1、raising standards worldwideNO COPYING WITHOUT BSI PERMISSION EXCEPT AS PERMITTED BY COPYRIGHT LAWBSI Standards PublicationPhotovoltaic devicesPart 10: Methods of linearity measurementBS EN 60904-10:2010National forewordThis British Standard is the UK implementation of EN 60904-10:2010. It isidentica
2、l to IEC 60904-10:2009. It supersedes BS EN 60904-10:1998 which iswithdrawn.The UK participation in its preparation was entrusted to Technical CommitteeGEL/82, Photovoltaic Energy Systems.A list of organizations represented on this committee can be obtained onrequest to its secretary.This publicatio
3、n does not purport to include all the necessary provisions of acontract. Users are responsible for its correct application. BSI 2010ISBN 978 0 580 64380 4ICS 27.160Compliance with a British Standard cannot confer immunity fromlegal obligations.This British Standard was published under the authority
4、of the StandardsPolicy and Strategy Committee on 30 April 2010.Amendments issued since publicationAmd. No. Date Text affectedBRITISH STANDARDBS EN 60904-10:2010EUROPEAN STANDARD EN 60904-10 NORME EUROPENNE EUROPISCHE NORM March 2010 CENELEC European Committee for Electrotechnical Standardization Com
5、it Europen de Normalisation Electrotechnique Europisches Komitee fr Elektrotechnische Normung Central Secretariat: Avenue Marnix 17, B - 1000 Brussels 2010 CENELEC - All rights of exploitation in any form and by any means reserved worldwide for CENELEC members. Ref. No. EN 60904-10:2010 E ICS 27.160
6、 Supersedes EN 60904-10:1998English version Photovoltaic devices - Part 10: Methods of linearity measurement (IEC 60904-10:2009) Dispositifs photovoltaques - Partie 10: Mthodes de mesure de la linarit (CEI 60904-10:2009) Photovoltaische Einrichtungen - Teil 10: Messverfahren fr die Linearitt (IEC 60
7、904-10:2009) This European Standard was approved by CENELEC on 2010-03-01. CENELEC members are bound to comply with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standard without any alteration. Up-to-date lists and bib
8、liographical references concerning such national standards may be obtained on application to the Central Secretariat or to any CENELEC member. This European Standard exists in three official versions (English, French, German). A version in any other language made by translation under the responsibil
9、ity of a CENELEC member into its own language and notified to the Central Secretariat has the same status as the official versions. CENELEC members are the national electrotechnical committees of Austria, Belgium, Bulgaria, Croatia, Cyprus, the Czech Republic, Denmark, Estonia, Finland, France, Germ
10、any, Greece, Hungary, Iceland, Ireland, Italy, Latvia, Lithuania, Luxembourg, Malta, the Netherlands, Norway, Poland, Portugal, Romania, Slovakia, Slovenia, Spain, Sweden, Switzerland and the United Kingdom. BS EN 60904-10:2010EN 60904-10:2010 - 2 - Foreword The text of document 82/582/FDIS, future
11、edition 2 of IEC 60904-10, prepared by IEC TC 82, Solar photovoltaic energy systems, was submitted to the IEC-CENELEC parallel vote and was approved by CENELEC as EN 60904-10 on 2010-03-01. This European Standard supersedes EN 60904-10:1998. The main technical changes with regard to the EN 60904-10:
12、1998 are as follows: Added clause for two-lamp method for Isc linearity. Changed standard deviation as a metric for linearity to percent deviation from linearity. This was done because a non-linear device can have a low standard deviation and percent deviation is the quantitative number that matters
13、 for the parameter of interest. Removed clause on spectral responsivity nonlinearity because it is not used by any PV testing / calibration group. For testing real PV devices it is difficult to make this error significant in the spectral mismatch correction factor while still passing Isc linearity.
