EN 61106-1993 en Videodisks - Methods of Measurements for Parameters《视盘 参数测量方法》.pdf

上传人:tireattitude366 文档编号:719503 上传时间:2019-01-04 格式:PDF 页数:48 大小:1.22MB
下载 相关 举报
EN 61106-1993 en Videodisks - Methods of Measurements for Parameters《视盘 参数测量方法》.pdf_第1页
第1页 / 共48页
EN 61106-1993 en Videodisks - Methods of Measurements for Parameters《视盘 参数测量方法》.pdf_第2页
第2页 / 共48页
EN 61106-1993 en Videodisks - Methods of Measurements for Parameters《视盘 参数测量方法》.pdf_第3页
第3页 / 共48页
EN 61106-1993 en Videodisks - Methods of Measurements for Parameters《视盘 参数测量方法》.pdf_第4页
第4页 / 共48页
EN 61106-1993 en Videodisks - Methods of Measurements for Parameters《视盘 参数测量方法》.pdf_第5页
第5页 / 共48页
点击查看更多>>
资源描述

1、R 3404583 0085143 703 W EUROPEAN STANDARD NORME EUROPENNE EUROPISCHE NORM EN 61106 August 1993 English version Videodisks - Methods of measurements for parameters (IEC 1106 : 1993) Viclbcliscliics - Mthodes de mesure des parime tres MeBverfahren dei Eigenschaften (CE1 1106 : 1993) Videoplatten - (CE

2、1 1106 : 1993) This European Standard was approved by CENELEC on 1993-07-06. CENELEC 1iieinbei.s are bound to coinply with the CEKICENELEC Internal Regulations which stipulate the conditions for giving this European Stanclard the status of a national standard without any alteration. Cl)-to-date list

3、s and bibliographical references concerning such national standards inay be obtained on application to the Central Secretariat or to any CENELEC nieniber. This European Standard exists in three official versions (English, French, German), A version in any other language niade by translation under th

4、e responsibility of a CEKELEC meinber into its own language and notifiecl to the Central Secretariat has the sanie status as the official versions. CEKELEC ineitibers are the national electrotechnical coininittees of Austria, Belgiuin, Deiunark, Finland, France, Germany, Greece, Iceland, Irelancl, I

5、taly, Luxeinbourg, Netherlands, Norway, Portugal, Spain, Sweden, Switzerland aiid Unitecl Kingdom. CENELEC European Committee for Electrotechnical Standardization Comit Europen de Norinalisation Electrotechnique Europisches Komitee fiir Elektrotechnische Xorniung Central Secretariat: rue de Stassart

6、 35, B-1050 Brussels 5 1Ni3 Copyright reserved to CEKELEC nieinbers Ref. No. EX 61106 : 1993 E El 3404583 0085144 b4T 9 Page 2 EN 61106 : 1993 Foreword The text of document 60B(C0)134, as prepared by Sub-Committee 60B: Video recording of IEC Technical Committee 60: Recording, was submitted to the IE

7、C-CENELEC parallel vote in August 1991. The reference document was approved by CENELEC as Eh 61106 on 6 July 1993. The following dates were fixed: - latest date of publication of an identical national standard (dop) 1994-07-01 - latest date of withdrawal of conflicting national standards (dow) 1994-

8、07-01 Annexes designated noirnative are pait of the body of the standard. In this standard, annexes A, 11, C, D, E, I?, G, H, J, K, L, M, N, P, Q, R, S, T, C and ZA are normative. W 3404583 0085145 586 W Page 3 EN 61106 : 1993 CONTENTS Page INTRODUCTION Clause 1 Scope 2 Normative references . 3 4 Li

9、st of parameters and their applications . Standard atmospheric conditions for testing Table 1 . Measuring items Annexes A B C D E F G H J K L M N P Q R S T U Thickness of protective transparent layer Rotation speed . Track position and number . Track depth Vertical deviation and acceleration of VHD

10、Vertical deviation and acceleration of LV . Radial deviation and acceleration of VHD Radial deviation and acceleration of LV . Tangential deviation of VHD Tangential deviation of LV Birefringence of transparent disk . Audio subcarrier amplitude and EFM amplitude Audio subcarrier frequencies. channel

11、s 1 and 2 Maximum video level Blanking level frequency Main carrier deviation . Pre-emphasis audio . Pre-emphasis video . Operation signals . Annex ZA (normative) Other international publications quoted in this standard with the references of the relevant European publications . 4 5 5 5 8 8 11 12 13

