1、(u I o 7- m EIA CB-12 90 9 3234600 0000070 T 9 - * c EIA ENGINEERING .U-EXN - Gold Plating Study Test Report CB-12 SEPTEMBER 1990 ELECTRONIC INDUSTRIES ASSOCIATION ENGINEERING DEPARTMENT EIA CB-12 90 = 3234600 0000071i 1 NOTICE ELA Engineering Standards and Publications are designed to serve the pub
2、lic interest through eliminating misunderstandings between manufacturers and purchasers, facilitating interchangeability and improvement of products, and assisting the purchaser in selecting and obtaining with minimum delay the proper product for his particular need. Existence of such Standards and
3、Publications shall not in any respect preclude any member or nonmember of ELA from manufacturing or selling products not conforming to such Standards and Publications, nor shall the existence of such Standards and Publications preclude their voluntary use by those other than ELA members, whether the
4、 standard is to be used either domestically or internationally. Recommended Standards and Publications are adopted by EL4 without regard to whether their adoption may involve patents on articles, materials, or processes. By such action, EIA does not assume any liability to any patent owner, nor does
5、 it assume any obligation whatever to parties adopting the Recommended Standard or Publication. Technical Publications are. distinguished from EU Recommended Standards or Interim Standards, in that they contain a compilation of engineering data or information useful to the technical community, and r
6、epresent approaches to good engineering practices that are suggested by the formulating committee. This Publication is not intended to preclude or discourage other approaches that similarly represent good engineering practice, or that may be acceptable to, or have been accepted by, appropriate bodie
7、s. Parties who wish to bring other approaches to the attention of the formulating committee to be considered for inclusion in future revisions of this Publication are encouraged to do so. It is the intention of the formulating committee to revise and update this Publication from time to time as may
8、be occasioned by changes in technology, industry practice, or government regulations, or for other appropriate reasons. (CB-12 was formulated under the cognizance of the EIA P-5.1 Task Group on Gold Plating.) Published by ELECTRONIC INDUSTRIES ASSOCIATION Engineering Department 2001 Pennsylvania Ave
9、., N.W. Washington, D.C. 20006 PRICE: $16.00 Copyright 1990 All Rights Reserved Printed in U.S.A. ,- CI - EIA CB-12 90 m 3234600 O000072 3 m CB-12 TABE OF CONTENTS ITEM Introduction Test Satriples and Preparation Sample Size Applicable Documents Test Selection Contact Coding Contact Allocation Table
10、 1 Evaluation Program Chart Porosity Gold Finish Thickness Contact Engagement and Separation Forces Low Level Circuit Resistance Durability Vi brat ion Thermal Cycling with Humidity Temperature Life (Elevated Teniperature) Salt Spray kamination (Gold Finish) Special Notes Sunnnarized Test Results Co
11、ntad Engaging and Separation Forces Electrical Resistance Monitoring Plating Thickness Porosity i - PAGE NUMBER 2 3 4 4 4 5 5 6 7 8 9 9 9 10 11 12 13 14 14 15 16 17 19 24 24 . - EIA CB-12 90 3234600 0000073 5 = CB-12 Page 1 INTRODUCTION SCOPE : The purpose of this study is to evaluate the performanc
12、e characteristics of gold plating thicknesses when exposed to a severe series of environmental sequences. phenomenon which could potentially cause contact interface degradation. The program is designed to stress the component system beyond nom1 military qualification test sequences. established. The
13、 sequences as established were chosen for their impact on No pass/fail criteria was The data as generated is used for comparative purposes only. PARTICIPATING COMPANIES AND BASIC REPORTING FORMAT Three companies participated in performing the test program as established. For reporting purposes, all
14、data is anonymous and grouped. companies chose the product to be tested per the slash sheets of MIL-C-39029. Testing was performed by qualified laboratories. All said laboratories had current suitability status in effect as issued by DESC for the products involved. Participating Upon completion of t
15、esting, all data was suhitted to an independent agency. Said agency sumM1-ized and presented the data in the formt contained herein as approved by the EIA P-5.1 Task Group on gold plating. Upon completion of the report, all data was returned to the submitting companies for their own disposition. Cop
16、ies of the report were suhitte to each participating company only. The data presented herein is “grouped“. That is, the averages are the grand average of all data suhnitted from all participating companies. maximum data point was,the maximum observed from all data suhitted from all participating com
17、panies. The The comnittee wishes to acknowledge all participating companies for their time and resources in generating the data contained herein. participating in the test program were: Companies a) Dupont b.) Elco c) Texas Instrmts The independent agency collating the data was Contech Research, Inc
18、. I EIA CB-12 90 = 3234600 0000074 7 CB-12 Page 2 TEST SAMPLES AND PREPARATION 1. 2. 3. 4. 5. 6. Unless otherwise indicated all materials were certified by the manufadurer to be in accordance with the applicable product specification. The connectors as tested and suhitted were certified by the manuf
