TIA-1183-1-2016 Measurement Methods and Test Fixtures for Balun-Less Measurements of Balanced Components and Systems Extending Frequency Capabilities to 2 GHz (Addendum to TIA-1183.pdf

1、 TIA-1183-1 (Addendum to TIA-1183) January 2016Measurement Methods and Test Fixtures for Balun-Less Measurements of Balanced Components and Systems, Extending Frequency Capabilities to 2 GHz ANSI/TIA-1183-1-2016 APPROVED: JANUARY 12, 2016 NOTICE TIA Engineering Standards and Publications are designe

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23、E USE OF THE CONTENTS HEREOF, AND THESE CONTENTS WOULD NOT BE PUBLISHED BY TIA WITHOUT SUCH LIMITATIONS. ANSI/TIA-1183-1 i Measurement methods and test fixtures for balun-less measurements of balanced components and systems FOREWORD . iv Introduction 1 1 Scope 2 2 Normative references 2 3 Definition

24、 of terms, acronyms and abbreviations, and units of measure 2 3.1 General 2 3.2 Definitions 2 3.3 Acronyms and abbreviations . 3 3.4 Units of measure . 3 3.5 Variables 3 4 General 4 5 Test configurations 4 5.1 Test configuration 5 6 Fixtures and setup . 10 6.1 Switching and interconnecting coaxial c

25、able requirements 11 6.2 Test fixture interface performance 12 6.3 Overall test setup performance before calibration 14 7 Port terminations . 14 7.1 Active port network analyzer terminations 15 7.2 Active port resistor terminations 15 7.3 Inactive port resistor terminations . 15 7.4 Calibration refe

26、rence loads . 15 7.5 Termination resistor selection . 15 7.5.1 Termination resistor impedance tolerance 16 7.5.2 Load terminations used for calibration 17 7.5.2.1 50 reference load measurement procedure 17 7.5.3 Reference loads for calibration . 17 7.5.4 Calibration kit definitions . 17 7.6 Active p

27、ort far end termination performance . 17 7.7 Inactive port termination performance . 18 8 Calibration . 18 8.1 General 18 8.2 Reference loads for calibration . 19 8.3 Overall test system performance after calibration. 19 9 Procedures for determining test system performance parameters . 19 9.1 Genera

28、l 19 9.2 Residual FEXT loss . 19 10 Test fixture Interface description . 19 10.1 Fixture dimensions 20 Annex A (informative)- Derivation of mixed mode parameters from four port S parameter measurements 23 Annex B (informative)- Impedance transformation calculations 24 Annex C (informative) Cabling s

29、tandards and termination impedances for differential cabling systems 25 Annex D (informative) Port identification and nomenclature . 26 Annex E (informative) De-embedding balunless 16 port test fixtures. 31 E.1 Four port fixture method. General calibration approach . 31 E.1.1 Four port fixture metho

30、d. Pre-characterization of probing devices 33 E.1.2 Four port fixture method. Determination of fixture matrices 34 ANSI/TIA-1183-1 ii E.1.3 Four port fixture method. Cascading de-embedding matrices. 35 E.2 Sixteen port fixture method. General calibration approach . 36 E.2.1 Sixteen port fixture meth

31、od. Determining fixture matrices . 36 E.2.2 Sixteen port fixture method. Cascading de-embedding matrices 36 E.3 Characterizing the probing fixture . 37 E.4 Characterizing a 4-port fixture . 39 E.4.1 Determination of SAA, SBB, SAB and SBA, . 39 E.4.2 Determination of SCC SAC and SCA . 39 E.4.3 Determ

32、ination of SDD SBD and SDB . 40 E.4.4 Determination of SDA, SAD, SBC, SCB, SCD and SDC . 40 E.5 Characterizing a 16-port fixture . 41 E.5.1 Additional FEXT coupling elements of the 16 port fixture matrix . 41 E.5.2 Additional NEXT coupling elements of the 16 port matrix . 41 E.5.3 Additional recipro

33、cal NEXT coupling elements of the 16-port matrix 42 E.6 RF simulation software consideration. 43 E.6.1 Port mapping of fixtures in a back-to-back configuration. 44 E.6.2 Performing 16 Port S to T transformations 46 E.6.3 Performing 16 Port T to S transformations 47 E.7 Conversion from single-ended t

34、o mixed mode using mathematical baluns 48 LIST OF TABLES Table 1 - Switch performance recommendations 11 Table 2 - Test fixture performance 13 Table 3 - Overall test setup performance before calibration . 14 Table 4 - Calibration termination performance 17 Table 5 Active port far end termination per

