1、 TIA-1183-1 (Addendum to TIA-1183) January 2016Measurement Methods and Test Fixtures for Balun-Less Measurements of Balanced Components and Systems, Extending Frequency Capabilities to 2 GHz ANSI/TIA-1183-1-2016 APPROVED: JANUARY 12, 2016 NOTICE TIA Engineering Standards and Publications are designe
2、d to serve the public interest through eliminating misunderstandings between manufacturers and purchasers, facilitating interchangeability and improvement of products, and assisting the purchaser in selecting and obtaining with minimum delay the proper product for their particular need. The existenc
3、e of such Standards and Publications shall not in any respect preclude any member or non-member of TIA from manufacturing or selling products not conforming to such Standards and Publications. Neither shall the existence of such Standards and Publications preclude their voluntary use by Non-TIA memb
4、ers, either domestically or internationally. Standards and Publications are adopted by TIA in accordance with the American National Standards Institute (ANSI) patent policy. By such action, TIA does not assume any liability to any patent owner, nor does it assume any obligation whatever to parties a
5、dopting the Standard or Publication. This Standard does not purport to address all safety problems associated with its use or all applicable regulatory requirements. It is the responsibility of the user of this Standard to establish appropriate safety and health practices and to determine the applic
6、ability of regulatory limitations before its use. Any use of trademarks in this document are for information purposes and do not constitute an endorsement by TIA or this committee of the products or services of the company. (From Project No. ANSI/TIA-PN-1183-1-D1, formulated under the cognizance of
7、the TIA TR-42 Telecommunications Cabling Systems, TR-42.7 Subcommittee on Telecommunications Copper Cabling Systems (568). Published by TELECOMMUNICATIONS INDUSTRY ASSOCIATION Technology and Standards Department 1320 N. Courthouse Road, Suite 200 Arlington, VA 22201 U.S.A. PRICE: Please refer to cur
8、rent Catalog of TIA TELECOMMUNICATIONS INDUSTRY ASSOCIATION STANDARDS AND ENGINEERING PUBLICATIONS or call IHS, USA and Canada (1-877-413-5187) International (303-397-2896) or search online at http:/www.tiaonline.org/standards/catalog/ All rights reserved Printed in U.S.A. NOTICE OF COPYRIGHT This d
9、ocument is copyrighted by the TIA. Reproduction of these documents either in hard copy or soft copy (including posting on the web) is prohibited without copyright permission. For copyright permission to reproduce portions of this document, please contact the TIA Standards Department or go to the TIA
10、 website (www.tiaonline.org) for details on how to request permission. Details are located at: http:/www.tiaonline.org/standards/catalog/info.cfm#copyright or Telecommunications Industry Association Technology (b) there is no assurance that the Document will be approved by any Committee of TIA or an
11、y other body in its present or any other form; (c) the Document may be amended, modified or changed in the standards development or any editing process. The use or practice of contents of this Document may involve the use of intellectual property rights (“IPR”), including pending or issued patents,
12、or copyrights, owned by one or more parties. TIA makes no search or investigation for IPR. When IPR consisting of patents and published pending patent applications are claimed and called to TIAs attention, a statement from the holder thereof is requested, all in accordance with the Manual. TIA takes
13、 no position with reference to, and disclaims any obligation to investigate or inquire into, the scope or validity of any claims of IPR. TIA will neither be a party to discussions of any licensing terms or conditions, which are instead left to the parties involved, nor will TIA opine or judge whethe
