1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Drawing updated to reflect current requirements. - ro 01-12-17 R. MONNIN REV SHET REV SHET REV STATUS REV A A A A A A A A A A A OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 PMIC N/A PREPARED BY RICK C. OFFICER DEFENSE SUPPLY CENTER COLUMBUS STANDARD M
2、ICROCIRCUIT DRAWING CHECKED BY RAJESH R. PITHADIA COLUMBUS, OHIO 43216 http:/www.dscc.dla.mil THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS APPROVED BY MICHAEL A. FRYE MICROCIRCUIT, LINEAR, LOW NOISE, OPERATIONAL AMPLIFIER, MONOLITHIC AND AGENCIES OF THE DEPARTMENT OF DEFENSE DRAWING APPROVAL
3、 DATE 94-04-04 SILICON AMSC N/A REVISION LEVEL A SIZE A CAGE CODE 67268 5962-93133 SHEET 1 OF 11 DSCC FORM 2233 APR 97 5962-E114-02 DISTRIBUTION STATEMENT A. Approved for public release; distribution is unlimited.Provided by IHSNot for ResaleNo reproduction or networking permitted without license fr
4、om IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-93133 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 REVISION LEVEL A SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and
5、 space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels are reflected in the PIN. 1.2 PIN. The PIN is as shown in the following exam
6、ple: 5962 - 93133 01 M P X Federal stock class designator RHA designator (see 1.2.1) Devicetype (see 1.2.2) Device class designator Caseoutline (see 1.2.4) Lead finish (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 RHA designator. Device classes Q and V RHA marked devices meet the MIL-PRF-38535 sp
7、ecified RHA levels and are marked with the appropriate RHA designator. Device class M RHA marked devices meet the MIL-PRF-38535, appendix A specified RHA levels and are marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device. 1.2.2 Device type(s). The device type(s) identif
8、y the circuit function as follows: Device type Generic number Circuit function 01 AD797 Low noise operational amplifier 1.2.3 Device class designator. The device class designator is a single letter identifying the product assurance level as follows: Device class Device requirements documentation M V
9、endor self-certification to the requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A Q or V Certification and qualification to MIL-PRF-38535 1.2.4 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows
10、: Outline letter Descriptive designator Terminals Package style P GDIP1-T8 or CDIP2-T8 8 Dual-in-line 1.2.5 Lead finish. The lead finish is as specified in MIL-PRF-38535 for device classes Q and V or MIL-PRF-38535, appendix A for device class M. Provided by IHSNot for ResaleNo reproduction or networ
11、king permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-93133 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 REVISION LEVEL A SHEET 3 DSCC FORM 2234 APR 97 1.3 Absolute maximum ratings. 1/ Supply voltage (VS) 18 V dc Common mode input voltage (VCM) . VSDiffere
12、ntial input voltage (VID) 2/ 0.7 V dc Output short circuit duration . Indefinite, within maximum internal power dissipation Power dissipation (PD) (TA= +25C) 1.3 W 3/ Lead temperature range (soldering 60 seconds) 300C Storage temperature range -65C to +150C Thermal resistance, junction-to-case (JC)
13、See MIL-STD-1835 Thermal resistance, junction-to ambient (JA) . 110C/W 1.4 Recommended operating conditions. Power supply voltage range (VS) 4.75 V to 18 V Ambient operating temperature range (TA) -55C to +125C 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The follo
14、wing specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those listed in the issue of the Department of Defense Index of Specifications and Standards (DoDISS) and supplement thereto, cited i
15、n the solicitation. SPECIFICATION DEPARTMENT OF DEFENSE MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for. STANDARDS DEPARTMENT OF DEFENSE MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. HANDBOOKS DEP
16、ARTMENT OF DEFENSE MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Unless otherwise indicated, copies of the specification, standards, and handbooks are available from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Phi
17、ladelphia, PA 19111-5094.) _ 1/ Stresses above the absolute maximum rating may cause permanent damage to the device. Extended operation at the maximum levels may degrade performance and affect reliability. 2/ The device inputs are protected by back-to-back diodes. To achieve low noise, internal curr