12、 15 17 20 23 26 28 29 30 31 32 34 36 37 38 40 42 48 fM 3404583 O085146 412 W Page 4 EN 61106 : 1993 INTRODUCTION Two videodisk systems are covered by the IEC publications quoted in clause 2. In order to play back these two types of videodisks it is necessary to use an optical pick-up device for the

13、optical system and a capacitance pick-up device for the capacitance system. These videodisks are characterized by mechanical, electrical and optical parameters for which measuring methods are unknown. IEC page Il 3404583 0085347 359 W Page 5 EN 61106 : 1993 VIDEODISKS - METHODS OF MEASUREMENT FOR PA

14、RAMETERS 1 Scope This International Standard collects the different typical parameters for videodisks described in IEC 844,845,856 and 857 and proposes a method of measurement for each. Some of these parameters can be measured by well known methods existing in every labo- ratory, whilst other parame

15、ters need specific equipment described in the annexes. 2 Normatlve references The following standards contain provisions which, through reference in this text, constitute provisions of this International Standard. At the time of publication, the editions indicated were valid. All standards are subje

16、ct to revision, and parties to agreements based on this International Standard are encouraged to investigate the possibility of applying the most recent editions of the standards indicated below. Members of IEC and IS0 maintain registers of currently valid International Standards. IEC 844: 1988, Pre

17、-recorded capacitance grooveless videodisk system. 50 Hz/625 lines - PAL, on Type VHD IEC 845: 1988, Pre-recorded capacitance grooveless videodisk system. 60 Hz/525 lines - NTSC, on Type VHD IEC 856: 1986, Pre-recorded optical reflective videodisk system. Laser vision. 50 Hz/625 lines - PAL IEC 857:

18、 1986, Pre-recorded optical reflective videodisk system. Laser visionu 60 Hz/525 lines - M/NTSC 3 List of parameters and their applications Applies to Classification (note 2) 3.1 Mechanical parameters 3.1 .1 3.1.2 Thickness of disk areas 3.1.3 Outer radius of disk 3.1.4 Diameter of center hole 3.1.5

19、 3.1.6 Inside diameter of label 3.1.7 Outside diameter of label Thickness of protective transparent layer Concentricity of disk assembled from two single disks LV, (note 1) LV, VHD LV, VHD LV, VHD LV LV LV For the notes, see page 13. 61 3404583 0085348 295 W Page 6 EN 61106 : 1993 3.1.8 3.1.8.1 3.1.

20、8.2 3.1.8.3 3.1.9 3.1.1 O 3.1.1 1 3.1.1 2 3.1.1 3 3.1.14 3.1.15 3.1.16 3.1.17 3.1.1 8 3.1.19 3.1.20 3.1.20.1 3.1.20.2 3.1.20.3 3.1.20.4 3.1.21 3.1.22 3.1.22.1 3.1.22.2 3.1.22.3 3.1.23 3.1.23.1 3.1.23.2 3.1.24 Rotation speed Angular velocity of CAV* disk Linear velocity of CLV” disk Angular accelerat

21、ion for CLV disk Mass of the disk Maximum unbalance force Starting radius lead-in tracks Starting radius programme area End radius programme area and starting position of lead-out tracks Minimum number of programme tracks Length of lead-out tracks Inner radius programme end signal area Track pitch W

22、idth and depth of information track Width and depth of pilot signal track Vertical deviation of programme tracks during playback Maximum distance from reference plane M ax mum vert cal acceleration Maxi mum vert cal deviation Maximum velocity Maximum static deflection of disk Radial deviation of pro

23、gramme tracks during playback Maximum deviation during one revolution Maximum radial deviation Maximum radial acceleration Tangential deviation of programme tracks Maximum time base error Shift between two adjacent tracks Disk case Applies to LV, VHD LV LV LV LV, VHD LV, VHD LV, VHD LV, VHD LV LV VH

24、D LV, VHD VHD VHD LV, VHD LV, VHD LV, VHD LV LV, VHD LV, VHD LV, VHD LV, VHD LV, VHD LV, VHD LV, VHD VHD Constant Angular Velocity. * Constant Linear Velocity. Note 2, see page 13. IEC page 111 m 3404583 0085349 323 m Page 7 EN 61106 : 1993 3.2 3.2.1 3.2.2 3.2.3 3.2.4 3.3 3.3.1 3.3.2 3.3.3 3.3.4 3.3

