1、 IEC 60689 Edition 2.0 2008-11 INTERNATIONAL STANDARD NORME INTERNATIONALE Measurement and test methods for tuning fork quartz crystal units in the range from 10 kHz to 200 kHz and standard values Mthodes de mesure et dessai concernant le rglage des rsonateurs quartz dans la plage comprise entre 10
2、kHz et 200 kHz et valeurs normales IEC 60689:2008 THIS PUBLICATION IS COPYRIGHT PROTECTED Copyright 2008 IEC, Geneva, Switzerland All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized in any form or by any means, electronic or mechanical, includin
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16、689 Edition 2.0 2008-11 INTERNATIONAL STANDARD NORME INTERNATIONALE Measurement and test methods for tuning fork quartz crystal units in the range from 10 kHz to 200 kHz and standard values Mthodes de mesure et dessai concernant le rglage des rsonateurs quartz dans la plage comprise entre 10 kHz et
17、200 kHz et valeurs normales INTERNATIONAL ELECTROTECHNICAL COMMISSION COMMISSION ELECTROTECHNIQUE INTERNATIONALE R ICS 31.140 PRICE CODE CODE PRIX ISBN 978-2-8322-0883-0 Registered trademark of the International Electrotechnical Commission Marque dpose de la Commission Electrotechnique International
18、e Warning! Make sure that you obtained this publication from an authorized distributor. Attention! Veuillez vous assurer que vous avez obtenu cette publication via un distributeur agr. 2 60689 IEC:2008 CONTENTS FOREWORD . 4 1 Scope . 6 2 Normative references . 6 3 Overview 6 3.1 General . 6 3.2 Appl
19、ied frequency range 6 3.3 Measurement method 6 3.4 Load capacitance 7 3.5 Recommended drive level . 7 3.6 Measurement conditions 7 3.7 Measurement of frequency-temperature characteristics . 7 3.8 Load capacitance frequency characteristics 7 4 Measurement methods . 7 4.1 Method A . 7 4.1.1 Vector net
20、work analyzer/vector impedance analyzer 7 4.1.2 Block diagram 7 4.1.3 Specifications for vector network analyzer/vector impedance analyzer 8 4.1.4 Test fixture 8 4.1.5 Measurement of equivalent circuit constants . 9 4.1.6 Frequency pulling 10 4.2 Method B . 10 4.2.1 General . 10 4.2.2 Block diagram
21、10 4.2.3 Calibration . 11 4.2.4 Procedure 11 5 Measurement conditions . 12 5.1 General . 12 5.2 Measurement conditions 12 5.3 Measurement of the frequency-temperature dependence 13 5.3.1 General . 13 5.3.2 Block diagram 13 5.3.3 Determination of the turnover point and parabolic coefficient (standard
22、 reference method) . 13 5.3.4 Measurement of the frequency versus temperature characteristics (mass production method) . 14 5.3.5 Frequency C Lcurve . 15 6 Test and environmental examination 15 6.1 Application of the definition of IEC 60122-1 . 15 6.2 Magnetism Influence of a magnetic field on the f
23、requency 16 6.3 Enclosure 16 6.4 Measuring conditions and electric performance . 16 6.4.1 General . 16 6.4.2 Measurement conditions 16 6.4.3 Standard values 16 Bibliography 18 60689 IEC:2008 3 Figure 1 Block diagram of the measurement method using the vector network analyzer or vector impedance anal
24、yzer . 8 Figure 2 Block diagram of test fixture . 9 Figure 3 Block diagram of test fixture (including a load capacitance). 9 Figure 4 Block diagram of test fixture for bridge method 11 Figure 5 Block diagram of test fixture for bridge method (including a load capacitance) . 11 Figure 6 Block diagram
25、 of measurement of the frequency-temperature dependence 13 Figure 7 Frequencytemperature template (Turnover point: 25 5 C, = 45 10 9 /C 2 ) 14 Figure 8a) f/f versus C Lcurve 15 Figure 8b) f/f versus C Lcurve . 15 Figure 8 f/f versus C Lcurve with different C Ls15 Table 1 Specifications for vector ne
26、twork analyzer/vector impedance analyzer 8 Table 2 Standard values 17 4 60689 IEC:2008 INTERNATIONAL ELECTROTECHNICAL COMMISSION _ MEASUREMENT AND TEST METHODS FOR TUNING FORK QUARTZ CRYSTAL UNITS IN THE RANGE FROM 10 kHz TO 200 kHz AND STANDARD VALUES FOREWORD 1) The International Electrotechnical
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36、ation. Use of the referenced publications is indispensable for the correct application of this publication. 9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of patent rights. IEC shall not be held responsible for identifying any or all suc