18、ent limiting resistors are not incorporated in to the design of this amplifier. If the differential input voltage exceeds 0.7 V, the input current should be limited to less that 25 mA by series protection resistors. Note, however, that this will degrade the low noise performance of this device. 3/ P
19、ower dissipation derating curve is defined by the following equation; 1.3 W - (TA- +25C) / JA. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-93133 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 RE
20、VISION LEVEL A SHEET 4 DSCC FORM 2234 APR 97 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specifi
21、c exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements for device classes Q and V shall be in accordance with MIL-PRF-38535 and as specified herein or as modified in the device manufacturers Quality Management (QM) plan. The modification in the QM plan
22、 shall not affect the form, fit, or function as described herein. The individual item requirements for device class M shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified herein. 3.2 Design, construction, and physical dimensions. The design, constr
23、uction, and physical dimensions shall be as specified in MIL-PRF-38535 and herein for device classes Q and V or MIL-PRF-38535, appendix A and herein for device class M. 3.2.1 Case outline. The case outline shall be in accordance with 1.2.4 herein. 3.2.2 Terminal connections. The terminal connections
24、 shall be as specified on figure 1. 3.3 Electrical performance characteristics and post irradiation parameter limits. Unless otherwise specified herein, the electrical performance characteristics and post irradiation parameter limits are as specified in table I and shall apply over the full ambient
25、operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are defined in table I. 3.5 Marking. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manuf
26、acturers PIN may also be marked as listed in MIL-HDBK-103. For packages where marking of the entire SMD PIN number is not feasible due to space limitations, the manufacturer has the option of not marking the “5962-“ on the device. For RHA product using this option, the RHA designator shall still be
27、marked. Marking for device classes Q and V shall be in accordance with MIL-PRF-38535. Marking for device class M shall be in accordance with MIL-PRF-38535, appendix A. 3.5.1 Certification/compliance mark. The certification mark for device classes Q and V shall be a “QML“ or “Q“ as required in MIL-PR
28、F-38535. The compliance mark for device class M shall be a “C“ as required in MIL-PRF-38535, appendix A. 3.6 Certificate of compliance. For device classes Q and V, a certificate of compliance shall be required from a QML-38535 listed manufacturer in order to supply to the requirements of this drawin
29、g (see 6.6.1 herein). For device class M, a certificate of compliance shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see 6.6.2 herein). The certificate of compliance submitted to DSCC-VA prior to listing as an approved source of supply fo
30、r this drawing shall affirm that the manufacturers product meets, for device classes Q and V, the requirements of MIL-PRF-38535 and herein or for device class M, the requirements of MIL-PRF-38535, appendix A and herein. 3.7 Certificate of conformance. A certificate of conformance as required for dev
31、ice classes Q and V in MIL-PRF-38535 or for device class M in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this drawing. 3.8 Notification of change for device class M. For device class M, notification to DSCC-VA of change of product (see 6.2 herein) involvi
32、ng devices acquired to this drawing is required for any change as defined in MIL-PRF-38535, appendix A. 3.9 Verification and review for device class M. For device class M, DSCC, DSCCs agent, and the acquiring activity retain the option to review the manufacturers facility and applicable required doc
33、umentation. Offshore documentation shall be made available onshore at the option of the reviewer. 3.10 Microcircuit group assignment for device class M. Device class M devices covered by this drawing shall be in microcircuit group number 85 (see MIL-PRF-38535, appendix A). Provided by IHSNot for Res
34、aleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-93133 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 REVISION LEVEL A SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test Symbol Conditions -55C
35、 TA +125C VS= 15 V Group A subgroups Device type Limits 1/ Unit unless otherwise specified Min Max Input offset voltage VIOVS= 5 V, 15 V 1 01 -80 +80 V 2,3 -180 +180 Input offset voltage drift VIO/ T VS= 5 V, 15 V, 2/ TA= -55C, +125C 8 01 -1 +1 V/C Input bias current -IIBVS= 5 V, 15 V, 1 01 -1.5 +1.
