1、BRITISH STANDARD BS EN 60749-6:2002 Semiconductor devices Mechanical and climatic test methods Part 6: Storage at high temperature The European Standard EN 60749-6:2002 has the status of a British Standard ICS 31.080.01 BS EN 60749-6:2002 This British Standard, having been prepared under the directi
2、on of the Electrotechnical Sector Policy and Strategy Committee, was published under the authority of the Standards Policy and Strategy Committee on 10 September 2002 BSI 10 September 2002 ISBN 0 580 40334 3 National foreword This British Standard is the official English language version of EN 60749
3、-6:2002. It is identical with IEC 60749-6:2002. It partially supersedes BS EN 60749:1999. The UK participation in its preparation was entrusted to Technical Committee EPL/47, Semiconductors, which has the responsibility to: A list of organizations represented on this committee can be obtained on req
4、uest to its secretary. Cross-references The British Standards which implement international or European publications referred to in this document may be found in the BSI Catalogue under the section entitled “International Standards Correspondence Index”, or by using the “Search” facility of the BSI
5、Electronic Catalogue or of British Standards Online. This publication does not purport to include all the necessary provisions of a contract. Users are responsible for its correct application. Compliance with a British Standard does not of itself confer immunity from legal obligations. aid enquirers
6、 to understand the text; present to the responsible international/European committee any enquiries on the interpretation, or proposals for change, and keep the UK interests informed; monitor related international and European developments and promulgate them in the UK. Summary of pages This document
7、 comprises a front cover, an inside front cover, the EN title page, pages 2 to 5 and a back cover. The BSI copyright date displayed in this document indicates when the document was last issued. Amendments issued since publication Amd. No. Date CommentsEUROPEAN STANDARD EN 60749-6 NORME EUROPENNE EUR
8、OPISCHE NORM August 2002 CENELEC European Committee for Electrotechnical Standardization Comit Europen de Normalisation Electrotechnique Europisches Komitee fr Elektrotechnische Normung Central Secretariat: rue de Stassart 35, B - 1050 Brussels 2002 CENELEC - All rights of exploitation in any form a
9、nd by any means reserved worldwide for CENELEC members. Ref. No. EN 60749-6:2002 E ICS 31.080.01 Partly supersedes EN 60749:1999 + A1:2000 + A2:2001 English version Semiconductor devices - Mechanical and climatic test methods Part 6: Storage at high temperature (IEC 60749-6:2002) Dispositifs semicon
10、ducteurs - Mthodes dessais mcaniques et climatiques Partie 6: Stockage haute temprature (CEI 60749-6:2002) Halbleiterbauelemente - Mechanische und klimatische Prfverfahren Teil 6: Lagerung bei hoher Temperatur (IEC 60749-6:2002) This European Standard was approved by CENELEC on 2002-07-02. CENELEC m
11、embers are bound to comply with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standard without any alteration. Up-to-date lists and bibliographical references concerning such national standards may be obtained on applic
12、ation to the Central Secretariat or to any CENELEC member. This European Standard exists in three official versions (English, French, German). A version in any other language made by translation under the responsibility of a CENELEC member into its own language and notified to the Central Secretaria
13、t has the same status as the official versions. CENELEC members are the national electrotechnical committees of Austria, Belgium, Czech Republic, Denmark, Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Luxembourg, Malta, Netherlands, Norway, Portugal, Slovakia, Spain, Sweden, Sw
14、itzerland and United Kingdom.EN 64709-:60022 - 2 Foreword The text of document 47/1603/FDIS, future edition 1 of IEC 60749-6, prepared by IEC TC 47, Semiconductor devices, was submitted to the IEC-CENELEC parallel vote and was approved by CENELEC as EN 60749-6 on 2002-07-02. This mechanical and clim
15、atic test method, as it relates to storage at high temperature, is a complete rewrite of the test contained in clause 2, chapter 3 of EN 60749:1999. The following dates were fixed: latest date by which the EN has to be implemented at national level by publication of an identical national standard or
16、 by endorsement (dop) 2003-04-01 latest date by which the national standards conflicting with the EN have to be withdrawn (dow) 2005-07-01 Annexes designated “normative“ are part of the body of the standard. In this standard, annex ZA is normative. Annex ZA has been added by CENELEC. _ Endorsement n
17、otice The text of the International Standard IEC 60749-6:2002 was approved by CENELEC as a European Standard without any modification. _ Page2 EN607496:2002067-946 EI:C0022 3 SEMICONDUCTOR DEVICES MECHANICAL AND CLIMATIC TEST METHODS Part 6: Storage at high temperature 1 Scope The purpose of this pa
18、rt of IEC 60749 is to test and determine the effect on all semiconductor electronic devices of storage at elevated temperature without electrical stress applied. This test is considered non-destructive but should preferably be used for device qualification. If such devices are used for delivery, the
19、 effects of this highly accelerated stress test will need to be evaluated. In general, this test of storage at high temperature is in conformity with IEC 60068-2-48 but, due to specific requirements of semiconductors, the clauses of this standard apply. 2 Normative references The following reference
20、d documents are indispensable for the application of this document. For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments) applies. IEC 60068-2-48:1982, Environmental testing Part 2: Tests. Guidance on th