19、adurer as being fabricated and assembled utilizing nom1 production techniques comn for this type of product and inspected in accordance with the quality criteria as established for the product involved. All connectors were coded and identified to maintain continuity throughout the test sequences. Te
20、st lead attachment for electrical resistance monitoring was in accordance with the applicable product specification. Unless otherwise specified in the test procedures used, no further preparation was performed. Three different connector styles were evaluated in this study. connectors are categorized
21、 as follows: These a) b) c) Style A - Pin (dia. 1 and socket type Style B - Square post and contact type Style C - Blade and dual tine stamped contact , I ;-. EIA CB-12 90 3234600 0000075 9 CB-12 Page 3 SAMFLE SIZE Unless otherwise specified, the number of connectors suhnitted to the exposures and t
22、he number of data points monitored were in accordance with the indicated test plan. APPLICABLE DOCUMENTS 1. The following test standards were used in the performance of this evaluation. a) MIL-STD-1344 b) EIA Rs 364 2. The following products were sunitted to the exposure in accordance with the follo
23、wing specifications: a) MIL-C-55302 1. All test were performed in accordance with the sequences and procedures as specified herein. 2. See Test Plan Flow Diagram, Figure #1, for test sequences used. 1 e EIA CB-12 90 m 3234600 O000076 O m CB-12 Page 4 CONTACT CODING The contacts shall be coded as sho
24、wn below as a convenience for comparative evaluation. engagement and separation forces, crimp.contact resistance, low level circuit resistance and the final measurements, be carefully recorded so that a comparison can be made between the initial and final measurements on It is important that the ini
25、tial measurements for contact the same contact. Contact Type: F- Plating Thickness: 1- M- 2- 3- Test Sequence: A- B- C- D- E- Durability: 1- 2- 3- Environmental Exposure: T - E- S- L- Contract Condition: M- U- Individual Contact Designator : X- Female Male 50 +9, -0 microinches 30 +9, -0 microinches
26、 20 +9, -0 microinches mting/Enviromnt Mated/Enviromnt Mated/Durability/Enviromnt Mated/Durability/Vibration/Enviromnt Mated/Vihration/Environment Standard durability (500 cycles) High durability (625 cycles) Low durability (250 cycles) Thermal cycling Elevated temperature Standard salt spray as per
27、 specification 240 Hour salt spray Mated unmated Substitute individual contad number without group ( i.e., -2 1 Example - Typical Contact Code F2l3T-4 - Female contact 30 millionths gold, test sequence “B“, thermal cycled, unmated, contact 4 within test group. MlC2EM-2 - Male contad, 50 millionths g
28、old, sequence “C“, high durability test, elevated temperature, mated, contact 2 within test .group. CONTACT ALLOCATION The allocation of contacts by contact code for each test sequence are shown on Table 1. EIA CB-12 90 m 3234b00 0000077 2 m I- e uww -Nm 1, II VI U U rJ U E O u O h N I 5 x h N v) u
29、U a U c O u O h cI II O -i x h N CB-12 Page 5 v) t- u 5 i- O U J. a t- ;r P EIA CE-12 90 = 3234600 O000078 4 CB-12 Page 6 / 1 Z 0 u U i-1 U b EIA CB-12 70 W 3234600 0000077 b W - * o I TEST RATIONALE POROSITY CB-12 Page 7 PURPOSE : To establish the magnitude and severity of porosity and other types
30、of imprfedions present on contad surfaces utilizing gold finishes. presence of these discontinuities may result in corrosion produds being created in these areas which result from base metals or underplate exposure. to potentially spread across the contacting surfaces. Contingent on the magnitude of
31、 other design attributes (i.e., normal force, environments involved, circuit parameters, wipe, sealing effects, etc.) or lack thereof, this potential can result in electrical degradation. The establishment of the presence of porosity and other imperfections is considered a reference test and is util
32、ized as a means to evaluate data generated from the environmental compartments in proper perspective. The These corrosion products in turn may be of sufficient magnitude The test was performd in accordance with MIL-STD-1344, Method 1017 (equivalent of EIA TP-53). This is a destructive test. this tes
33、t were not used in any other test sequence. Contacts used in - EIA CB-12 90 H 323LlbOO O000080 2 H CB-12 Page 8 GOLD FINISH THICKNESS PURPOSE : A standard technique for measurement of the lots to be tested. recomndation is to use contacts randomly chosen from the lots tested and measure the thicknes
34、s at the contact points via X-ray fluorescence technique. The This is also a reference test. As part of the gold thickness evaluation the report should show the type of finish (overall, selective plating, inlay, etc. 1, the hardness of the gold used, and the underplate (and thickness) used. shall be
35、 as specified in the relevant military or detailed specification sheet. The gold hardness used CONTACT ENGAGE“ AND SEPARATION FORCFS PURPOSE: This test is included to provide information as to the effect that the various stress conditions ami environmental exposures will have on the contact forces.