14、Measuring the responsivity over the entire response range means that the device will probably fail the temperature linearity near the band edge. Added a clause to allow short circuit linearity with temperature or total irradiance to be determined from absolute spectral responsivity measurements. Thi
15、s data is routinely reported in PTB primary reference cell calibration certificates. Added report clause in compliance with ISO/IEC 17025 requirements. Often the temperature coefficient of short circuit current is very small so measurement errors can result in percent deviations outside the accepted
16、 range. Therefore, the following text was added to 7.3c): “If the temperature coefficient of short circuit current is less than 0,1 %/K, then the device can be considered linear with respect to this parameter.” Attention is drawn to the possibility that some of the elements of this document may be t
17、he subject of patent rights. CEN and CENELEC shall not be held responsible for identifying any or all such patent rights. The following dates were fixed: latest date by which the EN has to be implemented at national level by publication of an identical national standard or by endorsement (dop) 2010-
18、12-01 latest date by which the national standards conflicting with the EN have to be withdrawn (dow) 2013-03-01 Annex ZA has been added by CENELEC. _ Endorsement notice The text of the International Standard IEC 60904-10:2009 was approved by CENELEC as a European Standard without any modification. I
19、n the official version, for Bibliography, the following notes have to be added for the standards indicated: IEC 60904-7 NOTE Harmonized as EN 60904-7. IEC 61829 NOTE Harmonized as EN 61829. _ BS EN 60904-10:2010- 3 - EN 60904-10:2010 Annex ZA (normative) Normative references to international publica
20、tions with their corresponding European publications The following referenced documents are indispensable for the application of this document. For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments) appli
21、es. NOTE When an international publication has been modified by common modifications, indicated by (mod), the relevant EN/HD applies. Publication Year Title EN/HD Year IEC 60891 - Photovoltaic devices - Procedures for temperature and irradiance corrections to measured I-V characteristics EN 60891 -
22、IEC 60904-1 - Photovoltaic devices - Part 1: Measurement of photovoltaic current-voltage characteristics EN 60904-1 - IEC 60904-3 - Photovoltaic devices - Part 3: Measurement principles for terrestrial photovoltaic (PV) solar devices with reference spectral irradiance data EN 60904-3 - IEC 60904-8 -
23、 Photovoltaic devices - Part 8: Measurement of spectral response of a photovoltaic (PV) device EN 60904-8 - IEC 60904-9 - Photovoltaic devices - Part 9: Solar simulator performance requirements EN 60904-9 - IEC 61215 - Crystalline silicon terrestrial photovoltaic (PV) modules - Design qualification
24、and type approval EN 61215 - IEC 61646 - Thin-film terrestrial photovoltaic (PV) modules - Design qualification and type approval EN 61646 - ISO/IEC 17025 - General requirements for the competence of testing and calibration laboratories EN ISO/IEC 17025 - BS EN 60904-10:2010 2 60904-10 IEC:2009 CONT
25、ENTS 1 Scope and object5 2 Normative references5 3 Apparatus.6 4 Sample selection 6 5 Procedure for current and voltage linearity test6 5.1 Procedure in natural sunlight .6 5.2 Procedure with a solar simulator 8 5.3 Procedure for short-circuit linearity from absolute spectral responsivity 9 6 Proced
26、ure for short-circuit current linearity from two-lamp method.9 6.1 Background .9 6.2 Apparatus - Light sources A and B.9 6.3 General procedure.9 7 Linearity calculation 10 7.1 Slope linearity determination10 7.2 Determination of the short circuit current linearity using the two lamp method.11 7.3 Li
27、nearity requirements .11 8 Report 11 Bibliography13 BS EN 60904-10:201060904-10 IEC:2009 5 PHOTOVOLTAIC DEVICES Part 10: Methods of linearity measurement 1 Scope and object This part of IEC 60904 describes procedures used to determine the degree of linearity of any photovoltaic device parameter with
28、 respect to a test parameter. It is primarily intended for use by calibration laboratories, module manufacturers and system designers. Photovoltaic (PV) module and system performance evaluations, and performance translations from one set of temperature and irradiance conditions to another frequently
29、 rely on the use of linear equations (see IEC 60891 and IEC 61829). This standard lays down the linearity requirements and test methods to ensure that these linear equations will give satisfactory results. Indirectly, these requirements dictate the range of the temperature and irradiance variables o
30、ver which the equations can be used. The methods of measurement described in this standard apply to all PV devices and are intended to be carried out on a sample or on a comparable device of identical technology. They should be performed prior to all measurement and correction procedures that requir
31、e a linear device. The methodology used in this standard is similar to that specified in IEC 60891 in which a linear (straight-line) function is fitted to a set of data points using a least-squares fit calculation routine. The variation of the data from this function is also calculated, and the defi