21、e application of the tests of IEC 68 to simulate the effects of storage 3 Test apparatus The apparatus required for this test shall consist of a controlled temperature chamber capable of maintaining the specific temperature within 2 C. 4 Procedure The device under test shall be subjected to continuo
22、us storage at 0 4 150 C for 0 72 000 1 h, except they shall be returned to room ambient conditions for interim electrical measurements. 4.1 Measurements Unless otherwise specified, interim and final electrical measurements shall be completed within 96 h after removal of the devices from the specifie
23、d test conditions. Intermediate measurements are optional unless otherwise specified. The electrical measurements shall consist of parametric and functional tests specified in the applicable procurement document. Page3 EN607496:2002067-946 EI:C0022 4 4.2 Failure criteria A device will be considered
24、a high temperature storage failure if parametric limits are exceeded, or if functionality cannot be demonstrated under nominal and worst-case conditions, specified in the relevant procurement document. Mechanical damage, such as cracking of the package, will be considered a failure. Cosmetic package
25、 defects and degradation of lead finish, or solderability are not considered failure criteria. 5 Summary The following details shall be specified in the relevant specification: a) Electrical measurements (see 4.1). b) Sample size. c) Time and temperature, if other than specified (see clause 4). d) I
26、ntermediate measurements, if required (see 4.1). _ Page4 EN607496:2002- 3 E N64709-:60022 Annex ZA (normative) Normative references to international publications with their corresponding European publications This European Standard incorporates by dated or undated reference, provisions from other pu
27、blications. These normative references are cited at the appropriate places in the text and the publications are listed hereafter. For dated references, subsequent amendments to or revisions of any of these publications apply to this European Standard only when incorporated in it by amendment or revi
28、sion. For undated references the latest edition of the publication referred to applies (including amendments). NOTE When an international publication has been modified by common modifications, indicated by (mod), the relevant EN/HD applies. Publication Year Title EN/HD Year IEC 60068-2-48 1982 Envir
29、onmental testing Part 2: Tests - Guidance on the application of the tests of IEC 60068 to simulate the effects of storage EN 60068-2-48 1999 Page5 EN607496:2002BS EN 60749-6:2002 BSI 389 Chiswick High Road London W4 4AL BSI British Standards Institution BSI is the independent national body responsib
30、le for preparing British Standards. It presents the UK view on standards in Europe and at the international level. It is incorporated by Royal Charter. Revisions British Standards are updated by amendment or revision. Users of British Standards should make sure that they possess the latest amendment
31、s or editions. It is the constant aim of BSI to improve the quality of our products and services. We would be grateful if anyone finding an inaccuracy or ambiguity while using this British Standard would inform the Secretary of the technical committee responsible, the identity of which can be found
32、on the inside front cover. Tel: +44 (0)20 8996 9000. Fax: +44 (0)20 8996 7400. BSI offers members an individual updating service called PLUS which ensures that subscribers automatically receive the latest editions of standards. Buying standards Orders for all BSI, international and foreign standards
33、 publications should be addressed to Customer Services. Tel: +44 (0)20 8996 9001. Fax: +44 (0)20 8996 7001. Email: ordersbsi-. Standards are also available from the BSI website at http:/www.bsi-. In response to orders for international standards, it is BSI policy to supply the BSI implementation of
34、those that have been published as British Standards, unless otherwise requested. Information on standards BSI provides a wide range of information on national, European and international standards through its Library and its Technical Help to Exporters Service. Various BSI electronic information ser
35、vices are also available which give details on all its products and services. Contact the Information Centre. Tel: +44 (0)20 8996 7111. Fax: +44 (0)20 8996 7048. Email: infobsi-. Subscribing members of BSI are kept up to date with standards developments and receive substantial discounts on the purch
36、ase price of standards. For details of these and other benefits contact Membership Administration. Tel: +44 (0)20 8996 7002. Fax: +44 (0)20 8996 7001. Email: membershipbsi-. Information regarding online access to British Standards via British Standards Online can be found at http:/www.bsi- Further i
37、nformation about BSI is available on the BSI website at http:/www.bsi-. Copyright Copyright subsists in all BSI publications. BSI also holds the copyright, in the UK, of the publications of the international standardization bodies. Except as permitted under the Copyright, Designs and Patents Act 198
38、8 no extract may be reproduced, stored in a retrieval system or transmitted in any form or by any means electronic, photocopying, recording or otherwise without prior written permission from BSI. This does not preclude the free use, in the course of implementing the standard, of necessary details su
39、ch as symbols, and size, type or grade designations. If these details are to be used for any other purpose than implementation then the prior written permission of BSI must be obtained. Details and advice can be obtained from the Copyright & Licensing Manager. Tel: +44 (0)20 8996 7070. Fax: +44 (0)20 8996 7553. Email: copyrightbsi-.