14、r proposed licensing terms or conditions are reasonable or non-discriminatory. TIA does not warrant or represent that procedures or practices suggested or provided in the Manual have been complied with as respects the Document or its contents. If the Document contains one or more Normative Reference
15、s to a document published by another organization (“other SSO”) engaged in the formulation, development or publication of standards (whether designated as a standard, specification, recommendation or otherwise), whether such reference consists of mandatory, alternate or optional elements (as defined
16、 in the TIA Procedures for American National Standards) then (i) TIA disclaims any duty or obligation to search or investigate the records of any other SSO for IPR or letters of assurance relating to any such Normative Reference; (ii) TIAs policy of encouragement of voluntary disclosure (see TIA Pro
17、cedures for American National Standards Annex C.1.2.3) of Essential Patent(s) and published pending patent applications shall apply; and (iii) Information as to claims of IPR in the records or publications of the other SSO shall not constitute identification to TIA of a claim of Essential Patent(s)
18、or published pending patent applications. TIA does not enforce or monitor compliance with the contents of the Document. TIA does not certify, inspect, test or otherwise investigate products, designs or services or any claims of compliance with the contents of the Document. ALL WARRANTIES, EXPRESS OR
19、 IMPLIED, ARE DISCLAIMED, INCLUDING WITHOUT LIMITATION, ANY AND ALL WARRANTIES CONCERNING THE ACCURACY OF THE CONTENTS, ITS FITNESS OR APPROPRIATENESS FOR A PARTICULAR PURPOSE OR USE, ITS MERCHANTABILITY AND ITS NONINFRINGEMENT OF ANY THIRD PARTYS INTELLECTUAL PROPERTY RIGHTS. TIA EXPRESSLY DISCLAIM
20、S ANY AND ALL RESPONSIBILITIES FOR THE ACCURACY OF THE CONTENTS AND MAKES NO REPRESENTATIONS OR WARRANTIES REGARDING THE CONTENTS COMPLIANCE WITH ANY APPLICABLE STATUTE, RULE OR REGULATION, OR THE SAFETY OR HEALTH EFFECTS OF THE CONTENTS OR ANY PRODUCT OR SERVICE REFERRED TO IN THE DOCUMENT OR PRODU
21、CED OR RENDERED TO COMPLY WITH THE CONTENTS. TIA SHALL NOT BE LIABLE FOR ANY AND ALL DAMAGES, DIRECT OR INDIRECT, ARISING FROM OR RELATING TO ANY USE OF THE CONTENTS CONTAINED HEREIN, INCLUDING WITHOUT LIMITATION ANY AND ALL INDIRECT, SPECIAL, INCIDENTAL OR CONSEQUENTIAL DAMAGES (INCLUDING DAMAGES F
22、OR LOSS OF BUSINESS, LOSS OF PROFITS, LITIGATION, OR THE LIKE), WHETHER BASED UPON BREACH OF CONTRACT, BREACH OF WARRANTY, TORT (INCLUDING NEGLIGENCE), PRODUCT LIABILITY OR OTHERWISE, EVEN IF ADVISED OF THE POSSIBILITY OF SUCH DAMAGES. THE FOREGOING NEGATION OF DAMAGES IS A FUNDAMENTAL ELEMENT OF TH
23、E USE OF THE CONTENTS HEREOF, AND THESE CONTENTS WOULD NOT BE PUBLISHED BY TIA WITHOUT SUCH LIMITATIONS. ANSI/TIA-1183-1 i Measurement methods and test fixtures for balun-less measurements of balanced components and systems FOREWORD . iv Introduction 1 1 Scope 2 2 Normative references 2 3 Definition
24、 of terms, acronyms and abbreviations, and units of measure 2 3.1 General 2 3.2 Definitions 2 3.3 Acronyms and abbreviations . 3 3.4 Units of measure . 3 3.5 Variables 3 4 General 4 5 Test configurations 4 5.1 Test configuration 5 6 Fixtures and setup . 10 6.1 Switching and interconnecting coaxial c
25、able requirements 11 6.2 Test fixture interface performance 12 6.3 Overall test setup performance before calibration 14 7 Port terminations . 14 7.1 Active port network analyzer terminations 15 7.2 Active port resistor terminations 15 7.3 Inactive port resistor terminations . 15 7.4 Calibration refe