36、5 A VCM= 0 V 2,3 -3.0 +3.0 +IIB1 -1.5 +1.5 2,3 -3.0 +3.0 Input offset current IIOVS= 5 V to 15 V 1 01 -400 +400 nA 2,3 -700 +700 Open loop gain AOLVOUT= 10 V, RL= 2 k 1,2,3 01 1 V/mV VOUT= 10 V, RL= 600 1 Output voltage swing +VOUTRL = 2 k 1,2,3 01 +12 V RL = 600 +11 VS= 5 V, RL= 600 +2.5 -VOUTRL =
37、2 k -12 RL = 600 -11 VS= 5 V, RL= 600 -2.5 See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-93133 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 REVISION LEVEL A SHEET
38、6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics Continued. Test Symbol Conditions -55C TA +125C VS= 15 V Group A subgroups Device type Limits 1/ Unit unless otherwise specified Min Max Power supply quiescent current IQVS= 5 V, 15 V, TA= +25C 1 01 10.5 mA Output current IOUTVS
39、= 5 V, 15 V, 3/ TA= +25C 1 01 30 mA Power supply rejection ratio PSRR VS= 5 V to 18 V 1 01 114 dB 2,3 110 Common mode rejection ratio CMRR VS= 5 V, 15 V, 1 01 114 dB VCM= VCMR2,3 110 Common mode input voltage range +VCMRVS= 15 V 1,2,3 01 +11 V VS= 5 V +2.5 -VCMRVS= 15 V -11 VS= 5 V -2.5 Gain bandwid
40、th product GBW G = 1000, TA= +25C 2/ 4 01 75 MHz Bandwidth (-3 dB) BW G = 10, TA= +25C 2/ 4 01 5.5 MHz Full power bandwidth FPBW VOUT= 20 VPP, 4/ RL= 1 k, TA= +25C 4 01 200 kHz Input voltage noise ENf = 1 kHz, TA= +25C 2/ 4 01 1.2 nV / Hz f = 10 Hz to 1 MHz 2/ TA= +25C 1.3 V rms See footnotes at end
41、 of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-93133 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 REVISION LEVEL A SHEET 7 DSCC FORM 2234 APR 97 TABLE I. Electrical performance charact
42、eristics Continued. Test Symbol Conditions -55C TA +125C VS= 15 V Group A subgroups Device type Limits 1/ Unit unless otherwise specified Min Max Total harmonic 2/ distortion THD f = 250 kHz, 3 V rms RL= 1 k, CN= 50 pF, TA= +25C 4 01 -90 dB f = 20 kHz, 3 V rms RL= 1 k, TA= +25C -110 Slew rate SR VOU
43、T= 10 V, TA= +25C, RL= 1 k, AV= 1, measured at 20% to 80% points, falling edge 4 01 12.5 V/s Settling time 2/ tS10 V step to .0015 % of the final value, VOUT= 10 V, TA= +25C 9 01 1200 ns 1/ The algebraic convention, whereby the most negative value is a minimum and the most positive is a maximum, is
44、used in this table. Negative current shall be defined as conventional current flow out of a device terminal. 2/ If not tested, shall be guaranteed to the limits specified under table I herein. 3/ Output current for VS- VOUT 4 V and AOL 200 k. 4/ Full power bandwidth = slew rate / (2 x x VPEAK). Prov
45、ided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-93133 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 REVISION LEVEL A SHEET 8 DSCC FORM 2234 APR 97 Device type 01 Case outline P Terminal number Terminal
46、 symbol 1 OFFSET NULL 2 -INPUT 3 +INPUT 4 -VS5 OFFSET NULL 6 OUTPUT 7 +VS8 DECOMPENSATION AND DISTORTION NEUTRALIZATION FIGURE 1. Terminal connections. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-93133 DE
47、FENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 REVISION LEVEL A SHEET 9 DSCC FORM 2234 APR 97 4. QUALITY ASSURANCE PROVISIONS 4.1 Sampling and inspection. For device classes Q and V, sampling and inspection procedures shall be in accordance with MIL-PRF-38535 or as modified in the device man
48、ufacturers Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein. For device class M, sampling and inspection procedures shall be in accordance with MIL-PRF-38535, appendix A. 4.2 Screening. For device classes Q and V, screening shall be in accordance with MIL-PRF-38535, and shall be conducted on all devices prior to qualification and technology conformance inspection. For device class M, screening shall be in acco
