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JIS K 3834-1990 Testing methods for specific resistivity recovery characteristic of water filtered by membranes《薄膜过滤水比阻抗复原特性的测试方法》.pdf 12

JIS K 3834-1990 Testing methods for specific resistivity recovery characteristic of water filtered by membranes《薄膜过滤水比阻抗复原特性的测试方法》.pdfJIS K 3834-1990 Testing methods for specific resistivity recovery characteristic of water filtered by membranes《薄膜过滤水比阻抗复原特性的测试方法》.pdf

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JIS K 3832-1990 Testing methods for bubble point of membrane filters《薄膜滤器起泡点的测试方法》.pdf 15

JIS K 3832-1990 Testing methods for bubble point of membrane filters《薄膜滤器起泡点的测试方法》.pdfJIS K 3832-1990 Testing methods for bubble point of membrane filters《薄膜滤器起泡点的测试方法》.pdf

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JIS K 3824-2012 7500 Testing methods for determining endotoxin rejection of ultrafiltration modules《超滤组件细菌内毒素抑制性的测试方法》.pdf 15

JIS K 3824-2012 7500 Testing methods for determining endotoxin rejection of ultrafiltration modules《超滤组件细菌内毒素抑制性的测试方法》.pdfJIS K 3824-2012 7500 Testing methods for determining endotoxin rejection of ultrafiltration modules《超滤组件细菌内毒素抑制性的测试方法》.pdf

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JIS K 3823-2012 9375 Testing methods for determining bacterial rejection of ultrafiltration modules《超滤组件细菌抑制性的测试方法》.pdf 18

JIS K 3823-2012 9375 Testing methods for determining bacterial rejection of ultrafiltration modules《超滤组件细菌抑制性的测试方法》.pdfJIS K 3823-2012 9375 Testing methods for determining bacterial rejection of ultrafiltration modules《超滤组件细菌抑制性的测试方法》.pdf

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JIS K 3822-1990 Testing methods for specific resistivity recovery characteristic of water filtered by ultrafiltration modules《超滤组件过滤水比阻抗复原特性的测试方法》.pdf 11

JIS K 3822-1990 Testing methods for specific resistivity recovery characteristic of water filtered by ultrafiltration modules《超滤组件过滤水比阻抗复原特性的测试方法》.pdfJIS K 3822-1990 Testing methods for specific resistivity recovery characteristic of water filtered by ultrafiltration modules《超滤组件过滤水比阻抗复原特性的测试方法》.pdf

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JIS K 0154-2017 2676 Surface chemical analysis -- Guidelines for preparation and mounting of specimens for analysis《表面化学分析 分析用试样制备和安装指南》.pdf 28

JIS K 0154-2017 2676 Surface chemical analysis -- Guidelines for preparation and mounting of specimens for analysis《表面化学分析 分析用试样制备和安装指南》.pdfJIS K 0154-2017 2676 Surface chemical analysis -- Guidelines for preparation and mounting of specimens for analysis《表面化学分析 分析用试样制备和安装指南》.pdf

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JIS K 0153-2015 9375 Surface chemical analysis -- Secondary-ion mass spectrometry -- Repeatability and constancy of the relative-intensity scale in static secon.pdf 20

JIS K 0153-2015 9375 Surface chemical analysis -- Secondary-ion mass spectrometry -- Repeatability and constancy of the relative-intensity scale in static secon.pdfJIS K 0153-2015 9375 Surface chemical analysis -- Secondary-ion mass spectrometry -- Repeatability and constancy of the relative-intensity scale in static secon.pdf

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JIS K 0152-2014 0625 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Repeatability and constancy of intensity scale《表面化学分析 X射线光电子能谱分析 强度标的重复性和一.pdf 24

JIS K 0152-2014 0625 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Repeatability and constancy of intensity scale《表面化学分析 X射线光电子能谱分析 强度标的重复性和一.pdfJIS K 0152-2014 0625 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Repeatability and constancy of intensity scale《表面化学分析 X射线光电子能谱分析 强度标的重复性和一.pdf

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JIS K 0150-2009 6875 Surface chemical analysis -- Analysis of zinc- and or aluminium-based metallic coatings by glow-discharge optical-emission spectrometry《表面化.pdf 44

JIS K 0150-2009 6875 Surface chemical analysis -- Analysis of zinc- and or aluminium-based metallic coatings by glow-discharge optical-emission spectrometry《表面化.pdfJIS K 0150-2009 6875 Surface chemical analysis -- Analysis of zinc- and or aluminium-based metallic coatings by glow-discharge optical-emission spectrometry《表面化.pdf

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JIS K 0149-1-2008 Microbeam analysis -- Scanning electron microscopy -- Guidelines for calibrating image magnification《微光束分析 扫描电子显微镜法 校准图像放大指南》.pdf 26

JIS K 0149-1-2008 Microbeam analysis -- Scanning electron microscopy -- Guidelines for calibrating image magnification《微光束分析 扫描电子显微镜法 校准图像放大指南》.pdfJIS K 0149-1-2008 Microbeam analysis -- Scanning electron microscopy -- Guidelines for calibrating image magnification《微光束分析 扫描电子显微镜法 校准图像放大指南》.pdf

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