37、h patent rights. International Standard IEC 60689 has been prepared by IEC technical committee 49: Piezoelectric and dielectric devices for frequency control and selection. This second edition cancels and replaces the first edition published in 1980. This edition constitutes a technical revision. Th
38、is edition includes the following significant technical changes with respect to the previous edition: a) The title of the first edition is Measurements and test methods for 32 kHz quartz crystal units for wrist watches and standard values. The title is modified and the frequency range of this second
39、 edition is extended to the range from 10 kHz to 200 kHz. b) The Lissajous method is defined in the first edition as the standard measurement method. The PI network and bridge method are used in this second edition. c) The PI network has a transformer for impedance matching. This composition differs
40、 from that of IEC 60444-1. 60689 IEC:2008 5 This bilingual version (2013-07) corresponds to the monolingual English version, published in 2008-11. The text of this standard is based on the following documents: FDIS Report on voting 49/809/FDIS 49/815/RVD Full information on the voting for the approv
41、al of this standard can be found in the report on voting indicated in the above table. The French version of this standard has not been voted upon. This publication has been drafted in accordance with the ISO/IEC Directives, Part 2. The committee has decided that the contents of this publication wil
42、l remain unchanged until the maintenance result date indicated on the IEC web site under “http:/webstore.iec.ch“ in the data related to the specific publication. At this date, the publication will be reconfirmed; withdrawn; replaced by a revised edition; or amended. 6 60689 IEC:2008 MEASUREMENT AND
43、TEST METHODS FOR TUNING FORK QUARTZ CRYSTAL UNITS IN THE RANGE FROM 10 kHz TO 200 kHz AND STANDARD VALUES 1 Scope This International Standard applies to measurements and test methods for tuning fork quartz crystal units in the range from 10 kHz to 200 kHz and standard values for frequency control an
44、d selection. 2 Normative references The following referenced documents are indispensable for the application of this document. For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments) applies. IEC 60027 (al
45、l parts), Letter symbols to be used in electrical technology IEC 60050-561, International Electrotechnical Vocabulary Chapter 561: Piezoelectric devices for frequency control and selection IEC 60122-1, Quartz crystal units of assessed quality Part 1: Generic specification IEC 60122-3, Quartz crystal
46、 units of assessed quality Part 3: Standard outlines and lead connections IEC 60444 (series), Measurement of quartz crystal unit parameters by zero phase technique in a -network IEC 60617, Graphical symbols for diagrams ISO 1000:1992, SI units and recommendations for the use of their multiples and c
47、ertain other Units 3 Overview 3.1 General Units, graphical symbols, letter symbols and terminology shall, wherever possible, be taken from the following standards: IEC 60027, IEC 60050-561, IEC 60122-1, IEC 60617, and ISO 1000. 3.2 Applied frequency range The frequency range is from 10 kHz to 200 kH
48、z. 3.3 Measurement method The measurement method is according to the IEC 60444 series. It is permitted to use the bridge method as a simple measuring method. 60689 IEC:2008 7 NOTE Other methods like Lissajous-or oscillator methods are not recommended for measurement of equivalent circuit constants.
49、3.4 Load capacitance Currently, defined values of load capacitance are 8 pF, 10 pF, 12 pF, 15 pF, 20 pF and 30 pF. 3.5 Recommended drive level Currently, the recommended drive level is 0,1 W. 3.6 Measurement conditions Measurement conditions are given in 5.2. 3.7 Measurement of frequency-temperature characteristics The measurement of frequency-temperature characteristics is given in Clause 5. 3.8 Loa