26、rence loads . 15 7.5 Termination resistor selection . 15 7.5.1 Termination resistor impedance tolerance 16 7.5.2 Load terminations used for calibration 17 7.5.2.1 50 reference load measurement procedure 17 7.5.3 Reference loads for calibration . 17 7.5.4 Calibration kit definitions . 17 7.6 Active p
27、ort far end termination performance . 17 7.7 Inactive port termination performance . 18 8 Calibration . 18 8.1 General 18 8.2 Reference loads for calibration . 19 8.3 Overall test system performance after calibration. 19 9 Procedures for determining test system performance parameters . 19 9.1 Genera
28、l 19 9.2 Residual FEXT loss . 19 10 Test fixture Interface description . 19 10.1 Fixture dimensions 20 Annex A (informative)- Derivation of mixed mode parameters from four port S parameter measurements 23 Annex B (informative)- Impedance transformation calculations 24 Annex C (informative) Cabling s
29、tandards and termination impedances for differential cabling systems 25 Annex D (informative) Port identification and nomenclature . 26 Annex E (informative) De-embedding balunless 16 port test fixtures. 31 E.1 Four port fixture method. General calibration approach . 31 E.1.1 Four port fixture metho
30、d. Pre-characterization of probing devices 33 E.1.2 Four port fixture method. Determination of fixture matrices 34 ANSI/TIA-1183-1 ii E.1.3 Four port fixture method. Cascading de-embedding matrices. 35 E.2 Sixteen port fixture method. General calibration approach . 36 E.2.1 Sixteen port fixture meth
31、od. Determining fixture matrices . 36 E.2.2 Sixteen port fixture method. Cascading de-embedding matrices 36 E.3 Characterizing the probing fixture . 37 E.4 Characterizing a 4-port fixture . 39 E.4.1 Determination of SAA, SBB, SAB and SBA, . 39 E.4.2 Determination of SCC SAC and SCA . 39 E.4.3 Determ
32、ination of SDD SBD and SDB . 40 E.4.4 Determination of SDA, SAD, SBC, SCB, SCD and SDC . 40 E.5 Characterizing a 16-port fixture . 41 E.5.1 Additional FEXT coupling elements of the 16 port fixture matrix . 41 E.5.2 Additional NEXT coupling elements of the 16 port matrix . 41 E.5.3 Additional recipro
33、cal NEXT coupling elements of the 16-port matrix 42 E.6 RF simulation software consideration. 43 E.6.1 Port mapping of fixtures in a back-to-back configuration. 44 E.6.2 Performing 16 Port S to T transformations 46 E.6.3 Performing 16 Port T to S transformations 47 E.7 Conversion from single-ended t
34、o mixed mode using mathematical baluns 48 LIST OF TABLES Table 1 - Switch performance recommendations 11 Table 2 - Test fixture performance 13 Table 3 - Overall test setup performance before calibration . 14 Table 4 - Calibration termination performance 17 Table 5 Active port far end termination per
35、formance . 17 Table 6 - Inactive port far end termination performance . 18 Table 7 - Overall test setup performance after calibration . 19 Table D.1 - Horizontal 100 twisted pair cable color codes 27 Table D.2 - Stimulus and response designations for ports 1 and 2 28 Table D.3 - Modular connector co
36、nductor mappings (ref) 29 Table D.4 Port nomenclature 30 Table E.1 Reciprocal relationships in a 16 port matrix 42 Table E-2 Test fixture port re-mapping for back-to-back through calibrations 44 Table E.3 Balun conversion S16P port identification 50 LIST OF FIGURES Figure 1 - Test system diagram for
37、 four port network analyzer . 6 Figure 2 - Laboratory test configuration for cable and channel insertion loss, return loss, TCL, TCTL, and propagation delay. 7 Figure 3 - Laboratory test configuration for NEXT loss between two pairs of a four-pair DUT . 8 Figure 4 - Laboratory two port test configur