35、formance . 17 Table 6 - Inactive port far end termination performance . 18 Table 7 - Overall test setup performance after calibration . 19 Table D.1 - Horizontal 100 twisted pair cable color codes 27 Table D.2 - Stimulus and response designations for ports 1 and 2 28 Table D.3 - Modular connector co

36、nductor mappings (ref) 29 Table D.4 Port nomenclature 30 Table E.1 Reciprocal relationships in a 16 port matrix 42 Table E-2 Test fixture port re-mapping for back-to-back through calibrations 44 Table E.3 Balun conversion S16P port identification 50 LIST OF FIGURES Figure 1 - Test system diagram for

37、 four port network analyzer . 6 Figure 2 - Laboratory test configuration for cable and channel insertion loss, return loss, TCL, TCTL, and propagation delay. 7 Figure 3 - Laboratory test configuration for NEXT loss between two pairs of a four-pair DUT . 8 Figure 4 - Laboratory two port test configur

38、ation for return loss and TCL (LCL) measurements. 9 Figure 5 - Laboratory test configuration for FEXT loss between two pairs of a DUT. . 9 Figure 6 - Insertion loss measurement of low loss devices. 11 Figure 7 - Example of a four-port test setup with test fixtures and programmable switching 12 Figur

39、e 8 - Example chip resistor performance guide. 16 Figure 9 - Example chip resistor terminations using 0603 chip resistors 16 Figure 10 - Example pin and socket interface dimension . 20 Figure 11 Example DUT interface dimensions . 20 Figure 12 - Example test fixture exploded assembly . 21 Figure 13 -

40、 Example test fixture assembly 22 ANSI/TIA-1183-1 iii Figure 14 Example termination of individually shielded pair cable . 22 Figure D.1 - Example S-parameter notation for two ports . 26 Figure D.2 - Four-pair DUT port numbering 26 Figure D.3 - Mapping 16 port network to mixed mode network 28 Figure

41、D.4 - T568A pin/pair mapping 29 Figure D.5 - T568B pin/pair mapping 29 Figure E.1 - Unprocessed measurement includes test fixtures and DUT . 32 Figure E.2 - De-embedding matrices cascaded to unprocessed 16-port matrix . 33 Figure E.3 - An example of probing devices (rigid SMA cable is modified) 34 F

42、igure E.4 - Using probing devices to interface ports C and D to measure FWDx and REVx . 34 Figure E.5 - Diagram of 4-port measuring fixture and 2-port probing fixture 37 Figure E.6 - Diagram of four port probing fixture . 38 Figure E.7 - Notation of 4-port measurement fixture FWD1 39 Figure E.8 - Fi

43、rst Setup for Characterization of a 4-Port Measurement Fixture . 39 Figure E.9 - Second setup for characterization of a 4-port measurement fixture . 40 Figure E.10 - Third setup for characterization of a 4-port measurement fixture . 40 Figure E.11 - Fourth setup for characterization of a 4-port meas

44、urement fixture . 40 Figure E.12 - Cascading using RF simulation application (comparable to Figure E.2) . 43 Figure E.13 - Adding ideal baluns to extract mixed mode parameters . 43 Figure E.14 - Port numbering of near and far end test fixtures . 44 Figure E.15 - Balun schematic 48 Figure E.16 - Illu

45、stration for cascading de-embedding matrices and ideal baluns 50 ANSI/TIA-1183-1 iv FOREWORD (This forward is not a part of this Addendum.) This project was initiated in conjunction with the need to measure additional parameters for modeling of alien crosstalk in permanent links and channels of Cate

46、gory 8 and better cabling and components. The scope of the project has been broadened to include frequencies up to 2.0 GHz and test system requirements to ensure accuracy of measurement as well as general testing guidelines. The Addendum is intended to be published as an independent testing referenc

47、e. This Addendum was developed by TIA Subcommittee TR-42.7. Approval of this Standard This Addendum was approved by TIA Sub-Committee TR-42.7, TIA Engineering Committee TR-42, and the American National Standards Institute (ANSI). ANSI/TIA reviews standards every 5 years. At that time, standards are

48、reaffirmed, rescinded, or revised according to the submitted updates. Updates to be included in the next revision should be sent to the committee chair or to ANSI/TIA. Contributing Organizations More than 30 organizations within the telecommunications industry contributed their expertise to the deve

49、lopment of this Addendum (including manufacturers, consultants, end users, and other organizations). Annexes There are six annexes in this Addendum. Annexes A through F are informative and not considered requirements of this addendum. ANSI/TIA-1183-1 1 Introduction This standard describes test fixturing and methods for obtaining performance measurements of passive devices designed for differential signal transmission. The measurements are generally aimed at swept frequency response measurements where the source signal is provided by test equipment. A network analyzer is typi