32、nition of linearity is expressed as an allowable variation percentage. A device is considered linear when it meets the requirements of 7.3. General procedures for determining the degree of linearity for these and any other performance parameter are described in Clauses 5 and 6. 2 Normative reference
33、s The following referenced documents are indispensable for the application of this document. For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments) applies. IEC 60891, Photovoltaic devices Procedures for
34、temperature and irradiance corrections to measured I-V characteristics IEC 60904-1, Photovoltaic devices Part 1: Measurement of photovoltaic current-voltage characteristics IEC 60904-3, Photovoltaic devices Part 3: Measurement principles for terrestrial photovoltaic (PV) solar devices with reference
35、 spectral irradiance data IEC 60904-8, Photovoltaic devices Part 8: Measurement of spectral response of a photovoltaic (PV) device IEC 60904-9, Photovoltaic devices Part 9: Solar simulator performance requirements IEC 61215, Crystalline silicon terrestrial photovoltaic (PV) modules Design qualificat
36、ion and type approval BS EN 60904-10:2010 6 60904-10 IEC:2009 IEC 61646, Thin-film terrestrial photovoltaic (PV) modules Design qualification and type approval ISO/IEC 17025, General requirements for the competence of testing and calibration laboratories 3 Apparatus a) Equipment necessary to measure
37、 an I-V curve (see IEC 60904-1). b) Any equipment necessary to change the irradiance over the range of interest without affecting the relative spectral irradiance distribution and the spatial uniformity, such as mesh filters or neutral density filters. NOTE The equipment and procedure used to change
38、 the irradiance are to be verified with a radiometer. The change in relative spectral irradiance distribution should not result in more than 0,5 % change in the short-circuit current of the device (see IEC 60904-7 and IEC 60904-8). Mesh filters are believed to be the best method for large surfaces.
39、c) Any equipment necessary to change the temperature of the test specimen over the range of interest. d) A means for controlling the temperature of the test specimen and reference device, or a removable shade. e) Equipment for measuring the spectral response of the test specimen (or a representative
40、 sample equivalent to the test specimen) in accordance with IEC 60904-8 to a repeatability of 2 % of the reading. NOTE IEC 60904-7 provides methods for the computation of spectral mismatch error introduced in the testing of photovoltaic devices, and IEC 60904-8 provides guidance for spectral measure
41、ment. 4 Sample selection This procedure shall be applied to a full-sized test specimen if possible. If this is not possible, a small sample equivalent in construction and materials should be used. 5 Procedure for current and voltage linearity test There are three acceptable procedures for performing
42、 the linearity test of short-circuit current with respect to temperature and irradiance. There are two acceptable procedures for performing the linearity test of open-circuit voltage with respect to temperature and irradiance. 5.1 Procedure in natural sunlight 5.1.1 Measurement in natural sunlight s
43、hall only be made when: The total irradiance is at least as high as the upper limit of the range of interest. The irradiance variation caused by short-term oscillations (clouds, haze, or smoke) is less than 2 % of the total irradiance as measured by the reference device. The wind speed is less than
44、2 ms1. 5.1.2 Mount the reference device co-planar with the test specimen so that both are normal to the direct solar beam within 1. Connect to the necessary instrumentation. NOTE The measurements described in the following subclauses should be made as expeditiously as possible within a few hours on
45、the same day to minimize the effect of changes in the spectral conditions. If not, spectral corrections may be required. 5.1.3 If the test specimen and reference device are equipped with temperature controls, set the controls at the desired level. If temperature controls are not used, shade the test
46、 specimen from the sun and allow it to stabilize within 1 C of the ambient air temperature. The BS EN 60904-10:201060904-10 IEC:2009 7 reference device should also stabilize within 1 C of its equilibrium temperature before proceeding. 5.1.4 Remove the shade (if used) and immediately take simultaneou
47、s readings of the test parameter Xi, the test specimen device parameter Yiand the temperature and short-circuit current of the reference device. 5.1.5 The irradiance Goshall be calculated from the measured short circuit current (Isc) of the PV reference device, and its calibration value at Standard
48、Test Conditions, STC (Irc). A correction should be applied to account for the temperature of the reference device Tmusing the current-temperature coefficient of the reference device rc. ()2510001mrcrcsco= TIIG 5.1.6 If the test parameter being varied is the irradiance, reduce the irradiance on the t
49、est specimen to a known fraction kiwithout affecting the spatial uniformity or the spectral irradiance distribution. There are various methods by which to accomplish this: a) Using calibrated, uniform density mesh filters. If this method is selected, the reference device should remain uncovered by the filter during the operation to enable the incident irradiance to be measured. In this case, kiis the filter calibration parameter (fraction of light transmit