25、.5 3.3.6 3.3.7 3.3.8 3.3.9 3.3.9.1 3.3.9.2 3.3.1 O 3.4 3.4.1 3.4.1.1 3.4.1.2 3.4.1.3 3.4.2 3.4.2.1 3.4.2.2 3.4.3 3.4.3.1 3.4.3.2 3.4.4 Disk material parameters Refractive index Birefringence of transparent disk Reflectivity Surface resistivity Recorded parameters Audio subcarrier amplitude and EFM (

26、note 3) amplitude Audio subcarrier frequencies, channels 1 and 2 Audio subcarrier frequency maximum deviation Video signal standards (visual check), color burst, VIRS (note 3), ITS (note 3), address signals Maximum video level Blanking level frequency Main carrier deviation Pilot frequency Pre-empha

27、sis audio and video Pre-emphasis audio Pre-emphasis video Digital data encoding format correctness Operation signals Radial signal Radial modulation index Radiai reflection index Radial signal to error ratio Push-pull tracking signal Magnitude Noise Tangential signal Drop outs Signal to noise ratio

28、High frequency modulation index Applies to LV LV LV VHD LV, VHD LV, VHD LV, VHD LV, VHD LV, VHD LV, VHD LV, VHD VHD LV, VHD LV, VHD LV, VHD LV LV LV LV LV LV, VHD LV LV NOTES 1 LV Laser vision 2 (1) Parameters which can be measured by conventional techniques. (2) Parameters for which specific method

29、s exist wih an IEC definition. (3) Parameters of videodisk technology which need specific attention. 3 EFM Eight to Fourteen Modulation. VIRS Vertical Interval Reference Signal. ITS International Test Signal. Classification (note 2) (3) (3) (3) (3) (3) (3) (3) (3) IEC page 131 3404583 0085150 943 W

30、- Iagc 8 EN 61106 : 1993 Annex C 4 Standard atmospheric conditions for testing Measurements and mechanical checks shall be carried out at any combination of tem- perature, humidity and air pressure within the following limits unless otherwise specified for certain parameters in IEC 844, 845, 856 and

31、 857: Ambient temperature: Air pre ssu re : 15 OC to 35 OC; 45 Yo to 75 %; 86 kPa to 106 kPa. Relative humidity: Samples shall be conditioned in the testing environment for 24 h before testing. Table 1 - Measuring items I I Parameters LV VHD 3.1 Mechanical parameters 3.1.1 3.1.2 3.1.3 3.1.4 3.1.5 3.

32、1.6 3.1.7 3.1.8 3.1.8.1 3.1 .8.2 3.1.8.3 3.1.9 3.1.10 3.1.1 1 3.1.12 3.1.13 3.1.14 3.1.15 3.1.16 Thickness of protective transparent layer Thickness of disk areas Outer radius of disk Diameter of centre hole Concentricity of disk assembled from two single disks Inside diameter of label Outside diame

33、ter of label Rotation speed Angular velocity of CAV disk Linear velocity of CLV disk Angular acceleration for CLV disk Mass of the disk Maximum unbalance force Starting radius lead-in tracks Starting radius programme area End radius programme area and starting position of lead-out tracks Minimum num

34、ber of programme tracks Length of lead-out tracks Inner radius programme end signal Annex A - A disk may be measured with sufficient accuracy by means of general measuring instruments such as a dial gauge, thickness gauge, caliper, and Plug gauge Annex 8 Conventional method - A disk shall be measure

35、d on a dynamic balancing machine with a specified rotation speed Annex C IEC page 151 = 3404583 0085353 88T W LV Page 9 EN 61106 : 1993 VHD Table 1 (continued) Annex K Parameters Annex J 3.1.17 Track pitch - 3.1.18 3.1.19 Width and depth of information track Width and depth of pilot signal track Con

36、ventional method 3.1.20 Vertical deviation of programme tracks during playback Conventional method Annex L Conventional method - 3.1.20.1 Maximum distance from reference plane - - - IEC 93 3.1.20.2 Maximum vertical acceleration 3.1.20.3 Maximum vertical deviation 3.1.20.4 Maximum velocity 3.1.21 Max

37、imum static deflection of disk 3.1.22 Radial deviation of programme tracks during playback 3.1.22.1 3.1.22.2 Maximum radial deviation 3.1.22.3 Maximum radial acceleration Maximum deviation during one revolution 3.1.23 Tangential deviation of programme tracks 3.1.23.1 Maximum time base error 3.1.23.2

