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本文(IEC 60424-2-2015 Ferrite cores - Guidelines on the limits of surface irregularities - Part 2 RM-cores《铁氧体磁芯.表面缺陷极限指南.第2部分 RM-磁芯》.pdf)为本站会员(roleaisle130)主动上传,麦多课文库仅提供信息存储空间,仅对用户上传内容的表现方式做保护处理,对上载内容本身不做任何修改或编辑。 若此文所含内容侵犯了您的版权或隐私,请立即通知麦多课文库(发送邮件至master@mydoc123.com或直接QQ联系客服),我们立即给予删除!

IEC 60424-2-2015 Ferrite cores - Guidelines on the limits of surface irregularities - Part 2 RM-cores《铁氧体磁芯.表面缺陷极限指南.第2部分 RM-磁芯》.pdf

1、 IEC 60424-2 Edition 2.0 2015-12 INTERNATIONAL STANDARD NORME INTERNATIONALE Ferrite cores Guidelines on the limits of surface irregularities Part 2: RM-cores Noyaux ferrites Lignes directrices relatives aux limites des irrgularits de surface Partie 2: Noyaux RM IEC 60424-2:2015-12(en-fr) THIS PUBLI

2、CATION IS COPYRIGHT PROTECTED Copyright 2015 IEC, Geneva, Switzerland All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized in any form or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing

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4、ion. Droits de reproduction rservs. Sauf indication contraire, aucune partie de cette publication ne peut tre reproduite ni utilise sous quelque forme que ce soit et par aucun procd, lectronique ou mcanique, y compris la photocopie et les microfilms, sans laccord crit de lIEC ou du Comit national de

5、 lIEC du pays du demandeur. Si vous avez des questions sur le copyright de lIEC ou si vous dsirez obtenir des droits supplmentaires sur cette publication, utilisez les coordonnes ci-aprs ou contactez le Comit national de lIEC de votre pays de rsidence. IEC Central Office Tel.: +41 22 919 02 11 3, ru

6、e de Varemb Fax: +41 22 919 03 00 CH-1211 Geneva 20 infoiec.ch Switzerland www.iec.ch About the IEC The International Electrotechnical Commission (IEC) is the leading global organization that prepares and publishes International Standards for all electrical, electronic and related technologies. Abou

7、t IEC publications The technical content of IEC publications is kept under constant review by the IEC. Please make sure that you have the latest edition, a corrigenda or an amendment might have been published. IEC Catalogue - webstore.iec.ch/catalogue The stand-alone application for consulting the e

8、ntire bibliographical information on IEC International Standards, Technical Specifications, Technical Reports and other documents. Available for PC, Mac OS, Android Tablets and iPad. IEC publications search - www.iec.ch/searchpub The advanced search enables to find IEC publications by a variety of c

9、riteria (reference number, text, technical committee,). It also gives information on projects, replaced and withdrawn publications. IEC Just Published - webstore.iec.ch/justpublished Stay up to date on all new IEC publications. Just Published details all new publications released. Available online a

10、nd also once a month by email. Electropedia - www.electropedia.org The worlds leading online dictionary of electronic and electrical terms containing more than 30 000 terms and definitions in English and French, with equivalent terms in 15 additional languages. Also known as the International Electr

11、otechnical Vocabulary (IEV) online. IEC Glossary - std.iec.ch/glossary More than 60 000 electrotechnical terminology entries in English and French extracted from the Terms and Definitions clause of IEC publications issued since 2002. Some entries have been collected from earlier publications of IEC

12、TC 37, 77, 86 and CISPR. IEC Customer Service Centre - webstore.iec.ch/csc If you wish to give us your feedback on this publication or need further assistance, please contact the Customer Service Centre: csciec.ch. A propos de lIEC La Commission Electrotechnique Internationale (IEC) est la premire o

13、rganisation mondiale qui labore et publie des Normes internationales pour tout ce qui a trait llectricit, llectronique et aux technologies apparentes. A propos des publications IEC Le contenu technique des publications IEC est constamment revu. Veuillez vous assurer que vous possdez ldition la plus

14、rcente, un corrigendum ou amendement peut avoir t publi. Catalogue IEC - webstore.iec.ch/catalogue Application autonome pour consulter tous les renseignements bibliographiques sur les Normes internationales, Spcifications techniques, Rapports techniques et autres documents de lIEC. Disponible pour P

15、C, Mac OS, tablettes Android et iPad. Recherche de publications IEC - www.iec.ch/searchpub La recherche avance permet de trouver des publications IEC en utilisant diffrents critres (numro de rfrence, texte, comit dtudes,). Elle donne aussi des informations sur les projets et les publications remplac

