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本文(IEC 60689-2008 Measurement and test methods for tuning fork quartz crystal units in the range from 10 kHz to 200 kHz and standard values《用于10kHz~200kHz及标准值的音叉石英晶体元件的测量和试验方法》.pdf)为本站会员(towelfact221)主动上传,麦多课文库仅提供信息存储空间,仅对用户上传内容的表现方式做保护处理,对上载内容本身不做任何修改或编辑。 若此文所含内容侵犯了您的版权或隐私,请立即通知麦多课文库(发送邮件至master@mydoc123.com或直接QQ联系客服),我们立即给予删除!

IEC 60689-2008 Measurement and test methods for tuning fork quartz crystal units in the range from 10 kHz to 200 kHz and standard values《用于10kHz~200kHz及标准值的音叉石英晶体元件的测量和试验方法》.pdf

1、 IEC 60689 Edition 2.0 2008-11 INTERNATIONAL STANDARD NORME INTERNATIONALE Measurement and test methods for tuning fork quartz crystal units in the range from 10 kHz to 200 kHz and standard values Mthodes de mesure et dessai concernant le rglage des rsonateurs quartz dans la plage comprise entre 10

2、kHz et 200 kHz et valeurs normales IEC 60689:2008 THIS PUBLICATION IS COPYRIGHT PROTECTED Copyright 2008 IEC, Geneva, Switzerland All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized in any form or by any means, electronic or mechanical, includin

3、g photocopying and microfilm, without permission in writing from either IEC or IECs member National Committee in the country of the requester. If you have any questions about IEC copyright or have an enquiry about obtaining additional rights to this publication, please contact the address below or y

4、our local IEC member National Committee for further information. Droits de reproduction rservs. Sauf indication contraire, aucune partie de cette publication ne peut tre reproduite ni utilise sous quelque forme que ce soit et par aucun procd, lectronique ou mcanique, y compris la photocopie et les m

5、icrofilms, sans laccord crit de la CEI ou du Comit national de la CEI du pays du demandeur. Si vous avez des questions sur le copyright de la CEI ou si vous dsirez obtenir des droits supplmentaires sur cette publication, utilisez les coordonnes ci-aprs ou contactez le Comit national de la CEI de vot

6、re pays de rsidence. IEC Central Office Tel.: +41 22 919 02 11 3, rue de Varemb Fax: +41 22 919 03 00 CH-1211 Geneva 20 infoiec.ch Switzerland www.iec.ch About the IEC The International Electrotechnical Commission (IEC) is the leading global organization that prepares and publishes International Sta

7、ndards for all electrical, electronic and related technologies. About IEC publications The technical content of IEC publications is kept under constant review by the IEC. Please make sure that you have the latest edition, a corrigenda or an amendment might have been published. Useful links: IEC publ

8、ications search - www.iec.ch/searchpub The advanced search enables you to find IEC publications by a variety of criteria (reference number, text, technical committee,). It also gives information on projects, replaced and withdrawn publications. IEC Just Published - webstore.iec.ch/justpublished Stay

9、 up to date on all new IEC publications. Just Published details all new publications released. Available on-line and also once a month by email. Electropedia - www.electropedia.org The worlds leading online dictionary of electronic and electrical terms containing more than 30 000 terms and definitio

10、ns in English and French, with equivalent terms in additional languages. Also known as the International Electrotechnical Vocabulary (IEV) on-line. Customer Service Centre - webstore.iec.ch/csc If you wish to give us your feedback on this publication or need further assistance, please contact the Cu

11、stomer Service Centre: csciec.ch. A propos de la CEI La Commission Electrotechnique Internationale (CEI) est la premire organisation mondiale qui labore et publie des Normes internationales pour tout ce qui a trait llectricit, llectronique et aux technologies apparentes. A propos des publications CE

12、I Le contenu technique des publications de la CEI est constamment revu. Veuillez vous assurer que vous possdez ldition la plus rcente, un corrigendum ou amendement peut avoir t publi. Liens utiles: Recherche de publications CEI - www.iec.ch/searchpub La recherche avance vous permet de trouver des pu

13、blications CEI en utilisant diffrents critres (numro de rfrence, texte, comit dtudes,). Elle donne aussi des informations sur les projets et les publications remplaces ou retires. Just Published CEI - webstore.iec.ch/justpublished Restez inform sur les nouvelles publications de la CEI. Just Publishe

14、d dtaille les nouvelles publications parues. Disponible en ligne et aussi une fois par mois par email. Electropedia - www.electropedia.org Le premier dictionnaire en ligne au monde de termes lectroniques et lectriques. Il contient plus de 30 000 termes et dfinitions en anglais et en franais, ainsi q

