1、 KSKSKSKS SKSKSKS KSKSKS SKSKS KSKS SKS KS 2006 11 30 http:/www.kats.go.krKS C IEC 607491 1： KS C IEC 60749 1： 2006 (2011 )C IEC 60749 1： 2006 : ( ) ( ) ( ) ( ) : (http:/www.standard.go.kr) ： ： 2006 11 30 ： 2011 12 13 2011-0563 ： ： ( 02-509-7294) (http:/www.kats.go.kr). 10 5 , . ICS 31.080.01 KS C I
2、EC 1： 60749 1： 2006(2011 ) Semiconductor devices Mechanical and climatic test methods Part 1： General 2002 IEC 60749 1 Semiconductor devices Mechanical and climatic test methods Part 1： General . 1. ( ) , IEC 60749 . , . 2. . ( ) . ( ) . IEC 60050( ), (International Electrotechnical Vocabulary, IEV)
3、 IEC 60747( ), IEC 60748( ), 3. , IEC 60747 IEC 60748 , . IEC 60050(IEV) . 4. 4.1 , . 1535 4575 %, 85106 kPa 4.2 . (255) 4575 %, 85106 kPa 4.3 , . . 4.4 , . C IEC 60749 1： 2006 2 5. 5.1 , IEC 60747 IEC 60748 “ ” . 5.2 IEC 60747 IEC 60748 “ ” “ ” . 5.3 / , . . 5.4 . 5.5 ( ) , . 6. , . C IEC 60749 1：
4、2006 3 A() 60749 IEC 60749 XX 1 3 1 (KS C IEC 60749 1 ) (KS C IEC 60749 3 ) 1 1 1 1.4. 5. 6. 14 21 15 20 12 10 36 22 19 ( )(KS C IEC 60749 14 ) (KS C IEC 60749 21 ) (1) SMD (KS C IEC 60749 20 ) , (KS C IEC 60749 12 ) (KS C IEC 60749 10 ) , (1) (KS C IEC 60749 22 ) (KS C IEC 60749 19 )2 2 2 2 2 2 2 2
5、 2 1. 2.1 2.2 2.3 3. 4. 5. 6. 7. 25 11 6 2 5 4 8 13 7 ( , )(1) (KS C IEC 60749 11 ) (KS C IEC 60749 6 ) (KS C IEC 60749 2 ) (1) , , (KS C IEC 60749 4 ) (KS C IEC 60749 8 ) (KS C IEC 60749 13 ) (KS C IEC 60749 7 ) 3 3 3 3 3 3 3 3 3 3 3 1.1 1.2 2. 3. 4A 4B 4C 5. 6. 7. 8. 31 32 9 ( )(KS C IEC 60749 31
6、) ( )(KS C IEC 60749 32 ) (KS C IEC 60749 9 ) 4 4 4 1.1 1.2 2. (1) 1 ： 153787 1 92 3(13) (02)26240114 (02)2624 0148 9 http:/ KSKSKSSKSKS KSKS SKS KSKS SKSKS KSKSKSKS C IEC 60749 1： 2006 Semiconductor devicesMechanical and climatic test methodsPart 1：GeneralICS 31.080.01 Korean Agency for Technology and Standards http:/www.kats.go.kr