38、 Shift behveen two adjacent tracks 3.1.24 Disk case 3.2 Disk material parameters 3.2.1 Refractive index 3.2.2 Birsfringence of transparant disk 3.2.3 Reflectivity 3.2.4 Surface resistivity 3ptical microscope (measure mean track pitch) Annex D Annex F Annex E Mechanical method I Annex G Annex H IEC p

39、aye 171 e3 3404583 0085352 73b = Verify the location of each test signal by use of waveform monitor Page 10 EN 61106 : 1993 - Table 1 (concluded) Annex T Parameters 3.3 Recorded parameters Under consideration 3.3.1 3.3.2 3.3.3 3.3.4 3.3.5 3.3.6 3.3.7 3.3.8 3.3.9 3.3.9.1 3.3.9.2 3.3.10 Annex U Audio

40、subcarrier amplitude and EFM amplitude - Audio subcarrier frequencies, channels 1 and 2 Audio subcarrier frequency maximum deviation Video signal standards (visual check), color burst, VIRS, ITS, address signals Maximum video level Blanking level frequency Main carrier deviation Pilot frequency Pre-

41、emphasis audio and video Pre-emphasis audio Pre-emphasis video Digital data encoding format correctness LV I VHD Optical microscope (measure mean track pitch) Annex M Annex N Annex P Annex Q Annex R Under consideration I - 3.4 Operation signals 3.4.1 Radial signal 3.4.1.1 Radial modulation index 3.4

42、.1.2 Radial reflection index 3.4.1.3 Radial signal to error ratio 3.4.2 Push-pull tracking signal I 3.4.2.1 Magnitude 3.4.2.2 Noise 1.4.3 Tangential signal 5.4.3.1 Drop outs L4.3.2 Signal to noise ratio Annex U - I 1.4.4 High frequency modulation index IEC page 191 m 3404583 0085353 652 W Page 11 EN

43、 61106 : 1993 Annex A (norm at ive) Thickness of protective transparent layer A.l Application This measuring method shall be applied. I Parameter I Applies to * I ILVI-l 3.1 .i Thickness of protective transparent layer A.2 Measuring apparatus Microscope. A.3 Measurement The difference between the po

44、sitions (a) and (b) of the microscope objective (see figure A.l) is x. (a) The microscope is focused on the information layer. (b) The microscope is focused on the surface of the transparent layer. The refractive index of the disk material is n. The thickness of the transparent layer is d = x/n. 4 b

45、) Figure A.l - Measuring method IEC page 211 E# 3404583 0085354 599 W Parameters Page 12 EN 61106 : 1993 Applies to Annex B (normative) 3.1.8.1 Angular velocity of CAV disk 3.1.8.2 3.1.8.3 Linear velocity of CLV disk Angular acceleration of CLV disk Rotation speed 6.1 Application This measuring meth

46、od shall be applied. LV VHD LV - LV - 8.2 Measuring apparatus Modified videodisk player Optical stylus or standard pick-up radius r (m) IEC 589191 o is the progressive average over one revolution (rad/s). The measuring equipment is a modified videodisk player provided with an indication of the motor

47、 angular velocity o in radians per second and with an indication of the distance r, in metres from the optical stylus or standard pick-up to the geometric centre of the centre hole. These parameters and their time dependent changes give the possibility of recording the angular velocity of a CAV disk

48、, the linear velocity of a CLV disk, and the angular acceleration of a CLV disk at any radius of the disk. When a modified videodisk player delivers a coloured picture to a motor has the correct angular velocity o = 25cf where fis the frequency. 6.3 Measurement 8.3.1 (3.1.8.1) Angular velocity of CA

49、V disk Frequency 29,97 Hz 14,985 HZ 12,5 HZ B.3.2 (3.1.8.2) Linear velocity of CL V disk (for L V) Y = oxr 8.3.3 (3.1.8.3) Angular acceleration of CL V disk (for L V) do a=- dt IEC page 231 TV set, the spindle 3404583 0085155 425 E Parameters Page 13 EN 61106 : 1993 Applies to I Annex C (no rrnat ive) Track position and number C.1 Appllcatlon This measuring method shall be applied. 3.1.1 1 Starting radius lead-in tracks 3.1.1 2 Starting radius programme area 3.1.13 End radius programme area 3.1.14 Minimum number of programme tracks 3.1.15 Length of lead-out t

展开阅读全文
相关资源
猜你喜欢
相关搜索

当前位置:首页 > 标准规范 > 国际标准 > 其他

copyright@ 2008-2019 麦多课文库(www.mydoc123.com)网站版权所有
备案/许可证编号:苏ICP备17064731号-1