 01 8.0 Bits Integral linearity error ELIDC, best s
32、traight line 1,2,3 01 -1.0 +1.0 LSB Differential linearity EDIDC 1,2,3 01 -.75 +.75 LSB Full power bandwidth FPBW No spurious codes 1,2,3 01 8 MHz Maximum conversion rate 1/ fS9,10,11 01 40 MHz Sampling time offset 1/ tSTO9,10,11 01 10 ns Digital output delay time 1/ tD9,10,11 01 18 ns Digital outpu
33、t hold time 1/ tH9,10,11 01 6.0 ns tPZL9,10,11 01 24 ns Digital output enable time 1/ tPZH 9,10,11 01 29 ns tPLZ9,10,11 01 16 ns Digital output disable time 1/ tPHZ 9,10,11 01 24 ns Convert pulse width low 1/ tPWL9,10,11 01 8.0 ns Convert pulse width high 1/ tPWHVCC= +4.75 V dc, +VAN= +4.75 V dc, -V
34、AN = -4.9 V dc, See figure 5.9,10,11 01 8.0 ns See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89862 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SH
35、EET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - Continued. Limits Test Symbol Conditions -55C TC +125C +4.75 V dc VCC +5.25 V dc unless otherwise specified Group A subgroups Device type Min Max Unit OEL = 0.4 V -0.4 MINVL = 0.4 V -1.5 Input low current IILCONV = 0.4 V 1
36、,2,3 01 -0.4 mA OEL = 2.7 V 20 MINVL = VCC, internal 5 k to VCC 0 A MINVL = 2.7 V -0.6 mA Input high current IILCONV = 2.7 V 1,2,3 01 100 A Input low voltage VILOEL, CONV, and MINVL 1,2,3 01 0 0.8 V CONV and MINVL 1,2,3 2.0 VCCOEL 1,2 2.0 VCCInput high voltage VIHOEL 3 01 2.25 VCCV Output leakage cu
37、rrent logic low ILOLVO= 0.4 V 1,2,3 01 -30 A Output leakage current logic high ILOHVO= 2.4 V 1,2,3 01 30 A Output low voltage VOLIOL= 1.0 mA 1,2,3 01 0.45 V Output high voltage VOHIOH= -0.4 mA 1,2,3 01 2.4 V Reference voltage VREF1,2,3 01 2.49 2.51 V Reference current, sourced IREF1,2,3 01 2.0 mA Se
38、e footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89862 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 7 DSCC FORM 2234 APR 97 TABLE I. Electrical p
39、erformance characteristics - Continued. Limits Test Symbol Conditions -55C TC +125C +4.75 V dc VCC +5.25 V dc unless otherwise specified Group A subgroups Device type Min Max Unit Digital supply current ICCVCC= 5.0 V 1,2,3 01 40 mA Positive analog supply current +IAN+VAN= +5.0 V 1,2,3 01 60 mA Negat
40、ive analog supply current -IAN-VAN= 5.2 V 1,2,3 01 30 mA 1 -0.4 +0.4 Gain error EGBipolar 2,3 01 -0.7 +0.7 % 1 -0.3 +0.3 Gain error EGUnipolar 2,3 01 -0.6 +0.6 % 1 -5 +5 Bipolar offset error VOS12,3 01 -7.5 +7.5 mV 1 -4 +4 Unipolar offset error VOS22,3 01 -6 +6 mV 1.123 MHz full scale input 44 Signa
41、l-to-noise ratio, RMS signal/RMS noise plus distortion SNR 8.0 MHz full scale input 9,10,11 01 40 dB 4 -0.95 +1.0 Dynamic differential linearity error EDD5 MHz input 5,6 01 -0.95 +1.3 LSB Power dissipation PDDC input 1,2,3 01 575 mW 1/ Parameter shall be tested as part of device initial characteriza
42、tion and after design and process changes. Parameter shall be guaranteed to the limits specified in table I for all lots not specifically tested. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89862 DEFENSE
43、SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 8 DSCC FORM 2234 APR 97 Case outline X. Inches mm Inches mm .010 0.25 .240 6.10 .018 0.46 .600 15.24 .030 0.76 .795 20.20 .100 2.54 1.370 34.80 .185 4.70 NOTES: 1. Dimensions are in inches. 2. Metric equivalents are given for ge
44、neral information only. 3. Unless otherwise specified, tolerance is .005 (0.13 mm). 4. Standoffs are optional at discretion of manufacturer. FIGURE 1. Case outline(s). Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE
45、 A 5962-89862 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 9 DSCC FORM 2234 APR 97 Device type 01 Case outline X Terminal number Terminal symbol Function 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 2.5 V REF SUM BIPOFF -VANAGND +VANO/U FLOW OEL D
46、1 (MSB) D2 D3 D4 D5 D6 D7 D8 (LSB) VCCDGND CONV MINVL AOUT SIGGND +AIN -AIN Reference voltage output Amplifier summing junction Strap to -VANfor bipolar inputs -5.2 V analog supply Analog and signal ground +5 V analog supply Out-of-range TTL output Output enable low TTL digital output TTL digital ou
47、tput TTL digital output TTL digital output TTL digital output TTL digital output TTL digital output TTL digital output +5 V digital supply Digital ground Convert command to flash MSB invert low Amplifier output, resistor isolated Signal ground, internally tied to AGND Positive analog input Negative
48、analog input FIGURE 2. Terminal connections. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89862 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 10 DSCC FORM 2234 APR 97 FIGURE 3. Functional diagram.Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-
