1、BRITISH STANDARD BS EN 60749-12:2002 Semiconductor devices Mechanical and climatic test methods Part 12: Vibration, variable frequency The European Standard EN 60749-12:2002 has the status of a British Standard ICS 31.080.01 BS EN 60749-12:2002 This British Standard, having been prepared under the d
2、irection of the Electrotechnical Sector Policy and Strategy Committee, was published under the authority of the Standards Policy and Strategy Committee on 10 September 2002 BSI 10 September 2002 ISBN 0 580 40333 5 National foreword This British Standard is the official English language version of EN
3、 60749-12:2002. It is identical with IEC 60749-12:2002. It partially supersedes BS EN 60749:1999. The UK participation in its preparation was entrusted to Technical Committee EPL/47, Semiconductors, which has the responsibility to: A list of organizations represented on this committee can be obtaine
4、d on request to its secretary. Cross-references The British Standards which implement international or European publications referred to in this document may be found in the BSI Catalogue under the section entitled “International Standards Correspondence Index”, or by using the “Search” facility of
5、the BSI Electronic Catalogue or of British Standards Online. This publication does not purport to include all the necessary provisions of a contract. Users are responsible for its correct application. Compliance with a British Standard does not of itself confer immunity from legal obligations. aid e
6、nquirers to understand the text; present to the responsible international/European committee any enquiries on the interpretation, or proposals for change, and keep the UK interests informed; monitor related international and European developments and promulgate them in the UK. Summary of pages This
7、document comprises a front cover, an inside front cover, the EN title page, pages 2 to 5 and a back cover. The BSI copyright date displayed in this document indicates when the document was last issued. Amendments issued since publication Amd. No. Date CommentsEUROPEAN STANDARD EN 60749-12 NORME EURO
8、PENNE EUROPISCHE NORM August 2002 CENELEC European Committee for Electrotechnical Standardization Comit Europen de Normalisation Electrotechnique Europisches Komitee fr Elektrotechnische Normung Central Secretariat: rue de Stassart 35, B - 1050 Brussels 2002 CENELEC - All rights of exploitation in a
9、ny form and by any means reserved worldwide for CENELEC members. Ref. No. EN 60749-12:2002 E ICS 31.080.01 Partly supersedes EN 60749:1999 + A1:2000 + A2:2001 English version Semiconductor devices - Mechanical and climatic test methods Part 12: Vibration, variable frequency (IEC 60749-12:2002) Dispo
10、sitifs semiconducteurs - Mthodes dessais mcaniques et climatiques Partie 12: Vibrations, frquences variables (CEI 60749-12:2002) Halbleiterbauelemente - Mechanische und klimatische Prfverfahren Teil 12: Schwingen, variable Frequenz (IEC 60749-12:2002) This European Standard was approved by CENELEC o
11、n 2002-07-02. CENELEC members are bound to comply with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standard without any alteration. Up-to-date lists and bibliographical references concerning such national standards ma
12、y be obtained on application to the Central Secretariat or to any CENELEC member. This European Standard exists in three official versions (English, French, German). A version in any other language made by translation under the responsibility of a CENELEC member into its own language and notified to
13、 the Central Secretariat has the same status as the official versions. CENELEC members are the national electrotechnical committees of Austria, Belgium, Czech Republic, Denmark, Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Luxembourg, Malta, Netherlands, Norway, Portugal, Slov
14、akia, Spain, Sweden, Switzerland and United Kingdom.NE 067-9412:2002 -2 - Foreword The text of document 47/1606/FDIS, future edition 1 of IEC 60749-12, prepared by IEC TC 47, Semiconductor devices, was submitted to the IEC-CENELEC parallel vote and was approved by CENELEC as EN 60749-12 on 2002-07-0
15、2. This mechanical and climatic test method, as it relates to variable frequency vibration, is a complete rewrite of the test contained in clause 3, chapter 2 of EN 60749:1999. The following dates were fixed: latest date by which the EN has to be implemented at national level by publication of an id
16、ent ical national standard or by endorsement (dop) 2003-04-01 latest date by which the national standards conflicting with the EN have to be withdrawn (dow) 2005-07-01 Annexes designated “normative“ are part of the body of the standard. In this standard, annex ZA is normative. Annex ZA has been adde
17、d by CENELEC. _ Endorsement notice The text of the International Standard IEC 60749-12:2002 was approved by CENELEC as a European Standard without any modification. _ Page2 EN6074912:2002067-9412 CEI:0220 3 SEMICONDUCTOR DEVICES MECHANICAL AND CLIMATIC TEST METHODS Part 12: Vibration, variable frequ
18、ency 1 Scope This part of IEC 60749 describes a test to determine the effect of variable frequency vibration, within the specified frequency range, on internal structural elements. This is a destructive test. It is normally applicable to cavity-type packages. In general, this variable frequency vibr
19、ation test is in conformity with IEC 60068-2-6 but, due to specific requirements of semiconductors, the clauses of this standard apply. 2 Normative references The following referenced documents are indispensable for the application of this document. For dated references, only the edition cited appli
20、es. For undated references, the latest edition of the referenced document (including any amendments) applies. IEC 60068-2-6:1995, Environmental testing Part 2: Tests Test Fc: Vibration (sinusoidal) 3 Test apparatus Apparatus for this test shall include equipment capable of providing the required var
21、iable frequency vibration at the specified levels and the necessary optical and electrical equipment for post-test measurements. 4 Procedure The device shall be rigidly fastened on the vibration platform and the leads or cables adequately secured to avoid excessive lead resonance. The device shall b
22、e vibrated with simple harmonic motion having an amplitude of either 1,5 mm double amplitude (maximum total excursion) or a peak acceleration of 200 m/s 2 , whichever is less. The vibration frequency shall be varied from between 20 Hz and 2 000 Hz. The entire frequency range of 20 Hz to 2 000 Hz and
23、 return to 20 Hz shall be traversed in not less than 4 min. This cycle shall be performed four times in each of the orientations X, Y, and Z (total of 12 times). 4.1 Test measurements Hermeticity tests for hermetic devices, visual examination, and electrical measurements that consist of parametric a
24、nd functional testing, shall be specified in the applicable procurement document. Page3 EN6074912:2002067-9412 CEI:0220 4 4.2 Failure criteria A device shall be considered a failure if hermetic limits are exceeded for hermetic devices, if parametric limits are exceeded or if functionality cannot be
25、demonstrated under nominal and worst-case conditions specified in the applicable procurement document. Mechanical damage such as cracking, chipping, or breaking of the package (10 to 20 magnification) shall also be considered as failures, provided such damage was not incurred by fixing or handling.
26、5 Summary The following details shall be specified in the relevant specification: a) Electrical measurements (see 4.2). b) Sample size. c) Test conditions, if different from clause 4. d) Hermeticity limits for hermetic devices (see 4.2). _ Page4 EN6074912:2002- 3 E N64709-2102:02 Annex ZA (normative
27、) Normative references to international publications with their corresponding European publications This European Standard incorporates by dated or undated reference, provisions from other publications. These normative references are cited at the appropriate places in the text and the publications a
28、re listed hereafter. For dated references, subsequent amendments to or revisions of any of these publications apply to this European Standard only when incorporated in it by amendment or revision. For undated references the latest edition of the publication referred to applies (including amendments)
29、. NOTE When an international publication has been modified by common modifications, indicated by (mod), the relevant EN/HD applies. Publication Year Title EN/HD Year IEC 60068-2-6 + corr. March 1995 1995 Environmental testing Part 2: Tests - Test Fc: Vibration (sinusoidal) EN 60068-2-6 1995 Page5 EN
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