16、es ou retires. IEC Just Published - webstore.iec.ch/justpublished Restez inform sur les nouvelles publications IEC. Just Published dtaille les nouvelles publications parues. Disponible en ligne et aussi une fois par mois par email. Electropedia - www.electropedia.org Le premier dictionnaire en ligne

17、 de termes lectroniques et lectriques. Il contient plus de 30 000 termes et dfinitions en anglais et en franais, ainsi que les termes quivalents dans 15 langues additionnelles. Egalement appel Vocabulaire Electrotechnique International (IEV) en ligne. Glossaire IEC - std.iec.ch/glossary Plus de 60 0

18、00 entres terminologiques lectrotechniques, en anglais et en franais, extraites des articles Termes et Dfinitions des publications IEC parues depuis 2002. Plus certaines entres antrieures extraites des publications des CE 37, 77, 86 et CISPR de lIEC. Service Clients - webstore.iec.ch/csc Si vous dsi

19、rez nous donner des commentaires sur cette publication ou si vous avez des questions contactez-nous: csciec.ch. IEC 60424-2 Edition 2.0 2012 INTERNATIONAL STANDARD NORME INTERNATIONALE Ferrite cores Guidelines on the limits of surface irregularities Part 2: RM-cores Noyaux ferrites Lignes directrice

20、s relatives aux limites des irrgularits de surface Partie 2: Noyaux RM INTERNATIONAL ELECTROTECHNICAL COMMISSION COMMISSION ELECTROTECHNIQUE INTERNATIONALE ICS 29.100.10 ISBN 978-2-8322-3031-2 Registered trademark of the International Electrotechnical Commission Marque dpose de la Commission Electro

21、technique Internationale Warning! Make sure that you obtained this publication from an authorized distributor. Attention! Veuillez vous assurer que vous avez obtenu cette publication via un distributeur agr. 2 IEC 60424-2:2015 IEC 2015 CONTENTS FOREWORD . 3 1 Scope 5 2 Normative references . 5 3 Lim

22、its of surface irregularities 5 3.1 Visual inspection and recommended limits . 5 3.2 Chips and ragged edges 6 3.2.1 Chips and ragged edges on mating surfaces 6 3.2.2 Chips and ragged edges on other surfaces . 6 3.3 Cracks 9 3.4 Flash. 10 3.5 Pull-outs . 10 3.6 Crystallites 11 3.7 Pores 12 Bibliograp

23、hy 13 Figure 1 Chips and ragged edges on mating surfaces . 6 Figure 2 Cracks location Top view . 9 Figure 3 Cracks location Bottom view 9 Figure 4 Dimension W 10 Figure 5 Flash and pull-out location 11 Figure 6 Pull-out in clamping recess area . 11 Figure 7 Crystallites location for RM-core . 11 Fig

24、ure 8 Pores location for RM-core . 12 Table 1 Relevant subclauses for given irregularity versus location 5 Table 2 Allowable chipping areas 6 Table 3 Area and length references for visual inspection . 8 Table 4 Limits for cracks 10 Table 5 W dimensions 10 IEC 60424-2:2015 IEC 2015 3 INTERNATIONAL EL

25、ECTROTECHNICAL COMMISSION _ FERRITE CORES GUIDELINES ON THE LIMITS OF SURFACE IRREGULARITIES Part 2: RM-cores FOREWORD 1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising all national electrotechnical committees (IEC National Committees).

26、 The object of IEC is to promote international co-operation on all questions concerning standardization in the electrical and electronic fields. To this end and in addition to other activities, IEC publishes International Standards, Technical Specifications, Technical Reports, Publicly Available Spe

27、cifications (PAS) and Guides (hereafter referred to as “IEC Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested in the subject dealt with may participate in this preparatory work. International, governmental and non- governmental organizati

28、ons liaising with the IEC also participate in this preparation. IEC collaborates closely with the International Organization for Standardization (ISO) in accordance with conditions determined by agreement between the two organizations. 2) The formal decisions or agreements of IEC on technical matter

29、s express, as nearly as possible, an international consensus of opinion on the relevant subjects since each technical committee has representation from all interested IEC National Committees. 3) IEC Publications have the form of recommendations for international use and are accepted by IEC National

30、Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any misinterpretation by any end user. 4) In order to promote international uniformity, IEC N

31、ational Committees undertake to apply IEC Publications transparently to the maximum extent possible in their national and regional publications. Any divergence between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in the latter. 5) IEC itself d

32、oes not provide any attestation of conformity. Independent certification bodies provide conformity assessment services and, in some areas, access to IEC marks of conformity. IEC is not responsible for any services carried out by independent certification bodies. 6) All users should ensure that they