15、ue les termes quivalents dans les langues additionnelles. Egalement appel Vocabulaire Electrotechnique International (VEI) en ligne. Service Clients - webstore.iec.ch/csc Si vous dsirez nous donner des commentaires sur cette publication ou si vous avez des questions contactez-nous: csciec.ch. IEC 60

16、689 Edition 2.0 2008-11 INTERNATIONAL STANDARD NORME INTERNATIONALE Measurement and test methods for tuning fork quartz crystal units in the range from 10 kHz to 200 kHz and standard values Mthodes de mesure et dessai concernant le rglage des rsonateurs quartz dans la plage comprise entre 10 kHz et

17、200 kHz et valeurs normales INTERNATIONAL ELECTROTECHNICAL COMMISSION COMMISSION ELECTROTECHNIQUE INTERNATIONALE R ICS 31.140 PRICE CODE CODE PRIX ISBN 978-2-8322-0883-0 Registered trademark of the International Electrotechnical Commission Marque dpose de la Commission Electrotechnique International

18、e Warning! Make sure that you obtained this publication from an authorized distributor. Attention! Veuillez vous assurer que vous avez obtenu cette publication via un distributeur agr. 2 60689 IEC:2008 CONTENTS FOREWORD . 4 1 Scope . 6 2 Normative references . 6 3 Overview 6 3.1 General . 6 3.2 Appl

19、ied frequency range 6 3.3 Measurement method 6 3.4 Load capacitance 7 3.5 Recommended drive level . 7 3.6 Measurement conditions 7 3.7 Measurement of frequency-temperature characteristics . 7 3.8 Load capacitance frequency characteristics 7 4 Measurement methods . 7 4.1 Method A . 7 4.1.1 Vector net

20、work analyzer/vector impedance analyzer 7 4.1.2 Block diagram 7 4.1.3 Specifications for vector network analyzer/vector impedance analyzer 8 4.1.4 Test fixture 8 4.1.5 Measurement of equivalent circuit constants . 9 4.1.6 Frequency pulling 10 4.2 Method B . 10 4.2.1 General . 10 4.2.2 Block diagram

21、10 4.2.3 Calibration . 11 4.2.4 Procedure 11 5 Measurement conditions . 12 5.1 General . 12 5.2 Measurement conditions 12 5.3 Measurement of the frequency-temperature dependence 13 5.3.1 General . 13 5.3.2 Block diagram 13 5.3.3 Determination of the turnover point and parabolic coefficient (standard

22、 reference method) . 13 5.3.4 Measurement of the frequency versus temperature characteristics (mass production method) . 14 5.3.5 Frequency C Lcurve . 15 6 Test and environmental examination 15 6.1 Application of the definition of IEC 60122-1 . 15 6.2 Magnetism Influence of a magnetic field on the f

23、requency 16 6.3 Enclosure 16 6.4 Measuring conditions and electric performance . 16 6.4.1 General . 16 6.4.2 Measurement conditions 16 6.4.3 Standard values 16 Bibliography 18 60689 IEC:2008 3 Figure 1 Block diagram of the measurement method using the vector network analyzer or vector impedance anal

24、yzer . 8 Figure 2 Block diagram of test fixture . 9 Figure 3 Block diagram of test fixture (including a load capacitance). 9 Figure 4 Block diagram of test fixture for bridge method 11 Figure 5 Block diagram of test fixture for bridge method (including a load capacitance) . 11 Figure 6 Block diagram

25、 of measurement of the frequency-temperature dependence 13 Figure 7 Frequencytemperature template (Turnover point: 25 5 C, = 45 10 9 /C 2 ) 14 Figure 8a) f/f versus C Lcurve 15 Figure 8b) f/f versus C Lcurve . 15 Figure 8 f/f versus C Lcurve with different C Ls15 Table 1 Specifications for vector ne

26、twork analyzer/vector impedance analyzer 8 Table 2 Standard values 17 4 60689 IEC:2008 INTERNATIONAL ELECTROTECHNICAL COMMISSION _ MEASUREMENT AND TEST METHODS FOR TUNING FORK QUARTZ CRYSTAL UNITS IN THE RANGE FROM 10 kHz TO 200 kHz AND STANDARD VALUES FOREWORD 1) The International Electrotechnical

27、Commission (IEC) is a worldwide organization for standardization comprising all national electrotechnical committees (IEC National Committees). The object of IEC is to promote international co-operation on all questions concerning standardization in the electrical and electronic fields. To this end

28、and in addition to other activities, IEC publishes International Standards, Technical Specifications, Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Commit