38、ation for return loss and TCL (LCL) measurements. 9 Figure 5 - Laboratory test configuration for FEXT loss between two pairs of a DUT. . 9 Figure 6 - Insertion loss measurement of low loss devices. 11 Figure 7 - Example of a four-port test setup with test fixtures and programmable switching 12 Figur
39、e 8 - Example chip resistor performance guide. 16 Figure 9 - Example chip resistor terminations using 0603 chip resistors 16 Figure 10 - Example pin and socket interface dimension . 20 Figure 11 Example DUT interface dimensions . 20 Figure 12 - Example test fixture exploded assembly . 21 Figure 13 -
40、 Example test fixture assembly 22 ANSI/TIA-1183-1 iii Figure 14 Example termination of individually shielded pair cable . 22 Figure D.1 - Example S-parameter notation for two ports . 26 Figure D.2 - Four-pair DUT port numbering 26 Figure D.3 - Mapping 16 port network to mixed mode network 28 Figure
41、D.4 - T568A pin/pair mapping 29 Figure D.5 - T568B pin/pair mapping 29 Figure E.1 - Unprocessed measurement includes test fixtures and DUT . 32 Figure E.2 - De-embedding matrices cascaded to unprocessed 16-port matrix . 33 Figure E.3 - An example of probing devices (rigid SMA cable is modified) 34 F
42、igure E.4 - Using probing devices to interface ports C and D to measure FWDx and REVx . 34 Figure E.5 - Diagram of 4-port measuring fixture and 2-port probing fixture 37 Figure E.6 - Diagram of four port probing fixture . 38 Figure E.7 - Notation of 4-port measurement fixture FWD1 39 Figure E.8 - Fi
43、rst Setup for Characterization of a 4-Port Measurement Fixture . 39 Figure E.9 - Second setup for characterization of a 4-port measurement fixture . 40 Figure E.10 - Third setup for characterization of a 4-port measurement fixture . 40 Figure E.11 - Fourth setup for characterization of a 4-port meas
44、urement fixture . 40 Figure E.12 - Cascading using RF simulation application (comparable to Figure E.2) . 43 Figure E.13 - Adding ideal baluns to extract mixed mode parameters . 43 Figure E.14 - Port numbering of near and far end test fixtures . 44 Figure E.15 - Balun schematic 48 Figure E.16 - Illu
45、stration for cascading de-embedding matrices and ideal baluns 50 ANSI/TIA-1183-1 iv FOREWORD (This forward is not a part of this Addendum.) This project was initiated in conjunction with the need to measure additional parameters for modeling of alien crosstalk in permanent links and channels of Cate
46、gory 8 and better cabling and components. The scope of the project has been broadened to include frequencies up to 2.0 GHz and test system requirements to ensure accuracy of measurement as well as general testing guidelines. The Addendum is intended to be published as an independent testing referenc
47、e. This Addendum was developed by TIA Subcommittee TR-42.7. Approval of this Standard This Addendum was approved by TIA Sub-Committee TR-42.7, TIA Engineering Committee TR-42, and the American National Standards Institute (ANSI). ANSI/TIA reviews standards every 5 years. At that time, standards are
48、reaffirmed, rescinded, or revised according to the submitted updates. Updates to be included in the next revision should be sent to the committee chair or to ANSI/TIA. Contributing Organizations More than 30 organizations within the telecommunications industry contributed their expertise to the deve
49、lopment of this Addendum (including manufacturers, consultants, end users, and other organizations). Annexes There are six annexes in this Addendum. Annexes A through F are informative and not considered requirements of this addendum. ANSI/TIA-1183-1 1 Introduction This standard describes test fixturing and methods for obtaining performance measurements of passive devices designed for differential signal transmission. The measurements are generally aimed at swept frequency response measurements where the source signal is provided by test equipment. A network analyzer is typi