33、have the latest edition of this publication. 7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and members of its technical committees and IEC National Committees for any personal injury, property damage or other damage of any nature wha

34、tsoever, whether direct or indirect, or for costs (including legal fees) and expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC Publications. 8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publi

35、cations is indispensable for the correct application of this publication. 9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of patent rights. IEC shall not be held responsible for identifying any or all such patent rights. International Sta

36、ndard IEC 60424-2 has been prepared by technical committee 51: Magnetic components and ferrite materials. This second edition cancels and replaces the first edition published in 1997. This edition constitutes a technical revision. This edition includes the following significant technical changes wit

37、h respect to the previous edition: a) addition of crystallites in 3.6 and of pores in 3.7. 4 IEC 60424-2:2015 IEC 2015 The text of this standard is based on the following documents: FDIS Report on voting 51/1108/FDIS 51/1122/RVD Full information on the voting for the approval of this standard can be

38、 found in the report on voting indicated in the above table. This publication has been drafted in accordance with the ISO/IEC Directives, Part 2. A list of all parts in the IEC 60424 series, published under the general title Ferrite cores Guidelines on the limits of surface irregularities, can be fo

39、und on the IEC website. Future standards in this series will carry the new general title as cited above. Titles of existing standards in this series will be updated at the time of the next edition. The committee has decided that the contents of this publication will remain unchanged until the stabil

40、ity date indicated on the IEC website under “http:/webstore.iec.ch“ in the data related to the specific publication. At this date, the publication will be reconfirmed, withdrawn, replaced by a revised edition, or amended. IEC 60424-2:2015 IEC 2015 5 FERRITE CORES GUIDELINES ON THE LIMITS OF SURFACE

41、IRREGULARITIES Part 2: RM-cores 1 Scope This part of IEC 60424 provides guidelines on the allowable limits of surface irregularities applicable to RM-cores in accordance with the relevant generic specification. This standard should be considered as a sectional specification useful in the negotiation

42、s between ferrite core manufacturers and customers about surface irregularities. Normative reference 2 Normative references The following documents, in whole or in part, are normatively referenced in this document and are indispensable for its application. For dated references, only the edition cite

43、d applies. For undated references, the latest edition of the referenced document (including any amendments) applies. 3 Limits of surface irregularities 3.1 Visual inspection and recommended limits To facilitate quick identification of recommended limits for a given irregularity based on its location

44、, the following subclauses are summarized in Table 1. Table 1 Relevant subclauses for given irregularity versus location Location Type of irregularity For limits, see Mating surfaces Chips Ragged edges Cracks 3.2.1 3.2.1 3.3 Centre-post Chips Ragged edges Cracks 3.2.2 3.2.2 3.3 Outer walls Chips Cra

45、cks 3.2.2 3.3 Back wall Chips Ragged edges Cracks Pull-outs 3.2.2 3.2.2 3.3 3.5 Wire slot areas Chips Ragged edges Flash 3.2.2 3.2.2 3.4 Wire way areas Chips Ragged edges Flash 3.2.2 3.2.2 3.4 Clamping recess areas Chips Ragged edges Pull-outs 3.2.2 3.2.2 3.5 6 IEC 60424-2:2015 IEC 2015 3.2 Chips an

46、d ragged edges 3.2.1 Chips and ragged edges on mating surfaces The areas of the chips located on the mating surfaces (C1, C1 and C1 irregularities in Figure 1) shall not exceed the following limits: the cumulative area of the chips shall be less than 4 % of the total mating surface; the total length

47、 of the ragged edges shall be less than 25 % of the perimeter of the relevant surface. Key C1, C1, C1: chip R1, R1: ragged edge L 1 , L 2 : length of ragged edge Figure 1 Chips and ragged edges on mating surfaces Allowable chipping areas for a given core are summarized in Table 2 Table 2 Allowable c

48、hipping areas Core size Mating surfaces (mm 2 ) Other surfaces (mm 2 ) RM4/RM5 2 4 RM6/RM7 3 6 RM8 4,5 9 RM10 7 15 RM12 12,5 25 RM14 15 30 NOTE These limits are applicable to cores with and without a hole in the centre-post. 3.2.2 Chips and ragged edges on other surfaces The areas of the chips locat

49、ed on the other surfaces shall not exceed the following limits: The allowable chipping areas are doubled as compared to the limits for the mating surface (see Table 2). The rule for the ragged edges is the same as for the mating surface. Chips and ragged edges are not acceptable on the ridge of the clamping recess area. IEC Inner edge of wire slot area C1 R1 L 1L 2R1 C1 C1

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