36、The contact engagement and separation forces shall be measured prior to the initial low level circuit resistance test and following the final low level circuit resistance at the completion of the test. measurements shall be in accordance with the relevant military specification . The method of LOW L
37、EVEL CIRCUIT RESISTANCE (L.L.C.R.) PURPOSE : To evaluate contact resistance characteristics of the contact systems under conditions where applied voltages and currents do not alter the physical contact interface and will detect oxides and films which degrade electrical stability. Electrical stabilit
38、y of the contact system is determined by analysis of the change in resistance occurring. This attribute is monitored throughout the test exposures. This test shall be performed in accordance with MIL-STD-1344, Method 3002 with a 100 milliamp test current and an open circuit voltage of 20 millivolts
39、maximum. The key measuring parameter is the change (positive or negative) in resistance occurring at each measurement period to each initial absolute value per contact. rneaningless. For this evaluation, the absolute values themselves are i I CB-12 Page 9 DURABILITY PURPOSE : This is a preconditioni
40、ng sequence which is used to induce wear that may occur under normal service conditions on the contacting surfaces. Connectors are mated and unmated a predetermined number of cycles utilizing the actual mating devices. exposed to the environments as specified to assess any impact on electrical stabi
41、lity. Upon completion, the test units shall be Test Conditions : Temperature - Room Humidity - Uncontrolled Durability - Test Method shall be in accordance with the relevant military connector specification Level 1 (Standard) - The number of insertion and withdrawal cycles shall be the cam as requir
42、ed by the military specification governing the specific contact. shall be 25% more than required for Level 1. shall be 50% less than required for Level 1. Level 2 (High) - The number of cycles Level 3 (Low) - The number of cycles EIA CB-12 90 m 3234600 0000082 b m CB-12 Page 10 VIBRATION PURPOSE : 1
43、. To determine the effects of vibration within the predominant vibration frequency range and magnitudes that my be encountered during the life of the connector. 2. To determine if electrical discontinuities at the level specified exist. 3. To determine the magnitude of axial mvmt between mating conn
44、ectors due to vihratory considerations. 4. To establish the mechanical integrity of the connector system exposed to external mechanical stresses. 5. To evaluate the impad on electrical stability of the contact system when micromotion between contacting surfaces may be induced.by mechanical means (fr
45、etting corrosion). Test Conditions : The vibration test shall be in accordance with the relevant military specification or specification sheet. The contacts shall be monitored for chatter during the test. I I EIA CB-22 90 m 3234600 0000083 8 m CB-12 Page 11 THERMAL CYCLING WITH HUMIDITY PURPOSE: To
46、evaluate the impact on electrical stability of the contact system when exposed to any environment which may generate thermal/moisture type failure mechanisms such as: fretting corrosion due to wear resulting from micromotion - thermal cycling induces micromotion between contacting surfaces and humid
47、ity accelerates the oxidation process. fretting corrosion of non-noble finish system. oxidation of wear debris which my have become entrapped between the contacting surfaces due to induced micromotion. oxidation of particulates which may have been deposited on or entrapped between the contacting sur
48、faces from the surrounding atmosphere. via the wet oxidation process, detect loss of electrical stability due to particulates which may be deposited on contacting surfaces, wear which may expose base mtal or underplates of contacting surfaces, and oxidation of non-noble finish systemc. Test Conditio
49、ns: Temperature Cycle - 5%+1% to 65%+2% Relative Humidity - 90+5% Cycle Th - 8 Hours (tot-al as follows: - 2 Hours to reach high temperature - 2 Hours at high temperature - 2 Hours to reach low temperature - 2 Hours at low temperature - 150 Cycles Duration NCYTE: The cycle th is determined to allow the R.H. factor to develop oxides or films involved. This test combines the degradation factors of thermal cycling and humidity. I EIA CB-12 90 m 3234b00 000008i.1 T m Y CB-12 Page 12 TEMPERATURE LIFE (EVALUATED TnipERAnmE) PURPOSE : To evaluate the impact on electrical stabili