29、tee interested in the subject dealt with may participate in this preparatory work. International, governmental and non- governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely with the International Organization for Standardization (ISO) in acc

30、ordance with conditions determined by agreement between the two organizations. 2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international consensus of opinion on the relevant subjects since each technical committee has representation from all i

31、nterested IEC National Committees. 3) IEC Publications have the form of recommendations for international use and are accepted by IEC National Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC Publications is accurate, IEC cannot be held resp

32、onsible for the way in which they are used or for any misinterpretation by any end user. 4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications transparently to the maximum extent possible in their national and regional publications. Any divergen

33、ce between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in the latter. 5) IEC provides no marking procedure to indicate its approval and cannot be rendered responsible for any equipment declared to be in conformity with an IEC Publication. 6)

34、All users should ensure that they have the latest edition of this publication. 7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and members of its technical committees and IEC National Committees for any personal injury, property damage

35、 or other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC Publications. 8) Attention is drawn to the Normative references cited in this public

36、ation. Use of the referenced publications is indispensable for the correct application of this publication. 9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of patent rights. IEC shall not be held responsible for identifying any or all suc

37、h patent rights. International Standard IEC 60689 has been prepared by IEC technical committee 49: Piezoelectric and dielectric devices for frequency control and selection. This second edition cancels and replaces the first edition published in 1980. This edition constitutes a technical revision. Th

38、is edition includes the following significant technical changes with respect to the previous edition: a) The title of the first edition is Measurements and test methods for 32 kHz quartz crystal units for wrist watches and standard values. The title is modified and the frequency range of this second

39、 edition is extended to the range from 10 kHz to 200 kHz. b) The Lissajous method is defined in the first edition as the standard measurement method. The PI network and bridge method are used in this second edition. c) The PI network has a transformer for impedance matching. This composition differs

40、 from that of IEC 60444-1. 60689 IEC:2008 5 This bilingual version (2013-07) corresponds to the monolingual English version, published in 2008-11. The text of this standard is based on the following documents: FDIS Report on voting 49/809/FDIS 49/815/RVD Full information on the voting for the approv

41、al of this standard can be found in the report on voting indicated in the above table. The French version of this standard has not been voted upon. This publication has been drafted in accordance with the ISO/IEC Directives, Part 2. The committee has decided that the contents of this publication wil

42、l remain unchanged until the maintenance result date indicated on the IEC web site under “http:/webstore.iec.ch“ in the data related to the specific publication. At this date, the publication will be reconfirmed; withdrawn; replaced by a revised edition; or amended. 6 60689 IEC:2008 MEASUREMENT AND

43、TEST METHODS FOR TUNING FORK QUARTZ CRYSTAL UNITS IN THE RANGE FROM 10 kHz TO 200 kHz AND STANDARD VALUES 1 Scope This International Standard applies to measurements and test methods for tuning fork quartz crystal units in the range from 10 kHz to 200 kHz and standard values for frequency control an

44、d selection. 2 Normative references The following referenced documents are indispensable for the application of this document. For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments) applies. IEC 60027 (al

45、l parts), Letter symbols to be used in electrical technology IEC 60050-561, International Electrotechnical Vocabulary Chapter 561: Piezoelectric devices for frequency control and selection IEC 60122-1, Quartz crystal units of assessed quality Part 1: Generic specification IEC 60122-3, Quartz crystal

46、 units of assessed quality Part 3: Standard outlines and lead connections IEC 60444 (series), Measurement of quartz crystal unit parameters by zero phase technique in a -network IEC 60617, Graphical symbols for diagrams ISO 1000:1992, SI units and recommendations for the use of their multiples and c

47、ertain other Units 3 Overview 3.1 General Units, graphical symbols, letter symbols and terminology shall, wherever possible, be taken from the following standards: IEC 60027, IEC 60050-561, IEC 60122-1, IEC 60617, and ISO 1000. 3.2 Applied frequency range The frequency range is from 10 kHz to 200 kH

48、z. 3.3 Measurement method The measurement method is according to the IEC 60444 series. It is permitted to use the bridge method as a simple measuring method. 60689 IEC:2008 7 NOTE Other methods like Lissajous-or oscillator methods are not recommended for measurement of equivalent circuit constants.

49、3.4 Load capacitance Currently, defined values of load capacitance are 8 pF, 10 pF, 12 pF, 15 pF, 20 pF and 30 pF. 3.5 Recommended drive level Currently, the recommended drive level is 0,1 W. 3.6 Measurement conditions Measurement conditions are given in 5.2. 3.7 Measurement of frequency-temperature characteristics The measurement of frequency-temperature characteristics is given in Clause 5. 3.8 Loa

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